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Page 1: Real-time probe based quantitative determination of ...€¦ · contact resonance (resonance in the case of small amplitude cantilever oscillation). These methods being contact mode

This content has been downloaded from IOPscience. Please scroll down to see the full text.

Download details:

IP Address: 160.94.16.192

This content was downloaded on 30/12/2014 at 23:01

Please note that terms and conditions apply.

Real-time probe based quantitative determination of material properties at the nanoscale

View the table of contents for this issue, or go to the journal homepage for more

2013 Nanotechnology 24 265706

(http://iopscience.iop.org/0957-4484/24/26/265706)

Home Search Collections Journals About Contact us My IOPscience

Page 2: Real-time probe based quantitative determination of ...€¦ · contact resonance (resonance in the case of small amplitude cantilever oscillation). These methods being contact mode

IOP PUBLISHING NANOTECHNOLOGY

Nanotechnology 24 (2013) 265706 (12pp) doi:10.1088/0957-4484/24/26/265706

Real-time probe based quantitativedetermination of material properties atthe nanoscaleG Saraswat1, P Agarwal2, G Haugstad3 and M V Salapaka1

1 Department of Electrical and Computer Engineering, University of Minnesota-Twin Cities, USA2 GE Global Research, Niskayuna, NY, USA3 Characterization Facility, University of Minnesota-Twin Cities, USA

E-mail: [email protected]

Received 20 December 2012, in final form 20 December 2012Published 4 June 2013Online at stacks.iop.org/Nano/24/265706

AbstractTailoring the properties of a material at the nanoscale holds the promise of achieving hithertounparalleled specificity of the desired behavior of the material. Key to realizing this potentialof tailoring materials at the nanoscale are methods for rapidly estimating physical propertiesof the material at the nanoscale. In this paper, we report a method for simultaneouslydetermining the topography, stiffness and dissipative properties of materials at the nanoscalein a probe based dynamic mode operation. The method is particularly suited for investigatingsoft-matter such as polymers and bio-matter. We use perturbation analysis tools for mappingdissipative and stiffness properties of material into parameters of an equivalent lineartime-invariant model. Parameters of the equivalent model are adaptively estimated, where, forrobust estimation, a multi-frequency excitation of the probe is introduced. We demonstrate thatthe reported method of simultaneously determining multiple material properties can beimplemented in real-time on existing probe based instruments. We further demonstrate theeffectiveness of the method by investigating properties of a polymer blend in real-time.

S Online supplementary data available from stacks.iop.org/Nano/24/265706/mmedia

(Some figures may appear in colour only in the online journal)

1. Introduction

Emergent functionality and novel properties of material canresult from the physical proximity and geometric arrangementof atoms/molecules enabled by the control of matter at theatomic scale. Current needs of emerging fields, such asmassive data storage and energy storage, include light weightand flexible materials with durability and stiffness that canbe met with the design of material at the nanoscale. Suchefforts of materials design and discovery at the atomic scalehave to be accompanied by interrogation methods that havehigh spatial and temporal resolution to determine materialproperties at the nanoscale.

An important means of interrogating material at thenanoscale is based on the principles of atomic forcemicroscopy. Ever since the invention of the probe based

method of atomic force microscopes (AFMs) by Binnig et alin 1986 [1], cantilever beams with a sharp tip at one endhave been used to interrogate various material properties. Arecent focus of probe researchers has been the quantitativeimaging of material properties, particularly of propertiesother than topography, such as the stiffness and dissipationattributes, at the nanoscale. This focus has the potentialto substantially further the impact of probe based methodson science and technology. Of particular importance is thedesign and interrogation of soft-matter, including polymersand bio-matter, which are increasingly being used in novelapplications such as drug delivery, flexible electronics and asenergy harvesting and storage material.

Among various methods of material property interro-gation using probe based techniques, there is a paucity ofmethods for soft-matter investigation. In this paper, we report

10957-4484/13/265706+12$33.00 c© 2013 IOP Publishing Ltd Printed in the UK & the USA

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Nanotechnology 24 (2013) 265706 G Saraswat et al

Figure 1. (a) Lennard Jones model for the non-linear tip–sampleinteraction showing tip trajectories for continuous contact (smalldeflections) and intermittent contact mode (large deflections). (b)Model of the cantilever–sample when deflections of the cantileverare small and non-linear interaction can be linearized. (c) Model ofthe cantilever–sample system with the piece-wise linear model ofthe non-linear cantilever–sample interaction force.

a method that simultaneously obtains estimates of the stiffnessof the material and the energy lost to the sample in theintermittent contact mode operation of AFM, which is amongthe least invasive modes of probe based interrogation. Thetemporal resolution of the method is better than that of typicalimaging speeds of AFM and, therefore, the estimates of thesample properties can be considered in real-time. Enabledby the new real-time capability of simultaneously imagingstiffness and dissipation in addition to the topography, weprovide new insights into the properties of a polymer blend.This study of a polymer blend also indicates the superiorlateral resolution of the imaging method, where nanometersized domains are discernible.

Current AFM methods [2, 3] to determine materialproperties are predominantly continuous contact methods,where the cantilever is continuously interacting with thesample. In the continuous contact mode, the deflectionremains small and the tip–sample interaction is eitherattractive or repulsive (see figure 1(a)). Under the assumptionof small cantilever deflection, the sample behavior can belinearized. Here, the combined cantilever–sample systemcan be visualized as an equivalent spring–mass–damper(equivalent cantilever) with an equivalent stiffness andequivalent damping (see figure 1(b)).

