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  • 7/21/2019 Statistical Approach to PPQ

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    Tara Scherder

    Managing Director, Arlenda, Inc

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    Statistical Approaches for PPQ

    Options and Outcomes

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    Reference: 2011 FDA Guidance Document: Process Validation

    2

    During the process qualification (PQ) stage of

    process validation, the process design is evaluatedto determine if it is capable of reproduciblecommercial manufacture

    A successful PPQ will confirm the process design

    and demonstrate that the commercialmanufacturing process performs as expected

    .State a clear conclusion as to whether the dataindicates the process met the conditions

    established in the protocol and whether theprocess is considered to be in a state of control

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    Our Session Today

    Choice of Statistical Method Understand Conclusions and Details

    (assumptions, requirements)

    Combine Statistics and Process Knowledge Part of Continuum of Process Understanding

    Two examples1. Content Uniformity

    2. Packaging Quality Measurements

    3

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    Methods

    Exploratory Methods Variance Components Monte Carlo Simulation ASTM E2709 and E2810 Control Charts & Capability Tolerance Intervals Bayesian Prediction Interval ANOVA ANSI Acceptance Sampling for Variables &Attributes

    Percent Non-Conformance

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    Example: Content Uniformity

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    Four samples drawn at each of15 locations across the batch,three batches

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    Graphical methods

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    151413121110987654321

    110

    105

    100

    95

    Location

    CU

    A

    B

    C

    Batch

    Multi-Vari Chart for CU by Batch - Location

    each batch has 4 samples at each of 15 locations

    CU Sampling Plan 2

    151413121110987654321

    110

    105

    100

    95

    90

    Location

    CU

    CU Sampling Plan 2each batch has 4 samples at each of 15 locations

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    Variance Components

    Parameter

    Batch A Batch B Batch C

    PointEstimate

    % of total(%LC)

    PointEstimate

    % of

    total

    (%LC)

    PointEstimate

    % of total(%LC)

    Between-location

    SD2.57 80.9 1.00 8.1 3.39 90.2

    Within-location

    SD1.25 19.1 3.39 91.9 1.12 9.8

    Total 2.86 100 3.54 100 3.57 100

    7

    ParameterPoint

    Estimate% Total

    Overall Mean 100.1

    Between-batch

    SD 1.25 12.2Between-

    location[Batch]

    SD

    2.52 50.2

    Within-location

    SD2.18 37.6

    Total 3.56 100

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    Monte Carlo Simulation

    Probability of passing a method/procedurebased on user provided inputs

    Provides a way of evaluating amethod/procedure or process usingcomputer generated data in place ofcollecting actual data

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    Monte Carlo SimulationPercentage of Batches Passing UDU Test

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    BatchPoint Estimate

    Confidence

    Limit

    S1 S1 & S2 S1 S1 & S2

    A 100 100 99.5 99.8

    B 99.7 100 87.4 98.4

    C 100 100 98.6 99.1

    Parameter

    Batch A Batch B Batch C

    Point

    Estimate

    % of total

    (%LC)

    Point

    Estimate

    % of total

    (%LC)

    Point

    Estimate

    % of total

    (%LC)

    Between-location

    SD2.57 80.9 1.00 8.1 3.39 90.2

    Within-location

    SD1.25 19.1 3.39 91.9 1.12 9.8

    Total 2.86 100 3.54 100 3.57 100

    Point Estimate

    S1 S1 and S2

    100.

