WORLD’S BEST MICROSCOPY COURSES:• Lehigh’s SEM courses were founded by Joe

Goldstein in 1970 OVER 50 YEARS AGO.

• More than 6,300 engineers, scientists, and technicians have taken our courses, coming from 50 states and 38 countries.

• Goldstein et al., the SEM textbook, is recognized as THE GOLD STANDARD for teaching and understanding the principles and application of SEM instruments.

• Williams and Carter, the TEM textbook, has over 1,000,000 chapter downloads!

• Lecturers have more than 1,000 years of combined experience in microscopy and microanalysis at the world’s leading research institutions and universities.

YOU RECEIVE:

• A copy of one of the TEXTBOOKS authored by the course lecturers

• Access to a WEBSITE containing exclusive imaging and analysis software

• A NOTEBOOK containing course notes of the PowerPoint slides presented by the lecturers

• A laboratory WORKBOOK authored by the course lecturers

• A CONTINUING EDUCATION CERTIFICATE

“I learned so much in this course! I can’t wait to get back to my lab and try some of these new techniques/knowledge that I’ve gained.”

QUESTIONS: For more information, contact: Nikki Rump at 610.758.1112 or nikki.rump@lehigh.edu

1970-2020LEHIGH UNIVERSITY

BETHLEHEM, PENNSYLVANIA

May 31 – June 5, 2020

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LEHIGH.EDU/MICROSCOPYREGISTER ONLINE LEHIGH.EDU/MICROSCOPY

50th ANNIVERSARY

CHARLES LYMAN

MSA PRESIDENT, 1991

MAS PRESIDENT, 2000

EDITOR MICROSCOPY AND

MICROANALYSIS 2000-2008

EDITOR MICROSCOPY TODAY

2009-2019

MAY 31 , 2020 – JUNE 5, 2020

“This course will be really helpful for my career! Will definitely be back for another.”

V I S IT U S

/company/lehigh-microscopy-school

LECTURERS• Mark Aindow, University of Connecticut • John Armstrong, American University • Paul Carpenter, Washington University • Helen Chan, Lehigh University • John Hunt, Gatan, Inc. • Lucille A. Giannuzzi, EXpressLO LLC & TESCAN USA• Andrew Herzing, NIST• Robert Keyse, Lehigh University • Carol Kiely, Lehigh University • Chris Kiely, Lehigh University • Animesh Kundu, Lehigh University • Eric Lifshin, SUNY Col. of Nanoscale Sci. & Eng. • Charles Lyman, Lehigh University • John Mansfield, Microscopy and Microanalysis • Joe Michael, Sandia National Laboratories • Bill Mushock, Lehigh University • Dale Newbury, NIST • Phil Oshel, Central Michigan University • Frank Platek, US FDA (retired)• Nicholas Ritchie, NIST • John Henry Scott, NIST • Keana Scott, NIST • Bradley Thiel, SUNY Col. of Nanoscale Sci. & Eng.• Masashi Watanabe, Lehigh University

QUESTIONS: For more information, contact: Nikki Rump at 610.758.1112 or nikki.rump@lehigh.edu

PARTICIPATING COMPANIESIn the past three years, the following companies have supplied personnel and/or brought their advanced instruments ... the largest array of new instruments at any course in the world.

• Bruker-Hysitron• Denton Vacuum, LLC • E. A. Fischione Instruments, Inc. • EDAX - Ametek • Electron Microscopy Sciences • EXpressLo, LLC • Gatan, Inc. • Hitachi High Technologies America, Inc. • JEOL USA, Inc. • Leica • Oxford Instruments • Protochips Inc.• SciXR • SPI Supplies • Tescan • Thermo Fisher-FEI• ZEISS

SPECIALIZED COURSESFocused Ion Beam (FIB): Instrumentation and ApplicationsJUNE 1-5Ion-solid interaction theory will be introduced and used in describing methods of specimen preparation for SEM, TEM, AFM, Auger, SIMS, and atom probe. Other topics covered include 2D/3D FIB/SEM analytical characterization, milling/deposition techniques for nanotechnology, and advances in FIB instrumentation.

Quantitative X-Ray Microanalysis: Problem Solving Using EDS and WDS TechniquesJUNE 1-5BRING A SPECIMEN – SOLVE A MICROANALYSIS PROBLEM! Discover how to get the highest quality results for a wide variety of materials doing analysis and x-ray mapping with silicon drift detectors, Si(Li) EDS, and WDS. Master problem-solving and quantitative analysis using advanced software tools. Learn how to get the best analytical resolution by working at low voltages. Get new tips on how to deal with ‘pernicious’ samples like beam-sensitive materials, particles, surface layers, and rough surfaces. Learn the best ways to analyze light and trace elements, and handling bad peak overlaps. Become a better analyst with increased skills and improve those job credentials.

Transmission Electron MicroscopyJUNE 1-5This course provides an overview of the concepts, instrumentation and application of TEM. It explores topics such as specimen preparation, TEM and STEM imaging modes, electron diffraction, EDS and EELS analysis, and processing of images and spectra. Coverage is also given of more specialized techniques such as electron tomography, in-situ microscopy and aberration correction.

EARLY BIRD DISCOUNTREGISTER AND PAY IN FULL BY APRIL 10.See lehigh.edu/microscopy for prices.Registration deadline of May 1 for all Specialized Courses. Registration deadline of May 22 for the Introductory and SEM Course.

CHRIS KIELY PROFESSOR & DIRECTOR Lehigh Microscopy School

In memory of JOSEPH I. GOLDSTEIN, Founder, Lehigh Microscopy School

INTRODUCTORY COURSESIntroduction to SEM and EDS for the New OperatorMAY 31A one-day course with lectures and labs related to the basic operation of the SEM.

Introduction to TEMMAY 31A one-day primer course with lectures and labs related to basic operation of the TEM, designed for less experienced participants attending our main TEM course.

MAIN COURSEScanning Electron Microscopy and X-Ray MicroanalysisJUNE 1-5Provides a working knowledge of SEM and EDS X-ray microanalysis as well as an introduction to variable pressure (environmental) SEM, high resolution SEM, and low voltage SEM, and electron backscattering diffraction. STUDENTS ARE ENCOURAGED TO BRING THEIR OWN SPECIMENS.

REGISTER ONLINE LEHIGH.EDU/MICROSCOPY

MASASHI WATANABEASSOCIATE PROFESSOR Department of Materials Science and Engineering Lehigh UniversityMAS President 2016-2018

CELEBR ATING 50 YEARS OF EXCELLENCEMAY 31 , 2020 – JUNE 5, 2020/COMPANY/LEHIGH-MICROSCOPY-SCHOOL