Recently, a continuous contact method called bandexcitation (BE) was reported to determine material propertiesat the nanoscale. The BE method has found widespreadapplication [4, 5]. Here, the cantilever is excited witha continuous band of frequencies near resonance, whilekeeping the cantilever deflection small. A second-order

model is fit to the measured response, which provides theparameters of the equivalent cantilever that represent thecantilever–sample system. The spatial resolution is dictatedby the size and the distance between the pixels while thetemporal resolution is limited by the large time spent ateach pixel. Another recent continuous contact method [3]which offers substantial improvement in terms of bandwidthover BE uses dual AC resonance tracking (DART [6]) toestimate the equivalent parameters in the contact resonancemode of the AFM. In this method, the tip–sample contact isexcited simultaneously at two frequencies on either side of thecontact resonance (resonance in the case of small amplitudecantilever oscillation). These methods being contact modeare relatively harsh to the sample and are not ideallysuited for soft-matter investigation. To date there are nomethods that provide real-time simultaneous estimates ofthe dissipation and stiffness of material and are amenableto the intermittent contact (dynamic) mode operation ofAFM [7]. The intermittent contact mode (also known asTapping ModeTM) is a prevalent means of investigating theproperties of soft-matter.

In the intermittent contact mode of AFM operation, thecantilever is oscillated with large amplitudes by a sinusoidaldither forcing at the base of the cantilever. Here the cantilevertip interacts with the sample intermittently every oscillationcycle, thus exerting extremely low lateral and frictional forceson the sample. The intermittent contact mode is gentlerand less invasive, but it poses new challenges. Figure 1(a)highlights how interaction forces felt by the cantilever differin the intermittent and continuous contact modes. In thismode, linearization of tip–sample interaction is not applicableas the tip traverses the entire non-linear interaction curve(figure 1(a)). Nevertheless, the notion of net attractive andnet repulsive interaction force can be introduced. It can thusbe argued that the net affect of the interaction force caneither decrease (net attractive) or increase (net repulsive)the equivalent stiffness of the cantilever–sample systemdepending on the relative strength of attractive and repulsiveforces [8]. Here, as the sample is raster-scanned in relationto the oscillatory cantilever, the amplitude and the phase ofthe first harmonic component (of the forcing frequency) of thecantilever trajectory are used to probe properties of the sample(see figure 2), including the topography. In existing studies,the phase of the first harmonic component of cantileveroscillation with respect to the dither forcing is heavily reliedupon to gauge material properties, particularly the dissipationproperties of the material. However, it is known that thephase can lead to ambiguous interpretations of the dissipationproperties of material [9, 10].

Systems based principles have resulted in unparal-leled results for the advancements in atomic force mi-croscopy [11–14]. In this paper, these principles are usedto develop a method for determining dissipation losses tothe sample and stiffness of the material. This paper buildson the recent work by the authors (see [15]), where amethod called recursive estimation of equivalent parameters(REEP) was reported. Here [15], the cantilever with a singlesinusoid excitation (with large amplitude oscillation in the

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Nanotechnology 24 (2013) 265706 G Saraswat et al

Figure 2. In dynamic mode AFM, the cantilever is externallyexcited at the first resonant frequency of the cantilever flexure. Theamplitude and phase at the forcing frequency (a and θ in the figure)are monitored to infer sample topography. A controller can be usedto position the cantilever tip with respect to the sample in the zdirection to regulate a set-point amplitude a0, in which case thecontrol signal provides the image.

range 24–200 nm) under the non-linear interaction with thesample is modeled as an equivalent cantilever (see [16, 17]).However, the equivalent cantilever parameters are estimatedusing a multitone excitation employing a recursive leastsquares method. The sensitivity of the equivalent parametersto topography was the main focus of this study. In this paper,we demonstrate that the equivalent parameter model undera multitone excitation remains valid. Toward this goal, weextend existing knowhow on averaging theory for periodicallyforced cantilevers, in a dynamic mode AFM operation, to amultitone excitation where the forcing is no longer periodicand thus periodic averaging theory is no longer applicable.Furthermore, we demonstrate that the estimates of the samplestiffness and dissipation can be obtained in real-time.

Before proceeding further, we note that the dissipationdetermined using the above methods, including the one tobe presented here, cannot be taken as a direct measureof the intensive dissipation property of the material. Evenif the viscoelastic dissipation properties (rate-dependentmechanical response) do not differ much between twosamples, non-mechanical differences, such as molecularfreedom at the surface and Hamaker constant of tip–sampleinteraction (which relates to the mutual polarizability of pairsof interacting atoms), can affect the total dissipation, whichalso contribute to adhesion hysteresis [8]. Thus probe basedmethods determine total dissipation occurring due to overalltip–sample interaction, having both bulk and interfacialsources of dissipation.

2. Materials and methods

2.1. Numerical simulation

All equations and models were simulated using custom codesin MATLAB. Standard ordinary differential equation (ODE)solvers of MATLAB were used. All the off-line data wascaptured through National Instrument’s (NI) data acquisitioncard using LabView.

2.2. Sample

Two polymer systems were primarily used; a blendof poly(butyl methacrylate) and poly(lauryl methacrylate)(PBMA–PLMA) and a triblock copolymer of poly(styrene-block-isobutylene-block-styrene) (PS-PIB-PS or SIBS). Forthe PBMA–PLMA case, the solution was 15 mg ml−1

of total polymers in tetrahydrofuran. The relative polymerconcentration was 75–25 for PBMA–PLMA. The polymerwas spin-coated onto a silicon wafer from the solution,under ambient conditions, to produce a film thicknessof ≈1 µm, followed by ambient drying. The relativepolymer concentration for SIBS was 17:83 for PS:PIB withMW = 103 000. The polymer was again spun under ambientcondition onto silicon wafer from 20% toluene solution, toproduce a film thickness of ≈1 µm, and dried in vacuumat 110 ◦C for 2 h. The SIBS film was additionally annealedovernight in the solvent vapor (small beaker of solvent underinverted larger beaker) to produce more pronounced phasesegregation into cylindrical PS domains that lie predominantlyparallel or perpendicular to the surface.

