specifications in circuit testtr8100lv - research
TRANSCRIPT
I N C I R C U I T T E S TS P E C I F I C A T I O N S
Headquarters,Taipei,Taiwan7F., No.45, Dexing West Rd., Shilin Dist., Taipei City 11158, TaiwanTEL: +886-2-2832-8918FAX: +886-2-2831-0598 E-Mail: [email protected] http://www.tri.com.tw
Linkou, TaiwanNo.256, Huaya 2nd Rd.,Guishan Dist., Taoyuan City 33383, TaiwanTEL: +886-2-2832-8918FAX: +886-3-328-6579
Hsinchu, Taiwan7F., No.47, Guangming 6th Rd., Zhubei City, Hsinchu County 30268, TaiwanTEL: +886-3-553-9796 FAX: +886-3-553-9786
USA832 Jury Court, Suite 4, San Jose, CA 95112 U.S.ATEL: +1-408-567-9898FAX: +1-408-567-9288E-mail: [email protected]
MalaysiaC11-1, Ground Floor, Lorong Bayan Indah 3 Bay Avenue, 11900 Bayan Lepas Penang, MalaysiaTEL: +604-6451171E-mail: [email protected]
EuropeGugelstr. 32 90443 NurembergGermanyTEL: +49-9119-401-7827FAX: +49-9119-400-6181E-mail: [email protected]
Japan4-26-10 Ishiwara, Sumida-ku, Tokyo, 130-0011 JapanTEL: +81-3- 6273-0518FAX: +81-3- 6273-0519E-mail: [email protected]
KoreaNo.207 Daewoo-Technopia, 768-1 Wonsi-Dong, Danwon-Gu, Ansan City, Gyeonggi-Do, KoreaTEL:+82-31-470-8858 FAX:+82-31-470-8859 E-mail: [email protected]
Shenzhen, China 5F.3, Guangxia Rd., Shang-mei-lin Area, Fu-Tian Dist., Shenzhen, Guangdong, 518049, ChinaTEL: +86-755-83112668FAX: +86-755-83108177E-mail: [email protected]
Suzhou, China B Unit, Building 4, 78 Xinglin St., Suzhou Industrial Park, 215123, China TEL: +86-512-68250001FAX: +86-512-68096639E-mail: [email protected]
Shanghai, China Room 6C, Building 14, Aly. 470, Guiping Rd., Xuhui Dist.,Shanghai, 200233, ChinaTEL: +86-21-54270101FAX: +86-21-64957923E-mail: [email protected]
T R 8 1 0 0 L V I C T
TR8100LV
TR8100LV SERIES
G E N E R A LTest Points TR8100LV Expandable to 3584, TR8100L LV Expandable to 5632Operating System Microsoft Windows 10Power Requirement 200-240 VAC, single phase, 50/60 Hz, 4 kVAFixture Type Vacuum Type Option: Pneumatic Type
A N A L O G H A R D W A R E Measurement Switching Matrix Analog Source 6-wire measurement 2 Programmable Voltage Source DC 0 ~ ±10V, AC 0 ~ 7Vrms1 Programmable High Voltage Source DC 45V, 50mA Max.1 Programmable Current Source DC 100mA Max.Arbitrary Waveform Generator(AWG)2 Digitally synthesized stimulus sources configurable Frequency range 0 ~ 100KHz, Resolution: 0.15Hz, BW: 100KHz Max.Analog MeasurementAC Voltmeter 0 ~ 100VpDC Voltmeter 0 ~ ±100VTestJet Technology Vectorless Open Circuit Detection
D I G I T A L H A R D W A R ENon-Multiplexing 1:1 system per pin architecturePin Drivers Programmable levels 0.5V to 4 V Pin Receivers Programmable levels -5V to 5VSink/Source Current 500mA Max.Pull-up / pull-down Resistor 4.7KDUT Power Supplies 5V@5A,3.3V@5A,12V@5A,0.2 ~ 20V@3A,-3 ~ -20V@3AOn- Board Programming of Flash & Support the Binary Code Input Without Coding EnvironmentEEPROM Memories MAC Address Programming Supports MAC Address Programming with MAC address being supplied from server
O P T I O N SBoundary Scan B-Scan Chain Test, B-Scan Cluster Test & B-Scan Virtual Nails Test Facilities DUT Power Supplies Programmable 75Vmax, 8Amax(Max Power <200W)Fixture Converter Kits available for GenRad &Teradyne
D I M E N S I O N S / W E I G H T TR8100LV 1150 mm(W) x 850 mm(D) x 830 mm(H) / 390kg(Max) (45.28” x 33.46” x 32.68” / 858lbs.)TR8100L LV 1550 mm(W) x 850 mm(D) x 830 mm(H) / 450kg(Max) (61.02" x 33.46” x 32.68” / 990lbs.)
