overview of advanced thermal materials
TRANSCRIPT
Copyright Carl Zweben 2010 1
OVERVIEW OF ADVANCED THERMAL MATERIALS
Carl Zweben, PhD Life Fellow ASME
Fellow SAMPE and ASMAssociate Fellow, AIAA
Advanced Thermal Materials Consultant 62 Arlington Road
Devon, PA 19333-1538 Phone: 610-688-1772
E-mail: [email protected]://sites.google.com/site/zwebenconsulting
Copyright Carl Zweben 2010 2
The information in these slides is part of a short course on composite materials that is presented
publicly and in-house
Contact author for information
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OUTLINE
• Introduction• Semiconductors, ceramic substrates and
traditional thermal materials• Advanced thermal materials• Applications• Summary and conclusions• Appendix (terminology and abbreviations)
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INTRODUCTION
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INTRODUCTION
• Critical thermal management problems:– Heat dissipation– Thermal stresses cause
• Warping, fracture, fatigue, solder creep• Primarily due to CTE mismatch• An issue for all cooling methods
• Problems similar for– Microprocessors, power modules, RF– Diode lasers– Light-emitting diodes (LEDs)– Plasma and LCD displays– Photovoltaics– Thermoelectric coolers (TECs)
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INTRODUCTION (cont)
• Microelectronic thermal problems well known– Xbox 360 $1 billion “Red Ring of Death” failure
widely cited as thermal issue– Nvidia $150-200 million GPU thermal problem– “Burned groin blamed on laptop” (BBC 11//02)
• Solder thermal fatigue limits laser pulsing• Higher process temperatures for lead-free solders
– Increased thermal stresses & warping• Higher ambient temperatures
– E.g. automotive under hood
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INTRODUCTION (cont)
• Weight (mass) important– Portable systems– Vibration and shock loads
• Volume and thickness decreasing• Cooling significant part of total cost of ownership
– System– Building, data center
• System cooling power increases building cooling load
• Low-CTE “Thermount” PCB withdrawn from market in 2006– No current thin-ply replacement
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INTRODUCTION (cont)
• Traditional thermal materials inadequate– Decades old: mid 20th Century– Impose major design limitations (see later)
• In response to critical needs, an increasing number of advanced materials have been developed
• Many with ultrahigh-thermal-conductivity– k = 400 to 1700 W/m-K– Low CTEs– Low densities– R&D to high-volume production
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INTRODUCTION (cont)
• Can now match CTEs of chips, lids, heat sinks, and PCBs– Reduces thermal stresses and warping– Possibly eliminates need for underfill– Enables use of hard solder attach
• Low thermal resistance– Low-CTE solders under development
• Thermally conductive PCBs provide heat path
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CTE MISMATCH CAUSES THERMAL STRESSES
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PACKAGING LEVELS
Source: USAF (modified)
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SEMICONDUCTORS, CERAMIC SUBSTRATES AND TRADITIONAL
THERMAL MATERIALS
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SEMICONDUCTOR AND CERAMIC SUBSTRATE PROPERTIES
MATERIAL CTE (ppm/K)Silicon 2.5-4.1GaAs 5.8-6.9GaP 5.9InP 4.5-4.8SiC 4.2-4.9Alumina (96%) 6.0-7.1AlN 3.5-5.7BeO 6-9LTCC 5.8
CTE RANGE ~ 2 – 7 ppm/K
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TRADITIONAL THERMAL AND PACKAGING MATERIALS
k CTE Specific k/SGMATERIAL (W/m-K) (ppm/K) Gravity (W/m-K)Copper 400 17 8.9 45Aluminum 218 23 2.7 81“Kovar” 17 5.9 8.3 2Alloy 42 10.5 5.3 8.1 1.3W/Cu (85/15) 167 6.5 17 10Mo/Cu (85/15) 184 7.0 10 18Cu-Invar-Cu* 172* 6.7* 8.4 20Cu-Mo-Cu* 182* 6.0* 9.9 18E-glass/epoxy 0.3* 12-24* 1.6-1.9 0.2Epoxy 0.2 45-65 1.3 0.2
*Inplane isotropic (x,y)
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WHAT’S WRONG WITH TRADITIONAL THERMAL MATERIALS?
