separability of multiple deep crack defects with an nde ... · technologies in the detection of...

5
HAL Id: hal-00987124 https://hal.archives-ouvertes.fr/hal-00987124 Submitted on 5 May 2014 HAL is a multi-disciplinary open access archive for the deposit and dissemination of sci- entific research documents, whether they are pub- lished or not. The documents may come from teaching and research institutions in France or abroad, or from public or private research centers. L’archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la diffusion de documents scientifiques de niveau recherche, publiés ou non, émanant des établissements d’enseignement et de recherche français ou étrangers, des laboratoires publics ou privés. Separability of multiple deep crack defects with an NDE Eddy Current System Rimond Hamia, Christophe Cordier, Christophe Dolabdjian To cite this version: Rimond Hamia, Christophe Cordier, Christophe Dolabdjian. Separability of multiple deep crack defects with an NDE Eddy Current System. IEEE TRANS MAG, 2013, 49 (1), pp.124-127. <hal- 00987124>

Upload: ngothuy

Post on 03-Apr-2018

219 views

Category:

Documents


5 download

TRANSCRIPT

HAL Id: hal-00987124https://hal.archives-ouvertes.fr/hal-00987124

Submitted on 5 May 2014

HAL is a multi-disciplinary open accessarchive for the deposit and dissemination of sci-entific research documents, whether they are pub-lished or not. The documents may come fromteaching and research institutions in France orabroad, or from public or private research centers.

L’archive ouverte pluridisciplinaire HAL, estdestinée au dépôt et à la diffusion de documentsscientifiques de niveau recherche, publiés ou non,émanant des établissements d’enseignement et derecherche français ou étrangers, des laboratoirespublics ou privés.

Separability of multiple deep crack defects with an NDEEddy Current System

Rimond Hamia, Christophe Cordier, Christophe Dolabdjian

To cite this version:Rimond Hamia, Christophe Cordier, Christophe Dolabdjian. Separability of multiple deep crackdefects with an NDE Eddy Current System. IEEE TRANS MAG, 2013, 49 (1), pp.124-127. <hal-00987124>