statistical approach to ppq
TRANSCRIPT
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Tara Scherder
Managing Director, Arlenda, Inc
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Statistical Approaches for PPQ
Options and Outcomes
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Reference: 2011 FDA Guidance Document: Process Validation
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During the process qualification (PQ) stage of
process validation, the process design is evaluatedto determine if it is capable of reproduciblecommercial manufacture
A successful PPQ will confirm the process design
and demonstrate that the commercialmanufacturing process performs as expected
.State a clear conclusion as to whether the dataindicates the process met the conditions
established in the protocol and whether theprocess is considered to be in a state of control
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Our Session Today
Choice of Statistical Method Understand Conclusions and Details
(assumptions, requirements)
Combine Statistics and Process Knowledge Part of Continuum of Process Understanding
Two examples1. Content Uniformity
2. Packaging Quality Measurements
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Methods
Exploratory Methods Variance Components Monte Carlo Simulation ASTM E2709 and E2810 Control Charts & Capability Tolerance Intervals Bayesian Prediction Interval ANOVA ANSI Acceptance Sampling for Variables &Attributes
Percent Non-Conformance
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Example: Content Uniformity
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Four samples drawn at each of15 locations across the batch,three batches
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Graphical methods
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151413121110987654321
110
105
100
95
Location
CU
A
B
C
Batch
Multi-Vari Chart for CU by Batch - Location
each batch has 4 samples at each of 15 locations
CU Sampling Plan 2
151413121110987654321
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105
100
95
90
Location
CU
CU Sampling Plan 2each batch has 4 samples at each of 15 locations
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Variance Components
Parameter
Batch A Batch B Batch C
PointEstimate
% of total(%LC)
PointEstimate
% of
total
(%LC)
PointEstimate
% of total(%LC)
Between-location
SD2.57 80.9 1.00 8.1 3.39 90.2
Within-location
SD1.25 19.1 3.39 91.9 1.12 9.8
Total 2.86 100 3.54 100 3.57 100
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ParameterPoint
Estimate% Total
Overall Mean 100.1
Between-batch
SD 1.25 12.2Between-
location[Batch]
SD
2.52 50.2
Within-location
SD2.18 37.6
Total 3.56 100
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Monte Carlo Simulation
Probability of passing a method/procedurebased on user provided inputs
Provides a way of evaluating amethod/procedure or process usingcomputer generated data in place ofcollecting actual data
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Monte Carlo SimulationPercentage of Batches Passing UDU Test
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BatchPoint Estimate
Confidence
Limit
S1 S1 & S2 S1 S1 & S2
A 100 100 99.5 99.8
B 99.7 100 87.4 98.4
C 100 100 98.6 99.1
Parameter
Batch A Batch B Batch C
Point
Estimate
% of total
(%LC)
Point
Estimate
% of total
(%LC)
Point
Estimate
% of total
(%LC)
Between-location
SD2.57 80.9 1.00 8.1 3.39 90.2
Within-location
SD1.25 19.1 3.39 91.9 1.12 9.8
Total 2.86 100 3.54 100 3.57 100
Point Estimate
S1 S1 and S2
100.
0100.0
Parameter Point Estimate % Total
Overall Mean 100.1
Between-batch SD 1.25 12.2
Between-
location[Batch] SD2.52 50.2
Within-location SD 2.18 37.6
Total 3.56 100
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ASTM E2709/E2810: General Strategy
1. Determine Sampling Plan Sample Size (# Locations & # per location)
Use Prior Knowledge
OC curves, examination of acceptance limit tables
2. Construct/Choose Acceptance Limit Table Select Confidence Level (Usually 90 or 95%)
Select Coverage (usually 95%): Desired Probability ofSamples passing Testing Standard (eg USP UDU)
3. Collect Data & Compute Summary Statistics4. Compare to appropriate Acceptance Limit Table
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Acceptance Limit Table Examplefor USP UDU Test
Result
Location 1 2 3 4
1 97.08 99.72 98.37 97.50
2 99.72 100.32 101.01 100.29
3 99.90 98.27 98.88 97.96
4 98.78 98.17 98.94 97.78
5 96.32 96.61 99.66 97.20
6 100.97 102.17 99.06 98.80
7 97.02 97.35 98.65 99.98
8 99.39 98.81 98.63 98.06
9 99.59 97.80 97.67 98.95
10 97.97 98.54 100.26 98.74
11 96.09 98.61 97.49 97.50
12 98.87 97.81 97.28 98.80
13 101.10 102.60 100.48 98.62
14 100.80 100.34 98.49 100.93
15 99.70
100.09
100.14
99.20
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Acceptance Limit Table Examplefor USP UDU Test
Descriptive Statistics
Overall Mean 98.93
SE (within-location Std Dev) 1.07
Standard deviation of Location
Means1.06
90%CI/95%Cov Standard Deviation of Location Means
0.9 1.0 1.1 1.2
SE LL UL LL UL LL UL LL UL
0.9 88.1 111.9 88.5 111.5 88.9 111.1 89.3 110.7
1.0 88.2 111.8 88.6 111.4 89.0 111.0 89.4 110.6
1.1 88.4 111.6 88.7 111.3 89.1 110.9 89.5 110.5
1.2 88.5 111.5 88.9 111.1 89.2 110.8 89.6 110.4
1.3 88.7 111.3 89.0 111.0 89.4 110.6 89.7 110.3
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Predicting Probability of PassingASTM 2810
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Across BatchesOverall Mean(%LC) 100.1
Variance Components (Std Dev)
Between Batch (%LC) 1.25*(p=0.02)
Between Location (%LC) 2.52*(p
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Control Charts: Two Subgroup Charts
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Sample
