test of the maps add-on board s. amar-youcef, m. deveaux, d. doering, c. müntz, s. seddiki, p....

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Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

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Page 1: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Test of the MAPS add-on board

S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Page 2: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Outline

• Test setup– Mi 20 – Sensor

• Data analysis• Results: Test MAPS add-on board• Summary

CBM Collaboration meeting Split 2009 2 / 16

Page 3: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Test setupTest setupOnly acquisition board changed in contrast to reference systemOnly acquisition board changed in contrast to reference system

Mimosa20 (2008)

Auxiliary board, power supply, signal processing, data transfer

HADES-DAQ compatible, no dead time, big RAM space for data storage or buffering, 50MHz readout clock;Data processing:digitalization, sparsification

Analysis

Sensor

Frontend board (PCB)

MAPS add-on boardon TRB2 (TRBnet)

PC

Data transfer:I/O card or OP-link

Monitoring

Analog signals Sync. signals

CBM Collaboration meeting Split 2009 3 / 16

Page 4: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Mimosa 20 - SensorMimosa20 (2008):Mimosa20 (2008):

•Differential analog output •2 banks•10 submatrices•Multiplexed onto 2 outputs•50 MHz •200 kPixels•30 µm pixel-pitch•SB pixels

30 µm

Cparasitic

Recharge diode

Collecting diode

Output

CBM Collaboration meeting Split 2009 4 / 16

Page 5: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Properties SB-pixel

Cparasitic

Recharge diode

Collecting diode

OutputIrecharge

Ileakage

Potential at output:

Equilibrium: Irecharge =Ileakage

CDS (Correlated Double Sampling):

Noise

CBM Collaboration meeting Split 2009

Potentiometer

5 / 16

Page 6: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Chip slow controlChip slow control

• JTAG interface for chip settings•Working point of source follower•Level marker pixels•Level of signals•Amplification•Analog buffer•Differential output buffer

CBM Collaboration meeting Split 2009 6 / 16

Page 7: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Clusterfinding

Noise

Hit-signal(Pixels over threshold)

Data analysis softwareData analysis softwareData taken and stored!

Import

CDS

Demultiplexing

DataDataData

CBM Collaboration meeting Split 2009 7 / 16

Page 8: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Noise in one Pixel

Noise [ADC]

Charge spectrum of 55-Fe source

Key observables:Key observables:

Noise [ADC]

Calibration [e-/ADC]

GainKα (55Fe )

Noise [e-]

CBM Collaboration meeting Split 2009

Noise Histogramm

Pixel to pixel dispersion of Noise

8 / 16

Page 9: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Status on last collaboration meetingStatus on last collaboration meeting

• We could start running this setup for a first time– Readoutchain working properly– But performance of analoge electronics not clarified

Goal: Goal: •Validate the board designValidate the board design•Check whether we can reach aspired performance Check whether we can reach aspired performance •Maximize sensitivity ↔ minimize noise Maximize sensitivity ↔ minimize noise •Understand MAPS add-on board in detailUnderstand MAPS add-on board in detail

Approach: Approach: •Systematic measurementsSystematic measurements•Optimize settingsOptimize settings

CBM Collaboration meeting Split 2009 9 / 16

Page 10: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

ResultsResultsCalibration: gain (@ f=50MHz)

Each data point measured with ‚optimal‘ settings!

Discharge of Kα signal, due to higher recharge current at higher temperatures!

CBM Collaboration meeting Split 2009 10 / 16

Page 11: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

SB-Pixel:SB-Pixel:

Potential at output with hit:

Irecharge > Ileakage

Irecharge = Ileakage

Irecharge < Ileakage + ISignal

CDS:

Hit-signal

At higher leakage current:Pixel recharge faster Hit signal smaller

CBM Collaboration meeting Split 2009 11 / 16

Page 12: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Calibration: gain (@ f=50MHz)

Expected saturation value:Expected saturation value:408 ADC = 1640 e408 ADC = 1640 e-

CBM Collaboration meeting Split 2009 12 / 16

Page 13: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Noise w.r.t. chip temperature:

CBM Collaboration meeting Split 2009 13 / 16

Page 14: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Noise w.r.t. readout frequency:

Conclusion: properties are comparable to reference system The MAPS add-on board is working well!

CBM Collaboration meeting Split 2009 14 / 16

Page 15: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Status nowStatus now

• Full control of the chip– Understand the behaviour by tuning the different

parameters– Know how to balance the parameter against each other in

order to optimize the noise

• Results match the design goals

CBM Collaboration meeting Split 2009 15 / 16

Page 16: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Summary

• MAPS add-on board – Working well– Understand how to control the Mi20 with– Ready for beamtime

• Further steps:– Prepare setup and software for upcoming

beamtime

Thank you!CBM Collaboration meeting Split 2009 16 / 16

Page 17: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

Backup slides

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10008507005504003002702402101801501209060300

IN P U T-V oltage[m V ]

deflection

m esured value 100kH z

m easured value 1M H z

m easured value 10M H z

m easured value 30M H z

CBM Collaboration meeting Split 2009 17 / 16

Page 18: Test of the MAPS add-on board S. Amar-Youcef, M. Deveaux, D. Doering, C. Müntz, S. Seddiki, P. Scharrer, Ch. Schrader, J. Stroth, T. Tischler

CBM Collaboration meeting Split 2009

U-I – characteristics of diode:

Non-linear behaviour

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