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Available online at www.scholarsresearchlibrary.com Scholars Research Library Archives of Physics Research, 2016, 7(1):1-14 (http://scholarsresearchlibrary.com/archive.html) ISSN 0976-0970 USA CODEN: APRRC7 1 Scholar Research Library Synthesis, Characterization and Study of Dielectric Properties, AC Conductivity, and Surface Morphology of Ferroelectrics Ba1- xSrxTiO3 by Ceramic Method Smita Patil*, R.B.Pujar, Bahubali Doddannavar P.C. Jabin Science College, Hubli-580031, Karnataka, India _____________________________________________________________________________________________ ABSTRACT Ferroelectrics with general chemical formula Ba1-xSrxTiO3 (x=0.3,0.5,0.7,0.9) were synthesized by ceramic method and characterized by X-ray diffraction, study of surface morphology by scanning electron microscopy(SEM), porosity variation with different composition of x and same behavior is indicated by SEM micrographs. Dielectric constant studies found with dispersion is due to Maxwell Wagner type interfacial polarization. AC conductivity studies with frequency suggest that small poloron type of conduction mechanism. Keywords: piezoelectric, ceramic, poloron, grain boundaries, dispersion ___________________________________________________________________________________________ INTRODUCTION The breakthrough in the research on ferroelectric materials came in the early 1950’s with widespread use of BaTiO3 based ceramics in capacitor applications and piezoelectric transducer devices. (1) particle size and surface structure explain the distinct properties of the ferroelectrics (2). In the present research work In this present work the ferroelectric Ba1-xSrxTiO3 has been synthesized with x=0.3, 0.5, 0.7, 0.9 using ceramic method for better physical properties with high purity. Experimental part Precursors, BaCO3, SrCO3and TiO2in AR grade, were taken in Stoichiometry proportion for preparing 10 grams of Ba1-XSrXTiO3with x=0.3 ,0.5, 0.7 and 0.9. The required quantities of these raw materials were mixed thoroughly in acetone medium by milling for 3 to 4 hours to get fine powders. The ferroelectric powder was pre-sintered at 10000 C for 10 hours in an air medium to make the raw materials, if any to react partially to reduce the evolution of gas in the final sintering process. Then the powders were pressed in to pellet by adding a drop of PVA and pressed by KBr Press by applying a pressure of about 7 tons per square inch for 5 minutes by putting a powder of about 1gm in a di of 1 cm in diameter. The pellets were subjected to final sintering at about 12000C and furnace cooled. Binder addition The calcined sample at 1200 0C was chosen and mixed with polyvinyl alcohol that acts as a binder. The role of a binder is to provide mechanical strength to the pellets that are to be formed for sintering. Binder is made by mixing

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  • Available online at www.scholarsresearchlibrary.com

    Scholars Research Library

    Archives of Physics Research, 2016, 7(1):1-14

    (http://scholarsresearchlibrary.com/archive.html)

    ISSN 0976-0970 USA CODEN: APRRC7

    1

    Scholar Research Library

    Synthesis, Characterization and Study of Dielectric Properties, AC

    Conductivity, and Surface Morphology of Ferroelectrics Ba1-

    xSrxTiO3 by Ceramic Method

    Smita Patil*, R.B.Pujar, Bahubali Doddannavar

    P.C. Jabin Science College, Hubli-580031, Karnataka, India

    _____________________________________________________________________________________________

    ABSTRACT

    Ferroelectrics with general chemical formula Ba1-xSrxTiO3 (x=0.3,0.5,0.7,0.9) were synthesized by ceramic method

    and characterized by X-ray diffraction, study of surface morphology by scanning electron microscopy(SEM),

    porosity variation with different composition of x and same behavior is indicated by SEM micrographs. Dielectric

    constant studies found with dispersion is due to Maxwell Wagner type interfacial polarization. AC conductivity

    studies with frequency suggest that small poloron type of conduction mechanism.

