Sales Presentation

MULAY’S CONSULTANCY

SERVICES

MULAY’S CONSULTANCY SERVICES

•Technological

Consultancy

Services

•Business

Consultancy Services

Registered business Address in USA

Mulay’s Consultancy Services

17602 17th Street

Suite 102-242

Tustin CA 92780-7915

www.ApekMulay.com

Voice +1-214-764-0868

contact@ApekMulay.com Apek Mulay, CEO and Founder

Registered business Address in INDIA

Mulay’s Consultancy Services

A-2, Bilwakunj CHSL, L.B.S. Road,

Mulund (West), Mumbai – 400 082

INDIA

MULAY’S CONSULTANCY SERVICES About our multi-disciplinary services !!!

Combined 20 years of experience in various fields through

professional partnerships such as

1. Training in Semiconductor Processing, Circuit Design, etc.

2. Semiconductor Failure Analysis consultant

3. Contract Integrated Circuit Failure Analysis & Reliability

services provider

4. Macroeconomic Consulting for business planning

5. Macrofinancial Consulting

MULAY’S CONSULTANCY SERVICES Our Achievements in Multiple disciplines !!!

Regular contributor to Blogs on EBN ( The Premier Online community of Global

Supply Chain professionals )

Contributor to reputed International trade publications like electronics.ca

publications, truthout.org, SEMI.org, etc.

Contributed articles in reputed technical magazines such as Electronic Devices

Failure Analysis (EDFA), Military & Aerospace Electronics (MA&E) magazine,

etc.

2300+ followers on LinkedIn with 100+ endorsement in different domains

Over 1.5 million hits on personal blog www.ApekMulay.com since May 2013.

Author of two books on semiconductor industry entitled Mass Capitalism : A

Blueprint for Economic Revival and Sustaining Moore’s Law: Uncertainty Leading to a Certainty to IoT Revolution.

Contract Failure Analysis services provider to small fabless companies in INDIA

and USA with our ties to the FA service laboratories in California,US.

Failure Analysis & Reliability Testing

Services

MULAY’S CONSULTANCY

SERVICES

MULAY’S CONSULTANCY SERVICES Consultancy in Semiconductor Failure Analysis, Technology, Tool procurement and techniques

• Experienced Failure Analysis engineer working for Qualcomm Inc., Texas Instruments Inc. ( Advanced CMOS Technology development team) , Nanolab

Technologies Inc. and Evans Analytical Group (EAG) Inc.

• Patent award from Texas Instruments Inc. for successfully defending my US patent

application 20130088585 ‘Surface Imaging with Materials Indentified with Colors’ on advanced failure analysis technique.

• M.S. in Electrical Engineering with thesis work performed at X-Fab Texas Inc. titled

‘Improving Reliability of Tungsten Plug Via for 0.25u BiCMOS and CMOS technology’.

• Hands-on lab experience with state-of-the-art failure analysis tools and different

techniques for performing all steps involved in failure analysis of Analog, Digital and

Mixed signal ICs.

• Provide second opinion consultancy on procurement of failure analysis tools for

laboratories.

• Training to staffed laboratories in developing new FA capabilities for reverse engineering.

MULAY’S CONSULTANCY SERVICES Failure Analysis Service provider

Advantages of using contract Failure Analysis services for a small and

growing semiconductor company

• Owning a FA Lab is highly capital intensive business

• Lab needs to be upgraded and maintained for state-of-the-art tools

• Labs need a highly qualified , skilled and well paid engineering staff for

providing root cause failure analysis from simple to complex jobs.

• Better to Invest more resources on product development rather than lab

maintenance

• Accelerated depreciation of state-of-the-art tools for performing failure analysis

• Lab makes use of hazardous chemicals and has to comply with several

environmental and government regulations for hazardous chemical handling

• It is time consuming and very skilled engineering job

• Fraction of operating costs, protected IP, product development, teardowns.

• Expert Failure Analysis consultancy services with every job from Apek Mulay

MULAY’S CONSULTANCY SERVICES

As a Failure Analysis service provider, we collaborate with several local failure analysis laboratories in California and we can get the best deal for our customers to provide them quality failure analysis services. No separate fee for services are charged to the customer above what our laboratories would provided. We will work with our contract labs, check their availability and work load to offer the fastest and quality FA results at lowest possible investments for our customers. This model helps us to beat the amounts of our competitors.