P O W E R F U L S O F T W A R E E N V I R O N M E N TMicrosoft Windows operating system software. User-friendly interfaceAutomatic Test Program Generator Automatic disable generator of surrounding componentsAutomatic test generation with Auto-learning of open/short, IC Clamping Diode and TestJet technologyAuto debugging of passive components.Built-in system self-diagnostic function Paperless repair station & real-time process monitoringTime selectable quality management and statistical reportsBoard view instantly displays failing device and pin
C-8100LV-EN-1911
S H O P F L O O R S Y S T E M S U P P O R T
• Supports text file, database, and DLL
interfaces.
• S/N and operator ID check.
• Multi-data exchange protocol.
T H E M O S T C O S T - E F F E C T I V E T E S T S T R A T E G Y
Non-Multiplexing Pin Design, Driver/Receiver
Ratio 1:1
• Optimized Nail Placement with 1:1 Ratio
Flexibility.
• ECNs do not require moving existing wires
in your fixture.
• 1:1 Driver/Receiver pins provide for the
fastest test program development
and debugging solutions available.
G E N R A D A N D T E R A D Y N E C O N V E R S I O N T O O L K I T S
There is no need to acquire new TRI fixtures
because we can convert your existing GenRad
or Teradyne ones.
P C B A Y I E L D M A N A G E M E N T S Y S T E M
TRI's Yield Management System (YMS) is
an omni-directional, integrated solution
for today's manufacturing environment. It
gathers and analyzes data from all TRI systems
on the shop floor and delivers it an a user-
friendly report format. TRI's YMS is a flexible
system to meet the present and future needs
of high-volume manufacturers.
Network setup tool
• H I G H - P E R F O R M A N C E , H I G H T H R O U G H P U T I N - C I R C U I T T E S T E R
• H I G H F A U L T C O V E R A G E T E S T S O L U T I O N
• E A S Y A N D F A S T T E S T P R O G R A M D E V E L O P M E N T
• F R I E N D L Y U S E R I N T E R F A C E D E S I G N
• L O W - V O L T A G E S O L U T I O N
Component Measurement CapabilityResistance 0.1 ohm ~ 40M ohm Capacitance 10pF ~ 40mFInductance 10uH ~ 60H
Re-FlowOven
TR8100LV
ICT / ATEBoard Testing
TR7100 SeriesTR7500 Series
Post Re-FlowInspection
Insertion & Wave
Soldering
F/TStation
Server
Test Server ICT Server
Server
YMS System configuration
TR7006 Series
Solder PasteInspection
Customer SFC system
Pre Re-FlowInspection
Post Re-FlowInspection
ICT/ATEBoard Testing
TR518 SeriesTR5000 SeriesTR8000 Series
TR7100 SeriesTR7500E Series
TR7100EP SeriesTR7500 Series
ScreenPrint
Pick&
PlaceRe-Flow
Oven
Insertion& Wave
Soldering
F/TStation
YMSserver
SQLserver
SPC SPCRepair station Repair station
SFCInterface SFC DB
YMS Module
Process YieldImprovement
Process ControlAlarm Module
Tester AutoFeedback Module
Auto FeedbackManagement
Tester DataIntegration Module
Defect ImageManagement
Integral ExcelReport Module
SPC Module
Placer Link Module
Web Module
Barcode CheckModule
System Tool &User Management
YMS
Specifications are subject to change without notice. All trademarks are the property of their owners.
The following are trademarks or registered trademarks of Test Research, Inc. (TRI)
The absence of a product or service name or logo from this list does not constitute a waiver of TRI’s trademark or other intellectual
property rights concerning that name or logo. All other trademarks and trade names are the property of their owners.
F E A T U R E S T R 8 1 0 0 L V
T H E S O L U T I O N F O R T E S T I N G L O W V O L T A G E T E C H N O L O G I E S
TR8100LV provides an ultra-low output
impedance to enhance low-voltage
backdriving capability.
• SN74AUC240 is a low-voltage device
where VCC=0.8v.
• TR8100LV meets the specification of
the SN74AUC240 in low-voltage
testing requirement.
F A S T A N D E A S Y T E S T P R O G R A M D E V E L O P M E N T
Test Program Development Flowchart.
