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Japan Advanced Institute of Science and Technology JAIST Repository https://dspace.jaist.ac.jp/ Title � : Timing Issues in Nanotechnology LSI Author(s) �, Citation Issue Date 2007-03-07 Type Presentation Text version publisher URL http://hdl.handle.net/10119/8303 Rights Description 4th VERITE : JAIST/TRUST-AIST/CVS joint workshop on VERIfication TEchnology��, �2007�3�6�3�7�,

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Japan Advanced Institute of Science and Technology

JAIST Repositoryhttps://dspace.jaist.ac.jp/

Title極微細LSIのタイミング設計 : Timing Issues in

Nanotechnology LSI

Author(s) 金子, 峰雄

Citation

Issue Date 2007-03-07

Type Presentation

Text version publisher

URL http://hdl.handle.net/10119/8303

Rights

Description

4th VERITE : JAIST/TRUST-AIST/CVS joint workshop

on VERIfication TEchnologyでの発表資料, 開催

:2007年3月6日~3月7日, 開催場所:北陸先端科学技

術大学院大学・知識講義棟2階中講義室

Timing Issues in Nanotechnology LSI

金子峰雄北陸先端科学技術大学院大学 情報科学研究科

極微細LSIのタイミング設計

Mineo KanekoInformation Science, JAIST

Minimum width 60nm

VLSI in the Year 2007

1cm

1cm

Clock frequency 3GHz

0.33ns

1mm

167m167m

Arranging 1mm φ wire in Baseball ground

]m[167]mm[1

]cm[1]nm[60=

Light propagates 10cmin 0.33ns.

]m[1.0])s[1033.0(])m[103( 98

=××× −

Moore's Law (Gordon E. Moore)Complexity grows double in every 18-24 months

"Cramming more components onto integrated circuits", Electronics Magazine 19 April 1965

History of IC = History of Shrinking

Shrink → High Space-Density → More Transistors in a chip Shrink → Improved Tr. performance → High Speed IC Further shrinking

→ Large propagation delay, Inaccuracy in delay estimation,Static and dynamic delay fluctuation

Electrical Aspect of VLSI

MOS Transistor

L

Wdox

Current I, Voltage V,Capacitance Cg

LWdCVLWdI

oxg

ox

⋅⋅∝⋅⋅⋅∝

−−

1

211

Switching delay; delay

12211

1−

−−

⋅=⋅⋅⋅⋅⋅⋅

=⋅

∝ VLVLWdVLWd

IVC

delayox

oxg

Wire

L

HW

dOX

Resistance Rw,Capacitance Cw

1

11

−−

⋅⋅∝⋅⋅∝

OXW

W

dLWCWHLR

I

I

OXWW

W

dWHLWRC

IVCdelay

⋅⋅⋅

=⋅=⋅

∝2

Propagation delay; delay

L1, W1, dox1 L2, W2, dox2Lr, Wr, Hr, dOXr

Delay = Switching delay + Propagation delay

Elmore delay(First Moment Model)

Difficulty in delay estimation: Need higher-order modelVarious parasitic effects Static/Dynamic delay fluctuation

Static/Dynamic delay fluctuation: Fluctuations of chemical density and physical size in the fabrication processNoise on supply voltageCross-talk noise

( )

Electrical Aspect of VLSI

⎟⎟⎠

⎞⎜⎜⎝

⎛++

⋅+

= −−

−−

221

2

1

11

1

1221

21

2LWdLWd

HWL

VWdLLWdLWddelay ox

rrOXr

rr

r

ox

oxrrOXr κλ

Propagation delay is not improved by shrinking

Mask pattern

Specification

x

y

Physical-Level Design Transistor circuitModule generation Mask pattern design

Top-down Hierarchical Design of VLSI

Data flowControl flow

Algorithm-Level Design

Two-stage, Multi-stageState assignment Technology mapping

Logic-Level Design

Register Transfer-Level Design

Scheduling Binding Bus, multiplexer, net

t

System-Level Design HW/SW partitioningMemory architecture

MV Q

Timing issues in Data-path Execution of c = a + b

R1

FU1

R2

R3

Register

Functional unit

Register R1

Input of FU

Register R3

Output of FU

Control signal to latch a, b

time

Functional delay+ Propagation delay

arrival of the result c

Control signal to latch c

Timing of control signals ( , ) determines data-path behavior・ Many operations share the same FU, many data share the same register. ・ Various different delay values・ Delay may vary from its nominal value statically and dynamically.