    Keywords: piezoelectric, ceramic, poloron, grain boundaries, dispersion ___________________________________________________________________________________________

    INTRODUCTION

    The breakthrough in the research on ferroelectric materials came in the early 1950’s with widespread use of BaTiO3

    based ceramics in capacitor applications and piezoelectric transducer devices. (1) particle size and surface structure

    explain the distinct properties of the ferroelectrics (2).

    In the present research work

    In this present work the ferroelectric Ba1-xSrxTiO3 has been synthesized with x=0.3, 0.5, 0.7, 0.9 using ceramic

    method for better physical properties with high purity.

    Experimental part

    Precursors, BaCO3, SrCO3and TiO2in AR grade, were taken in Stoichiometry proportion for preparing 10 grams of

    Ba1-XSrXTiO3with x=0.3 ,0.5, 0.7 and 0.9. The required quantities of these raw materials were mixed thoroughly

    in acetone medium by milling for 3 to 4 hours to get fine powders. The ferroelectric powder was pre-sintered at

    10000 C for 10 hours in an air medium to make the raw materials, if any to react partially to reduce the evolution of

    gas in the final sintering process. Then the powders were pressed in to pellet by adding a drop of PVA and pressed

    by KBr Press by applying a pressure of about 7 tons per square inch for 5 minutes by putting a powder of about 1gm

    in a di of 1 cm in diameter. The pellets were subjected to final sintering at about 12000C and furnace cooled.

    Binder addition

    The calcined sample at 1200 0C was chosen and mixed with polyvinyl alcohol that acts as a binder. The role of a

    binder is to provide mechanical strength to the pellets that are to be formed for sintering. Binder is made by mixing

    http://www.scholarsresearchlibrary.com/

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    2-3% of polyvinyl alcohol in powder form with distilled water and then stirring with the help of a magnetic stirrer.

    The binder vaporizes during sintering. After mixing the binder the sample is left for some time so that the mixture

    dries and then grinded again.

    RESULT AND CONCLUSIONS

    X ray characterization

    X-Ray diffraction of the sample was obtained from Indian institute of science, Bangalore. Using filtered Cu.kα,

    radiation of wavelength 1.5418 A0. The interplanar distance of the cubic system was calculated by the relation

    d = a/ (h2+k2+l2)1/2

    Where, a = lattice constant

    (h, k, l) = miller indices

    While the relation calculated the lattice constant

    a = λ (h2+k2+l2)/2sinθ

    Where, λ = wavelength of the monochromatic X-ray used

    θ = glancing angle

    The diffract grams were indexed in the light of the crystal structure of natural spinel BaTiO3. The prominent line in

    the diffraction pattern of spinel corresponds to (110) plane. Knowing the values of θ, λ and (hkl), lattice constant was

    calculated. Knowing the value of lattice constant and miller indices, the value of interplanar distance was calculated

    for other planes.

    Density measurement The density and porosity were calculated as follows:

    Actual density (da) = m/V

    Where m= mass

    V= Volume

    X-Ray density (dx) = 8M/Na3

    Where M- molecular weight

    N- Avogadro’s number

    a-lattice constant

    Porosity (Pa) = (dx-da) 100 =-------

    dx

    Data on X-Ray Diffraction

    Table 1: For X=0.3 a=8.1621A0 λ=1.5418A0

    2Ө Ө Sin Ө (h k l) d (A0) Calculate d obs(A0)

    22.2426 11.1213 0.192886753 (0,0,1) 3.996645638 3.99684

    31.6778 15.8389 0.272933465 (1,1,0) 2.824497905 2.82463

    39.0354 19.5177 0.334098047 (1,1,1) 2.307406484 2.30752

    45.4871 22.74355 0.386607143 (2,0,0) 1.994013856 1.99411

    51.1842 25.5921 0.431961399 (2,1,0) 1.784650207 1.178474

    57.5744 28.7872 0.481557893 (2,1,1) 1.600845944 1.60092

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    66.1869 33.09345 0.54600619 (2,1,0) 1.411888755 1.41196