E A S Y - T O - U S E O N - B O A R D P R O G R A M M I N G S O F T W A R E M O D U L E S
Modularized memory algorithms provide
convenient On-Board Programming function.
Flash Programming
• Supports a macro command language
• Supports conditional programming
• Supports multi vendor programming
• Menu-based debug tool
Serial Device Programming
• Menu-based test program generation
• Supports conditional programming
• Supports multi vendor programming
Fabmaster WireAnalysis
Retrofit
Fixturing
ATPG Debug
CAD Power DataFrequency Data
Digital Parts Data
Analog LibraryDigital Library
EEPROM ProgrammingSPI Programming
ISP Programming
L I M I T E D T E S T A C C E S S S O L U T I O N S
• TRI ToggleScanTM Test: Combines Boundary-Scan test and
vectorless test to reduce the physical test probes. Includes
Connector Test, Socket Test, Resistor Array Test, Capacitor
Array Test, & Non-Boundary-Scan Chip Test.
• Drive-Through Test: Overpowers the resistors and capacitors to
control and sense signals.
• CPU-Socket Test: Applies CSS (CPU Socket Sensor) on the top of
the CPU to test the CPU without any physical test probes.
• Boundary Scan Test : The TR8100LV implements IEEE1149.1
& 1149.6 Boundary-Scan testing beginning with TRI’s ABSTG
(Automatic Boundary Scan Test program Generator). This
auto-generates test programs and reporting for different kinds
of test categories, such as individual boundary-scan device tests,
boundary-scan cluster test, boundary-scan devices chain test and
virtual nails test.
• Optimal Test Analyzer (OTA): Powerful software that performs line
optimal analysis for cost efficiency and to decrease testing time.
I N T E G R A T E D A S S E T S C A N W O R K S B O U N D A R Y - S C A N T E C H N O L O G Y *
Manufacturers will be able to globally deploy solutions from both
Asset and TRI. The optional ScanWorks card solution integrated with
TRI systems provides substantial cost savings.
(*)Optional
PowerControlCircuit
7474
B-ScanIC
LCD 3V
Boundary-Scan Cluster Test
U2SDRAMU1
Boundary-Scan Virtual Nails Test
Driver Receiver
U1 U2
TDI TDO TDI TDO
TMS TMS
TCKTCK
Boundary-Scan Chain Test
BSTG
U S E R - F R I E N D L Y I N T E R F A C E
TR8100LV provides a simple-to-understand flexible interface
• Color syntax program editor
• C-like test language
• Editable waveform display tool
• Integrated development environment
E A S Y M O D E L D E V E L O P M E N T
Narrative library structure for fast and easy edits
• Import pin information
• Library syntax check
• Integrated GUI for all device types
Import pin information
Board view with trace display capabilityWaveform display
Table-based test program editor Simple test GUI Color syntax program editor
Library
Library edit tool
Multi-Chip BSDL Test
J T A G
Output PinDrive A Signal
To DutBSCAN
Chip
VectorlessProbe
DUT
No test probes needed to detect opens and shorts
TRI TR8100LV
TRI ToggleScanTM Test
Drive-Through Test
F E A T U R E S T R 8 1 0 0 L V
T H E S O L U T I O N F O R T E S T I N G L O W V O L T A G E T E C H N O L O G I E S
TR8100LV provides an ultra-low output
impedance to enhance low-voltage
backdriving capability.
• SN74AUC240 is a low-voltage device
where VCC=0.8v.
• TR8100LV meets the specification of
the SN74AUC240 in low-voltage
testing requirement.
F A S T A N D E A S Y T E S T P R O G R A M D E V E L O P M E N T
Test Program Development Flowchart.
E A S Y - T O - U S E O N - B O A R D P R O G R A M M I N G S O F T W A R E M O D U L E S
Modularized memory algorithms provide
convenient On-Board Programming function.
Flash Programming
• Supports a macro command language
• Supports conditional programming
• Supports multi vendor programming
• Menu-based debug tool
Serial Device Programming
• Menu-based test program generation
• Supports conditional programming
• Supports multi vendor programming
Fabmaster WireAnalysis
Retrofit
Fixturing
ATPG Debug
CAD Power DataFrequency Data
Digital Parts Data
Analog LibraryDigital Library
EEPROM ProgrammingSPI Programming
ISP Programming
L I M I T E D T E S T A C C E S S S O L U T I O N S
• TRI ToggleScanTM Test: Combines Boundary-Scan test and
vectorless test to reduce the physical test probes. Includes
Connector Test, Socket Test, Resistor Array Test, Capacitor
Array Test, & Non-Boundary-Scan Chip Test.
