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MAPAN - Journal of Metrology Society of India, Vol. 26, No. 1, 2011; p. 1

PrefaceIt is our pleasure to introduce this special issue of MAPAN on the theme of Length and Dimensional

Metrology. It is only possible through measurements to verify, improve and ensure the product quality. Qual-ity assurance in production engineering is much more than the simple length measurement which may becategorized as coordinate metrology, laser interferometery, form and surface metrology and use of optical andnew physical methods, e.g. scanning probe microscopes. Dimensional metrology basically deals with dimen-sional parameters from nano-micro-macro level measurements for microsystems technology and the aircraftindustry. The readers of this issue will find many interesting and important research articles to understandhow the length and dimensional metrology play essential role and is the underpin of the development ofcurrent manufacturing industry. The most prominent task of a National Metrology Institute (NMI) is therealization and dissemination of the SI units to users. This issue comprises of selected papers exemplarilydealing with these tasks and needless to say implicating traceability aspects. The first paper is a review articlecontributed by Prof. Takamasu of Tokyo University, Japan highlighting an overview of the current situation ofthe dimensional metrology and problems which restrain the accuracy. Optical techniques are very commonand effective for the length and dimensional metrology and two papers are related to the optical measure-ments. An Indian researcher proposes a new technique to measure the size and spacing of the sieves usingimage processing and another Indian researcher presents a technique to calibrate polygons. Uncertainty hasalso been a significant topic in all fields of metrology. Several papers treated this topic for coordinate androundness measurements. A Japanese researcher describes gears which are one of the most conventional butimportant parts in industries particularly in automotive industry. An interesting topic to measure 3D shapeusing SEM is explained by another Japanese researcher. Finally a deep consideration is made by a Taiwaneseresearcher on the traceability which is a crucial issue in metrology. Finally as guest editors, we would like toextend our sincere gratitude to the authors who have contributed to this special issue on Length and Dimen-sional Metrology. We would also like to thank the Publication and Information Committee of MetrologySociety of India for inviting us to be the guest editors of this reputed journal.

Guest editors

TOSHIYUKI TAKATSUJIDeputy Director

NMIJ, Japan

K.P. CHAUDHARYNational Physical Laboratory (NPLI)

New Delhi, India

PREFACE

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MAPAN - Journal of Metrology Society of India, Vol. 26, No. 1, 2011; p. 2

Dr. Toshiyuki Takatsuji completed his graduate and master degrees in 1988 and1990, respectively from Kobe University, Japan. His master degree was on speckleinterferometry and nonlinear optics. After joining the National Research Laboratory ofMetrology (NRLM), he studied on statistics. The NRLM was restructured to NationalMetrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Scienceand Technology (AIST) during 2001. He has also worked as Visiting Scientist at NationalMeasurement Laboratory (NML), Commonwealth Scientific and Industrial ResearchOrganization (CSIRO), Australia from 1994 to 1996. He obtained his doctorate degree fromKobe University, Japan on multidimensional measurement research of dimensional quantities during 1999.Currently, he is the deputy director of NMIJ, AIST and responsible for the administration of NMIJ research,development and services of dimensional metrology. He has published several scientific research papers,books and reviews. He was bestowed the best paper award by Japan Society of Precision Engineering (JSPE),Japan in 2006. He also received the Commendation Certificate for Science and Technology by the Minister ofEducation, Culture, Sports, Science and Technology and prizes for Science and Technology under ResearchCategory in 2009. He has also served as an expert member of ISO/TC 213 (Geometrical Products Specifications)/ WG 10 (Coordinate Measuring Machines) and as a Japanese delegate on the Consultative Committee forLength (CCL) of the International Committee for Weights and Measures (CIPM).

Dr. Krishan Pal Chaudhary received his B.Sc. degree in 1974 from Delhi University,India and M.Sc. (Physics) from Meerut University, India. He did his Post GraduateDiploma in scientific Instrumentation in 1977 from National Institute of Technology(NIT), Kurukshetra, India. After completion of his M. Tech in Instrumentation from NIT,in 1989 with distinction, he obtained his Ph. D. in Optical Metrology from Indian Instituteof Technology (IIT) Delhi, India. He joined Central Scientific Instrument Organization(CSIO) Chandigarh, India in 1980 and later on transferred to National Physical Laboratory(NPLI), New Delhi, India in 1996 as Scientist E1. At present, he is working as Scientist Gand Head, Dimension Standards in NPLI. He has published more than 57 papers in journals of repute andmore than 80 papers in international and national conferences. He has also obtained six patents / copyrightsfor his inventions. Two of his developed technologies have already been commercialized. His team has alsogiven many consultancy services to the user industries. His current research interests include optical metrologyand instrumentation. He is a Fellow member of many professional societies like SPIE, Metrology Society ofIndia, Optical Society of India, IETE, USI and CCL working group of Dimensional metrology etc.. He is anexpert member of some of the important committees of the Bureau of Indian Standards (BIS) and also chairingsome of them. He is also one of the Core Committee (accreditation committee) members of National AccreditationBoard of Laboratories (NABL), India and also a certified Technical / Lead Assessor of NABL.