    70.7069 35.35345 0.57861873 (1,0,3) 1.332310829 1.33238

    75.3387 37.66935 0.611103692 (3,0,1) 10261488043 1.26155

    79.6232 39.8116 0.640265231 (2,2,2) 1.204032271 1.20409

    83.8336 41.9168 0.66805077 (3,2,0) 1.153954212 1.15305

    Figure 1: X-Ray diffraction pattern for X=0.3(Ba0.7Sr0.3 TiO3)

    Table 2: For X=0.5 a=8.1851A0 λ=1.5418A0

    2Ө Ө Sin Ө (h k l) d (A0) Calculate d obs(A0)

    22.3469 11.17345 0.19377977 (0,0,1) 3.978227 3.97842

    32.2221 16.11105 0.277499942 (1,1,0) 2.77801 2.77815

    39.7956 19.8978 0.340343445 (1,1,1) 20265064923 2.26518

    46.0967 23.04835 0.391507772 (2,0,0) 1.969054142 1.96915

    51.3630 25.6815 0.433368116 (2,1,0) 1.778857215 1.77894

    57.5845 28.79225 0.481635137 (2,1,1) 1.6005892 1.60067

    66.1760 33.088 0.545926497 (2,2,0) 1.4112094858 1.41216

    67.3645 33.68225 0.554586664 (3,0,1) 1.390044242 1.9011

    76.8363 38.41815 0.621396005 (3,1,1) 1.240593749 1.24065

    84.0062 42.0031 0.669170813 (2,2,2) 1.152022749 1.15112

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    Figure 2: X-Ray diffraction pattern for X=0.5 (Ba0.5 Sr0.5 TiO3)

    Table 3: For X=0.7 a=8.1610A0 λ=1.5418A0

    2Ө Ө Sin Ө (h k l) d (A0) Calculate d obs(A0)

    22.5402 11.2701 0.19543438 (0,0,1) 3.944546493 3.94474

    32.2479 16.12395 0.27771624 (1,1,0) 2.775854952 2.77599

    39.7798 19.8899 0.340213792 (1,1,1) 2.265928122 2.26604

    46.2977 23.14885 0.393121207 (2,0,0) 1.960972812 1.96107

    52.0467 26.02335 0.438737399 (2,1,0) 1.757087498 1.75717

    57.5855 28.79275 0.481642785 (2,1,1) 1.600563785 1.60064

    67.6035 33.80175 0.556320996 (2,2,0) 1.385710777 1.38578

    76.8726 38.4363 0.621644168 (3,0,1) 1.240098499 1.24016

    81.4254 40.7127 0.652266433 (2,2,2) 1.181879 1.18096

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    Figure 3: X-Ray diffraction pattern for X=0.7 (Ba0.3Sr0.7 TiO3)

    Table 4: For X=0.9 a=8.1829A0 λ=1.5418A0

    2Ө Ө Sin Ө (h k l) d (A0) Calculate d obs (A0)

    22.6975 11.34875 0.1967820427 (0,0,1) 3.197564418 3.91775

    32.3564 16.1782 0.278625711 (1,1,0) 2.76679419 2.76693

    39.9131 19.95655 0.341307433 (1,1,1) 2.258667479 2.25878

    46.4251 23.21255 0.394143226 (2,0,0) 1.955887982 1.95598

    52.2547 26.12735 0.440367791 (2,1,0) 1.750582163 1.75067

    57.7232 28.8616 0.482695532 (2,1,1) 1.597072994 1.59715

    67.7425 33.87125 0.557328553 (2,2,0) 1.383205644 1.38327

    72.4703 36.23515 0.591100613 (1,0,3) 1.3404177297 1.30424

    77.0870 38.5435 0.623108627 (3,0,1) 1.237183961 1.23724

    81.6354 40.8177 0.653654426 (3,1,1) 1.179369357 1.17845

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    Figure 4: X-Ray diffraction pattern for X=0.9 (Ba0.1 Sr0.9 TiO3)