• Drive-Through Test: Overpowers the resistors and capacitors to
control and sense signals.
• CPU-Socket Test: Applies CSS (CPU Socket Sensor) on the top of
the CPU to test the CPU without any physical test probes.
• Boundary Scan Test : The TR8100LV implements IEEE1149.1
& 1149.6 Boundary-Scan testing beginning with TRI’s ABSTG
(Automatic Boundary Scan Test program Generator). This
auto-generates test programs and reporting for different kinds
of test categories, such as individual boundary-scan device tests,
boundary-scan cluster test, boundary-scan devices chain test and
virtual nails test.
• Optimal Test Analyzer (OTA): Powerful software that performs line
optimal analysis for cost efficiency and to decrease testing time.
I N T E G R A T E D A S S E T S C A N W O R K S B O U N D A R Y - S C A N T E C H N O L O G Y *
Manufacturers will be able to globally deploy solutions from both
Asset and TRI. The optional ScanWorks card solution integrated with
TRI systems provides substantial cost savings.
(*)Optional
PowerControlCircuit
7474
B-ScanIC
LCD 3V
Boundary-Scan Cluster Test
U2SDRAMU1
Boundary-Scan Virtual Nails Test
Driver Receiver
U1 U2
TDI TDO TDI TDO
TMS TMS
TCKTCK
Boundary-Scan Chain Test
BSTG
U S E R - F R I E N D L Y I N T E R F A C E
TR8100LV provides a simple-to-understand flexible interface
• Color syntax program editor
• C-like test language
• Editable waveform display tool
• Integrated development environment
E A S Y M O D E L D E V E L O P M E N T
Narrative library structure for fast and easy edits
• Import pin information
• Library syntax check
• Integrated GUI for all device types
Import pin information
Board view with trace display capabilityWaveform display
Table-based test program editor Simple test GUI Color syntax program editor
Library
Library edit tool
Multi-Chip BSDL Test
J T A G
Output PinDrive A Signal
To DutBSCAN
Chip
VectorlessProbe
DUT
No test probes needed to detect opens and shorts
TRI TR8100LV
TRI ToggleScanTM Test
Drive-Through Test
F E A T U R E S T R 8 1 0 0 L V
T H E S O L U T I O N F O R T E S T I N G L O W V O L T A G E T E C H N O L O G I E S
TR8100LV provides an ultra-low output
impedance to enhance low-voltage
backdriving capability.
• SN74AUC240 is a low-voltage device
where VCC=0.8v.
• TR8100LV meets the specification of
the SN74AUC240 in low-voltage
testing requirement.
F A S T A N D E A S Y T E S T P R O G R A M D E V E L O P M E N T
Test Program Development Flowchart.
E A S Y - T O - U S E O N - B O A R D P R O G R A M M I N G S O F T W A R E M O D U L E S
Modularized memory algorithms provide
convenient On-Board Programming function.
Flash Programming
• Supports a macro command language
• Supports conditional programming
• Supports multi vendor programming
• Menu-based debug tool
Serial Device Programming
• Menu-based test program generation
• Supports conditional programming
• Supports multi vendor programming
Fabmaster WireAnalysis
Retrofit
Fixturing
ATPG Debug
CAD Power DataFrequency Data
Digital Parts Data
Analog LibraryDigital Library
EEPROM ProgrammingSPI Programming
ISP Programming
L I M I T E D T E S T A C C E S S S O L U T I O N S
• TRI ToggleScanTM Test: Combines Boundary-Scan test and
vectorless test to reduce the physical test probes. Includes
Connector Test, Socket Test, Resistor Array Test, Capacitor
Array Test, & Non-Boundary-Scan Chip Test.
• Drive-Through Test: Overpowers the resistors and capacitors to
control and sense signals.
• CPU-Socket Test: Applies CSS (CPU Socket Sensor) on the top of
the CPU to test the CPU without any physical test probes.
• Boundary Scan Test : The TR8100LV implements IEEE1149.1
& 1149.6 Boundary-Scan testing beginning with TRI’s ABSTG
(Automatic Boundary Scan Test program Generator). This
auto-generates test programs and reporting for different kinds
of test categories, such as individual boundary-scan device tests,
boundary-scan cluster test, boundary-scan devices chain test and
virtual nails test.
• Optimal Test Analyzer (OTA): Powerful software that performs line
optimal analysis for cost efficiency and to decrease testing time.
