test report no.: 13014285 001 page 1 of 12 prüfbericht - nr.: 12 · 2016. 8. 10. · 4 641 1.640...
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TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
Test report no.: Prüfbericht - Nr.:
13014285 001
Client (Customer address): Auftraggeber (Kundenadresse):
LG Electronics Inc. # 191-1, Gongdan-dong, Gumi, Gyeongsangbuk-do, 730-030, Rep. of Korea
Test item: Gegenstand der Prüfung:
Photovoltaic (PV) Module(s)
Date of receipt: Eingangsdatum:
19/08/2013
Module type designation: Modultypen-Bezeichnung:
LG290N1C-A3 Serial No.: Serien-Nr.:
See sample list on page 6
Order no.: Auftragsnummer:
133034684 Quotation no.: Angebotsnummer:
N/A
Testing location: Prüfort:
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center
300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea
Test specification: Prüfgrundlage:
IEC 62804 Edition 1: Draft,: ―System voltage durability qualification test for crystalline silicon modules‖
Test result: Prüfergebnis:
All of the required tests of the IEC 62804 Edition 1: Draft standard were passed according to its regulations of the pass criteria. Test specifics are documented in the section Summary of Testing. It is therefore declared, that the crystalline photovoltaic modules of the aforementioned types fulfil the requirements of the standard IEC 62804 Edition 1: Draft
compiled by / erstellt:
reviewed by / kontrolliert:
25 August, 2013 Ho-Jin Park 25 August, 2013 Dipl.-Ing. SooBong Lim
Date Datum
Title/Name Titel/Name
Date Datum
Title/Name Titel/Name
Other Aspects/Sonstiges : This draft standard will be published officially after several amendments. This international standard lays down IEC requirements for the qualification of terrestrial PV modules for operation under the stress of system bias voltage. High voltage potential that exists between the active circuit and the grounded module surfaces can lead to module degradation. These degradation mechanisms associated with the high voltage have been labelled potential-induced degradation (PID)
This test report relates to the listed test samples. Without permission of the test centre this test report is not permitted to be duplicated in extracts. This test report does not entitle to carry any safety mark on this or similar products.
Dieser Prüfbericht bezieht sich nur auf die gelisteten Prüfmuster und darf ohne Genehmigung der Prüfstelle nicht auszugsweise vervielfältigt werden. Dieser Bericht berechtigt nicht zur Verwendung eines Prüfzeichens.
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
Address/es of the manufacturing site/s:
Name / Description: LG Electronics Inc.
Street: # 191-1, Gongdan-dong
Postcode / City: 730-030 / Gumi, Gyeongsangbuk-do
Country: Rep. of Korea
Type of production: Crystalline
Inspection report no: 13500182 004
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
Table of content Address/es of the manufacturing site/s: 2 Summary of testing 4 General information 5 Testing procedure 6 Marking 8 Tables 9
Visual inspection (Initial) (10.1) 9 Maximum power determination (Initial) (10.2) 9 Performance at low irradiance (Initial) (10.7) 9 Wet leakage current test (Initial) (10.15) 9 Ground continuity test (Initial, MST 13) 10 Voltage stress in damp heat (10.13) 10
Maximum power determination after voltage stress in damp heat (10.2) 10 Performance at low irradiance after voltage stress in damp heat (10.7) 11 Wet leakage current test after voltage stress in damp heat (10.15) 11 Visual inspection after voltage stress in damp heat (10.1) 11
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
Summary of testing
- Tests included in Figure 1 were performed in the specified order. - All modules, including the control module, were exposed to sunlight to an irradiation of about 7 kWhm
-2.
- Performed IEC 61215 Clause 10.1 visual inspection. - Performed IEC 61215 Clause 10.2 maximum power determination. - Performed IEC 61215 Clause 10.7 performance at low irradiance. - Performed IEC 61215 Clause 10.15 wet leakage current test. - Performed IEC 61730-2 ground continuity test (MST 13) - Applied voltage stress to modules in damp heat environment with the following conditions.
1. Chamber air temperature : 60℃ ± 2℃
2. Chamber relative humidity : 85% ± 5% RH 3. Test duration : 96 h dwell at above stated temperature and relative humidity 4. Voltage : module rated system voltage and polarities.
Remarks: N/A
Summary of test locations:
All tests were performed at TÜ V Rheinland Yeungnam University Photovoltaic Testing Center.