Register R1

Input of FU

Register R3

Output of FU

time

Functional delay+ Propagation delay

ー Synchronous Systemー

Clock signal

・ Design needs ``Delay estimation'' + ``Timing margin'' ・ Easy to implement as a circuit・ Worst-case estimation + Sufficient margin = Low performance

Arrival of the result

R1

FU1

R2

R3

Register

Functional unit

Timing issues in Data-path

Register R1

Register R3

Output of FU

Input of FU

time

Detect the arrival of the result c

ー Asynchronous System ー

Send out latch control signal

Controller

・ No delay-estimation, no timing-margin ・ Tolerance to a large range of delay fluctuation ・ Large area (circuit) overhead in detecting-circuitry

R1

FU1

R2

R3

Register

Functional unit

Timing issues in Data-path

Functional delay + Propagation delay

R1

R2

R3

FU1

FU2

Data-path part+Control part

Resource Binding;assigns each operation to one of available functional units, and assigns each data to one of available registers

Scheduling;determines the start time of each operation

What is High-Level Synthesis?

u

v w

y

dxdu

x

dv dw

FU1

FU2

R1

R2

R3

time

u

wv

yx

Behavioral description of an application

algorithm

Layout(Floorplan)

ConnectionDelay information

Timing constraints

Wire-delay aware high-level synthesis:

SchedulingResource bindingConstraints on

parallel execution

Constraints on resource sharing

High-level synthesis under FU-delay dominant situation

A. New Approach to High-Level Synthesis

A. New Approach to High-Level Synthesis

Scheduling-Centric

Scheduling

Binding

Layout

Delay Extract

Evaluation

Binding-Centric

Binding

Layout

Delay Extract

Scheduling

Evaluation

3D-Approach

Binding

LayoutScheduling

Evaluation

Delay Extract

Wire-delay aware high-level synthesis:

A. 3D-Approach High-Level Synthesis

Execution Reconfiguration of a FU

Data lifetime Reconfiguration of a register

Application to Dynamically Reconfigurable LSI

Computation algorithm to be implemented (Dependence Graph) O, D :Set of operations,and set of data A : Dependency e : O → N ; Operation delay Sizes of functional units and registers

x

yt

( ) ix wip +( )ipx

( )ipy

( ) iy hip + ( )iσ

( ) ei +σ

( ) ( ) ( )( )( ) ( ) ( ) NiNipNip

iipip

yx

yx

∈∈∈ σ

σ

,,

,,dataoperation/each For

Need to check conflictsNeed to check timing constraints

( )ADODG ,,=

Naive solution space ( )DON +3

Execution or data lifetime

A. 3D-Approach High-Level Synthesis

x

yt

( ) ix wip +( )ipx

( )ipy

( ) iy hip + ( )iσ

( ) ei +σ

Execution or data lifetime

・ Each of Γ1, Γ2, Γ3, Γ4 is apermutation of elements in O,D

・ Γ5 is a permutation of elements in O (a topological order w.r.t. DG)

・ (Γ1, Γ2, Γ3, Γ4, Γ5) represents relative spatial relation in x-y-t space.・ O((|O|+|D|)^2) computation-time algorithm to compute

which has the minimum layout area and the minimum makespan among all solutions satisfying the spatial relation specified by the code.

