NIR Sensor Technology-Spectroscopy

• Moving Grating-Scanning Monochromator

• AOTF• MEMS• FTIR• Filter Photometer• Fixed Grating-Diode ArrayFixed Grating-Diode Array

Acquisition Time

• FTNIR ~ 8 seconds• AOTF~10 seconds• NIR Diode Array~1 sec or less• Scanning Monochromator~30

seconds • 50 X 20 msecs = 1 sec

In presentation by Martin Warman, Pfizer, Inc. at IFPAC 2004

Types of NIR Spectrometers

• Scanning Devices• Moving Grating-

Scanning Monochromator

• AOTF• MEMS• FTIR

• Non-Scanning Devices

• Filter Photometer

• Fixed Grating-Fixed Grating-Diode ArrayDiode Array

Multiple-sensor detection (CCD’s, diode arrays)

An avenue to avoid interference and ambiguity

SampleFor the following unit operations:

1. Blending

2. Coating

3. Drying

4. Granulation

5. Roller Compaction

6. On-Line Content Uniformity

The Sample is Moving!

Resolution & Spectral Range

•How much resolution do you need?

•What are spectral signatures of the materials you are looking at typically in the NIR spectral range?

•What spectral range is adequate?

NIR Diode Array Specifications

No of Pixels Spectral Range nm

Resolution nm

128 900-1700 6.5

256* 900-1700 3.25

512 900-1700 1.6125

1024 900-1700 0.8

Standard InGaAs – 1.7 micron

* Most popular choice

NIR Diode Array Specifications

No of Pixels Spectral Range nm

Resolution nm

128 1100-2200 8.8

256* 1100-2200 4.4

512 1100-2200 2.2

1024** 1100-2200 1.1

Extended InGaAs – 2.2 micron

* Most popular choice **Not readily available

Other Desirable Features

•Ruggedness

•Diode Array spectrometers have no moving parts

•Ease of use

•Low Maintenance

Unique Features of CDI NIRS Automated built in references for wavelength

and amplitude, can add customer specific references

Do not have to remove from vessel to do OQ, can be done on the fly, even during experiment

Meets USP 1119 specifications-generates report

Dual redundant light source All in one package, Class I Div II, EP available

Instrument Rating PentagonScore: 0 = low; 5 = high

Cost

Robustness Index

Ease of useRichnessof data

Speed ofAcquisition

1998

1998