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
General information
Abbreviations used in the report:
HF – Humidity freeze TC – Thermal cycling
DH – Damp heat Vmpp – Maximum power point voltage
Impp – Maximum power point current Voc – Open circuit voltage
Isc – Short circuit current FF – Fill factor
Pmpp – Maximum power α – Current temperature coefficient
NOCT – Nominal Operating Cell Temperature β – Voltage temperature coefficient
STC – Standard Test Conditions – Power temperature coefficient
Possible test case verdicts:
- test case does not apply to the test object ........................... : N/A
- test object does meet the requirement ................................. : Passed (P)
- test object does not meet the requirement ........................... : Failed (F)
Date(s) of performance of tests[DD/MM/YYYY] ................ : From 20/08/2013 until 25/08/2013
General remarks:
The test verdicts presented in this report relate only to the object tested. This report shall not be reproduced, except in full, without the written approval of the issuing testing laboratory. The term ―degradation‖ implies a decrease in power. Negative values under this heading therefore indicate an increase in output. "(see remark #)" refers to a remark appended to the report. "(see Annex #)" refers to an annex appended to the report.
Throughout this report a point is used as the decimal separator.
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
Testing procedure
Random sampling from production
Prototype submitted by client
New module type
Modifications (if yes, please choose the applicable modification according to the Retesting Guideline)
Original test report ref. no.:
Change in cell technology
Modification to encapsulation system
Modification to superstrate
Increase in module size
Modification to back sheet / substrate
Modification to frame and / or mounting structure
Modification to junction box / electrical termination
Change in cell interconnect materials or technique
Change in electrical circuit of an identical package
Higher or lower power output (by 10%) in the identical package including size and using the identical cell process
Qualification of a frameless module after the design has received certification as a framed module
Change in bypass diode or number of diodes
Description of similarity (differences) between the applied model and the previously tested model:
N/A
Module group assignment:
Sample # Sample S/N
Remarks /
constructional characteristics
(module dimension)
1(control) K21137240048 LG290N1C-A3 / 1000 X 1640 X 35
2 K21137240047 LG290N1C-A3 / 1000 X 1640 X 35
3 K21137240046 LG290N1C-A3 / 1000 X 1640 X 35
4 K21137191917 LG290N1C-A3 / 1000 X 1640 X 35
5 K21137191921 LG290N1C-A3 / 1000 X 1640 X 35
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Test Report No. 13014285 001
10 TEST PROCEDURES
Note: Any changes and deviations from test sequence are possible but must be recorded and reported in detail.
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
Marking
Name, monogram or symbol of manufacturer ...... : — P
Type or model number .......................................... : — P
Serial number ........................................................ : — P
Polarity of terminals or leads ................................. : — P
Maximum system voltage for which the module is suitable
— P
Nominal and minimum values of maximum output power at STC after preconditioning……………… :
— P
The date and place of manufacture ...................... : — P
Test verdicts
Initial examination All modules —
10 Preconditioning (min. 5.5 kWh ~ 20kWh).............. : exposed to natural sunlight P
10.1 Visual inspection ................................................... : See table 10.1 P
10.2 Maximum power determination ............................. : See table 10.2 P
10.7 Performance at low irradiance See table 10.7 P
10.15 Wet leakage current test ....................................... : See table 10.15 P
MST13 Ground continuity test ........................................... : See table MST13 P
10.13 Damp heat test ...................................................... : See table 10.13 P
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
Tables
Visual inspection (Initial) (10.1)
Test date [DD/MM/YYYY] ............................... : 20/08/2013 —
Sample # Nature and position of initial findings —
1 No visual defects found P
2 No visual defects found P
3 No visual defects found P
4 No visual defects found P
5 No visual defects found P
Supplementary information: N/A
Maximum power determination (Initial) (10.2)
Test date [DD/MM/YYYY] ............................... : 20/08/2013 —
Module temperature °C ................................. : 25 °C —
Irradiance W/m² ............................................. : 1000 —
Sample # Pmpp W Vmpp V Impp A Voc V Isc A FF %
1 290.3 30.99 9.367 39.61 9.992 73.36
2 290.5 30.86 9.414 39.61 10.095 72.66
3 291.2 30.91 9.421 39.63 10.040 73.19
4 295.2 30.88 9.560 39.52 10.113 73.86
5 295.5 30.86 9.575 39.57 10.103 73.92
Supplementary information: N/A
Performance at low irradiance (Initial) (10.7)
Test date [DD/MM/YYYY] ............................... : 20/08/2013 —
Module temperature °C ................................. : 25 °C —
Irradiance W/m² ............................................. : 200 —
Sample # Pmpp W Vmpp V Impp A Voc V Isc A FF %
1 58.5 31.01 1.888 36.66 1.990 80.26
2 58.9 30.94 1.903 36.63 2.017 79.66
3 59.0 31.02 1.903 36.64 2.015 79.97
4 59.3 31.30 1.894 36.61 2.015 80.37
5 59.5 31.22 1.907 36.65 2.018 80.49
Supplementary information: N/A
Wet leakage current test (Initial) (10.15)
Test date [DD/MM/YYYY] ................................ : 20/08/2013 —
Test voltage applied V .................................. : 1000 —
Solution resistivity cm ................................ : : < 3,500 P
Solution temperature °C................................ : 22 3 P
Sample # Measured Area Result* —
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
[M] [m²] [M * m²]
1 1310 1.640 2148 P
2 877 1.640 1438 P
3 727 1.640 1192 P
4 641 1.640 1051 P
5 653 1.640 1071 P
* Minimum requirement acc. to the standard is 40 M*m².