2.3. Atomic force microscopy

All experiments were performed on a commercially availableAFM, MFP-3D from Asylum Research. Two Olympuscantilevers, AC240 (typical spring constant of 2 N m−1 andresonant frequency of 70 kHz) and AC160 (typical springconstant of 42 N m−1 and resonant frequency of 300 kHz)were used. Both cantilevers were rectangular shaped, hadsilicon tetrahedral tips with a typical radius of 7 nm andaluminum coating on the reflex side. For imaging, a closedloop x–y nano-positioning system was used to raster scanthe sample. A z-piezo was used to position the cantilever tipvertically with respect to the sample to regulate a set-pointamplitude. The same z-piezo was also used to generate‘approach–retract cycle’ [8] curves where the cantilever wasfirst moved closer to the sample in the approach phase andthen away from the sample in the retract phase.

3. Theoretical considerations

3.1. Arriving at the equivalent cantilever model

A first mode approximation of the cantilever dynamics resultsin a spring–mass–damper model of the cantilever where thesample forces are felt by the mass. For small deflectionsof the mass, the sample’s influence can be modeled asa spring (with stiffness ks) and a damper (with dampingcs), where the stiffness of the spring is given by the localslope of the curve that relates the interaction force andthe cantilever–sample separation (see figure 1(b)). Herethe cantilever–sample system can be envisioned to be anequivalent cantilever (another spring–mass–damper system)with changed parameters, such as the stiffness changing fromk to k + ks.

In the case where the cantilever oscillations are large,the cantilever tip explores a considerable portion of thetip–sample non-linearity, which does not allow for a linearized

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Nanotechnology 24 (2013) 265706 G Saraswat et al

Figure 3. Figure showing that using averaging theory, thecantilever being forced by g(t) and the tip–sample separationdependent force φ with the tip deflection p(t) can be viewed as anequivalent cantilever with changed resonant frequency fe and qualityfactor Qe being forced by g(t) resulting in the deflection p(t) (withno sample force φ).

approximation of the tip–sample interaction. However, undersinusoidal forcing it is still possible to arrive at an equivalentcantilever model of the combined cantilever–sample systemby appealing to averaging theory (see figure 3 and [9]). Here,the second-order dynamics of the cantilever–sample system isgiven by

mp+ cp+ kp = φ(p, p)+ mg(t) (1)

where p(t) is the instantaneous cantilever position, m isthe mass, k is the spring constant and c is the dampingcoefficient of the first modal approximation of the cantilever;g(t) is the dither excitation and φ(p, p) is the force dueto non-linear tip–sample interaction. Let ω2

:= k/m be theresonant frequency. Assuming that the damping c, forcing g,and the tip–sample interaction φ are small, we define c =εc, g = εg and φ = εφ, where ε is a small parameter. Itfollows from equation (1) that

p+ ω2p = (ε/m)φ(p, p)+ (ε/m)g(t)− (ε/m)cp. (2)

Defining a change of coordinates from (p, p)→ (a, θ) via

p = a cos(ωt + θ); p = −aω sin(ωt + θ), (3)

and differentiating the relations in equation (3) with respect totime, the dynamics in the changed coordinates is given by

a = −ε

ωm[φ(a cos(ωt + θ),−aω sin(ωt + θ))

+ c(aω sin(ωt + θ))+ g(t)] sin(ωt + θ)

θ = −ε

ωm[φ(a cos(ωt + θ),−aω sin(ωt + θ))

+ c(aω sin(ωt + θ))+ g(t)] cos(ωt + θ).

(4)

Evidently the dynamics in equation (4) is time varying andnon-linear.

In the case of single frequency excitation (g(t) =E sinωt), the dynamics of equation (4) is periodic with period(2π/ω). Application of first-order periodic averaging [18] tothe non-linear time varying dynamics of equation (4) resultsin the averaged time-invariant dynamics as described below(where with some abuse of notation the averaged amplitudeand phase are also represented by a and θ ):

a = −ce(a)

2ma−

ε

2mωE sin θ,

θ = ωe(a)− ω −ε

2maωE cos θ,

(5)

where

ω2e (a) = ω

2−

2am8c,

ce(a)

2m=

c

2m+

1amω

8d,

(6)

with 8c = (1/2π)∫ 2π

0 φ(a cosψ,−aω sinψ) cosψ dψ and

8d = (1/2π)∫ 2π

0 φ(a cosψ,−aω sinψ) sinψ dψ . By revert-ing the averaged dynamics (equation (5)) in the (a, θ)coordinates to the original (p, p) coordinates, the followingequation can be shown to hold

p+ce(a)

mp+ ωe(a)

2p =1m

g(t). (7)

The above dynamics describes an equivalent cantilever withchanged resonant frequency ωe and damping ce (depending onthe slowly varying parameter a) with no non-linear tip–sampleinteraction (figure 3). The equivalent stiffness is definedas ke := mω2

e and the equivalent quality factor as Qe :=(√kem/ce

). It follows from equation (6), that the change in

the stiffness and damping coefficient are given by − (2/a) 8cand (2/aω) 8d respectively.

To verify the equivalent cantilever model (equation (7)),simulations using a piece-wise linear model [17, 19] oftip–sample interaction and cantilever modeled as a second-order system with f0 = 70 kHz and Q = 200 were performed.The model of the intermittent contact mode dynamics withthe piece-wise linear model is described in figure 1(c). Thenegative spring accounts for the long-range attractive forcesand the positive spring accounts for the short-range repulsiveforces. The dampers account for the energy dissipation inthe sample and the variable l characterizes the tip–sampleseparation. It can be summarized as,

φ(p, p) =

0, if p ≥ −(l− d)

−ω2a(p+ l− d)+ cap,

if − l ≤ p < −(l− d)

ω2b(p+ l)− ω2

a(p+ l− d)+ cap+ cbp,

if p < −l.

