psi test report april 2011
DESCRIPTION
PSI test REPORT APRIL 2011. G. Spiezia, P. Peronnard (EN/STI/ECE). Outline. Devices under tests Experimental setup Beam setup and results Conclusions. Devices under test. Setup. PIF facility at PSI 230 MeV proton beam Flux: up to 1.65E+08 p/cm 2 /s Experiment - PowerPoint PPT PresentationTRANSCRIPT
PSI test REPORT APRIL 2011
G. Spiezia, P. Peronnard (EN/STI/ECE)
Outline
Devices under testsExperimental setupBeam setup and resultsConclusions
Devices under testDUT name DUT type HFE0 Ic Vce0
BCP56 NPN Transistor 63-250 1A 80V
DUT name DUT type HFE0 Ic Vce0
BSR17A NPN Transistor 30-300 200mA 40V
DUT name DUT type HFE0 Ic Vce0
BCP53 PNP Transistor 25-250 1A 80V
DUT name DUT type HFE0 Ic Vce0
BSR18A PNP Transistor 30-300 200mA 40V
DUT name DUT type If - Emitter Io - Detector Supply voltage
HCPL2601 Optocoupler 50mA 50mA 5V
DUT name DUT type Sampling rate Input range Supply voltage
MAX11046 16-bit 8ch ADC 250ksps +-5V 5V analog – 3V3 digital
SetupPIF facility at PSI
230 MeV proton beamFlux: up to 1.65E+08 p/cm2/s
Experiment Power supply E3633A for the input signal and the
supply voltage to monitor the Single Event Latch up (SEL)
Power supply E3648A (double output) for powering the DUT
Tektronix DPO7254 oscilloscope (2.5GHz, 40GS/s) to monitor Single Event Transient (SET)
Data Acquistion Switch Unit Agilent 34970A for monitoring the DUT outputs. 8 channels were sequentially monitored (up to 32).
Setup
GUI interface for remote control and logging
GPIB Instruments
Ethernet to GPIB
DUT Ethernet switch
BEAM Actel Evaluation Board for digital DUT
RS232 serial link
Schematics
BCP56/BSR17 – 8 transistors on the test board
Schematics
BCP53/BSR18A – 8 transistors on the test board
Schematics
HCPL2601
Schematics
MAX11046
Test methodology for the ADCAn off-line calibration is done
For each channel, the min and max values are stored in a register file
The beam is enabledThe FPGA checks if a sample is outbound, if yes, the
sample is sent to the control PCChannels 0 to 3 were set to 2.5V with a power supply
(use of a calibrator would be better but not practical)Channels 4 to 7 were set to 0V with a short-circuit
NB: no external memory is available on the evaluation board. It is not yet possible to get an histogram of the samples. The obtained results are preliminary.
Beam RunRun # DUT id
Energy [MeV]
Flux Fluence TID (Gy)
1 BCP53 230 1.6E+08 2.00E+11 260
2 BSR17A 230 1.6E+08 1.70E+11 201
3 BSR18A 230 1.64E+08 2.00E+10 200
4 BCP56 230 1.6E+08 3.80E+11 200
5 HCPL2601 230 1.57E+08 3E+11 165
6 HCPL2601 60 7.1E+07 4.86E+10 65
7 MAX11046 230 1.6E+08 4.82E+11 256
Results – Overview
no SET were observed with our test setup
Drift observed on the gain of the transistors and the reference output of the ADC
No destruction for the transistorNo events observed on the optocouplerThe ADC stopped to work after 200Gy
Results – BCP53
Results – BCP56
Results – BSR17A
Results – BSR18A
Results – MAX11046Channe
lMin Max Difference Calibration
0 0xC000 (0xC01B) 0xC07F (0xC021) 19,38mV 920µV
1 0xC02C (0xC01A) 0xC051 (0xC022) 5.624mV 1220µV
2 0xC02C (0xC01B) 0xC07F (0xC022) 12.616mV 1070µV
3 0xC029 (0xC01B) 0xC0E0 (0xC022) 27.816mV 1070µV
4 0x4043 (0x8000) 0xC044 (0x8004) 4.98V 610µV
5 0x4047 (0x8000) 0x800B (0x8004) 2.48V 610µV
6 0x7FED (0x8000) 0x8015 (0x8005) 6.08mV 760µV
7 0x7FF0 (0x7FFF) 0x800B (0x8004) 4.104mV 762µV
A drift of 4mV was measured on the reference pin
Conclusions No destruction and no SET were
observed for the transistors with our test setup
Drifts were observed on the gain of the transistors
The preliminary results of the ADC shown that it is sensible to SEE and it is susceptible to break after 200Gy (read values are always 0x0000 or 0xFFFF)