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Aerospace and Defense Symposium 2007 EuMw 2007 Agilent Workshop Spectrum Analysis Back to Basics Beyond S-Parameters © Agilent Technologies, Inc. 2007 Page M6- 1

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Aerospace and Defense Symposium 2007EuMw 2007 Agilent Workshop

Spectrum Analysis Back to Basics

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Page M6- 1

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopAgenda

• Introduction• Overview:

– What is Signal Analysis?– What Measurements are available?

• Theory of Operationy p• Specifications• Modern spectrum analyzer designs & capabilities

» Wide Bandwidth Vector Measurements» Wide Bandwidth Vector Measurements

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopOverviewWhat is Signal, Vector and Spectrum Analysis?

•Display and measure amplitude versus frequency for RF & MW signals

•Separate or demodulate complex signals into their base components (sine waves)

Spectrum Analysis

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Separate or demodulate complex signals into their base components (sine waves)

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopOverviewFrequency versus Time Domain

Amplitude(power)

Time domainMeasurements

(Oscilloscope)

Frequency DomainMeasurements

(Spectrum Analyzer)

Beyond S-Parameters© Agilent Technologies, Inc. 2007

(Oscilloscope) ( p y )

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopOverviewTypes of Measurements Available

• Frequency, power, modulation, distortion & noise

• Spectrum monitoring Modulation• Spectrum monitoring• Spurious emissions• Scalar network analysis• Noise figure & phase noiseNoise figure & phase noise• Harmonic & intermodulation distortion• Analog, digital, burst & pulsed RF Modulation• Wide bandwidth vector analysis

El i i f

NoiseNoise

• Electromagnetic interference

• Measurement range (-168 dBm to +30 dBm)• Frequency range (3 Hz to 325 GHz) q y g ( )

Spur SearchSpur Search

Beyond S-Parameters© Agilent Technologies, Inc. 2007

DistortionDistortion

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopOverviewDifferent Types of Analyzers

FFT Analyzer

Parallel filters measured simultaneouslyA

LCD shows full spectral display

ff1 f2

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopOverviewDifferent Types of Analyzers

Swept Analyzer

AFilter 'sweeps' over range of

interest

LCD shows full spectral display

ff1 f2

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopAgenda

• IntroductionIntroduction• Overview• Theory of Operation:

– Swept Spectrum Analyzer Hardware

• Specifications• Modern spectrum analyzer designs & capabilitiesp y g p

» Wide Bandwidth Vector Measurements

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationSwept Spectrum Analyzer Block Diagram

RF inputattenuator IF filter

(RBW) envelope IF gain

Log

mixer(RBW) p

detectorIF gain

Inputsignal

Pre-SelectorOr Low PassInput Filter

gAmp

videofilter

localill t

C l

oscillatorsweep

generatorCrystal

Reference Oscillator

ADC, Display & Video

Processing

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationDisplay terminology

Reference Level

plitu

deAm

p

Start Freq. Stop Freq.

Freq Span Center Freq.

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Freq. Span Center Freq.

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationMixer

MIXERMIXER

f sig f sig LOf

LOf f sig- LOf f sig+RFLO

IF

1.5 GHz

LOf3,6 GHz 6.5 GHz

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationIF Filter (Resolution Bandwidth – RBW)

IF Filter

InputSpectrum

IF Bandwidth(RBW)

Display

A B C

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationEnvelope Detector

B f d t t Aft d t tBefore detector After detector

Envelope DetectorDetector

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationEnvelope Detector and Detection Types

Envelope Envelope Detector

Digitally Implemented Detection TypesADC, Display &

Video Processing

Positive detection: largest valuein bin displayedbins/buckets*

Digitally Implemented Detection Types Video Processing

Negative detection: smallest valuein bin displayedSample detection: middle value in bin displayedp yOther Detectors: Normal (Rosenfell), Average (RMS Power)

Beyond S-Parameters© Agilent Technologies, Inc. 2007

*Sweep points

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationAverage Detector Type

E l Envelope Detector

Voltsbi

ADC, Display & bin

Sample detection

xPos Peak detection

Video Processing

xNeg Peak detectionx

TimePower Average Detection (rms) = Square root of the sum of the squares of ALL of the voltage data values in the bin /50Ω

Beyond S-Parameters© Agilent Technologies, Inc. 2007

squares of ALL of the voltage data values in the bin /50Ω

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationVideo Filter (Video Bandwidth – VBW)

Vid Video Filter

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationVideo Filter vs. Trace/Video averaging

Vid FilVideo Filter

ADC, Display & Video Processing

• Video Filter operates as the sweep progresses, sweep time may be required to slow down by the transient response of the VBW filterVBW filter.