(8)

For these simulations, the free air amplitude (amplitudeof the cantilever deflection when cantilever is not interactingwith the sample) was chosen to be 24 nm, and the meantip–sample separation (l) was varied from 24 to 20 nm(approach phase) and back to 24 nm (retract phase) linearlywith time. Such a measurement of the different aspectsof the cantilever trajectory while linearly decreasing andthen increasing the tip–sample separation is called a ‘forcecurve’ or ‘approach–retract cycle’. Figure 4 shows simulationresults that provide strong corroboration that the amplitudetrajectories of the averaged dynamics (equation (5)) providea good approximation to that of the original dynamics ofequation (4).

3.2. Deriving sample properties from equivalent cantileverparameters

It is evident that from the knowledge of the nominalparameters (k, c and ω), the equivalent cantilever parameters

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Nanotechnology 24 (2013) 265706 G Saraswat et al

Figure 4. Shows the amplitude of the first harmonic. In theapproach phase (from time 0.04 to 0.05) the amplitude reduces from21.5 to 20.2 nm and in the retract phase the amplitude recovers to21.5 nm. The amplitude as obtained by the averaged dynamicsclosely follows the original amplitude shown; the inset shows theerror to be within ±0.1 nm.

(ke and ce), and the amplitude a, it is possible to determine 8cand 8d (see equation (6)). As 8d characterizes the differencebetween the equivalent damping and nominal damping (wheresample is absent) and 8c characterizes the difference betweenthe equivalent resonant frequency and nominal resonantfrequency (which relates to the stiffness), we can view 8dand 8c as characterizing the dissipative and conservativeproperties of the sample respectively. As 8d is the dissipationforce per cycle, 8D := aω8d is the energy dissipation percycle. Furthermore, it can be shown that within an order ε

−1T

∫ T

0φ(p, p)p dt =

1T

∫ T

0(ce − c)p2 dt = aω8d (9)

where − (1/T)∫ T

0 φ(p, p)p dt denotes the average power per

period dissipated by the sample whereas (1/T)∫ T

0 (ce−c)p2 dtdenotes the average power lost by a viscous damper in aspring–mass–damper system with damping coefficient (ce −

c). Thus the average power lost to the sample is equal tothe average power lost by an equivalent viscous damper withcoefficient (ce − c), which is also equal to 8D. This furtherbolsters the equivalent cantilever description. It immediatelyfollows from this discussion that if the sample is conservativethen 8d = 0. A similar interpretation holds for 8c (see [20])where the notion of reactive power in electrical circuits isgeneralized to mechanical systems and it can be shown that8c represents the average reactive power.

3.3. Formulation of equivalent cantilever parametersestimation as system identification

To determine 8c and 8d from equation (6), it is essentialto determine the equivalent resonant frequency ωe anddamping ce. We see that the equivalent cantilever parameters(equation (6)) depend on the slowly varying amplitude a.

It follows that if the estimation scheme is fast compared tothe evolution of the amplitude dynamics, then the dynamicsdescribed by equation (7) is a linear and time-invariantsystem in the estimation time scale. Thus the problem ofestimating equivalent cantilever parameters is transformed toidentification of a linear time-invariant system (equation (7))with the caveat that the estimation time scale should beshorter than the time scale of amplitude dynamics. In [15],the authors have reported a method (the REEP algorithm)for recursively estimating the parameters of a second-ordersystem (equation (7)). It was observed experimentally andthrough simulations [15] that with mono-frequency excitationg(t) = E sinωt it was not possible to estimate the parametersof the second-order system (equation (7)) within the desiredtime scale. It was concluded that multi-frequency forcingwill make the estimation process more robust and fasterand thus the excitation signal was chosen of the form,g(t) = γ sin(ωt) + γ+ sin(ω + 1ω)t + γ− sin(ω − 1ω)t.The magnitudes γ+ and γ− and the sideband frequencies(ω ± 1ω) are chosen to ensure that the trajectory of thecantilever is minimally altered when compared to the singlefrequency excitation while facilitating robustness in parameterestimation. It was shown in [15] that this is indeed possibleand thus the entire operation maintains a dynamic modebehavior.

The need for g to be richer than a single sinusoid impliesthat it is difficult to have g to be periodic and thus first-orderperiodic averaging [18] is no longer applicable. Thus, thevalidity of the equivalent cantilever approximation has to beanalyzed under the new excitation, which has multitones.We now analyze how much multitone excitation affects theequivalent cantilever model.

3.4. Multitone excitation

By using tools from [18], we derive the equivalent cantileverconcept for multitone excitation. The result is summarized inthe following theorem.

Theorem 3.1. Consider the dynamic system given by equa-tion (2) with forcing g(t) = A sin γ t + B1 sin(γ − α)t +B2 sin(γ + α)t, where γ is such that

ε1 = γ 2− ω2

with α = O(ε). Then the system can be approximated by thatof a linear system with equivalent damping coefficient ce(a)and equivalent resonant frequency ωe(a) (as in equation (7))forced by a input of the form g(t) with an error of O(ε) on thetime scale 1/ε.

