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NFC (Near Field Communication) TEST & MEASUREMENT Instruments SOLUTIONS

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NFC (Near Field Communication)

TEST & MEASUREMENT

Instruments SOLUTIONS

INTRODUCTIONNear field communication (NFC) traces its roots back to

radio-frequency identification (RFID). Indeed, NFC is

actually a subset of RFID with a shorter communication

range for security purposes. It is a form of contactless

communication between devices like smartphones or

tablets. Contactless communication allows a user to

wave the smartphone over a NFC compatible device to

send information without needing to touch the devices

together or go through multiple steps setting up a

connection.

The technology behind NFC allows a device, known as a reader,

interrogator, or active device, to create a radio frequency current that

communicates with another NFC compatible device or a small NFC tag

holding the information the reader wants. Passive devices, such as the

NFC tag in smart posters, store information and communicate with the

reader but do not actively read other devices. Peer-to-peer communication

through two active devices is also a possibility with NFC. This allows both

devices to send and receive information.

Agilent E5072A ENA Series

Network Analyzer

NFC Testing on Production Line

R&S FSL3/ FSL313 Spectrum Analyzer, 9 kHz to 3 GHz, with

Tracking Generator

Litepoint IQnfcNear Field Communication Test

System

Near Field Communication (NFC) is standards-based, short range communication technology that integrates Radio

Frequency Identification (RFID) technology with mobile communication devices (e.g., smartphones, tables and

eReaders) and the wireless Internet infrastructure. NFC-enabled devices establish radio communication by touching

or coming into close proximity with one another. When testing NFC components or devices, both analog (RF) and

digital (protocol) tests must be performed. Analog tests measure such things as power levels, waveform quality,

frequency accuracy, and modulation, while digital tests check for things like low-layer protocol exchanges, link

timings and framing, as well as higher level protocols layers like Logical Link Control Protocol (LLCP) and Simple

NDEF Exchange Protocol (SNEP). During R&D testing, developers test NFC device signal modulation, bit-level

coding, bit rates, frame formats, protocol and command sets. They also verify that protocol commands and

sequences are implemented correctly.

R&S FSW Series Signal and Spectrum Analyzer

Agilent (Keysight) T3111S NFC Conformance Test System

Agilent 4294A Precision

Impedance Analyzer, 40 Hz

to 110 MHz

NFC_A V1.0

1/F, 206 Choi Hung Road, Kowloon, Hong Kong

2 0 6 1

Tel: (852) 2666 2000 Fax: (852) 3010 1010

Email: [email protected]

EZU TECHNOLOGIES LTD

EZU RENTALS LTD

EZU RENTALS INC

6F-17, No.14, Lane 609, Sec 5, Chongxin Road,

Sanchong District, New Taipei City 241,Taiwan

241 609 14 6 17

Tel.: (886) 2 2999 7111

Fax: (886) 2 8192 6666

Email: [email protected]

INDONESIA CHINA

Tel: (86) 755 8267 7732

Mobile:

Fax: (86) 755 3397 5323

Email: [email protected]

(86) 150 1253 3333

Tel: (62) 21 6220 0801

Mobile:

Fax: (62) 21 6220 0801

Email: [email protected]

(62) 816 187 9188

B ran d M o d el D escrip tio n

R& S S M B V 100A V ecto r S igna l Genera to r

R& S RTO1002 600 M Hz, 10 Gsam p le /s 20 /40 M sam p le , 2 channe ls

R& S F S -K 112P C NF C M easurem ent

R& S F S L3 S pectrum A na lyze r

R& S F S V 7 S igna l and S pectrum A na lyze r

R& S F S W 8 S igna l and S pectrum A na lyze r, 2 Hz to 8 GHz

R& S ZV L3 V ecto r Ne twork A na lyze r

A g ilent

(K eysight)T3111S C onfo rm ance Test S ystem

A g ilent

(K eysight)T3121S NF C R/D Test S ystem

A g ilent

(K eysight)E 5061B E NA S eries Ne twork A na lyze r

A g ilent

(K eysight)E 5072A E NA S eries Ne twork A na lyze r

A g ilent

(K eysight)4294A P recis ion Im pedance A na lyze r, 40 Hz to 110 M Hz

L itepo int IQnfc Near F ie ld C om m unica tion Test S ystem