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The top documents tagged [system test logic slide]
April 20, 2001VLSI Test: Bushnell-Agrawal/Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System view
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Copyright 2001, Agrawal & BushnellVLSI Test: Lecture 281 Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard n Motivation n Bed-of-nails tester n System
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