In the derivation of the theorem, we again performa change of coordinates via equation (3), and after sometrigonometric manipulations obtain(

a

θ

)= −εF(a, θ, t, αt). (10)

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Nanotechnology 24 (2013) 265706 G Saraswat et al

Here F is a sum of finite periodic vector fields (as shownin equation (A.7)). We now introduce a new independentvariable τ = αt, where the dynamics can be written as(

a

θ

)= −εF(a, θ, t, τ )

τ = α

(11)

with appropriate initial conditions. As it is shown in appendixthat F is periodic in t over 2π/γ , we can average the systemover t keeping τ constant, which gives the averaged equations(

aav

θav

)= −εF0(aav, θav, t, τav)

τav = α

(12)

or (aav

θav

)= −εF0(aav, θav, t, αt) (13)

where F0() = (γ /2π)∫ 2π/γ

0 F() dt.It follows from [18] that aav(t)−a(t) = O(ε) and θav(t)−

θ(t) = O(ε) on the time scale 1/ε. After averaging F over theperiod 2π/γ , and again with the approximation 2γ ≈ γ + ω,we arrive at the averaged equations, given by

a = −ce(a)a

2m−

[cos θ

2(A+ (B1 + B2) cosαt)

+sin θ sinαt

2(B2 − B1)

]θ = ωe(a)− ω +

1aγ

[sin θ

2(A+ (B1 + B2) cosαt)

−cos θ sinαt

2(B2 − B1)

](14)

where ωe and ce are again given by equation (6). Comparingequation (14) to equation (5), the effect of multiple sineexcitation is clear in terms of extra terms in the (a, θ)dynamics. As in the case of single sinusoid excitation,by reverting the dynamics of equation (14) in the (a, θ)coordinates to the original (p, p) coordinates, equation (7)can be recovered. This corroborates the equivalent cantilevermodel for multitone excitation and consequentially thevalidity of the REEP algorithm. Even with the multitone input,we see that the relationship between the equivalent parameters(ωe and ce) and sample properties (through 8d and 8c) remainunchanged.

Further simulations were done to validate these resultusing the piece-wise linear model of equation (8). The freeair amplitude was again chosen to be 24nm, and squarepulses of 1 nm to the tip–sample interaction length wasgiven as a sample. Equations (5) and (14) were solvedsimultaneously and the difference in trajectories determinedvia averaged equations; the results of a comprehensivenon-linear simulation are described in figure 5. It is seen thatthe steady state rms error of multitone averaging equations

Figure 5. Simulation results for the difference in steady statetrajectories of an actual simulation with monotone averagedequations and averaged equations with multitone excitation for astep input of 1 nm. Clearly, multitone averaging is able to betterapproximate the trajectories.

is less (≈60% less) when compared to the mono-frequencyaveraging equations. A detailed derivation of the theorem 3.1is given in supporting material.

4. Recursive estimation of equivalent parameters

In the previous section, the concept of equivalent cantileverwas corroborated for the multi-frequency excitation whichis required for estimation of equivalent parameters. Now,we present the details of the REEP algorithm. A generalschematic of REEP [15] setup is shown in figure 6. Thecantilever is excited with a sum of three sinusoids via ditherpiezo. Apart from the central frequency of excitation (whichis at or close to the first modal resonant frequency of thecantilever), two side frequencies are chosen to provide enoughfrequency content to the deflection signal ascertaining the fastconvergence of recursive algorithm. Amplitudes of these sidebands are set such that the orbit of the cantilever deflectiondoes not differ much from nominal dynamic mode operation.A general discretized second-order dynamics that representsthe equivalent cantilever can be written as,

e(n) = ϑ(n)+ b1ϑ(n− 1)+ b0ϑ(n− 2)

u(n) = a2g(n)+ a1g(n− 1)+ a0g(n− 2)

p(n)+ b1p(n− 1)+ b0p(n− 2) = u(n)+ e(n),

(15)

where p(n) and g(n) denote the cantilever deflection anddither forcing at sampled time t = nTs where Ts is thesampling interval, ai’s and bi’s are respectively the numeratorand denominator of the second-order discrete model ofthe equivalent cantilever and ϑ(n) is zero mean whitemeasurement noise with variance σ 2

ϑ .On identification of the equivalent cantilever (plant)

at different levels of tip–sample interaction, via frequencysweep, it was observed that the coefficients a2, a1 anda0, which capture the delays in the system, do notchange much and contribute to the response of system atfrequencies considerably away from the cantilever resonance.Subsequently the values of a2, a1 and a0 are fixed to the

6

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Nanotechnology 24 (2013) 265706 G Saraswat et al

Figure 6. (a) Schematic of the REEP setup using a sum of threesinusoids as the drive signal to the cantilever. Two side frequenciesare chosen such that the orbit of the cantilever deflection does notdiffer much from the tapping mode operation. (b) Modeling thecantilever–sample interaction in tapping mode operation as a G–8interconnection, where G(iω) is the second-order cantilever beammodel and 8 is the non-linear tip–sample force. g(t), z(t), ϑ andp(t) are the dither forcing, the sample height profile, themeasurement noise and measured cantilever deflection respectively.The BCEWRLS algorithm takes g(t) and p(t) as input and providesthe estimates of the equivalent resonant frequency, fe, and qualityfactor, Qe (which can be used to calculate ke and ce directly), of thecantilever in real-time.

sample-free model values and b1, b0 are the remainingparameters to be estimated. Equation (15) can be written as

z(n) = [b1 b0]︸ ︷︷ ︸θ

[−p(n− 1)

−p(n− 2)

]︸ ︷︷ ︸

φ(n)

+e(n)(16)

where θ represents the vector of unknown parameters andz(n) = p(n) − a2g(n) − a1g(n − 1) − a0g(n − 2). Atany time instant t = nTs, past data z(k) and φ(k) for k =0, 1, . . . , n are available. In [15], an estimate θLS of θ wasdetermined recursively by solving an exponentially weightedleast square problem. Here e(n) is correlated and it dependson ϑ(n), ϑ(n− 1) and ϑ(n− 2), which results in the estimateθLS(n) converging to θ within a bias. This generates a needto derive a suitable bias correction term for the estimation.Using the principle from a recently reported method [21] for a

bias compensated recursive least square, a bias compensatedexponentially weighted recursive least squares (BCEWRLS)method was developed, as a handle on the convergence rateof the parameter estimates is also required. Derivation of theentire algorithm is included in a manuscript in preparation,which is attached, for submission to IEEE Transactions onCircuits and Systems.