    Table 5: Data on Porosity

    Composition(X) x-ray density gr/cm Actual density gr /cc Porosity

    P=dx-da/dx

    0.3 4.54922 2.96566 34.80%

    0.5 4.3636 2.7940 38.77%

    0.7 4.3560 2.14256 50.81%

    0.9 4.1785 3.7918 9.254%

    Figure 5: Porosity VS Composition

    0.3 0.4 0.5 0.6 0.7 0.8 0.9

    10

    20

    30

    40

    50

    POR

    OSI

    TY

    COMPOSITION

    B

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    Table 6: Data on lattice parameters

    The diffraction pattern of ferroelectrics indicates tetragonal of perovskites structure without extra peaks this confirms

    the formation of single phase ferroelectrics.

    The observed and estimated values of d for each plane are in good agreement with earlier reports (q) the tetragonality

    ratio (c/a) is constants the variation of lattice constants with composition is listed in table no (6). From the table, it is

    observed that lattice parameters decrease with increases “Sr” content it is attributed to the volume differences of Ionic

    radius Sr=219pm. Ti=176pm, Ba =25pm&O=48pm ions.

    Porosity Variation of porosity with composition is depicted in table (5) from the table it is noticed that porosity of all the

    samples lies in the tangle of 9 to 50 it indicates that porosity increases up to x=0.7 & reaches minimum x=0.9. The

    same behavior indicated by SEM Micrographs.

    Experimental detail for SEM

    The surface morphology of ferroelectric is carried out by scanning electron microscopy (SEM) from Indian institute

    of science, Bangalore. The average grain size of ferroelectric sample the average grain size was calculated by

    counting number of grain boundaries intercepted by a measured length of a random straight line drawn on

    micrographs [3].

    Average grain size = length / number of particles =______μm

    Photo 1: X=0.3 SEM for Ba0.7Sr0.3TiO3

    composition(X) lattice constant

    a(A0)

    C

    (A0)

    Tetragonality

    (c/a)

    0.3 3.99463 3.99463 1.001

    0.5 3.92889 3.92889 1.000

    0.7 3.92584 3.92584 1.000

    0.9 3.91302 3.91302 1.000

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    Photo 2: X=0.5 SEM for Ba0.5Sr0.5 TiO3

    Photo 3: X=0.7SEM for Ba0.3Sr0.7 TiO3

    Photo 4: X=0.9 SEM for Ba0.1 Sr0.9 TiO3

    Table 7: Data on Average grain size

    Above tabulation indicates that, as the composition of ferroelectrics increases, the average grain size also increases.

    Composition(X)BaTiO3 Average Grain Size

    0.3 0.101 µm

    0.5 0.214 µm

    0.7 0.2303 µm

    0.9 0.2283 µm

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    The SEM micrographs of ferroelectric samples with the four different compositions shown in the photos (1-4)

    respectively. It is observed that all the samples show fine particles without segregation of impurity and highly dense

    microstructure with the proper grain growth after sintering. The average grain size was calculated by counting number

    of grain boundaries intercepted by a measured length of a random straight line drawn on micrographs [3].

    Experimental detail for dielectric properties and AC conductivity

    a) Dielectric constant and dielectric loss

    The final sintered pellet samples were well polished and coated with silver paste on both surfaces for good ohmic

    contact. This silver pasted pellet samples of ferroelectric are used to estimate the parallel capacitance (Cp) and

    dielectric loss tangent (tanQ) at room temperature in the frequency range of 0 Hz to1MHz.

    The dielectric constant is calculated using the relation,

    ε’ = Cpt

    ε0A

    Where Cp - parallel capacitance,

    t -thickness of the pellet,

    A -cross sectional area of the pellet (πr2 = nd2 /4),

    ε0-permittivity of free space = 8.854 x 10-12 F/m.

