mg 2 nih 4 thin films synthesis results. main goals: hydrogenation of mg 2 ni thin films in high...
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Mg2NiH4 thin films synthesis results
Main goals:Main goals:
• hydrogenation of Mg2Ni thin films in high hydrogen pressure and temperature (p,T);
• analysis of Mg2Ni films after hydrogenation (p,T) using XRD and SEM methods.
Parameters of hydrogenationParameters of hydrogenation
Pressure – 8 barTemperature – 180 - 250 °CHydrogenation duration – 1 hours
10 20 30 40 50 60 700
1000
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3000
4000
5000
Diffraction angle, 2 theta
h-Mg2Ni(113)h-Mg
2Ni(112)
m-Mg2NiH
4(213)
m-Mg2NiH
4(420)
P(H2) = 8 bar
T = 180 0Ct = 1h
m-Mg2NiH
4(211)
h-Mg2Ni(203)
h-Mg2Ni(003)
Mg2NiH
4 standard
Mg2Ni standard
DNQ 210-2 VH
DNQ 210-2
Inte
nsi
ty, a
rb.u
.
MgMg22Ni films after Ni films after plasma plasma hydrogenation (p,T)hydrogenation (p,T)
XRD diffractogram of Mg2Ni film after hydrogenation
SEM micrograph of of Mg2Ni film after hydrogenation
MgMg22Ni films after Ni films after plasma plasma hydrogenation (p,T)hydrogenation (p,T)
XRD diffractogram of Mg2Ni film after hydrogenation
SEM micrograph of of Mg2Ni film after hydrogenation
10 20 30 40 50 60 700
1000
2000
3000
4000
5000
m-Mg2NiH
4(113)
Diffraction angle, 2 theta
P(H2) = 8 bar
T = 190 0Ct = 1h
m-Mg2NiH
4(220)
h-Mg2Ni(006)
h-Mg2Ni(003)
Mg2NiH
4 standard
Mg2Ni standard
DNQ 204-3 VH
DNQ 204-3
Inte
nsi
ty, a
rb.u
.
MgMg22Ni films after Ni films after plasma plasma hydrogenation (p,T)hydrogenation (p,T)
XRD diffractogram of Mg2Ni film after hydrogenation
SEM micrograph of of Mg2Ni film after hydrogenation
10 20 30 40 50 60 700
1000
2000
3000
4000
5000
Inte
nsit
y, arb
.u.
Diffraction angle, 2 theta
h-Mg2Ni(113)h-Mg
2Ni(112)
m-Mg2NiH
4(213)
m-Mg2NiH
4(420)
P(H2) = 8 bar
T = 200 0Ct = 1h
m-Mg2NiH
4(211)
h-Mg2Ni(203)
h-Mg2Ni(003)
Mg2NiH
4 standard
Mg2Ni standard
DNQ 210-3 VH
DNQ 210-3
MgMg22Ni films after Ni films after plasma plasma hydrogenation (p,T)hydrogenation (p,T)
XRD diffractogram of Mg2Ni film after hydrogenation
SEM micrograph of Mg2Ni film after hydrogenation
10 20 30 40 50 60 700
1000
2000
3000
4000
5000
Inte
nsit
y, a
rb.u
.
Diffraction angle, 2 theta
m-Mg2NiH
4(220)LT
m-Mg2NiH
4(110)LT
P(H2) = 8 bar
T = 210 0Ct = 1h
h-Mg2Ni(006)
h-Mg2Ni(003)
Mg2NiH
4 standard
Mg2Ni standard
DNQ 211-2 VH
DNQ 211-1
MgMg22Ni films after Ni films after plasma plasma hydrogenation (p,T)hydrogenation (p,T)
XRD diffractogram of Mg2Ni film after hydrogenation
SEM micrograph of Mg2Ni film after hydrogenation
10 20 30 40 50 60 700
1000
2000
3000
4000
5000
Inte
nsi
ty, a
rb.u
.
Diffraction angle, 2 theta
P(H2) = 8 bar
T = 220 0Ct = 1h
c-Mg2NiH
4(311)
c-Mg2NiH
4(220)
c-Mg2NiH
4(111)
h-Mg2Ni(006)
h-Mg2Ni(003)
Mg2NiH
4 standard
Mg2Ni standard
DNQ 220-1 VH
DNQ 220-1
MgMg22Ni films after Ni films after plasma plasma hydrogenation (p,T)hydrogenation (p,T)
XRD diffractogram of Mg2Ni film after hydrogenation
SEM micrograph of Mg2Ni film after hydrogenation
10 20 30 40 50 60 700
1000
2000
3000
4000
5000
Inte
nsi
ty, a
rb.u
.
Diffraction angle, 2 theta
P(H2) = 8 bar
T = 240 0Ct = 1h
c-Mg2NiH
4(220)c-Mg
2NiH
4(111)
h-Mg2Ni(006)
h-Mg2Ni(003)
Mg2NiH
4 standard
Mg2Ni standard
DNQ 211-1 VH
DNQ 211-1
MgMg22Ni films after Ni films after plasma plasma hydrogenation (p,T)hydrogenation (p,T)
XRD diffractogram of Mg2Ni film after hydrogenation
SEM micrograph of Mg2Ni film after hydrogenation
10 20 30 40 50 60 700
500
1000
1500
2000
2500
3000
3500
4000
4500
5000
Diffraction angle, 2 theta
Inte
nsi
ty, a
rb.u
.
h-Mg(103)
h-Mg(110)
P(H2) = 8 bar
T = 250 0Ct = 1h
c-Mg2NiH
4(311)
c-Mg2NiH
4(220)c-Mg
2NiH
4(111)
h-Mg2Ni(006)
h-Mg2Ni(003)
Mg2NiH
4 standard
Mg standard
DNQ 211-3 VH
DNQ 211-1
ConclusionsConclusions 1-4 µm nanocrystalline Mg2Ni thin film was
successfully formatted using magnetron sputtering;
After the hydrogenation of Mg2Ni thin films in hydrogen atmosphere, in high pressure and high temperature, Mg2NiH4 thin films were successfully formed.
SEM analysis shows that after hydrogenation formation of the “bubbles” in the Mg2NiH4 thin films are observed.