    0100.0

    Parameter Point Estimate % Total

    Overall Mean 100.1

    Between-batch SD 1.25 12.2

    Between-

    location[Batch] SD2.52 50.2

    Within-location SD 2.18 37.6

    Total 3.56 100

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    ASTM E2709/E2810: General Strategy

    1. Determine Sampling Plan Sample Size (# Locations & # per location)

    Use Prior Knowledge

    OC curves, examination of acceptance limit tables

    2. Construct/Choose Acceptance Limit Table Select Confidence Level (Usually 90 or 95%)

    Select Coverage (usually 95%): Desired Probability ofSamples passing Testing Standard (eg USP UDU)

    3. Collect Data & Compute Summary Statistics4. Compare to appropriate Acceptance Limit Table

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    Acceptance Limit Table Examplefor USP UDU Test

    Result

    Location 1 2 3 4

    1 97.08 99.72 98.37 97.50

    2 99.72 100.32 101.01 100.29

    3 99.90 98.27 98.88 97.96

    4 98.78 98.17 98.94 97.78

    5 96.32 96.61 99.66 97.20

    6 100.97 102.17 99.06 98.80

    7 97.02 97.35 98.65 99.98

    8 99.39 98.81 98.63 98.06

    9 99.59 97.80 97.67 98.95

    10 97.97 98.54 100.26 98.74

    11 96.09 98.61 97.49 97.50

    12 98.87 97.81 97.28 98.80

    13 101.10 102.60 100.48 98.62

    14 100.80 100.34 98.49 100.93

    15 99.70

    100.09

    100.14

    99.20

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    Acceptance Limit Table Examplefor USP UDU Test

    Descriptive Statistics

    Overall Mean 98.93

    SE (within-location Std Dev) 1.07

    Standard deviation of Location

    Means1.06

    90%CI/95%Cov Standard Deviation of Location Means

    0.9 1.0 1.1 1.2

    SE LL UL LL UL LL UL LL UL

    0.9 88.1 111.9 88.5 111.5 88.9 111.1 89.3 110.7

    1.0 88.2 111.8 88.6 111.4 89.0 111.0 89.4 110.6

    1.1 88.4 111.6 88.7 111.3 89.1 110.9 89.5 110.5

    1.2 88.5 111.5 88.9 111.1 89.2 110.8 89.6 110.4

    1.3 88.7 111.3 89.0 111.0 89.4 110.6 89.7 110.3

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    Predicting Probability of PassingASTM 2810

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    Across BatchesOverall Mean(%LC) 100.1

    Variance Components (Std Dev)

    Between Batch (%LC) 1.25*(p=0.02)

    Between Location (%LC) 2.52*(p

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    Control Charts: Two Subgroup Charts

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    454137332925211713951

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    105

    100

    95

    Sample

    SampleMean

    __X=99.91UC L=101.59

    LCL=98.22

    A B C

    454137332925211713951

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    12

    8

    4

    0

    Sample

    SampleRange

    _R=2.32

    UCL=5.29

    LCL=0

    A B C

    61

    1

    8

    5

    1

    1

    1

    1

    51

    111

    1

    11

    1

    Xbar-R Chart of CU by Batch

    454137332925211713951

    110

    100

    90

    SubgroupMean

    _X=99.91

    UCL=107.46

    LCL=92.35

    A B C

    454137332925211713951

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    5

    0MRofSubgroupMean

    __MR=2.84

    UCL=9.28

    LCL=0

    A B C

    454137332925211713951

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    8

    0

    Sample

    SampleRange

    _R=2.32

    UCL=5.29

    LCL=0

    A B C

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    1

    1

    I-MR-R/S (Between/Within) Chart of CU by Batch

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    Tolerance Interval*

    Assures with a pre-specified confidence level, that there is

    at least a pre-specified probability (called coverage) thatthe individual results will fall within the interval endpoints

    k depends on distribution, coverage and confidence

    PTS-TI

    95% confidence that the percentage of tablets outside the range of(85%, 115%) label claim (LC) is less than 12.5%

    PTI-TOST

    95% confidence and 87.5% coverage of the 85% to 115% LC limitingthe percentages of tablets below 85% and above 115% LC are bothless than 6.25% of the batch

    *computationally complex for multi location sampling plan

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    Bayesian Prediction Interval