4.1. Verification of the REEP estimates

To verify the convergence of REEP estimates to the actualequivalent parameters, simulations were performed usingthe piece-wise linear model (equation (8)) of tip–sampleinteraction. In the simulation environment, we have accessto the non-linear forcing, the instantaneous amplitude, andcantilever’s natural parameters, which can be used to calculatethe equivalent parameters at different tip–sample separationfrom equation (6). Since REEP and averaging theory aretwo separate methods to find the equivalent parameters, theircomparison can be used to validate both or either of the twotheories.

For simulations, the off-sample cantilever model wasassumed to have a resonant frequency of 80.318 kHz, a qualityfactor of 168 and a free air amplitude of 28 nm. For the resultsprovided here, non-linear tip–sample force parameters werechosen such that interaction was predominantly repulsive.Tip–sample separation was reduced from 28 nm to 8 nm andthen increased back to 28 nm in the approach–retract cycle.

Figure 7 shows the phase, estimated resonant fre-quency and estimated quality factor versus amplitude inthe approach–retract cycle performed. As the tip–sampleinteraction force changes from net attractive to significantlynet repulsive, a sudden jump in the cantilever model betweenstable branches of the net attractive and net repulsive occurs,which is visible in figure 7. The blue curve estimatesare obtained using the REEP algorithm and the red curveestimates are obtained analytically using the equations ofaveraging theory. It can be seen from these plots that thetwo independent equivalent resonant frequency and qualityfactor estimates match quantitatively. The slight deviationbetween the two estimates at low set points of amplitude ismost likely because the averaging theory is valid under gentleinteractions that might not hold at low setpoints. Simulationswere also done for the two cases when the interaction ispredominantly attractive and when the interaction is neitherpredominantly attractive nor repulsive. They showed similaragreement as well, as seen from figures B1 and B2 (providedin supporting information available at stacks.iop.org/Nano/24/265706/mmedia).

4.2. Off-line experimental results

Here a silicon cantilever, AC240TS, from Olympus withresonance frequency 78.837 kHz and spring constant 2 N m−1

(calculated using equi-partition method after taking a thermalresponse) was used to evaluate the efficacy of the method.Experiments were performed on different polymer samplesand the dither and deflection signals were sampled at

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Nanotechnology 24 (2013) 265706 G Saraswat et al

Figure 7. Figure shows (a) phase (b) equivalent resonant frequency and (c) equivalent quality factor of the cantilever versus amplitudecurves during the approach–retract cycle of the tip–sample separation. The phase plot indicates that the tip–sample interaction is netattractive at low interaction levels while it is net repulsive at higher interaction levels during the approach–retract cycle. The cantileveramplitude also jumps from the stable attractive branch to the stable repulsive branch and vice-versa during the force curve. This behavior isconsistent in all the three figures. The jump locations and magnitudes are also captured in both the algorithms. Red plots are obtained fromaveraging theory while the blue plots are obtained from the REEP algorithm.

500 kHz simultaneously. The sampled data was used to obtainestimates of ke and ce off-line on MATLAB. Equation (6)was used to calculate 8d and 8c. The sampled deflectionsignal was demodulated in MATLAB and the instantaneousamplitude was used to determine 8D. Figure 8(a) plots8D versus amplitude during an approach–retract cycle fortwo different polymers, PBMA and PLMA. It shows theagreement between the power dissipated as estimated byREEP and via analytical means [22] for experimental dataobtained for both polymers. The data confirms that the REEPmethod does indeed provide good estimates of the powerdissipated.

The real utility of the REEP algorithm is the simultaneousdetermination of the local stiffness of the sample and the localdissipation, which is evident in the 8c and 8d images of aSIBS (see section 2) block copolymer (see figures 8(c) and(d)), where the data was collected off-line and the equivalentparameters estimated off-line. 8c and 8d were determinedfrom the equivalent parameters. The net power dissipated dueto interaction with the sample depends on the extent of thesample deformation caused by the intermittent contact withthe tip; more compliant samples will lead to large deformationwhereas stiffer samples will lead to smaller deformation.Thus the contrast in the phase image is a combination of theintensive dissipativity and the compliance of the material. Theexperimental data in figure 8 indicates that the contrast in thephase image is caused by the different stiffness of styreneand isobutylene and less likely due to changes in intensivedissipative properties. These results indicate that simultaneousdetermination of local stiffness and damping will enable newcapabilities toward understanding material properties. It isto be noted that this is the first time both dissipative aswell as conservative power (also, the local stiffness and localdamping coefficient) are being obtained in a dynamic modeinvestigation.

As mentioned earlier, the rate of convergence of estimatesof the equivalent parameters is faster than the rate of evolutionof amplitude dynamics, this facilitates real-time estimation ofthese properties. Real-time implementation of the algorithmon a hardware module is presented next.

Figure 8. (Experimental data; off-line) (a) Comparison of powerdissipated as determined by 8D from REEP and via an analyticalmethod described in [22] for two polymers PLMA and PBMA attwo different locations for each polymer. It is known that PBMA isless dissipative than PLMA, as confirmed with the results shown.(b) the phase image (c) 8c image (d) 8d image of a SIBS blockcopolymer. The image size is ≈0.05 µ× 1 µ, stretched in y-axis bya factor of 2 to increase clarity. Note the high contrast thatdifferentiates the domains of styrene (about 10 nm in width) onisobutylene is high in the phase image. The contrast in the 8c imagethat characterizes the conservative (reactive) power is high;however, the contrast is minimal in the dissipative powercharacterized by 8d. Thus isobutylene and styrene have similardissipative characteristics but different stiffness.