I N T E G R A T E D A S S E T S C A N W O R K S B O U N D A R Y - S C A N T E C H N O L O G Y *
Manufacturers will be able to globally deploy solutions from both
Asset and TRI. The optional ScanWorks card solution integrated with
TRI systems provides substantial cost savings.
(*)Optional
PowerControlCircuit
7474
B-ScanIC
LCD 3V
Boundary-Scan Cluster Test
U2SDRAMU1
Boundary-Scan Virtual Nails Test
Driver Receiver
U1 U2
TDI TDO TDI TDO
TMS TMS
TCKTCK
Boundary-Scan Chain Test
BSTG
U S E R - F R I E N D L Y I N T E R F A C E
TR8100LV provides a simple-to-understand flexible interface
• Color syntax program editor
• C-like test language
• Editable waveform display tool
• Integrated development environment
E A S Y M O D E L D E V E L O P M E N T
Narrative library structure for fast and easy edits
• Import pin information
• Library syntax check
• Integrated GUI for all device types
Import pin information
Board view with trace display capabilityWaveform display
Table-based test program editor Simple test GUI Color syntax program editor
Library
Library edit tool
Multi-Chip BSDL Test
J T A G
Output PinDrive A Signal
To DutBSCAN
Chip
VectorlessProbe
DUT
No test probes needed to detect opens and shorts
TRI TR8100LV
TRI ToggleScanTM Test
Drive-Through Test
I N C I R C U I T T E S TS P E C I F I C A T I O N S
Headquarters,Taipei,Taiwan7F., No.45, Dexing West Rd., Shilin Dist., Taipei City 11158, TaiwanTEL: +886-2-2832-8918FAX: +886-2-2831-0598 E-Mail: [email protected] http://www.tri.com.tw
Linkou, TaiwanNo.256, Huaya 2nd Rd.,Guishan Dist., Taoyuan City 33383, TaiwanTEL: +886-2-2832-8918FAX: +886-3-328-6579
Hsinchu, Taiwan7F., No.47, Guangming 6th Rd., Zhubei City, Hsinchu County 30268, TaiwanTEL: +886-3-553-9796 FAX: +886-3-553-9786
USA832 Jury Court, Suite 4, San Jose, CA 95112 U.S.ATEL: +1-408-567-9898FAX: +1-408-567-9288E-mail: [email protected]
MalaysiaC11-1, Ground Floor, Lorong Bayan Indah 3 Bay Avenue, 11900 Bayan Lepas Penang, MalaysiaTEL: +604-6451171E-mail: [email protected]
EuropeGugelstr. 32 90443 NurembergGermanyTEL: +49-9119-401-7827FAX: +49-9119-400-6181E-mail: [email protected]
Japan4-26-10 Ishiwara, Sumida-ku, Tokyo, 130-0011 JapanTEL: +81-3- 6273-0518FAX: +81-3- 6273-0519E-mail: [email protected]
KoreaNo.207 Daewoo-Technopia, 768-1 Wonsi-Dong, Danwon-Gu, Ansan City, Gyeonggi-Do, KoreaTEL:+82-31-470-8858 FAX:+82-31-470-8859 E-mail: [email protected]
Shenzhen, China 5F.3, Guangxia Rd., Shang-mei-lin Area, Fu-Tian Dist., Shenzhen, Guangdong, 518049, ChinaTEL: +86-755-83112668FAX: +86-755-83108177E-mail: [email protected]
Suzhou, China B Unit, Building 4, 78 Xinglin St., Suzhou Industrial Park, 215123, China TEL: +86-512-68250001FAX: +86-512-68096639E-mail: [email protected]
Shanghai, China Room 6C, Building 14, Aly. 470, Guiping Rd., Xuhui Dist.,Shanghai, 200233, ChinaTEL: +86-21-54270101FAX: +86-21-64957923E-mail: [email protected]
T R 8 1 0 0 L V I C T
TR8100LV
TR8100LV SERIES
G E N E R A LTest Points TR8100LV Expandable to 3584, TR8100L LV Expandable to 5632Operating System Microsoft Windows 10Power Requirement 200-240 VAC, single phase, 50/60 Hz, 4 kVAFixture Type Vacuum Type Option: Pneumatic Type
A N A L O G H A R D W A R E Measurement Switching Matrix Analog Source 6-wire measurement 2 Programmable Voltage Source DC 0 ~ ±10V, AC 0 ~ 7Vrms1 Programmable High Voltage Source DC 45V, 50mA Max.1 Programmable Current Source DC 100mA Max.Arbitrary Waveform Generator(AWG)2 Digitally synthesized stimulus sources configurable Frequency range 0 ~ 100KHz, Resolution: 0.15Hz, BW: 100KHz Max.Analog MeasurementAC Voltmeter 0 ~ 100VpDC Voltmeter 0 ~ ±100VTestJet Technology Vectorless Open Circuit Detection