• Copper and aluminum– High CTEs
• Thermal stresses, warping• Require compliant polymeric and solder
thermal interface materials (TIMs)– Higher thermal conductivities desirable– Copper has high density
• What’s wrong with compliant polymeric TIMs?– Pump-out and dry-out for greases– High thermal resistance for most– Increasingly, the key contributor to total thermal
resistance
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WHAT’S WRONG WITH TRADITIONAL THERMAL MATERIALS? (cont)
• What’s wrong with compliant solders?– E.g. indium alloys– Process problems (voiding, poor wetting)– Poor fatigue life (low yield stress)– Creep– Intermetallics– Corrosion– Electromigration– Relatively low melting point– Cost higher than many solders
DIRECT ATTACH WITH HARD SOLDERS DESIRABLE
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• Low-CTE materials seriously deficient– E.g. alloy 42, Kovar, tungsten/copper,
molybdenum/copper, copper-Invar-copper, etc. – Conductivities < aluminum (200 W/m-K)– High densities– High cost
• CVD diamond– High thermal conductivity– Low CTE– Expensive– Thin flat plates only (i.e. CVD diamond films)
WHAT’S WRONG WITH TRADITIONAL THERMAL MATERIALS? (cont)
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ADVANCED THERMAL MATERIALS
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NEW THERMAL MANAGEMENT MATERIALS
• Many advanced materials– Various stages of development– R&D to large scale production– New ones continuously emerging
• Monolithic materials– Primarily carbonaceous (graphitic)
• Composites– Polymer matrix– Metal matrix– Metal/metal alloys-composites– Carbon matrix (e.g. carbon/carbon)– Ceramic matrix
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NEW THERMAL MANAGEMENT MATERIALS (cont)
• Al/SiC first, and most successful advanced thermal material– First used by speaker and colleagues at GE for
electronics and optoelectronics in early 1980s– New processes developed– Millions of piece parts produced annually– Part cost dropped by orders of magnitude– Microprocessor lids now $1-5 in high volume– CVD diamond and highly-oriented pyrolytic
graphite inserts increase heat spreading• “Hybrid materials” approach
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SiC-PARTICLE/ALUMINUM (Al/SiC) SUPPLIERS
v/o k CTE SpecificSupplier (%) (W/m-K) (ppm/K) GravityAmetek 68 220 7.5 3.03CPS 63 200 8.0 3.01DWA 55 200 8.8 3.00Denka - 200 7.5 2.96MC-21 20-45 150-180 10-16 2.7-2.9PCC-AFT* 70 175 7 3.01Sumitomo - 150-200 8-15 2.60-2.78TTC - 165-255 4.8-16.2 2.77-3.10
*Purchased by Rogers Corporation
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ADVANCED MATERIALS PAYOFFS
• Lower junction temperatures• Reduced thermal stresses and warpage• Simplified thermal design
– Possible elimination of fans, heat pipes, TECs, liquid cooling, refrigeration
• Increased reliability• Improved performance• Weight savings up to 90%• Size reductions up to 65%• Dimensional stability• Improved optical alignment
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ADVANCED MATERIALS PAYOFFS (cont)
• Possible elimination of underfill• Increased manufacturing yield• Reduced electromagnetic emission • Reduced power consumption• Longer battery life• Reduced number of devices (e.g. power modules,
LEDs)• Low cost potential
– Component– System– Total cost of ownership (TCO)
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DISADVANTAGES OF SOME ADVANCED MATERIALS
• Higher cost (low volumes, reinforcements)• Limited service experience• Low fracture toughness• Possible hysteresis• Ceramic materials hard to machine• Some particulate materials hard to metallize• Surface roughness and flatness• Edge sharpness (laser diodes)• Direct attach during infiltration complicates rework• Galvanic corrosion potential• Porosity (not hermetic)
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COMPOSITE MATERIAL REINFORCEMENTS
Continuous Fibers
Particles
Discontinuous Fibers, Whiskers
Fabrics, Braids, etc.