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Nanotechnology 24 (2013) 265706 G Saraswat et al

Figure 9. Block diagram of the real-time hardware module.

5. Real-time implementation

Over the course of multiple experiments, cantilever dynamicschange and often the cantilever has to be changed. Itis desirable to have the ability of changing the moduleparameters in an easy fashion to incorporate any change inthe cantilever dynamics. The FPGA based solution offersreconfigurable hardware which facilitates design reuse and ahigh-bandwidth implementation. The design parameters canbe changed easily. Xilinx Virtex 2-Pro30 board from AvnetInc. was used to implement the algorithm.

5.1. Individual blocks

Figure 9 provides a schematic of various blocks of the modulewhich were synthesized. A brief description of each block isgiven below.

• REEP Block: This is the main block running the recursivealgorithm.• Biquad Filters: For input conditioning, two high-pass filters

were needed. Mostly to remove any drift and/or DCbias in the inputs (deflection signal and dither forcing).Two low-pass filters to remove high-frequency contentof estimated b0 and b1 were also needed. Total of 4biquad filters (based on Sallen-key architecture) wereimplemented.• ωe − Qe block: This block implements equation of

converting discrete parameters, b0 and b1, to continuoustime estimates of equivalent resonant frequency ωe andequivalent quality factor Qe.• ADC and DAC blocks: Analog-to-Digital Converters

(ADC) and Digital-to-Analog Converters (DAC) were usedto interface Digital Hardware with Analog signals of AFM.

Due to the need for high precision, algorithm wasimplemented in floating point representation using theopen source floating point library FPLibrary-v0.94. Insection 6, we document testing of the module while imagingPBMA–PLMA polymer blend with MFP-3D.

6. Experiments and results

Experiments were performed on PBMA–PLMA polymerblend. An Olympus cantilever (AC160TS) with resonance

frequency 334.7 kHz, spring constant 36 N m−1 (determinedusing the thermal response of the cantilever) and qualityfactor of 491 was used on a MFP-3D, AFM. The FPGAmodule with a closed-loop bandwidth of 1.5 MHz wasable to estimate the parameters of the equivalent cantileveraccurately. Figures 10(a) and (b) show a comparison ofthe parameters as estimated off-line using MATLAB and asestimated by the FPGA based real-time module. The resultsshow a good match on the estimation of the equivalentresonant frequency fe(=ωe/2π) and equivalent quality factorQe determined while performing an approach–retract cycleon the PLMA polymer. Here, the dither excitation signalconsisting a sum of three sinusoids was generated externallyand fed to both the AFM and the FPGA. The deflection signalfrom AFM was buffered and supplied to the FPGA.

For imaging purposes, internal data acquisition channelsof MFP-3D were used to save the two estimated parametersalong with height, amplitude and phase image. Once theimaging was done, 8c and 8D images were directly obtainedfrom fe,Qe and amplitude images using simple arithmeticof equation (6). Figure 10 further illustrates the results of a20 µm × 20 µm scan of a PBMA–PLMA polymer blend,where Figures 10(c)–(f) show images of fe,Qe, 8c (−8cwas plotted as the conservative force is negative) and 8Drespectively. Similar to the observations in [23], three differenttypes of domains are observed. The small circular domainsapproximately 200 nm in diameter are formed by the polymerPBMA. The intermediate circular domains (with diameter≈500 nm) and the large circular domains (with diameter inthe range 1–4 µm) are formed by the polymer PLMA.

For the three polymer domains, an estimate of the averagestiffness and dissipation values was determined from the 8cand 8d values at ten different locations of each domain.Figures 11(a) and (b) plots the mean together with thestandard deviation of 8c and 8d respectively for each ofthe three domains. Both types of PLMA domains showedhigher dissipation than PBMA as seen from figure 11(b),which is consistent with the observation in [23]. As evidentfrom figure 11(a), PLMA domains showed relatively lowercontact stiffness compared to PBMA, which is expectedas PLMA is rubbery at room temperature whereas PBMAis glassy. Unexpectedly, intermediate size PLMA domainsshow relatively higher stiffness. We speculate that the higherstiffness of the intermediate sized PLMA domains is dueto sub-surface PBMA. We will investigate the reasonsfor the unexpected higher stiffness of intermediate sizedPLMA domains by using the real-time module to estimatethe stiffness for different levels of tip–sample interaction(different levels of tip–sample interaction can be achieved byaltering the set-point amplitudes).

From these experiments, it is established that thedeveloped module is able to provide real-time simultaneousestimates of stiffness and dissipation properties of the sample.We remark that the traditional images of height, phase andamplitude can be simultaneously obtained together (shownin figure B3 included in SI available at stacks.iop.org/Nano/24/265706/mmedia) with the stiffness and dissipation images.Such a capability provides a rich source for researchers

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Figure 10. Figure shows (a) equivalent resonant frequency and (b) equivalent quality factor versus amplitude ‘approach–retract’ curve onPLMA polymer as calculated from Matlab (Off-line, green curve) and FPGA module (real-time, blue curve). Both curves match each other,verifying the estimates determined by real-time module. (c) and (d) shows 20 µm× 20 µm images of equivalent resonant frequency (fe) andequivalent quality factor (Qe) of PBMA/PLMA polymer blend respectively. fe,Qe and amplitude image (shown in figure B3(b) included inSI available at stacks.iop.org/Nano/24/265706/mmedia) were used to determine 8c (in N) and 8D (in Joules). They are depicted in figure(e) and (f) respectively.

Figure 11. Figure shows mean (a) −8c and (b) 8D of PBMA and PLMA polymers. The 1st data point is for PBMA domains and the 2ndand 3rd data points are for intermediate size and large size PLMA domains respectively. It is clear that both types of PLMA domains havelower stiffness and higher dissipation as compared to the smaller PBMA domains.

to interpret and discern material properties and to discernsources that lead to these properties.