・ The size of the solution space

Constrained Sequence-Quintuple

5-tuple (Γ1, Γ2, Γ3, Γ4, Γ5)

( )( )5!DO +

( ) ( ) ( )( ){ }DOiiipip yx U∈|,, σ

A. 3D-Approach High-Level Synthesis

A. New Approach to High-Level Synthesis

Basic Theory

Elementary Technology

・ Condition for feasible binding ・ Efficient solution space for 3D-Approach to High-Level

Synthesis

・ Binding constrained scheduling ・ Data-path layout, performance estimation

Synthesis System ・ Synthesis system considering wire delay ・ Synthesis system for reconfigurable systems ・ Synthesis system considering control skew ・ Synthesis system for asynchronous systems

B. Design Considering Skew

clock

R1

FU1

R2

R3

Register

Functional unit

R1

R3

clock

R1

R3

R1

R3

Max. delayMin. delay

Skew (timing difference)

B. Schedule and Skew Optimization

Optimum schedule under zero-skew

Minimum clock period=8Schedule length=3Total computation time = 8×3+0 = 24

8

6 8

36

4

R1

R2

R3

Applying skew optimization→skew values

Minimum clock period=7Schedule length=3Total computation time =7×3+1=22

)1,1,0(),,( 321−=rrr τττ

8

6 8

36

4

R1

R2

R3

Simultaneous schedule and skew optimization→skew value

Minimum clock period=5Schedule length=3Total computation time=5×3+3=18

)3,1,0(),,( 321=rrr τττ

8

6 8

3 6

4

R1

R2

R3

B. Skew-aware High-Level Synthesis

Basic Theory

Elementary Technology

・ Computational Complexity:Fixed Schedule, Optimize Skew → PSimultaneous Schedule and Skew Optimization (even if the execution order is fixed) → NP-hard

・ Exact algorithm to compute optimum skew ・ Heuristic algorithm for simultaneous schedule and skew

optimization

Synthesis System ・ Binding-centric approach/3D approach to skew-aware

data-path synthesis

C. Delay Fluctuation

clock

R1

FU1

R2

R3

Register

Function unit

R1

R3

Max. delayMin. delay

R1

R3 Violation of hold condition

R1

R3 Violation of setup condition

C. Delay Fluctuation

R1

FU1

R2

R3

Register

Functional unit

Double latch

φ1

φ2

φ1

φ2

effective computation time

φ

φ

MSS

M S1 S2M

S1

S2

marginsetup/hold

Proposed method

R1

R2

effective computation time

marginsetup/hold

effective computation time

margin

through

M S

R1

R2

input data

output data

overwrite

output timing

setup hold

read timing

setup hold

read timing output timing

setup hold

read/output timing

High-Level, Logic-Level, Circuit-LevelSynthesis for VLSI which has the Robustness to Delay Fluctuation

D. Asynchronous System

R1

FU1

R2

R3

Register

Functional unit

Max. delay R1

R3

Min. delay

Detect the output arrival

Detect the latch completion Send out latch control signal

Send out latch control signal

Controller

R1

R3

Controller

Setup and hold conditions are always satisfied.

o1 o2 o3o4

d3d2

d1

FU_1FU_2

Reg_1Reg_2Reg_3

working phaseidle phase

d4

0 1 2 3 4 5 6 7 8 time9

c1

c2

c4

d5d6

o4

d7

c3

MUX

o1 o2 o3

d4

DEMUX

d1 d3 d2

Reg_5

C

C

Reg_1 Reg_2Reg_3

Reg_4 Reg_6

Datapath

Controller

datacontrol signal

FU_1FU_2

o1 o2 o3o4

High-Level, Logic-Level, Circuit-LevelSynthesis for Asynchronous System

D. Asynchronous System

High performance/Low power/Reliable System on Chip

High speed, low power・Propagation delay and power consumption on signal/clock wires・Static/dynamic delay fluctuation

Large scale, system on chip・Huge size of optimization problems

VLSI: a core device for reliable e-society

Efficient algorithms for huge size of problemsDesign methodologies to break through the design crisis

Reliable chip: VLSI test, fault-tolerance

Reliability

Reliable design: Reliable EDA tools, 100% automation

Considering layout in high-level designRobustness, tolerance, insensitiveness to delay fluctuation

・Complex design constraints, a large number of design variables・Increasing circuit complexity, low voltage, chemical/physical fluctuation