    Therefore ε 1 = 4 C p t

    8.854x10-12 x3.142x d2

    Therefore ε1= 14.38Cpt x1012 d2

    Above Equation is used to estimate dielectric constant of ferroelectric samples.

    b) AC Conductivity

    The AC conductivity (σac) is related to the dielectric relaxation caused by localized electric charge carriers. The

    frequency dependent AC conductivity is calculated from the dielectric constant (ε’) and loss tangent (tanδ) i.e.

    σac= ε’ ε0 ω tan δ

    Where ε’ - the relative dielectric constant of the material,

    ε0- Permittivity of free space,

    tanδ - loss tangent

    ω-angular frequency

    The frequency response of the dielectric behavior and AC conductivity is known as relaxation spectra or dispersion

    curve. This curve gives the valuable information about the type of conduction mechanism present in the polycrystalline

    sintered ferroelectric samples.

    RESULTS AND DISCUSSION

    Dielectric constant The variation of dielectric constant with frequency of all the samples is shown in figure.6-17. The dielectric constant

    decreases rapidly up to 1 kHz due to usual dielectric diversion in low frequency region. Beyond 1khg it almost remains

    constant in high frequency region. The dispersion is due to Maxwell wages type interfacial polarization (4) in

    agreement with Koops phenomenon magical theory (5). The maximum dielectric constant at low frequency is due to

    space charge polarization at grain boundaries, interfacial dislocation pileups, oxygen. Vacancies, grain boundaries

    &defects (6) for the composition X=0.7 the dielectric constant is maximum it is attributed maximum space charge

    polarization at the grain boundaries. The Maximum grain size & minimum grain boundary area at X=0.7 results in the

    increase of mean free path of electron & hence dielectric constant becomes maximum at X=0.7.

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    Figure 6: Dielectric constant VS Log frequency (f) for X=0.3 (Ba0.7Sr0.3TiO3)

    Figure 7: Dielectric constant VS Log frequency (f) for X=0.5 (Ba0.5Sr0.5 TiO3)

    Figure 8: Dielectric constant VS Log frequency (f) for X=0.7 (Ba0.3Sr0.7 TiO3)

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    Figure 9: Dielectric constant VS Log frequency (f) for X=0.9 (Ba0.1 Sr0.9 TiO3)

    The graph representation loss angle (tanδ) VS Log frequency (f)

    Figure 10: loss angle (tanδ) VS Log frequency (f) for X=0.3 (Ba0.7Sr0.3 TiO3)

    Figure 11: loss angle (tanδ) VS Log frequency (f) for X=0.5 (Ba0.5Sr0.5 TiO3)

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    Figure 12: loss angle (tanδ) VS Log frequency (f) for X=0.7 (Ba0.3Sr0.7 TiO3)

    Figure 13: loss angle (tanδ) VS Log frequency (f) for X=0.9 (Ba0.1 Sr0.9 TiO3)

    The graph representation AC-Conductivity Slog frequency (f)

    Figure 14: AC-Conductivity VS Log frequency (f) for X=0.3 (Ba0.7 Sr0.3 TiO3)

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    Figure 15: AC-Conductivity VS Log frequency (f) for X=0.5 (Ba0.5 Sr0.5 TiO3)

    Figure 16: AC-Conductivity VS Log frequency (f)X=0.7 (Ba0.3 Sr0.7 TiO3)

    Figure 17: AC-Conductivity VS Log frequency (f) X=0.9 (Ba0.1 Sr0.9 TiO3)

    REFERENCES

    1. A Safari, R K Panda, V F Janas, Ferroelectric Ceramics: Processing, Properties & Applications. 2. B Jaffe, W Cook, H Jaffe, Piezoelectric Ceramics, Academic Press, London, 1971. 3. Goel NC, thesis Delhi University, 1977. 4. CG koops, Phy Rev,1951,83,121.

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    5. AJ Bosmon, HJ VanDwal, Adv phys.

    6. KW Wagner, Am J Phys, 1993,40,8176.