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0 20 40 60 80 100 PARTICLE VOLUME FRACTION (%)
CO
EFFI
CIE
NT
OF
THER
MA
L EX
PAN
SIO
N (p
p m/K
)
25
20
15
10
5
0
Aluminum
Copper
Beryllium
Titanium, SteelAluminaSilicon
Powder MetallurgyInfiltration
CTE OF SILICON-CARBIDE-PARTICLE-REINFORCED ALUMINUM (Al/SiC) vs PARTICLE VOLUME FRACTION
E-glass PCB
NEW MATERIAL
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Silver
Copper
Aluminum
E-glass PCB
SiC/Al (Al/SiC)
C/Al
C/Cu
C/C
C/Ep
Cu/W
Kovar
Si, GaAs, Silica, Alumina, Beryllia, Aluminum Nitride, LTCC
Si-Al
Diamond-Particle-Reinforced Metals and Ceramics
SiC/Cu
HO
PG
(170
0)
-5 0 5 10 15 20 25COEFFICIENT OF THERMAL EXPANSION (ppm/K)
THER
MA
L C
ON
DU
CTI
VITY
(W/m
K)
100
200
300
400
500
600
0 Invar
THERMAL CONDUCTIVITY vs CTE FOR PACKAGING MATERIALS
1200
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SPECIFIC PROPERTIES
• Specific property is absolute property divided by density
• Figure of merit when weight is important• If specific gravity (S.G.) is used for density,
absolute and specific properties have same units, e.g.– Thermal conductivity, k = W/m-K– Specific thermal conductivity, k/S.G = W/m-K
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Copper
Aluminum
SiC/Al (Al/SiC)
C/Al
C/Cu
C/C
C/Ep
Cu/WKovar
Si, GaAs, Silica, Alumina, Beryllia, Aluminum Nitride, LTCC
Si-Al
Diamond-Particle-Reinforced Metals and CeramicsH
OPG
(740
)
-5 0 5 10 15 20 25COEFFICIENT OF THERMAL EXPANSION (ppm/K)
SPEC
IFIC
TH
ERM
AL
CO
ND
UC
TIVI
TY
(W/m
K)
50
100
150
200
250
300
350
0
SPECIFIC THERM. COND. vs CTE FOR PACKAGING MATERIALS
Invar
670
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MODERATE-THERMAL-CONDUCTIVITY MATERIALS (k < 300)
k CTE Specific k/SGMATERIAL (W/m-K) (ppm/K) Gravity (W/m-K)Copper 400 17 8.9 45Industrial Gr 95 7.9 1.8 53Carbon Foam* 135-145 -1 0.6-0.9 220-270Disc. CF/Ep* 20-290 4-7 1.6-1.8 12-160SiC/Al (Al/SiC) 170-255 4.8-16.2 2.9-3.0 57-85Cont. CF/Al* 218-290 0-16 2.3-2.6 84-126Disc. CF/Al* 185 6.0 2.5 74Industrial Gr/Cu 175 8.7 3.1 56Beryllia/Be 240 6.1 2.6 92Be/Al 210 13.9 2.1 100Silver/Invar 153 6.5 8.8 17Si-Al 126-160 6.5-14 2.5-2.6 49-63
* Inplane isotropic values
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HIGH-THERMAL-CONDUCTIVITY MATERIALS (300 < k < 400)
k CTE Specific k/SGMATERIAL (W/mK) (ppm/K) Gravity (W/mK)Copper 400 17 8.9 45Natural Graphite/Ep* 370 -2.4 1.9 190Cont. CF/Ep* 330 -1 1.8 183Disc. CF/Cu* 300 6.5-9.5 6.8 44Carbon/carbon* 350 -1.0 1.9 210 (363)------------------------------------------------------------------------------------------Graphite Foam/Cu 342** 7.4 5.7 60SiC/Cu 320 7-10.9 6.6 48
Materials below line are experimental* Inplane isotropic values** k(z)
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ULTRAHIGH-THERMAL-CONDUCTIVITY MATERIALS (k > 400) – Part 1
k CTE Specific k/SGMATERIAL (W/m-K) (ppm/K) Gravity (W/m-K)Copper 400 17 8.9 45CVD Diamond 500-2200** 1-2 3.5 143-629HOPG* 1500-1700 -1 2.3 650-740Natural Graphite* 140-500+ -0.4 1.1-1.9 127-263------------------------------------------------------------------------------------------Cont. CF/Cu* 400-420 0-16 5.3-8.2 49-79Gr Flake/Al* 400-600 4.5-5.0 2.3 174-260GR particle/Al* 650-700 4-7 2.3 283-304
Materials below line are experimental* Inplane isotropic values ** k(z) – somewhat anisotropic
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ULTRAHIGH-THERMAL-CONDUCTIVITY MATERIALS (k > 400) – Part 2
k CTE Specific k/SGMATERIAL (W/m-K) (ppm/K) Gravity (W/m-K)Copper 400 17 8.9 45Diamond/Al 325-600 7-9 3-4 93-171Diamond/Cu 400-1200 5-8 5.5-7 62-185Diamond/Co >600 3.0 4.1 >146Diamond/Ag 550-650 5-8 6-7 85-100Diamond/SiC 600-680 1.8 3.3 182-206------------------------------------------------------------------------------------------Diamond/Si 525 4.5 - -Diamond/Mg 575 5.5 - -Diamond+SiC/Al 575 5 - -