D I G I T A L H A R D W A R ENon-Multiplexing 1:1 system per pin architecturePin Drivers Programmable levels 0.5V to 4 V Pin Receivers Programmable levels -5V to 5VSink/Source Current 500mA Max.Pull-up / pull-down Resistor 4.7KDUT Power Supplies 5V@5A,3.3V@5A,12V@5A,0.2 ~ 20V@3A,-3 ~ -20V@3AOn- Board Programming of Flash & Support the Binary Code Input Without Coding EnvironmentEEPROM Memories MAC Address Programming Supports MAC Address Programming with MAC address being supplied from server
O P T I O N SBoundary Scan B-Scan Chain Test, B-Scan Cluster Test & B-Scan Virtual Nails Test Facilities DUT Power Supplies Programmable 75Vmax, 8Amax(Max Power <200W)Fixture Converter Kits available for GenRad &Teradyne
D I M E N S I O N S / W E I G H T TR8100LV 1150 mm(W) x 850 mm(D) x 830 mm(H) / 390kg(Max) (45.28” x 33.46” x 32.68” / 858lbs.)TR8100L LV 1550 mm(W) x 850 mm(D) x 830 mm(H) / 450kg(Max) (61.02" x 33.46” x 32.68” / 990lbs.)
P O W E R F U L S O F T W A R E E N V I R O N M E N TMicrosoft Windows operating system software. User-friendly interfaceAutomatic Test Program Generator Automatic disable generator of surrounding componentsAutomatic test generation with Auto-learning of open/short, IC Clamping Diode and TestJet technologyAuto debugging of passive components.Built-in system self-diagnostic function Paperless repair station & real-time process monitoringTime selectable quality management and statistical reportsBoard view instantly displays failing device and pin
C-8100LV-EN-1911
S H O P F L O O R S Y S T E M S U P P O R T
• Supports text file, database, and DLL
interfaces.
• S/N and operator ID check.
• Multi-data exchange protocol.
T H E M O S T C O S T - E F F E C T I V E T E S T S T R A T E G Y
Non-Multiplexing Pin Design, Driver/Receiver
Ratio 1:1
• Optimized Nail Placement with 1:1 Ratio
Flexibility.
• ECNs do not require moving existing wires
in your fixture.
• 1:1 Driver/Receiver pins provide for the
fastest test program development
and debugging solutions available.
G E N R A D A N D T E R A D Y N E C O N V E R S I O N T O O L K I T S
There is no need to acquire new TRI fixtures
because we can convert your existing GenRad
or Teradyne ones.
P C B A Y I E L D M A N A G E M E N T S Y S T E M
TRI's Yield Management System (YMS) is
an omni-directional, integrated solution
for today's manufacturing environment. It
gathers and analyzes data from all TRI systems
on the shop floor and delivers it an a user-
friendly report format. TRI's YMS is a flexible
system to meet the present and future needs
of high-volume manufacturers.
Network setup tool
• H I G H - P E R F O R M A N C E , H I G H T H R O U G H P U T I N - C I R C U I T T E S T E R
• H I G H F A U L T C O V E R A G E T E S T S O L U T I O N
• E A S Y A N D F A S T T E S T P R O G R A M D E V E L O P M E N T
• F R I E N D L Y U S E R I N T E R F A C E D E S I G N
• L O W - V O L T A G E S O L U T I O N
Component Measurement CapabilityResistance 0.1 ohm ~ 40M ohm Capacitance 10pF ~ 40mFInductance 10uH ~ 60H
Re-FlowOven
TR8100LV
ICT / ATEBoard Testing
TR7100 SeriesTR7500 Series
Post Re-FlowInspection
Insertion & Wave
Soldering
F/TStation
Server
Test Server ICT Server
Server
YMS System configuration
TR7006 Series
Solder PasteInspection
Customer SFC system
Pre Re-FlowInspection
Post Re-FlowInspection
ICT/ATEBoard Testing
TR518 SeriesTR5000 SeriesTR8000 Series
TR7100 SeriesTR7500E Series
TR7100EP SeriesTR7500 Series
ScreenPrint
Pick&
PlaceRe-Flow
Oven
Insertion& Wave
Soldering
F/TStation
YMSserver
SQLserver
SPC SPCRepair station Repair station
SFCInterface SFC DB
YMS Module
Process YieldImprovement
Process ControlAlarm Module
Tester AutoFeedback Module
Auto FeedbackManagement
Tester DataIntegration Module
Defect ImageManagement
Integral ExcelReport Module
SPC Module
Placer Link Module
Web Module
Barcode CheckModule
System Tool &User Management
YMS
Specifications are subject to change without notice. All trademarks are the property of their owners.
