robust embedded nvm solutions for autotronics · automotive sc tam 21 29.1 ww sc tam 287.1 358.7...

eMemory Technology Inc.

Oct. 26, 2017

Robust Embedded NVM Solutions

for Autotronics

Embedded Wisely, Embedded Widely

• Autotronics Market

• eMemory’s NVM Solutions

• Autotronics with eMemory’s NVM Solutions

• Robust Design Scheme for Functional Safety

• Summary

2

Outline






• Summary

3

Outline

Embedded Wisely, Embedded Widely 4

$440 $460

$490 $520

$565 $580 $610

$-

$100

$200

$300

$400

$500

$600

$700

2012 2013 2014 2015 2016F 2017F 2018F

Average Semiconductor Content (SC) per Vehicles($)

2012~2018 ~6% CAGR

The Rise of SC per Vehicles

http://www.google.com.tw/url?sa=i&source=images&cd=&cad=rja&uact=8&docid=6XkvrPNLwfz1YM&tbnid=DFXmSl8jxAdwOM:&ved=0CAgQjRw4tQM&url=http://www.asianproducts.com/cp_taiwan/_A9780466617313_ASICs_1.htm&ei=DA6-U9KmBY3bkAWb04CIBg&psig=AFQjCNEhnw0qwqrIUi-B3Uy1vmleZmGrew&ust=1405050764191099

http://www.google.com.tw/url?sa=i&source=images&cd=&cad=rja&uact=8&docid=6XkvrPNLwfz1YM&tbnid=DFXmSl8jxAdwOM:&ved=0CAgQjRw4tQM&url=http://www.asianproducts.com/cp_taiwan/_A9780466617313_ASICs_1.htm&ei=DA6-U9KmBY3bkAWb04CIBg&psig=AFQjCNEhnw0qwqrIUi-B3Uy1vmleZmGrew&ust=1405050764191099


6.7%

6.5%

5.8%

4.3%

4.3%

1.8%

1.2%

0.0% 1.0% 2.0% 3.0% 4.0% 5.0% 6.0% 7.0% 8.0%

Automotive

Comm

Ind/Med

Gov/Mil

Total Ics

Computer

Consumer

IC Market Growth Rates by End-Use Application (2014-2019F CAGR)

US$, Billions 2015 2019F

Automotive SC TAM 21 29.1

WW SC TAM 287.1 358.7

Automotive % 7.3% 8.1%

Automotive Has Highest CAGR of IC






• Summary

6

Outline


Trustworthy Logic NVM • Completed Logic NVM lineup offer one-stop-shop solution.

› Compatible to any process

›Robust structure

› Low process cost

›Competitive macro sizes

› Easy integration

› Easy porting

Product Type OTP OTP MTP EEPROM

Endurance (Cycles) 10 10 1K~10K 1K~100K

Additional Mask Steps 0 0 0 0

Technology Anti-Fuse Floating gate Floating gate Floating gate

Scalability Simple Simple Simple Simple

Memory Density < 4Mb HD < 512Kb GHD < 16Mb

< 512Kb < 4Kb

Testability No Yes Yes Yes


Production Map

8

0.5- 0.4um 0.25um 0.18um 0.16um 0.15xum 0.13um 0.11um

90- 80nm

65- 55nm 40nm

28- 22nm

SiGe

CIS

Mixed Signal

Logic (Generic/ LP)

HV

BCD

Automotive

HPM(HKMG)

ULP

eFlash (eFlash ULP)

DRAM

FinFET

0.35- 0.3um 10nm

NeoBit

NeoFuse

NeoEE

NeoMTP

NeoFlash

Production/Qualification

Verified/Under Development

16- 14nm 12nm 7nm


8” 12”

350nm 250nm 180nm 160nm

130nm 110nm

90nm 80nm

55nm 40nm 28nm 16nm 12nm

10nm 7nm

LCD Driver

Finger Print

MCU Like

PMIC

Bluetooth

DTV/STB

Sensor

Controller

Application

Processor

Automotive

Wireless

Charger

eMemory Solution Availability






• Summary

10

Outline


Autotronics with eMemory IPs

11

Intelligent drive

Distronic system

Rear view system Blind Spot Warning System

Cockpit System Keyless door

Infotainment system

Auto parking system

OBU & GPS

Sensor system

V2X

802.11p

NFC

http://www.google.com.tw/url?sa=i&rct=j&q=&esrc=s&frm=1&source=images&cd=&cad=rja&uact=8&ved=0CAcQjRw&url=http://www.autoliv.com/ProductsAndInnovations/PassiveSafetySystems/Pages/Seatbelts&ei=unXtVMKWOcHbmAWDjoLwAQ&psig=AFQjCNHltLUxwW1ES4QMQcWV0zbeVLg1Bg&ust=1424934711324646

http://www.google.com.tw/url?sa=i&rct=j&q=&esrc=s&frm=1&source=images&cd=&cad=rja&uact=8&ved=0CAcQjRw&url=http://mpt1st.deviantart.com/art/Car-Seat-198296419&ei=bnbtVJ7LGaaumAWHhoH4CA&psig=AFQjCNGmyGsg1KqNNaV3sNTE7-_SfXgLPA&ust=1424934883816555


NVM Applications for Autotronics •Display panel for infotainment and OBU (On-Board Unit)