Materials below line are experimental
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EXPERIMENTAL LOW-CTE COMPOSITE SOLDER
Matrix: Sn96.5Ag3.5
Lewis, Ingham and Laughlin, Cookson
Wt % Mo CTE(ppm/K)
Thermal Conductivity
(W/m-K)0 21 55
20 15 6840 8 7660 5.2 97100 5.1 137
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APPLICATIONS
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APPLICATIONS
• Microelectronic applications– CPU, RF, Power, etc.
• Optoelectronic applications– LEDs– Diode Lasers– Displays– Detector/sensors– Photovoltaics– Thermoelectric coolers
• Thermally conductive, low-CTE printed circuit boards
• Advanced thermal interface materials
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THE FIRST SILICON-CARBIDE-PARTICLE- REINFORCED (AL/SiC) MMC MICROWAVE PACKAGE
Source: GE
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SUMMARY AND CONCLUSIONS
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SUMMARY AND CONCLUSIONS
• Thermal management now critical problem for microelectronics and optoelectronics
• Traditional thermal materials inadequate– Mid-20th century
• Low-CTE, low-density materials with thermal conductivities up to 1700 W/m-K available
• Can now match CTEs of chips, lids, heat sinks, and PCBs– Reduces thermal stresses and warping– Possibly eliminates need for underfill– Enables use of hard solder attach
• Low thermal resistance
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SUMMARY AND CONCLUSIONS (cont)
• Several advanced materials well established– SiC particle/aluminum– Silicon-aluminum– Carbon fiber/polymer– Natural graphite– Pyrolytic graphite sheet– Highly-oriented pyrolytic graphite
• Diamond composites used in production microelectronic and optoelectronic systems
• Short (2-3 year) cycle from introduction to production demonstrated
• Applications increasing steadily
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WE ARE THE INFANCY OF APACKAGING MATERIALS REVOLUTION
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APPENDIX
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TERMINOLOGY
• Homogeneous– Properties constant throughout material
• Heterogeneous– Properties vary throughout material– E.g. different in matrix and reinforcement– Composites always heterogeneous
• Isotropic– Properties the same in every direction
• Anisotropic– Properties vary with direction
• Inplane isotropic (transversely isotropic)– Properties the same for every direction in a
plane (different perpendicular to the plane)
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ABBREVIATIONS
• C: carbon• CAMC: carbon matrix composite• CCC: carbon/carbon composite• C/C: carbon/carbon• CF - carbon fiber• CMC: ceramic matrix composite• Cond: conductivity• Cont: continuous• CTE: coefficient of thermal expansion• Dens: density• Disc: discontinuous
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ABBREVIATIONS (cont)
• Elect: Electrical• Ep: epoxy• HOPG: highly oriented pyrolytic graphite• Gr: graphite• MMC: metal matrix composite• PAN: polyacrylonitrile• PCB: printed circuit board• Pitch: carbonaceous petroleum or coal byproduct • PMC: polymer matrix composite• LTCC: low-temperature cofired ceramic• Mod: modulus
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ABBREVIATIONS (cont)
• PGS: pyrolytic graphite sheet• SG, S.G.: specific gravity• SiCp: Silicon carbide particle• TEC: thermoelectric cooler• Therm: thermal• UHM: ultrahigh modulus• UHS: ultrahigh strength