Supplementary information: N/A
Ground continuity test (Initial, MST 13)
Test date [DD/MM/YYYY] 20/08/2013 —
Maximum over-current protection rating [A] 20 —
Current applied [A] 50 —
Location of designated grounding point At grounding position of rail type frame
—
Location of second contacting point At grounding position of rail type frame of opposite long frame
—
Sample # Position in test sequence Voltage [mV] Resistance
[m] —
2 Damp Heat sequence 128 2.56 P
3 Damp Heat sequence 163 3.26 P
4 Damp Heat sequence 236 4.72 P
5 Damp Heat sequence 254 5.08 P
Supplementary information: N/A
Voltage stress in damp heat (10.13)
Test date [DD/MM/YYYY] start / end .............. : 21/08/2013 – 25/08/2013 —
Test voltage applied V ................................... : -1000 V for sample no.2,4 and +1000 V for sample no.3,5
P
Temperature[℃] .............................................. : 60 P
Humidity[%] ..................................................... : 85 P
Total duration [h] ............................................. : 96 —
Sample # — —
2 — P
3 — P
4 — P
5 — P
Supplementary information: Modules were not covered by conductive foil.
Maximum power determination after voltage stress in damp heat (10.2)
Test date [DD/MM/YYYY] ............................... : 25/08/2013 —
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
Module temperature °C ................................. : 25 °C —
Irradiance W/m² ............................................. : 1000 —
Sample # Pmpp
W
Vmpp
V Impp A Voc V Isc A FF %
Degradation [%]
—
2 287.6 30.83 9.328 39.50 10.069 72.30 1.02 P
3 291.5 30.88 9.442 39.58 10.095 72.96 -0.12 P
4 292.2 30.88 9.463 39.45 10.053 73.67 1.02 P
5 294.6 30.86 9.546 39.56 10.090 73.81 0.31 P
Supplementary information: Maximum allowable Pmpp degradation after this test is 5%.
Performance at low irradiance after voltage stress in damp heat (10.7)
Test date [DD/MM/YYYY] ............................... : 25/08/2013 —
Module temperature °C ................................. : 25 °C —
Irradiance W/m² ............................................. : 200 —
Sample # Pmpp W Vmpp V Impp A Voc V Isc A FF %
2 58.1 31.02 1.873 36.47 1.994 79.92
3 58.9 30.97 1.903 36.63 2.014 79.87
4 58.5 31.07 1.884 36.49 1.992 80.54
5 59.1 31.69 1.863 36.62 2.002 80.48
Supplementary information: N/A
Wet leakage current test after voltage stress in damp heat (10.15)
Test date [DD/MM/YYYY] ................................ : 25/08/2013 —
Test voltage applied V .................................. : 1000 —
Solution resistivity cm ................................ : : < 3,500 P
Solution temperature °C................................ : 22 3 P
Sample # Measured Area Result*
— [M] [m²] [M * m²]
2 2490 1.640 4084 P
3 789 1.640 1294 P
4 1910 1.640 3132 P
5 716 1.640 1174 P
* Minimum requirement acc. to the standard is 40 M*m².
Supplementary information: N/A
Visual inspection after voltage stress in damp heat (10.1)
Test date [DD/MM/YYYY] ................................ : 25/08/2013 —
Sample # Nature and position of findings —
2 No visual defects found P
3 No visual defects found P
4 No visual defects found P
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
5 No visual defects found P
Supplementary information: N/A
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Test Report No. 13014285 001
TÜ V Rheinland Yeungnam University Photovoltaic Testing Center, 300 Sampung-dong, Gyeongsan-si, Gyeongbuk, Korea Web: www.tuv.com
Annex 1: Photos of modules
Figure 2. front view of test sample
Figure 3. rear view of test sample
Figure 4. detail view of solar cell
Figure 5. detail view of type label
Figure 6. detail view of polarity marking