Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 1

Preliminary testing results of Elma and HPK sensors

Sergey Korjenevski Kansas State University

Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 2

Stock @ KSU – 10/10/02

ELMA prototypes: L0 23 detectors

3 irradiated 7 first batch (February 2002) 16 second batch (July 2002)

L1 0 detectors 4 detectors were delivered July 2002, 2 were tested,

sent to Fermilab for SVX4 tests and module construction

Expected more with MMM

HPK prototypes: L1 10 detectors (September 2002) 3 test structures

Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 3

Leakage Current

L0 ELMA

Leakage at 350V Room T

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Current, nA

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Dzero cut off

Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 4

L0 ELMA

Depletion VoltageFull Depletion L0

02468101214

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• Most of the prototypes have depletion point at around 25V • QA document does not require low limit on FDV• For production run raw Si must be changed, FDV will be different

Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 5

L0 ELMA

Strip Measurements Data available for detailed statistical

analysis Polyresistors are lower than specification

237-9d1 230K 1-3d1 550K

Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 6

L1 ELMA

Leakage Current 2-7 432nA @350V 2-9 364nA @350V Breakdown 630V

Depletion Voltage 21V

Strip scan Ileak ~0.2 nA per strip Rpoly 580K (2-7 only) Cac ~100pF No pinholes

Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 7

L1 HPK

Leakage CurrentLeakage current @ 300V

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• DØ requires Ileak < 1700 nA at FDV RT for L1• All 10 detectors are acceptable • HPK_L1_020 has breakdown at ~ 750V, the rest >800V (spec 700V)

Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 8

L1 HPK

Depletion VoltageDepletion Voltage

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• DØ requires Vfd < 300 V • All 10 detectors are acceptable • KSU measurements ~10% lower than HPK. Could HPK define Vfd as Depletion + 10%?

Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 9

L1 HPK

Strip Measurements 5 sensors were tested – I leak; I diel; R poly; Cac

Rpoly depends on voltage through polyresistor; Some indication of Rpoly out of specification ~200K too low. Will be investigated. HPK Rpoly estimation is made on Rpoly monitor, - was not supplied.

HPK01 0.04nA per strip; no PH; Cac Cp-Q mode 67pF; HPK03 0.04nA per strip; bad strip 42; Cac 89pF; HPK04 0.05nA per strip; bad strip 346; Cac ~60pF; HPK06 0.05nA per strip; PH 13, 47, 267; HPK07 0.05nA 27 leaking; PH 320; Cac ~65pF;

Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 10

HPK L1 comments

Three Test Structures were sent along

No Rpoly monitor (HPK reports R value)

These 3 TS are being tested at the moment

These TS will be tested by other centers for calibration

Sergey Korjenevski KSUDØ Run2b Silicon meeting, Oct 10, 2002 11

Near Future Plans

Finish testing of HPK_L1 sensors Polysilicon Resistor issue needs to be

resolved Switching matrix to install

Speed up the sensor testing Simplify the procedure

Data Base IO format needs to be addressed

Cool chuck for irradiation studies