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The top documents tagged [bias temperature]
ADXL335
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Effects of Switched-Bias Annealing on Charge Trapping in HfO 2 high- Gate Dielectrics
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Effects of Switched-Bias Annealing on Charge Trapping in HfO 2 high- Gate Dielectrics
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Mei Xu , Jamie Wolff and Michelle Harrold National Center for Atmospheric Research (NCAR)
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