The following are trademarks or registered trademarks of Test Research, Inc. (TRI)
The absence of a product or service name or logo from this list does not constitute a waiver of TRI’s trademark or other intellectual
property rights concerning that name or logo. All other trademarks and trade names are the property of their owners.
I N C I R C U I T T E S TS P E C I F I C A T I O N S
Headquarters,Taipei,Taiwan7F., No.45, Dexing West Rd., Shilin Dist., Taipei City 11158, TaiwanTEL: +886-2-2832-8918FAX: +886-2-2831-0598 E-Mail: [email protected] http://www.tri.com.tw
Linkou, TaiwanNo.256, Huaya 2nd Rd.,Guishan Dist., Taoyuan City 33383, TaiwanTEL: +886-2-2832-8918FAX: +886-3-328-6579
Hsinchu, Taiwan7F., No.47, Guangming 6th Rd., Zhubei City, Hsinchu County 30268, TaiwanTEL: +886-3-553-9796 FAX: +886-3-553-9786
USA832 Jury Court, Suite 4, San Jose, CA 95112 U.S.ATEL: +1-408-567-9898FAX: +1-408-567-9288E-mail: [email protected]
MalaysiaC11-1, Ground Floor, Lorong Bayan Indah 3 Bay Avenue, 11900 Bayan Lepas Penang, MalaysiaTEL: +604-6451171E-mail: [email protected]
EuropeGugelstr. 32 90443 NurembergGermanyTEL: +49-9119-401-7827FAX: +49-9119-400-6181E-mail: [email protected]
Japan4-26-10 Ishiwara, Sumida-ku, Tokyo, 130-0011 JapanTEL: +81-3- 6273-0518FAX: +81-3- 6273-0519E-mail: [email protected]
KoreaNo.207 Daewoo-Technopia, 768-1 Wonsi-Dong, Danwon-Gu, Ansan City, Gyeonggi-Do, KoreaTEL:+82-31-470-8858 FAX:+82-31-470-8859 E-mail: [email protected]
Shenzhen, China 5F.3, Guangxia Rd., Shang-mei-lin Area, Fu-Tian Dist., Shenzhen, Guangdong, 518049, ChinaTEL: +86-755-83112668FAX: +86-755-83108177E-mail: [email protected]
Suzhou, China B Unit, Building 4, 78 Xinglin St., Suzhou Industrial Park, 215123, China TEL: +86-512-68250001FAX: +86-512-68096639E-mail: [email protected]
Shanghai, China Room 6C, Building 14, Aly. 470, Guiping Rd., Xuhui Dist.,Shanghai, 200233, ChinaTEL: +86-21-54270101FAX: +86-21-64957923E-mail: [email protected]
T R 8 1 0 0 L V I C T
TR8100LV
TR8100LV SERIES
G E N E R A LTest Points TR8100LV Expandable to 3584, TR8100L LV Expandable to 5632Operating System Microsoft Windows 10Power Requirement 200-240 VAC, single phase, 50/60 Hz, 4 kVAFixture Type Vacuum Type Option: Pneumatic Type
A N A L O G H A R D W A R E Measurement Switching Matrix Analog Source 6-wire measurement 2 Programmable Voltage Source DC 0 ~ ±10V, AC 0 ~ 7Vrms1 Programmable High Voltage Source DC 45V, 50mA Max.1 Programmable Current Source DC 100mA Max.Arbitrary Waveform Generator(AWG)2 Digitally synthesized stimulus sources configurable Frequency range 0 ~ 100KHz, Resolution: 0.15Hz, BW: 100KHz Max.Analog MeasurementAC Voltmeter 0 ~ 100VpDC Voltmeter 0 ~ ±100VTestJet Technology Vectorless Open Circuit Detection
D I G I T A L H A R D W A R ENon-Multiplexing 1:1 system per pin architecturePin Drivers Programmable levels 0.5V to 4 V Pin Receivers Programmable levels -5V to 5VSink/Source Current 500mA Max.Pull-up / pull-down Resistor 4.7KDUT Power Supplies 5V@5A,3.3V@5A,12V@5A,0.2 ~ 20V@3A,-3 ~ -20V@3AOn- Board Programming of Flash & Support the Binary Code Input Without Coding EnvironmentEEPROM Memories MAC Address Programming Supports MAC Address Programming with MAC address being supplied from server
O P T I O N SBoundary Scan B-Scan Chain Test, B-Scan Cluster Test & B-Scan Virtual Nails Test Facilities DUT Power Supplies Programmable 75Vmax, 8Amax(Max Power <200W)Fixture Converter Kits available for GenRad &Teradyne
D I M E N S I O N S / W E I G H T TR8100LV 1150 mm(W) x 850 mm(D) x 830 mm(H) / 390kg(Max) (45.28” x 33.46” x 32.68” / 858lbs.)TR8100L LV 1550 mm(W) x 850 mm(D) x 830 mm(H) / 450kg(Max) (61.02" x 33.46” x 32.68” / 990lbs.)
