scanning probe microscopy.pptx
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OUTLINE
Background and History
Scanning Probe Microscopy
comparison
Types Scanning Tunneling Microscopy
Atomic Force Microscope (AFM)
-Advantage
-isadvantage -Application
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Scanning Probe Microscopy• Scanning probe microscopy (SPM is a ne! branc" o#
$icroscopy %
• An i$age o# &"e s'r#ace is ob&aine by $o)ing &"e probe in a
ras&er scan o# &"e speci$en* +ine by +ine* an recoring &"e
s'r#ace i$ages%• T"e posi&ion o# &"e &ip !i&" respec& &o &"e s'r#ace $'s& be )ery
acc'ra&e+y con&ro++e (&o !i&"in abo'& ,%- . by $o)ing ei&"er &"e
s'r#ace or &"e &ip%
• I& is possib+e &o acc'ra&e+y con&ro+ &"e re+a&i)e posi&ions o# &ip
an s'r#ace by ens'ring goo )ibra&iona+ iso+a&ion o# &"e
$icroscope an 'sing sensi&i)e pie/oe+ec&ric posi&ioning e)ice%
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http://en.wikipedia.org/wiki/Microscopyhttp://en.wikipedia.org/wiki/Raster_scanhttp://en.wikipedia.org/wiki/Raster_scanhttp://en.wikipedia.org/wiki/Microscopy
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Types of scanning probe microscopy
A0M* a&o$ic #orce $icroscopy
E0M* e+ec&ros&a&ic #orce $icroscope
0MM* #orce $o'+a&ion $icroscopy
M0M* $agne&ic #orce $icroscopySTM* scanning &'nne+ing $icroscopy
S1M* scanning )o+&age $icroscopy
S2PM* scanning 2a++ probe $icroscopy
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http://en.wikipedia.org/wiki/Atomic_force_microscopyhttp://en.wikipedia.org/wiki/Electrostatic_force_microscopehttp://en.wikipedia.org/w/index.php?title=Force_modulation_microscopy&action=edithttp://en.wikipedia.org/wiki/Magnetic_force_microscopyhttp://en.wikipedia.org/wiki/Scanning_tunneling_microscopyhttp://en.wikipedia.org/wiki/Scanning_voltage_microscopyhttp://en.wikipedia.org/wiki/Scanning_Hall_probe_microscopyhttp://en.wikipedia.org/wiki/Scanning_Hall_probe_microscopyhttp://en.wikipedia.org/wiki/Scanning_voltage_microscopyhttp://en.wikipedia.org/wiki/Scanning_tunneling_microscopyhttp://en.wikipedia.org/wiki/Magnetic_force_microscopyhttp://en.wikipedia.org/w/index.php?title=Force_modulation_microscopy&action=edithttp://en.wikipedia.org/wiki/Electrostatic_force_microscopehttp://en.wikipedia.org/wiki/Atomic_force_microscopy
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Scanning T'nne+ing Microscopy (STM
T"e STM is an $icroscope &"a& 'ses a sing+e a&o$ &ip&o a&&ain a&o$ic reso+'&ion%
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An e!tremely "ine conducting probe is #eld
about an atom$s diameter "rom t#e sample%
&lectrons tunnel bet'een t#e sur"ace and t#e tip
producing an electrical signal%
#ile it slo'ly scans across t#e sur"ace
t#e tip is raised and lo'ered in order to keep
t#e signal constant and maintain t#e distance%
T#is enables it to "ollo' even t#e smallest
details o" t#e sur"ace it is scanning.
Basic opera&ion10
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STM Moes o# Opera&ion
Cons&an& C'rren&Main&ain a cons&an& &'nne+ingc'rren& by a3's&ing &"e separa&ion
Cons&an& 2eig"&Main&ain a cons&an& "eig"& an$eas're &"e c'rren& c"ange
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Prob+e$s an So+'&ions• Bringing &"e &ip c+ose &o &"e s'r#ace an scanning &"e s'r#ace
Feedback Servo oops• 4eeping &"e &ip c+ose &o &"e s'r#ace
!onverse "ie#oe$ec%rici%y
• Crea&ing a )ery #ine &ip
&$ec%ro'c(emica$ e%c(ing• 0orces be&!een &ip an sa$p+e
)eg$igib$e in mos% cases• Mec"anica+ )ibra&ions an aco's&ic noise
Sof% s*spension of %(e microscope +i%(in an *$%ra
(ig( vac**m c(amber ,10-11 Torr)
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STM I$ages
5enon on Nic6e+ (--,Nickel (110)
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-%omic Force .icroscope ,-F./
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n%rod*c%ion
• Mos& !ie+y 'se branc" o# scanning probe $icroscopy• Opera&es by $eas'ring &"e in&erac&ion #orce be&!een &"e
&ip an sa$p+e%• A0M 7 is &"e )an er 8aa+s #orce be&!een &"e &ip an &"e
s'r#ace9 &"is $ay be ei&"er &"e s"or& range rep'+si)e #orce(in con&ac&7$oe or &"e +onger range a&&rac&i)e #orce (innon7con&ac& $oe%
8or6ing concep& o# A0M
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A0M
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-% Laser:% Mirror;% P"o&oe&ec&or
% Sa$p+e?% Probe@% Can&i+e)er
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A0M OPERATION
• An a&o$ica++y s"arp &ip is scanne o)er a s'r#ace !i&"#eebac6 $ec"anis$s &o $ain&ain &"e &ip a& a cons&an&#orce (&o ob&ain "eig"& in#or$a&ion* or "eig"& (&o ob&ain#orce in#or$a&ion abo)e &"e sa$p+e%
• Tips are &ypica++y $ae #ro$ Si;N
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asic se%'*p of an -F.