• Trace/Video Average takes multiple sweeps, sweep time for each sweep is not affectedaffected

• Many signals give the same results with either video filtering or trace averagingTrace averaging for 1, 5, 20, and 100 sweeps, top to

bottom (trace position offset for each set of sweeps)

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationOther Components

SWEEP GEN

LO

LCD Display, ADC& Video processing

IF GAINRF INPUT

ATTENUATOR

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopTheory of OperationHow it All Works Together - 3 GHz spectrum analyzer

(GHz)0 31 2

Signal Range LO Rangef s

ff sf LO- f sf LO

+f LO

0 3 61 2 4 5

input

mixerIF filter

detector

f s

3.6 6.5

3.6 GHz

f IFsweep generator Ag

LO

A

f LO

3.6(GHz)3 64 5

(GHz)0 31 2LCD display

fLO

6.5

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopAgenda

• Overview• Theory of Operation• Theory of Operation• Specifications:

– Which are important and why?y

• Modern spectrum analyzer designs & capabilities» Wide Bandwidth Vector Measurements

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopKey Specifications

8563A SPECTRUM ANALYZER 9 kHz - 26.5 GHz

S f t l i• Safe spectrum analysis• Frequency Range• Accuracy: Frequency & Amplitude• Resolution• Resolution• Sensitivity• Distortion• Dynamic RangeDynamic Range

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecifications?A Definition

• Specifications describe the performance of parameters covered by the product warranty (temperature = 0 to 55°C, unless otherwise noted)otherwise noted).

• Typical values describe additional product performance information that is not covered by the product warranty It isinformation that is not covered by the product warranty. It is performance beyond specification that 80 % of the units exhibit with a 95 % confidence level over the temperature range 20 to 30° C Typical performance does not include measurement30 C. Typical performance does not include measurement uncertainty.

Nominal values indicate expected performance or describe• Nominal values indicate expected performance, or describe product performance that is useful in the application of the product, but is not covered by the product warranty.

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsPracticing safe spectrum analysis - Safe Hookups to RF Input

•Use best practices to eliminate static discharge to the RF input!•Do not exceed the Damage Level on the RF Input!•Do not input signals with DC bias!

!!0 V DC MAX

+30dBm (1W) MAX

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsFrequency Range

Description SpecificationsInternal Mixing

Bands• 0 3 Hz to 3.0 GHz• 1 2.85 to 6.6 GHz• 2 6.2 to 13.2 GHz• 3 12 8 to 19 2 GHz• 3 12.8 to 19.2 GHz• 4 18.7 to 26.8 GHz• 5 26.4 to 31.15 GHz

6 31 0 0 0 G• 6 31.0 to 50.0 GHz

External mixing 18 to 325 GHz

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsAccuracy: Frequency & amplitude

Components which contribute to uncertainty are:p y

• Input mismatch (VSWR)

• RF Input attenuator (Atten. switching uncertainty)

• Mixer and input filter (frequency response)

• IF gain/attenuation (reference level accuracy)

• RBW filters (RBW switching uncertainty)

• Log amp (display scale fidelity)

• Reference oscillator (frequency accuracy)

• Calibrator (amplitude accuracy)

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsAbsolute and relative Accuracy: Frequency & amplitude

AbsoluteAbsoluteAmplitude

in dBm

RelativeAmplitudein dB

AbsoluteFrequency

FrequencyAmpli

tude

RelativeFrequency

FrequencyA

Note: Absolute accuracy is also “relative” to the calibrator reference point

Beyond S-Parameters© Agilent Technologies, Inc. 2007

y p

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsAccuracy: Frequency Readout Accuracy

• From the PSA Data Sheet:

Determined by Reference Accuracy

± (freq readout x freq reference error +0.25%*span + 5% of RBW + 2Hz + 0.5 x Horiz. Res.*)