7. Conclusion

Recent capabilities of controlling matter at the nanoscalehave lead to new possibilities of achieving functionalityof material with hitherto unparalleled specificity. Sucha quest for designing material at the nanoscale hasprovided renewed urgency for real-time methods fordetermining material properties at the nanoscale. Probebased instruments have a spatial resolution that is wellsuited for nanoscale interrogation. However, currently there

is a lack of methods for soft-matter investigation withtemporal resolution compatible with real-time needs. In thispaper we report a method for simultaneously determiningelasticity, dissipativity, and topography of material at thenanoscale in real-time in a dynamic mode operation of atomicforce microscopy, which renders it suitable for soft-matterinvestigation. We demonstrate that averaging/perturbationanalysis can be fruitfully employed to envision the possiblecomplex system of a probe interacting with the sample as alinear and time-invariant (LTI) system with parameters thatare governed by the dissipation and stiffness of the material.Such a model holds in a time scale smaller than that ofthe amplitude dynamics. Furthermore we have demonstrated

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Nanotechnology 24 (2013) 265706 G Saraswat et al

that a real-time adaptive estimation of the parameters of themodel can be realized within the time-scale in which the LTIassumption holds. We have demonstrated the efficacy of themethod, which is implemented on a FPGA based hardwaremodule for imaging a polymer blend. The preliminary studyof the polymer blend illustrates the new found capabilities forsoft-matter research made possible by the methods developedhere.

The equivalent LTI model and the time-scale of itsvalidity might also allow for determination of materialproperties such as electrical and thermal properties. Moreover,recently, multiple modes of the cantilever flexure arebeing employed for nanoscale investigation. The paradigmdeveloped in this paper along with the recent work onhigher mode contributions [24] provides a framework forgeneralizing the methods developed here for such extensionsand is a topic of future research.

Acknowledgments

This research was supported by National Science Foundationunder grant ECCS-1202411, awarded to Murti Salapaka andGreg Haugstad.

Appendix. Proof of theorem 3.1

Equation (2) can be written as

p+ ω2p = εf (p, p)+ εE(t) (A.1)

where

f (p, p) =−cp+ φ(p, p)

m; E(t) = g(t)/m. (A.2)

Change of coordinates, as in equation (3) gives

a = −ε

γ[1a cos(γ t + θ)+ f (p, p)+ E(t)] sin(γ t + θ)

θ = −ε

aγ[1a cos(γ t + θ)+ f (p, p)+ E(t)] cos(γ t + θ).

(A.3)

Here f (p, p) = f (a cos(γ t + θ),−aγ sin(γ t + θ)) isperiodic with period 2π/γ . Equation (A.3) is exact, that isthere are no approximations, and the vector field is the sum offinite periodic fields, that is:(

a

θ

)= −εF(a, θ, t) =:

(F1(a, θ, t)

F2(a, θ, t)

)(A.4)

where F is sum of finite periodic vector fields. Thus averagingapplies. Now,

g(t) sin(γ t + θ) = [A sin γ t + B1 sin(γ − α)t

+ B2 sin(γ + α)t] sin(γ t + θ)

which gives

g(t) sin(γ t + θ) =cos θ

2[A+ cosαt(B1 + B2)]

+sin θ sinαt

2(B2 − B1)

−cos(2γ t + θ)

2[A+ cosαt(B1 + B2)]

+sin(2γ t + θ) sinαt

2(B2 − B1)

=: f1(t, αt, θ). (A.5)

Similarly,

g(t) cos(γ t + θ) = −sin θ

2[A+ cosαt(B1 + B2)]

+cos θ sinαt

2(B2 − B1)

+sin(2γ t + θ)

2[A+ cosαt(B1 + B2)]

+cos(2γ t + θ) cosαt

2(B2 − B1)

=: f2(t, αt, θ). (A.6)

This gives

F1(a, θ, t) =1γ[1a cos(γ t + θ)+ f (p, p)] sin(γ t + θ)

+1γ ε

f1(t, αt, θ)

F2(a, θ, t) =1

aγ[1a cos(γ t + θ)+ f (p, p)] cos(γ t + θ)

+1

aγ εf2(t, αt, θ).

(A.7)

So equation (A.4) can be written as(a

θ

)= −εF(a, θ, t, αt). (A.8)

Let us introduce the new independent variable τ = αt,then the system can be written as(

a

θ

)= −εF(a, θ, t, τ )

τ = α

(A.9)

with appropriate initial conditions. As F is periodic over2π/γ , we can average the system over t, keeping τ constant,which gives the averaged equations(

˙aav

˙θav

)= −εF0(aav, θav, t, τav)

˙τav = α

(A.10)

or (˙aav

˙θav

)= −εF0(aav, θav, t, αt) (A.11)

where F0() = (γ /2π)∫ 2π/γ

0 F() dt.

Then from [18], we have aav(t) − a(t) = O(ε), andθav(t) − θ(t) = O(ε) on the time scale 1/ε. After averagingF over the period 2π/γ , and making the approximation

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Nanotechnology 24 (2013) 265706 G Saraswat et al

2γ ≈ γ + ω, we finally get

a = −ce(a)a

2m−

[cos θ

2(A+ (B1 + B2) cosαt)

+sin θ sinαt

2(B2 − B1)

]θ = ωe(a)− ω +

1aγ

[sin θ

2(A+ (B1 + B2) cosαt)

−cos θ sinαt

2(B2 − B1)

](A.12)

where the equivalent damping coefficient ce and resonantfrequency ωe are again given by equation (6). The solution isequivalent to that of a linear system with damping coefficientce and resonant frequency ωe forced by a input of form g(t),thus further bolstering the equivalent cantilever concept formultitone excitation.

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