P O W E R F U L S O F T W A R E E N V I R O N M E N TMicrosoft Windows operating system software. User-friendly interfaceAutomatic Test Program Generator Automatic disable generator of surrounding componentsAutomatic test generation with Auto-learning of open/short, IC Clamping Diode and TestJet technologyAuto debugging of passive components.Built-in system self-diagnostic function Paperless repair station & real-time process monitoringTime selectable quality management and statistical reportsBoard view instantly displays failing device and pin
C-8100LV-EN-1911
S H O P F L O O R S Y S T E M S U P P O R T
• Supports text file, database, and DLL
interfaces.
• S/N and operator ID check.
• Multi-data exchange protocol.
T H E M O S T C O S T - E F F E C T I V E T E S T S T R A T E G Y
Non-Multiplexing Pin Design, Driver/Receiver
Ratio 1:1
• Optimized Nail Placement with 1:1 Ratio
Flexibility.
• ECNs do not require moving existing wires
in your fixture.
• 1:1 Driver/Receiver pins provide for the
fastest test program development
and debugging solutions available.
G E N R A D A N D T E R A D Y N E C O N V E R S I O N T O O L K I T S
There is no need to acquire new TRI fixtures
because we can convert your existing GenRad
or Teradyne ones.
P C B A Y I E L D M A N A G E M E N T S Y S T E M
TRI's Yield Management System (YMS) is
an omni-directional, integrated solution
for today's manufacturing environment. It
gathers and analyzes data from all TRI systems
on the shop floor and delivers it an a user-
friendly report format. TRI's YMS is a flexible
system to meet the present and future needs
of high-volume manufacturers.
Network setup tool
• H I G H - P E R F O R M A N C E , H I G H T H R O U G H P U T I N - C I R C U I T T E S T E R
• H I G H F A U L T C O V E R A G E T E S T S O L U T I O N
• E A S Y A N D F A S T T E S T P R O G R A M D E V E L O P M E N T
• F R I E N D L Y U S E R I N T E R F A C E D E S I G N
• L O W - V O L T A G E S O L U T I O N
Component Measurement CapabilityResistance 0.1 ohm ~ 40M ohm Capacitance 10pF ~ 40mFInductance 10uH ~ 60H
Re-FlowOven
TR8100LV
ICT / ATEBoard Testing
TR7100 SeriesTR7500 Series
Post Re-FlowInspection
Insertion & Wave
Soldering
F/TStation
Server
Test Server ICT Server
Server
YMS System configuration
TR7006 Series
Solder PasteInspection
Customer SFC system
Pre Re-FlowInspection
Post Re-FlowInspection
ICT/ATEBoard Testing
TR518 SeriesTR5000 SeriesTR8000 Series
TR7100 SeriesTR7500E Series
TR7100EP SeriesTR7500 Series
ScreenPrint
Pick&
PlaceRe-Flow
Oven
Insertion& Wave
Soldering
F/TStation
YMSserver
SQLserver
SPC SPCRepair station Repair station
SFCInterface SFC DB
YMS Module
Process YieldImprovement
Process ControlAlarm Module
Tester AutoFeedback Module
Auto FeedbackManagement
Tester DataIntegration Module
Defect ImageManagement
Integral ExcelReport Module
SPC Module
Placer Link Module
Web Module
Barcode CheckModule
System Tool &User Management
YMS
Specifications are subject to change without notice. All trademarks are the property of their owners.
The following are trademarks or registered trademarks of Test Research, Inc. (TRI)
The absence of a product or service name or logo from this list does not constitute a waiver of TRI’s trademark or other intellectual
property rights concerning that name or logo. All other trademarks and trade names are the property of their owners.