RBW ErrorIF filter center frequency error

Span Accuracy Residual Error

*Horizontal resolution is span/(sweep points – 1)

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsAccuracy: Frequency Readout Accuracy Example

Frequency: 1 GHzSpan: 400 kHzpRBW: 3 kHzSweep points: 1000

Calculation: (1x109Hz) x (±1.8x10–7/Year ref. Error) = 180Hz400kHz Span x 0.25% = 1000H3kHz RBW x 5% = 150Hz2Hz + 0.5 x 400kHz/1000-1 = 202H

Total uncertainty = ±1532Hz

Utilizing internal frequency counter improves accuracy to ±180Hz

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsAccuracy: Key amplitude uncertainty contributions

Relative and absolute: Sample Uncertainties

• Input impedance mismatch (±0 13 dB)• Input impedance mismatch (±0.13 dB)

• Input attenuator switching uncertainty (±0.6 dB)

• Frequency response (±1 8 dB)• Frequency response (±1.8 dB)

• Reference level accuracy (±1.0 dB)

• RBW switching uncertainty (±0.5 dB)

• Display scale fidelity (±0.85 dB)

Absolute only:

• Calibrator accuracy (±0.34 dB)

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsAccuracy: Frequency Response

Signals in the Same Harmonic Band+1 dB

Signals in the Same Harmonic Band

0

- 1 dBBAND 1

Absolute amplitude accuracy – Specification: ± 1 dBRelative amplitude accuracy – Specification: ± 2 dB

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsAccuracy: Display Fidelity

• Display Fidelity includes:– Log Amp Fidelity– Envelope Detector Linearity– Digitizing Circuit Linearity

• Display fidelity error applies when elity

sp ay de ty e o app es esignals are not at the same reference level amplitude when measured

• In the past, technique for best ispl

ay F

ide

accuracy was to move each measured signal to the reference line, eliminating display fidelity error.

Di

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsAmplitude Accuracy: Reference Level Switching

• Uncertainty applies when changing the Ref. Level

• Also called IF Gain Uncertainty• Decision: Do I change the

reference level or live with the display fidelity uncertainty in my measurements?measurements?

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsAmplitude Accuracy - Summary

Optimize measurement setup & techniques for best accuracy

Minimize changes to uncertainty contributors O h t ib t ith l t i t– Or change contributor with least error impact

– Or stay within the optimum accuracy envelope parameters that modern auto-alignment calibration techniques provide

Traditionally, one technique for best accuracy was to move each measured signal to the reference line, eliminating display fidelity error. However, in today’s designs, display fidelity has improved to the point where there is generally less error just to leave the signals where they occur on the displayerror just to leave the signals where they occur on the display.

Except for freq. response, uncertainty contributors that impact both signals equally in a relative measurement can be ignored.

In the absence of specified relative freq. response, the relative response uncertainty is assumed to be 2x specified absolute error.

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsResolution

What Determines Resolution?

Resolution Bandwidth

Noise SidebandsRBW Type and

Selectivity

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsResolution: Resolution Bandwidth

3 dB3 dB BW

MixerEnvelope Detector

IF Filter/

InputSpectrum

LO Resolution Bandwidth Filter (RBW)

Sweep

RBW

Display

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsResolution: Resolution BW

3 dB

10 kHz RBW

10 kHz

Determines resolvability of equal amplitude signals

Beyond S-Parameters© Agilent Technologies, Inc. 2007

y q p g

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsResolution BW Selectivity or Shape Factor

3 dB 3 dB BW

60 dB

3 dB BW

60 dBBW

60 dB BW3 dB BW

Selectivity =

Determines resolvability of unequal amplitude signals

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsResolution BW Selectivity or Shape Factor

RBW = 10 kHzRBW = 1 kHzSelectivity 15:1

3 dB

distortion products

7.5 kHz

60 dB BW = 15 kHz

60 dB

10 kHz10 kHz

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsResolution: RBW Type and Selectivity

Typical SelectivityAnalog 15:1Digital ≤5:1

ANALOG FILTER

Digital ≤5:1

DIGITAL FILTER

SPAN 3 kHzRES BW 100 Hz

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsResolution: Noise Sidebands

Phase Noise

Noise Sidebands can prevent resolution of unequal signals

Beyond S-Parameters© Agilent Technologies, Inc. 2007

resolution of unequal signals

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsResolution: RBW Determines Sweep Time