Failure Analysis Service provider

Please ship the samples in attention of Mulay’s Consultancy Services with

reference sample, wire bond type, data sheet, failing pin information after we sign

NDA and business contract.

We can offer to do just about any Failure Analysis job at very competitive

investment and with a fast turnaround time.

MULAY’S CONSULTANCY SERVICES Failure Analysis Services provider

• Decapsulation by chemical wet etch / Laser

• Counterfeit Detection

• Delayering / Parallel Lapping

• EMMI (Emission Microscopy)

• FIB (Focused Ion Beam) Precision Cutting

• InGaAs EMMI

• I-V (Curve Trace) measurement

• Mechanical Polishing

• OBIRCH (Optical Beam Induced Resistance Change)

• Optical Microscopy)

• Optical Profiler

• SAM (Scanning Acoustic Microscopy) or SAT (Scanning Acoustic Tomography)

• SEM (Scanning Electron Microscopy)

• SIMS (Secondary Ion Mass Spectrometry)

• TEM (Transmission Electron Microscope)

•X-Ray (Standard / 2-D) Examination

• X-Ray (3-D) Examination

MULAY’S CONSULTANCY SERVICES Reliability Services provider

•Autoclave or Pressure Cooker Test

•Bias Life Test (BLT)

•Die Shear Test

•ESD - Charged Device Model (CDM)

•ESD - Human Body Model (HBM)

•ESD - Machine Model (MM)

•HAST (Highly Accelerated Temperature and Humidity Stress Test)

•High-Temperature Storage Life Test (HTSL)

•HTOL (High Temperature Operating Life Test) / Burn-in

•Humidity-Bias Test (THB)

•Latch-up Test

•Lead Integrity Test

•Mark Permanency Test

•Moisture/Reflow Sensitivity Classification (MSC)

•Physical Dimension Measurement

•Preconditioning Test (PC)

•Real Time Thermal Profiling

•Solderability •Solder Ball Shear Test (BGA) •Temperature Cycling (TC) Air to Air •Temperature Humidity Bias Lifetest 85°C/85% •Thermal Shock (Liquid to Liquid) •Wire Bond Pull Test •Wire Bond Shear Test

MULAY’S CONSULTANCY SERVICES State-of-the-art Tools for Failure Analysis

• Focused Ion Beam (FIBs) systems – 13 systems (FEI 205, FEI 800, FEI 9500, Vectra – G5, Quanta 3D, Nova 600, Helios 400 S)

• Scanning Electron Microscopes (SEMs) – 6 systems (Hitachi S4800, S4700, S5000, S4500 and EDX)

• Transmission Electron Microscopes (TEMs) – 4 systems (FEI Tecnai G2 F20, FEI Tecnai G2Lab6) with EDX detector, STEM Analysis and Tridiem EELS detector

• Scanning Ion Mass Spectrometry (SIMS) – 2 systems (Camaca IMS-6F , Atomica 4500 )

• Nano View P4050 optical profiler – 1 system

• Thermo K-alpha XPS/ESCA (Electron Spectroscopy for Chemical Analysis) – 1 system

MULAY’S CONSULTANCY SERVICES State-of-the-art Tools for Failure Analysis

• Allied Sample Polisher, Buehler Sample Polisher, South Bay Technology Sample Polisher – 17 systems

• Ion Millers – 2 systems (Gatan 600, Gatan 691PIPS)

• Fschione 1020 Plasma Cleaner – 1 system

• FEINFOCUS Tiger X-Ray Inspection – 3 systems

• Hitachi MC1 Scanning Acoustic Tomograph (SAT) – 2 systems

• Optical Microscopes – 15 Systems (LEICA, NIKON, OLYMPUS)

• Chemical Decapsulation – 5 systems (NSC PS101, Nisene)

• Laser Decapsulation – 2 systems (Control Semi, Fatcat)

• Reactive Ion Etchers (RIEs) – 3 systems (PR2001E /NARC)

MULAY’S CONSULTANCY SERVICES State-of-the-art Tools for Failure Analysis

• New Wave-ezlate trilite laser cutter – 4 systems

• Emission Microscope Systems (EMMI) – Hamamatsu Phemos- 1000 (CCD and InGaAs detector) – 3 systems

• Optical Beam Induced Resistance Change (OBIRCH) – Hamamatsu uAMos-200 – 2 systems

