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The PeakForce TUNA™ module builds on Bruker’s exclusive PeakForce Tapping™ technology to provide the most complete and highest resolution property mapping to date. Available only on Bruker’s Dimension ® Icon ® and MultiMode ® 8 Atomic Force Microscopes (AFMs), PeakForce TUNA enables, for the first time, quantitative conductivity mapping on fragile samples, such as organic photovoltaics, lithium ion cathodes, and carbon nanotube assemblies, while eliminating the adverse effects caused by sample damage and tip contamination. Extending Nanoscale Electrical Characterization Highest resolution current mapping on the most fragile samples Unmatched repeatability and consistency in nanoelectrical measurements Correlated nanomechanical and nanoelectrical properties The Challenge Nanoscale electrical properties are key parameters in many research areas, from solar energy organic photovoltaic compounds and OLED applications to next-generation electrical devices built on nanoscale building blocks. Though unique in its ability to provide high-resolution nanoscale characterization, atomic force microscopy has for the most part been unable to address these parameters quantitatively with conventional techniques. Conventional AFM conductivity mapping is based on contact mode, which involves lateral forces and leads to sample damage and tip contamination. The result is low spatial resolution and artifacts that mask the desired information. The Breakthrough The PeakForce TUNA module solves the problems of conventional conductivity mapping and provides direct, precise force control and the complete elimination of lateral forces. Nanoelectrical Application Module PeakForce TUNA Innovation with Integrity Atomic Force Microscopy

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The PeakForce TUNA™ module builds on Bruker’s exclusive PeakForce Tapping™ technology to provide the most complete and highest resolution property mapping to date. Available only on Bruker’s Dimension® Icon® and MultiMode® 8 Atomic Force Microscopes (AFMs), PeakForce TUNA enables, for the first time, quantitative conductivity mapping on fragile samples, such as organic photovoltaics, lithium ion cathodes, and carbon nanotube assemblies, while eliminating the adverse effects caused by sample damage and tip contamination.

Extending Nanoscale Electrical Characterization

Highest resolution current mapping on the most fragile samples

Unmatched repeatability and consistency in nanoelectrical measurements

Correlated nanomechanical and nanoelectrical properties

The Challenge

Nanoscale electrical properties are key parameters in many research areas, from solar energy organic photovoltaic compounds and OLED applications to next-generation electrical devices built on nanoscale building blocks. Though unique in its ability to provide high-resolution nanoscale characterization, atomic force microscopy has for the most part been unable to address these parameters quantitatively with conventional techniques. Conventional AFM conductivity mapping is based on contact mode, which involves lateral forces and leads to sample damage and tip contamination. The result is low spatial resolution and artifacts that mask the desired information.

The Breakthrough

The PeakForce TUNA module solves the problems of conventional conductivity mapping and provides direct, precise force control and the complete elimination of lateral forces.

Nanoelectrical Application ModulePeakForce TUNA

Innovation with IntegrityAtomic Force Microscopy

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Li Battery Example OPV Example Nanotube Example

Simultaneous mapping of nanomechanical and nanoelectrical properties on Lithium ion cathode (L333). Sample courtesy of Dr. Battaglia, LBL.

High-resolution conductivity map of organic photovoltaic (PEDOT-P3HT), overlaid on topography. Current range is 5pA, the height range is 10nm, and the image size is 2µm. Sample courtesy of Prof. Nguyen, UCSB.

The PeakForce Advantage

Peakforce TUNA provides current imaging with the highest sensitivity while maintaining the highest spatial resolution on the most fragile sample and simultaneously providing correlated mechanical property information on the same sample location. It is able to do this through a combination of the PeakForce Tapping technique and an innovative, high-bandwidth (>10kHz for 1010 V/A stage) yet low-noise (<100fA, cycle averaged, imaging bandwidth) current amplifier that provides access to the full fA to µA current range without changing module or probe holder. Other benefits include dramatically improved ease of use with ScanAsyst™ Imaging Mode, and highest resolution quantitative nanomechanical property mapping with PeakForce QNM™ Imaging Mode.

Enabling You to Discover More

Lithium Batteries — Among the critical factors determining the performance of a Lithium battery is the formation of the cathode composite. Rationally optimizing processing conditions requires knowledge of the actual nanoscale phase separation and associated local electrical properties. The image on the left above shows PeakForce TUNA images acquired on L333-glue composite. A clear correlation can be seen between Young’s modulus, adhesion, and current

maps. Materials can be assigned and their dispersion determined. Analysis shows that a conductive network has formed in the PVDF+AB region with an overall coverage of 56%.

Organic Photovoltaics — Future applications of organic photovoltaic (OPV) materials, e.g., in solar energy generation, depend on further gains in their energy conversion efficiency. Due to the bulk heterojunction structure of OPVs, their efficiency depends on the interfacial charge separation (exciton dissociation) and subsequent transport along nanoscale conductive pathways and therefore on the nanoscale phase separation. The center image above shows a high-resolution conductivity map of PEDOT-P3HT. Local current maxima (yellow) provide evidence of partially sub-surface conductive networks.

Carbon Nanotubes — Recent years have witnessed an explosion of available nanoscale building blocks and proposals for building future devices out of them. Carbon nanotubes have received particular attention. Their sensitivity to lateral forces makes them notoriously difficult to image with conventional AFM approaches. The third image above shows topography and current maps on such a carbon nanotube sample. The determination of conductivity for individual carbon nanotubes indicates their state of electrical connectivity with a macroscopic electrode.

Cover imagesForeground: The PeakForce TUNA module on Dimension Icon scanner.Background: High-resolution conductivity map of organic photovoltaic (PEDOT-P3HT:PCBM), overlaid on topography (image size 3µm).

Height

Adhesion

Modulus

Current

Height (top) and current (bottom) maps revealing electrical connectivity on fragile carbon nanotube sample that is not amenable to contact mode imaging. Sample courtesy of Prof. Hague, Rice University.