Meas Uncal

Swept too fast

Penalty For Sweeping Too FastIs An Uncalibrated Display

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsResolution: RBW Type Determines Sweep Time

8563E Analog RBW8563E Analog RBWPSA Digital RBW

PSA FFT RBW

280 sec134 134 sec

13.5 sec

Beyond S-Parameters© Agilent Technologies, Inc. 2007

13.5 sec

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsSensitivity/DANL

MixerRF

Input

Detector

InputRES BW

Filter

LO

Sweep

yA Spectrum Analyzer Generates and Amplifies Noise Just

Like Any Active Circuit

Beyond S-Parameters© Agilent Technologies, Inc. 2007

yy

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsSensitivity/DANL

Sensitivity is the Smallest Signal That Can Be Sensitivity is the Smallest Signal That Can Be Sensitivity is the Smallest Signal That Can Be Measured

SignalEqualsN i

2.2 dB

Noise

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsSensitivity/DANL

Effective Level of Displayed Noise is a Function f RF I A i

signal level

of RF Input Attenuation

10 dB

Attenuation = 10 dB Attenuation = 20 dB

Signal To Noise Ratio Decreases as RF Input Attenuation is Increased

Beyond S-Parameters© Agilent Technologies, Inc. 2007

p

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsSensitivity/DANL: IF Filter(RBW)

Displayed Noise is a Function of IF Filter

100 kHz RBW

Bandwidth

100 kHz RBW

10 kHz RBW

1 kHz RBW

10 dB

10 dB

Decreased BW = Decreased Noise

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsSensitivity/DANL: Video BW filter (or Trace Averaging)

gVideo BW or Trace Averaging Smoothes Noise for Easier Identification of Low Level Signals

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsSensitivity/DANL:

0.

Signal-to-Noise Ratio Can Be GraphedE

RATI

O, d

Bc -20

-40

Displayed Noise in a Displayed Noise in a 1 kHz RBW

GNAL

-TO-

NOIS

E

-60

80SIG -80

-100-60 -30 0 +30

POWER AT MIXER =INPUT - ATTENUATOR SETTING dBm

60 30 0 +30

Displayed Noise in a Displayed Noise in a 100 Hz RBW

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsSensitivity/DANL: Summary

For Best Sensitivity Use:

Narrowest Resolution BW

Minimum RF Input Attenuationp

S ffi i A i ( id )Sufficient Averaging (video or trace)

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsDistortion

Mixers Generate Distortion

Frequency TranslatedSignals

Resultant

Signal ToBe Measured

Mixer GeneratedDistortion

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsDistortion

Most Influential Distortion is the Second and Third Order

< -50 dBc < -50 dBc< -40 dBc

T T I dTwo-Tone Intermod Harmonic Distortion

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsDistortion

Distortion Products Increase as a Function of Fundamental's Power

Power33

Third-order distortion

f f2f - f1 2 1 2

Powerin dB

2 12f - f

Third order distortion

Second-order distortion

3Power

2

Two-Tone Intermod

Second Order: 2 dB/dB of Fundamental

f 2f 3f

Powerin dB

Harmonic Distortion

Second Order: 2 dB/dB of FundamentalThird Order: 3 dB/dB of Fundamental

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Harmonic Distortion

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsDistortion

Distortion is a Function of Mixer Level

Bc

0

-20

Second

DIST

ORTI

ON, d

B

-40

-60

SecondOrder

D 60

-80ThirdOrder

POWER AT MIXER =INPUT - ATTENUATOR SETTING dBm

-100-60 -30 0 +30

TOI

Order

SHI

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsDistortion – Internal or External?

Attenuator Test: Change power to the mixer

Change input attenuator1by 10 dB

Watch distortion amplitude on screen

2

No change in amplitude:distortion is part of input

screen

signal (external)

Change in amplitude:at least some of the distortion is being at least some of the distortion is being generated inside the analyzer (internal)

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsSpectrum Analyzer Dynamic Range

DynamicRangegRange

The ratio expressed in dB of the largest to the smallest The ratio, expressed in dB, of the largest to the smallest signals simultaneously present at the input of the spectrum analyzer that allows measurement of the smaller signal to a given degree of uncertainty.