• Conductive Atomic Force Microscopy (C-AFM) – Veeco INNOVA – 1 system

• Microprobe stations (Signatone S-926, Cascade)- 3 systems

• Semiconductor Parameter Analyzer ( Agilent 4155B, Agilent 4156C )- 4 systems

• Gold Wire Bonder (KNS- Maxum Plus) – 2 systems

• Aluminum Wire Bonder (ASM AB530 , SPB–U600-WPCB) – 2 systems

MULAY’S CONSULTANCY SERVICES State-of-the-art Tools for Nanoprobing up to 28

nm technology node Machine specifications / Limitations: Field Emission Scanning Electron Microscope [Brand and model number]: JSM-6700F (JEOL) Current and voltage measuring system [Brand and model number]: Keithley Model 4200-SCS Micro-probe Electrical Measuring System [Brand and model number]: Zyvex/DCG Systems (D-Prober)

Range of Movement Resolution

Coarse adjustment - X, Y, Z-axis：12mm 100 nm

Micro-adjustment -X, Z-axis: 100 µm; Y-axis:10 µm 5 nm Operation Environment 10-4 Pa or less

Probe tip diameter < 50nm

Probe material Tungsten

Max. number of probers-4 channels

MULAY’S CONSULTANCY SERVICES State-of-the-art Tools for Reliability Testing

• Keytek 256 pin ( or MK2 ) Electro-Static Discharge (ESD) Testing – 9 systems

• Oryx Orion-9000 Non-socket Charged Device Module (CDM) Testing – 1 system

MULAY’S CONSULTANCY SERVICES Price List for FA Services

• Optical inspection & photos (Package) => $100/hr (No charge new customer)

•Standard (2-D) X-Ray => $120/hr (This is to look at inside construction of samples)

•C-SAM (C-Scanning Acoustic Microscope) Analysis => $200/hr (This is to look for delamination inside the samples)

•Electrical analysis (Curve trace) => $160/hr (This is a comparative electrical analysis of failing samples to a good sample)

•Chemical Decapsulation => $40 (non-BGA) or $50 (BGA) / device (This is a destructive analysis)

•Optical inspection & photos (Die surfaces) => $100/hr. (This is to inspect die surfaces)

•OBRICH (Optical Beam Induced Resistance Change) inspection (as needed) => $350/hr (This is to look for emission / hot spots on die surface. We will do this if IV Curve Trace shows anomaly. Avg time 30-60 min/sample)

•Mechanical delayering (as needed) => $110 / metal layer and $75/ passivation layer (This is a mechanical delayering (parallel lapping) of the die to look for defects on each layer. This is done if there is a hot spot on the die)

•SEM (Scanning Electron Microscope) Analysis (as needed) => $225 / hr (This is a high power close up inspection of the sample)

•Data review and Final report => $300-$500/set of a part number

•Additional analyses (AFM, X-section, 3D X-Ray…) are also available

MULAY’S CONSULTANCY SERVICES Prior to job submission

• Min charge for each line item is 1 hr regardless of the sample size. Additional service is

charged on ½ hr increments.

•We can run multiple samples of the same part number through items 1, 2, 3, 4, and 6 in the same run.

•Our std turnaround time is 5-7 days depending on complexity of analysis and our work load at the time of parts arrival.

•You may issue an open PO for $1,500 and we will only charge you for the pre-approved services. We will provide progress report after each set of analysis to obtain your approval for the next set of analysis.

Items needed for FA:

•Failing samples to be analyzed

•Reference (good) sample (Prefer 2 samples)

•Wire bond type (Ag, Cu or Al), if known (email is okay)

•Data sheet of IC (email is okay)

•Failing pin numbers for each failing part (email is okay)

•Any other info that could help our analyst to identify the root cause of failure. (email is okay)

•Ship samples to ATTN of Mulay’s Consultancy Services after signing contract

Macroeconomic and Macro financial

Consulting Services

MULAY’S CONSULTANCY

SERVICES

MULAY’S CONSULTANCY SERVICES Macroeconomic and Macro-financial Consulting

• Provide an in-depth analysis of impacts of

macroeconomics on Global semiconductor

industry

• Help provide solutions to companies for

rejuvenation of businesses in electronics and

semiconductor industry

• Provide advise to industry on proper

planning for robust macroeconomic growth on microelectronics industry to realize

benefits of Moore’s law, 450 mm silicon wafers, etc.

• Forecasting the near and long term future of

global semiconductor industry with

macroeconomic lens.

• Consultancy for achieving sustainable

manufacturing, high profitability, balanced

economy with high productivity.

Macroeconomic and Macro-financial Consulting