session 2 – power quality and emc - cired 2/main... · session 2 – power quality and emc ......
TRANSCRIPT
Prague, 8-11 June 2009
1Jan Meyer – Germany Session 2 Paper 0677
Automated Test System for Accuracy Verification of Power Quality Measurement Instruments
Session 2 – Power Quality and EMC
Presentation of Paper 0677
J. Meyer, P. Schegner, M. DomagkTechnische Universitaet Dresden; Germany
R. KuntnerOMICRON electronics; Austria
F. Hillenbrandimc Messsysteme GmbH; Germany
Prague, 8-11 June 2009
2Jan Meyer – Germany Session 2 Paper 0677
Classification of voltage quality measurements
Response to customer complaints
Compliance with contractual limits
Assessment of average quality, Benchmarking
Equipment, analysis and instrument accuracy: problem-specific
Equipment, analysis and instrument accuracy:contract-specific
Equipment, analysis and instrument accuracy:
according to standard
Need for periodical verification of instrument accuracy
Few, mobile units Few, fix installed units Many, fix installed unitsMany, fix installed units
Virtually no verification up to now for Type C measurementsIncreasing number of installed units (esp. fix installed/long term)
Increasing importance of accuracy verification issues ?Growthing interest of regulatory authorities in monitoring campaigns
Requirements for accuracy verification in future ?
Prague, 8-11 June 2009
3Jan Meyer – Germany Session 2 Paper 0677
Basic idea and advantages of a mobile test system
Prague, 8-11 June 2009
4Jan Meyer – Germany Session 2 Paper 0677
IEC standard 61000-4-30
Much more tests are necessary to verify the correct implementation of the methods according to IEC 61000-4-30 completely (classes A and S).
Basic standard: IEC 61000 4-30 Ed.2 (2008-10)
Product standard required(IEC 62586 actual under development in TC85 WG20)
Normative for voltages onlyNo consideration of external measurement transformersDifferent instrument classes A, S, B A: highest requirements on accuracy and comparability S: standard requirements on accuracy and comparability
Specification of 3 testing states for steady-state performance verification
Prague, 8-11 June 2009
5Jan Meyer – Germany Session 2 Paper 0677
Considered Voltage quality parameters (Testing state 3)
power frequency
interharmonics
harmonics
unbalance(u2 = 4,95%)
0 10 20 30 40-150
-100
-50
0
50
100
150
time / ms
L1 L2 L3
supply voltage
flicker
fN = 51HzDetermined by
other parametersPst=4
r=110/min (d=2,9%)
UL1 = 76 Vrms
UL2 = 70 Vrms
UL3 = 64 Vrms
U(7) = 10%.Udin (180°)U(13) = 5%.Udin (0°)U(25) = 5%.Udin (0°)
1%.Udin bei 3,5fnomUdin = 50 Vrms
Prague, 8-11 June 2009
6Jan Meyer – Germany Session 2 Paper 0677
Mandatory test procedure according to IEC 61000-4-30
Prague, 8-11 June 2009
7Jan Meyer – Germany Session 2 Paper 0677
Requirements and principle method
Prague, 8-11 June 2009
8Jan Meyer – Germany Session 2 Paper 0677
Waveform generation in detail
Com
man
d ou
tput
to t
est
gene
rato
r
sign
al g
e-ne
ration
1
activa
tion
of
voltag
e ou
tput
s
mul
tipl
icat
ion
of
sign
als
sign
al g
e-ne
ration
2
Prague, 8-11 June 2009
9Jan Meyer – Germany Session 2 Paper 0677
Approach for synchronized output of test sequence
Prague, 8-11 June 2009
10Jan Meyer – Germany Session 2 Paper 0677
Example of a test report (graph of 5th voltage harmonic)
0 5 10 15-1
-0.5
0
0.5
1
5th voltage harmonic / V
mea
sure
men
t un
cert
aint
y /
V
testing state 1
testing state 2
testing state 3
not allowed
not allowed
allowed range
Requirements acc. to IEC 61000-4-7 class I
Short test time of 3 minutes for 15 test points (45 measurement values)Simple identifi-cation of different testing states
TEST PASSED
Result for 5th harmonic
Prague, 8-11 June 2009
11Jan Meyer – Germany Session 2 Paper 0677
Conclusions and future work
Implementation of further testing procedures (e.g. for events, harmonic grouping, post-processing, ...) Development of a test database with a standardized interface to extend the system for different instrument types
Fast and easy way for accuracy verification according to the testing states of IEC 61000-4-30Fully automated and not limited to the specified testing states
Still to do:
Already achieved:
Prague, 8-11 June 2009
12Jan Meyer – Germany Session 2 Paper 0677
Thank you for your attention !
I E E HContact details:Jan MeyerTechnische Universität DresdenInstitute of Electrical Power Systems and High Voltage Engenieering01062 Dresden
Tel. 0351-463 35102Fax. 0351-463 37036
E-Mail: [email protected]