Beyond S-Parameters© Agilent Technologies, Inc. 2007

given degree of uncertainty.

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsDynamic Range

Dynamic Range Can Be Presented Graphically..Maximum 2nd Order

RATI

O, d

Bc -20

40

Dynamic Range

Maximum 3rd Order Dynamic Range

NAL-T

O-NO

ISE

R -40

-60

SIGN -80

-100

POWER AT MIXER =INPUT - ATTENUATOR SETTING dBm

-60 -30 0 +30TOI

Optimum Mixer Levels

SOI

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsDynamic Range

Dynamic Range for Spur Search Depends on Closeness to Carrier

Dynamic Range Limited By Noise Sidebands

dBc/Hz

Dynamic Range

Compression/NoiseLimited By

Noise Sidebands Displayed AverageNoise Level

100 kHzto

1 MHz

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsDynamic Range – Distortion, Noise Floor, LO phase noise

Dynamic Range is actually:

Maximum dynamic range calculation

Calculated from distortion products and sensitivity/DANL

bounded by

-dBc/Hz Phase Noise sidebands @ close-in offset frequencies

y

Determined by the phase noise specifications of the SA

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsDynamic Range vs. Measurement Range

+30 dBm MAXIMUM POWER LEVEL

+3 dBm MIXER COMPRESSION

DISPLAY RANGE100 dB @ 10 dB/Div

-41 dBm

51 dBm SECOND ORDER DISTORTION

THIRD-ORDER DISTORTIONMEASUREMENT

RANGE(Dynamic Range)

100 dB @ 10 dB/Div(200 dB @ 20dB/Div)

-51 dBm SECOND-ORDER DISTORTIONSIGNAL/NOISE

RANGE157 dB

RANGE198 dB

0 dBc NOISE SIDEBANDSSIGNAL /3rd ORDER(Dynamic Range)

(Dynamic Range)

DISTORTION113 dB range SIGNAL/ 2nd ORDER

DISTORTION103 dB RANGE

SIGNAL/NOISE SIDEBANDS

-116 dBc @ 10kHz OFFSETINCREASING

RBW OR

(Dynamic Range)

-154 dBm (1 Hz BW & 0 dB ATTENUATION) MINIMUM NOISE FLOOR (DANL)

116 dBc @ 10kHz OFFSET

-168 dBm with preamp

RBW ORATTENUATION

Beyond S-Parameters© Agilent Technologies, Inc. 2007

p p

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopSpecificationsSummary: Optimizing Dynamic Range

•What settings provide the best sensitivity?•Narrowest resolution bandwidthNarrowest resolution bandwidth•Minimal input attenuation•Sufficient averaging

•How do you test for analyzer distortion?•Increase the input attenuation and look for signal amplitude changes•Then set the attenuator at the lowest setting without amplitude change

•What determines dynamic range?A l di t ti i l l d id b d/ h i•Analyzer distortion, noise level, and sideband/phase noise

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopAgenda

• IntroductionO i• Overview

• Theory of OperationSpecifications• Specifications

• Modern spectrum analyzer designs & capabilities– Wide Analysis Bandwidth MeasurementsWide Analysis Bandwidth Measurements

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopModern Spectrum Analyzer Block Diagram

Analog IFFilter

Digital IF Filter Digital Detectors

FFT

Pre-amp

Digital Log AmpSwept vs . FFTAttenuation

YIGADC

Replacedby

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopModern Spectrum Analyzer Block Diagram

Digital IF Filters• 160 RBW filters

Digital Detectors•Normal •RMS• 4.1:1 Shape factor

Auto Alignment• Temp & time calibration

AnalogPre-Filter

(Single Pole)

• 1 Hz to 8 MHz• ±0.03 dB switching error

•Peak•Min•SampleDANL -153dBm

3 to 50 GHz Pre-ampImprove 1 GHz

to -168dBm

•QPD •Avg

• Fast sweep • EMI RBW’s

Digital Log Amp

FFT

FFT vs Swept RBW F S

Attenuation

Digitally Synthesized LO• Fast tuning

14 bit ADC• Wider dynamic range

ith t i

g g p• ±0.07 dB Scale Fidelity• >100 dB Dynamic range• ±0.0 dB reference level error

p• Faster Sweep

w/Max DR2 dB stepto 50 GHz

Frequency CounterDigital Video Filters• Close-in phase noise• Far-out phase noise

with autoranging• Dither on/off

• Fast (0.1s)• High resolution (mHz)