SampleMean
__X=99.91UC L=101.59
LCL=98.22
A B C
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Sample
SampleRange
_R=2.32
UCL=5.29
LCL=0
A B C
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111
1
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Xbar-R Chart of CU by Batch
454137332925211713951
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100
90
SubgroupMean
_X=99.91
UCL=107.46
LCL=92.35
A B C
454137332925211713951
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0MRofSubgroupMean
__MR=2.84
UCL=9.28
LCL=0
A B C
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Sample
SampleRange
_R=2.32
UCL=5.29
LCL=0
A B C
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I-MR-R/S (Between/Within) Chart of CU by Batch
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Tolerance Interval*
Assures with a pre-specified confidence level, that there is
at least a pre-specified probability (called coverage) thatthe individual results will fall within the interval endpoints
k depends on distribution, coverage and confidence
PTS-TI
95% confidence that the percentage of tablets outside the range of(85%, 115%) label claim (LC) is less than 12.5%
PTI-TOST
95% confidence and 87.5% coverage of the 85% to 115% LC limitingthe percentages of tablets below 85% and above 115% LC are bothless than 6.25% of the batch
*computationally complex for multi location sampling plan
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Bayesian Prediction Interval
Bayesian solution provides true prediction of failure offuture batches
Incorporates uncertainty in parameter estimation
Can incorporate between batch, between location, and
within location variance components
Statistical statement : X% probability that 95% ofbatches will pass UDU, or fall within some assayrange
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Fit model Perform simulations to obtain posterior distribution of
parameters Obtain predictive distribution of CU Assess
probability that .025 and .975 percentiles will be outside specification
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ANOVA
Fixed locations or batches: detectsignificant variation in group means
Random locations: detect significantvariation amonggroups
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ANOVA
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Batch and Location
Treated as Fixed Effects
ParameterPoint
Estimate% Total
Overall Mean 100.1
Between-batch
SD1.25 12.2
Between-
location[Batch]
SD
2.52 50.2
Within-location
SD2.18 37.6
Total 3.56 100
Batch and Location Treated
as Random Effects
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Example: Package Fill Volume
Packaging run time = 170 minutes
Fill rate = 180 bottles/minute
Total bottles filled = 30,600
Filler has 6 nozzle heads
Specifications: LSL = 99.5; USL = 100.5 ml
AQL (acceptance quality level) = 0.1%
Shift in mean after 26,000 bottles from 100.2-100.35 and Std Dev from 0.08 to 0.09 ml
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ANSI Z1.9
For Lot size = 30,600; AQL = 0.1%; Tightened, Level IIInspection, Variability Unknown, sample size of 100 isrequired.
One simulation , estimate of % non-conforming (ncf)was 0.052 (table B-5 of standard); maximum allowable% ncf is 0.218
Decision: ACCEPT the BATCH
Actual % ncf was 0.14%, which is higher than the AQLof 0.1%.
Based on the OC curve, if 100 samples are drawn from alot of this size with 0.14% ncf, the lot will be accepted75 % of the time. That is, a bottle with a defect willrandomly be found in the sample only 25 % of the time
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Control Charts & Capability
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Example: Critical DefectANSI Z1.4 Attribute Acceptance
50,000 bottles; AQL=0.065%; ANSI Z1.4 Tightened,Inspection level II (no specification for RejectableQuality Level, or Lot Tolerance Percent Defective)
Using Tables from standard, the required sample size is1250, and the lot will be accepted if 1 or lessnonconforming bottles are found.
Beta error is high; for instance, there is a 19% chance ofaccepting a lot that has 0.246 % nonconforming.
Consumer risk not controlled.
No statistical statement can be made regarding qualityof lot
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Example: Major DefectANSI Z1.4 Attribute Acceptance
50,000 bottles; AQL=1%; ANSI Z1.4 Tightened, Inspectionlevel II
Using Tables from standard, the required sample size is 500;lot will be accepted if 8 or less nonconforming bottles arefound
Can identify other sampling plans using software that might bemore efficient.
23543210
1.0
0.8
0.6
0.4
0.2
0.0
Lot Percent Defective
ProbabilityofAcceptance
n sample s ize
c acceptance number
275 4
500 8
n c
Operating Characteristic (OC) Curve
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Example: Critical DefectProportion Non-conforming
For any pass/fail sampling results, a statisticalstatement regarding the quality of the lot can bemade. For instance, a confidence statement can bemade regarding the bounds for the percent nonconforming
Example: assume no failures are found in a sample of1250. This allows the following statistical statement:
With 95.0% confidence, the population
nonconformance rate will be no morethan 0.0050 (~0.5%)(1)
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(1) Agresti/Coull interval from Lawrence D. Brown, T. Tony Cai and Anirban DasGupta, Interval
Estimation for aBinomial Proportion, Statistical Science, 2001, Vol. 16, No. 2, 101133
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James Bergum
Richard Montes
Helen Strickland Jennifer Walsh
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Contributors
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