    Bayesian solution provides true prediction of failure offuture batches

    Incorporates uncertainty in parameter estimation

    Can incorporate between batch, between location, and

    within location variance components

    Statistical statement : X% probability that 95% ofbatches will pass UDU, or fall within some assayrange

    16

    Fit model Perform simulations to obtain posterior distribution of

    parameters Obtain predictive distribution of CU Assess

    probability that .025 and .975 percentiles will be outside specification

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    ANOVA

    Fixed locations or batches: detectsignificant variation in group means

    Random locations: detect significantvariation amonggroups

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    ANOVA

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    Batch and Location

    Treated as Fixed Effects

    ParameterPoint

    Estimate% Total

    Overall Mean 100.1

    Between-batch

    SD1.25 12.2

    Between-

    location[Batch]

    SD

    2.52 50.2

    Within-location

    SD2.18 37.6

    Total 3.56 100

    Batch and Location Treated

    as Random Effects

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    Example: Package Fill Volume

    Packaging run time = 170 minutes

    Fill rate = 180 bottles/minute

    Total bottles filled = 30,600

    Filler has 6 nozzle heads

    Specifications: LSL = 99.5; USL = 100.5 ml

    AQL (acceptance quality level) = 0.1%

    Shift in mean after 26,000 bottles from 100.2-100.35 and Std Dev from 0.08 to 0.09 ml

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    ANSI Z1.9

    For Lot size = 30,600; AQL = 0.1%; Tightened, Level IIInspection, Variability Unknown, sample size of 100 isrequired.

    One simulation , estimate of % non-conforming (ncf)was 0.052 (table B-5 of standard); maximum allowable% ncf is 0.218

    Decision: ACCEPT the BATCH

    Actual % ncf was 0.14%, which is higher than the AQLof 0.1%.

    Based on the OC curve, if 100 samples are drawn from alot of this size with 0.14% ncf, the lot will be accepted75 % of the time. That is, a bottle with a defect willrandomly be found in the sample only 25 % of the time

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    Control Charts & Capability

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    Example: Critical DefectANSI Z1.4 Attribute Acceptance

    50,000 bottles; AQL=0.065%; ANSI Z1.4 Tightened,Inspection level II (no specification for RejectableQuality Level, or Lot Tolerance Percent Defective)

    Using Tables from standard, the required sample size is1250, and the lot will be accepted if 1 or lessnonconforming bottles are found.

    Beta error is high; for instance, there is a 19% chance ofaccepting a lot that has 0.246 % nonconforming.

    Consumer risk not controlled.

    No statistical statement can be made regarding qualityof lot

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    Example: Major DefectANSI Z1.4 Attribute Acceptance

    50,000 bottles; AQL=1%; ANSI Z1.4 Tightened, Inspectionlevel II

    Using Tables from standard, the required sample size is 500;lot will be accepted if 8 or less nonconforming bottles arefound

    Can identify other sampling plans using software that might bemore efficient.

    23543210

    1.0

    0.8

    0.6

    0.4

    0.2

    0.0

    Lot Percent Defective

    ProbabilityofAcceptance

    n sample s ize

    c acceptance number

    275 4

    500 8

    n c

    Operating Characteristic (OC) Curve

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    Example: Critical DefectProportion Non-conforming

    For any pass/fail sampling results, a statisticalstatement regarding the quality of the lot can bemade. For instance, a confidence statement can bemade regarding the bounds for the percent nonconforming

    Example: assume no failures are found in a sample of1250. This allows the following statistical statement:

    With 95.0% confidence, the population

    nonconformance rate will be no morethan 0.0050 (~0.5%)(1)

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    (1) Agresti/Coull interval from Lawrence D. Brown, T. Tony Cai and Anirban DasGupta, Interval

    Estimation for aBinomial Proportion, Statistical Science, 2001, Vol. 16, No. 2, 101133

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    James Bergum

    Richard Montes

    Helen Strickland Jennifer Walsh

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    Contributors

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