T"e abi+i&y o# an A0M &o ac"ie)e near a&o$ic sca+e reso+'&ion epens on &"e
&"ree essen&ia+ co$ponen&s a can&i+e)er !i&" a s"arp &ip*
a scanner &"a& con&ro+s &"e x 7y 7z posi&ion* an
&"e #eebac6 con&ro+ an +oop%
Cantiliever with a sharp tip% T"e s&i##ness o# &"e can&i+e)er nees &o be +ess%
• T"e &ip s"o'+ "a)e a rai's o# c'r)a&'re +ess &"an :,7=, n$ (s$a++er is
be&&er a cone ang+e be&!een -,7:, egrees%
Scanner T"e $o)e$en& o# &"e &ip or sa$p+e in &"e x * y * an z 7irec&ions is
con&ro++e by a pie/o7e+ec&ric &'be scanner* si$i+ar &o &"ose 'se in STM%
• 0or &ypica+ A0M scanners* &"e $ai$'$ ranges #or are @, $$ @, $$ in &"e
x 7y p+ane an = $$ #or &"e z 7irec&ion%
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Feedback control. The forces that are exerted
between the tip and the sample are measured by the
amount of bending (or deflection) of the cantilever.
By calculating the difference signal in the photodiode
quadrants, the amount of deflection can be correlated
with a height .
Because the cantilever obeys Hooke's Law for small
displacements, the interaction force between the tip
and the sample can be determined.
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A0M Opera&ion Moes
Con&ac& Moe• Tip re$ains in &"e rep'+si)e regi$e o# &"e in&er7$o+ec'+ar #orce
c'r)e
Tapping Moe• Tip is osci++a&e a& a "ig" #re'ency• De#+ec&ions in &"e osci++a&ions
are obser)e
Non7Con&ac& Moe• Tip is osci++a&e o'&sie
o# &"e rep'+si)e regi$e
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-pp$ica%ions
T"e A0M is 'se#'+ #or ob&aining &"ree7i$ensiona+ &opograp"ic
in#or$a&ion o# ins'+a&ing an con'c&ing s&r'c&'res !i&" +a&era+
reso+'&ion o!n &o -%= n$ an )er&ica+ reso+'&ion o!n &o ,%,= n$%
T"ese sa$p+es inc+'e c+'s&ers o# a&o$s an $o+ec'+es* ini)i'a+
$acro$o+ec'+es* an bio+ogica+ species (ce++s* DNA* pro&eins%
Si$i+ar &o STM opera&ion* &"e A0M can opera&e in gas* a$bien&* an
#+'i en)iron$en&s an can $eas're p"ysica+ proper&ies inc+'ing
e+as&ici&y* "arness* #ric&ion an c"e$ica+ #'nc&iona+i&y%
Me&a+s &oo+ing s&'ies* ro'g"ness $eas're$en&s* corrosion s&'ies%%%
So+i po!er ca&a+ys&s aggrega&e s&r'c&'ra+ e&er$ina&ion
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-dvan%ages
T"e A0M "as se)era+ a)an&ages o)er &"e scanninge+ec&ron $icroscope (SEM%
Un+i6e &"e e+ec&ron $icroscope !"ic" pro)ies a &!o7i$ensiona+ pro3ec&ion or a &!o7i$ensiona+ i$age o# asa$p+e* &"e A0M pro)ies a &r'e &"ree7i$ensiona+ s'r#acepro#i+e%
Ai&iona++y* sa$p+es )ie!e by A0M o no& re'ire anyspecia+ &rea&$en&s (s'c" as $e&a+carbon coa&ings &"a& !o'+irre)ersib+y c"ange or a$age &"e sa$p+e% T"is $a6es i& possib+e &o s&'y bio+ogica+ $acro$o+ec'+es
an e)en +i)ing organis$s% In princip+e* A0M can pro)ie "ig"er reso+'&ion &"an SEM% I&"as been s"o!n &o gi)e &r'e a&o$ic reso+'&ion in '+&ra7"ig")ac''$ (U21%
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http://en.wikipedia.org/wiki/Electron_microscopehttp://en.wikipedia.org/wiki/Electron_microscope
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A0M I$ages
-, F$ scan Tapping Moe i$age o# a CD (+e#& an a D1D (rig"& s'r#ace isc
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Re#erences
• G% Binnig an 2% Ro"rer% Scanning T'nne+ingMicroscopy* IBM H Res% De)e+op%* ;,;==* -@>%
• G% Binnig* 2% Ro"rer* JScanning T'nne+ing Microscopy 70ro$ Bir&" &o Ao+escenceK* Nobe+ +ec&'re* Dece$ber @*-@$
• 8i6ipeia* JScanning T'nne+ing MicroscopeK*"&&pen%!i6ipeia%org!i6iScanning&'nne+ing$icroscope
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http://www.chembio.uoguelph.ca/educmat/chm729/STMpage/stmtutor.htmhttp://en.wikipedia.org/wiki/Scanning_tunneling_microscopehttp://en.wikipedia.org/wiki/Scanning_tunneling_microscopehttp://en.wikipedia.org/wiki/Scanning_tunneling_microscopehttp://en.wikipedia.org/wiki/Scanning_tunneling_microscopehttp://www.chembio.uoguelph.ca/educmat/chm729/STMpage/stmtutor.htm
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T2AN4 YOU
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