› LCD driver IC/LED driver IC

› Power management IC/ Wireless Charger IC

› Timer control register

•Camera module for advanced driver assistance (ADAS) system

› CMOS image sensor

› Image signal processor

•MCU for sensor controller

› Motion/ Temperature/ Weight/ Light / GPS …

12


NVM Usage for Autotronics

OD LUT OTP/PMTP/MTP

Gama Voltage Gen. OTP/PMTP/MTP

Trimming

Trimming Ana. CKT of PMICs / Drivers

Trimming set OTP/PMTP/MTP

Identification Setting

Identification of PMICs / Sensors

ID set OTP/PMTP/MTP/PUF

PID/VID Serial

Number User ID

Parameter Setting

Setting parameters of Image Sensors

Shift Register

Data Latch DAC

Encryption

Security Key Gen. of Comm. ICs

Key Storage PUF/OTP

MCU

Content Copy Protection

Content receiver

Media processor

Functional Selection Function Config. of Sensors / PMICs

Function set OTP/PMTP

Code Storage Program code of AP MCU / Comm. ICs

Code Storage OTP/PMTP/MTP

Program Counter

Micro Controller

Instruction Register

Func-A (On/Off)

Func-B (On/Off)

Func-C (On/Off)

eMemory NVM IP






• Summary

14

Outline


Autotronics NVM IP Design Feature

IP Category Application

Operating Junction

Temperature (Tj)

Failure Reduction In-field Safety

Quality Analysis

1. High Temperature

Consumer or Industrial Grade

-40℃ ~ 150℃ QM level NA BKM)***

2. Zero Failure AEC-Q100 Grade 0

Automotive

-40℃ ~ 175℃ Read 1. Comprehensive

test modes. 2. ECC (Optional)

NA FMEA -40℃ ~ 150℃ PGM / ERS)**

3. Functional Safety ISO 26262

Automotive with ASIL

requirements

-40℃ ~ 175℃ Read

1. Comprehensive test modes

2. ECC 3. Dual-Core

Lockstep Design

1. Power-On Self-Test (POST)*

2. Error report or Monitor Modes)*

1. FMEDA 2. Safety

manual

-40℃ ~ 150℃ PGM / ERS)**

Remark: )* Collaborate with end-customers to build-in any safety enhancement function inside IP. )** ERS is Erase function that is special for MTP. )*** eMemory’s Best Know Methodology standards on cell device, circuit design, layout skills and design for testing (DFT).


Consideration for Zero Failure

• Zero Failure needs to be covered by high quality in process,

design, testing and qualification parts.

16

Process

Design

Testing

Qualification

Zero Failure


•Robust circuit design

› Comprehensive testing modes design followed by FMEA, FTA & DFA

- Burn-in & High voltage stress test modes

- Double margin guaranteed in read modes (individual read mode in

2cells/bit…)

› On rule chip layout and full corner simulation

› High experience for all kinds SPEC & application IP design

- First silicon functional – saving customer resource

› Collaborate with end-customers to build-in any safety enhancement

function inside IP.

Robust Design Scheme & Function

17


Ready for Autotronics

ISO26262

ASIL D

Certification

Customize

Safety Function

(Dual Core,

Error Report)

AEC_Q100 with Grade 0/1

Zero failure HTOL, ELFR, HTST

Safety Manual

FMEDA, FTA…

Work Products

2C1B + ECC

DFT (Testmodes design)

Auto.

NVM IP

Design Scheme

Quality & Reliability

Safety

Extra Test with Burn-in & Stress

modes


Reference SPEC for 150°C DR

19

IP Type NeoBit NeoEE NeoFuse

Foundry TSMC UMC TSMC/UMC

Process 0.18um BCD 0.11um BCD 28nm HKMG

Operating Voltage VDD: 1.5V~1.98V VDD:1.8V~5.5V 0.81V~0.99V

VDD:2.5V~5.5V(PGM) 1.7V~1.98V

Memory Configuration 8Kx8 128x8 4K32

Program Scheme Byte PGM 128 bits PGM Oxide rupture

with External 7.5V with Charge Pump with Charge Pump

Erase Scheme UV illumination Chip ERS

with Charge Pump NA

Program Time (Typ) 100us 10ms 20us

Erase Time (Typ) UV 30min 10ms NA

Access Time (Max) 100ns 1us 40ns

Program Current (Max) 500uA/bit 1.6mA/3.0mA 11mA/13mA

Read Current (Max) 1.37mA@10MHz 1mA@1MHz 2.7mA@25MHz

Standby Current (Typ/Max)

1uA/13uA 1uA/10uA 3uA/70uA

Endurance 1 1K 1

Retention 150oC 10year 150oC 10year 150oC 10year


Autotronics Platform

20

•Qualify with AEC-Q100 requirement.

Qualified Well Verified Developing

NeoBit NeoFuse NeoEE NeoMTP

0.11um VIS 1.5V/7V/32V(Grade 1) UMC 1.5V/7V/32V(Grade 1) VIS 1.5V/7V/32V(Grade 1)

0.13um

tsmc BCD (Grade 0)

GF BCD (Grade0) GF BCD (Grade0)

0.15um VIS 1.8V/13.5V (Grade 1)

0.16um VIS 1.8V/7V/32V(Grade 1)

0.18um

tsmc BCD (Grade1) UMC BCD (Grade 0)

tsmc BCD (Grade 1)

VIS 3.3V/13.5V (Grade 1) tsmc BCD (Grade 0)

0.25um tsmc BCD (Grade1)


eMemory

Autotronics

High Reliability

High Yield

• Zero Failure • DFT with Comprehensive Testing Mode • Dual core lockstep for functional safety

Certification

• 100% Verified by Foundry Device and Process Corners • ISO26262 Certification

• Full Corners Simulation • On-rule Layout for Process Stability • 2C1B Double Design Margin

• High temperature (up to 175℃) operation • Qualified by AEC-Q100 • ECC Further Reduce Random Fault Risk

High Quality

Summary


The Most Reliable Logic NVM IP for Autotronics

22 22 Embedded Wisely, Embedded Widely

robust embedded nvm solutions for autotronics · automotive sc tam 21 29.1 ww sc tam 287.1 358.7...

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