• Power, voltage,log filtering

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopModern Spectrum Analyzer - SpecificationsDigital IF provides improved accuracy

PSA vs. Traditional

• Input impedance mismatch ±0.13 ±0.29 dB

• Input attenuator switching uncertainty ±0.18 ±0.6 dB

• Frequency response ±0.38 ±1.8 dB

• Reference level accuracy ±0.0 ±1.0 dB

• RBW switching uncertainty ±0.03 ±0.5 dB

• Display scale fidelity ±0.07 ±0.85 dB

• Calibrator accuracy ±0.24 ±0.34 dB

Total accuracy (up to 3 GHz) ±0.62 dB vs. ±1.8 dB95% Confidence ±0.24 dBTypical ±0.17 dB

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopModern Spectrum Analyzer FeaturesBuilt-in One-Button Power Measurements

F S

Occupied BandwidthGSM/EDGE cdma2000

Power MeasurementsFormat Setups

Channel Power Multi-Offset ACP – fast ACP

W-CDMA cdmaOne NADC/PDC Multi-carrier Power

CCDFHarmonic Distortion

NADC/PDC BluetoothTetra (Ch. Pwr, ACP)

Harmonic DistortionBurst PowerTOI

802.11a/b (SEM)HiperLAN2 (SEM)DVB-TTOI

Spurious Emissions Spectral Emissions Mask

DVB-TUWBS-DMB

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopModern Spectrum Analyzer FeaturesApplication Focused Internal Software (one-button measurements)

Phase noisePhase noise

Ext. source control

Noise figure

General purpose applications

ACPR, Multi-carrier Power

Occupied Bandwidth (OBW)

Spectral Emissions Mask

Code compatibility suite

Flexible demod

W CDMA HSDPA

Flexible digital modulation analysis Code Domain Power

Phase and Freq. (PFER)

Mod Accuracy (Rho)

W-CDMA, HSDPA, HSUPAGSM with EDGE

Cdma2000 & 1xEV-DVPower & digital modulation

ORFS (GSM/EDGE)

Power vs Time

Spurious Emissions

Cdma2000 & 1xEV DV

1xEV-DO

cdmaOne

modulation measurements for wireless comms formats. CCDF

IM distortion

Channel power

NADC/PDC

TD-SCDMAEVM

SEM

ACPR

Beyond S-Parameters© Agilent Technologies, Inc. 2007

SEM

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopM d d i d d b d idth f t i hi h d t t

Who needs wide analysis BW?

• Aerospace and Defense

Modern designs demand more bandwidth for capturing high data rate signals and analyzing the quality of digitally modulated bandwidths

Radar – Chirp errors & modulation quality Satellite – Capture 36/72 MHz BW’s w/high data

ratesMilitary communications Capture high data rateMilitary communications – Capture high data rate

digital comms & measure EVM • Emerging communications

W LAN 802 16 (wireless last mile) mesh networksW-LAN, 802.16 (wireless last mile), mesh networks- Measure EVM on broadband, high data rate signals

• Cellular CommunicationsW CDMA ACPR & Multi carrier Pre DistortionW-CDMA ACPR & Multi-carrier Pre-Distortion- High dynamic range over 60 MHz BW to see low level 3rd order distortion for 4 carrier pre-distortion algorithms

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent WorkshopPSA Wide Analysis Bandwidth

A/D ASIC

SweptResults

14 bit30 Msps Pre-filter

CPUExisting Narrowband

IF A/D ASIC

I/QDetectorsLog AmpRBW filters

Autorange

DisplayProc

DemodFFT Display

IF(10 MHz)

Decimation

A/DASIC

A/D &FPGA

I/Q DetectorsFilters

14 bit200 Msps

Sweptand

S

Wideband IF/DigitizerDemod

FFTFiltersDecimationResampling

SteppedLO

(80 MHz)FFTMemoryCalibration

Beyond S-Parameters© Agilent Technologies, Inc. 2007

Aerospace and Defense Symposium 2007EuMw 2007 Agilent Workshop

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Beyond S-Parameters© Agilent Technologies, Inc. 2007