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  • METHODS OF STUDYING THE

    CORROSION PROCESS MECHANISM

    http://home.agh.edu.pl/~grzesik

  • Methods of determining the contribution of individual

    reagents in matter transport through the scale

    • Marker method

    • Two-stage oxidation method

    • Determining self-diffusion coefficients

    • Scratch method

    • Pellet method

  • Schematic illustration of scale formation

    according to Tammann (1920)

    Metal Metal

    OxidantOxidant

    Scale12 2X Me MeX

  • Marker method – schematic illustration

    of Pfeil’s classic experiment (1929)

    Fe

    Air

    Scale

    Fe

    SiO2

    SiO2

    Air

  • Marker experiment in a Fe-O system

    H. Engell, F. Wever, Acta Met. 5, 695-700 (1957)

  • Marker method – interpreting results

    Oxidant

    Metal

    Marker

    Scale

    Oxidant

    Metal

    Marker Scale

    Oxidant

    Metal

    Scale

    Oxidant

    Metal*

    **

    * reaction location: 12 2X Me MeX

    *

    Marker

    Marker

  • Oxidant

    Metal

    Marker

    Me1-yX

    X2

    Me

    Marker

    MeX1-y

    X2

    Me

    Marker

    Me1±yX1±z

    X2

    Me

    MarkerMe1+yX MeX1+y

    For temperatures above Tammann’s temperature

    Marker method – interpreting results

    in the case of predomiant lattice diffusion

  • Conditions for the correct

    procedure of a marker experiment

    • the surface of the examined metal or alloy is smooth

    • the marker does not react with the metallic substrate, oxidant, or

    with substances that are compounds constituting the scale

    • before beginning the oxidation process, contact between

    the marker and surface of examined material is maintained

    • the formed scale is compact, single-phase and strictly adheres

    to the metallic core

    • oxidation time is selected so that the thickness of the scale

    will be at least one order of magnitude larger than the marker

  • Methods of depositing markers

    on metallic substrate surfaces

    • even distribution of marker grains (Al2O3, SiO2, etc.)

    • even distribution of a thin (10 mm) wire (Pt, Au)

    with around 1 mm length

    • welding a thin wire constituting a marker

    • Depositing a marker (Pt, Au) through an appropriate mesh

    (Cu – SEM; Al)

    • electrolytic deposition of a marker layer

    • decomposition of a noble metal salt, placed on the sample

    surface

    • photolytic method

    • Covering the sample surface with diluted platinum paste

  • Examples of incorrectly using the marker methodusing a non-elastic wire around the metal

    Me

    Markers

    Me

    Me

    MeX MeX

    Markers

  • AA

    A A

    Me

    MeX

    Examples of incorrectly using the marker methodmarker does not adhere to the metal after deposition

    Cross-section

  • Example of how a marker experiment can be

    incorrectly interpreted due to the undercutting mechanism

    Marker

    Metal Metal Metal Metal

    OxidantOxidantOxidantOxidant

    Scale

    Scale

    Scale

  • Co

    S9

    8C

    o

    Pt

    50 mm

    Cross-section of a sulfide scale formed

    on cobalt with an indicated marker location

    Z. Grzesik, Ceramika, 87, 1-124 (2005).

    T = 700 oC, p(S2) = 10-2 Pa

  • Co

    Co

    S4

    3

    Pt

    50 mm

    Z. Grzesik, Ceramika, 87, 1-124 (2005).

    T = 860 oC, p(S2) = 10-1 Pa

    Cross-section of a sulfide scale formed

    on cobalt with an indicated marker location

  • Energia / MeV

    0,0 0,5 1,0 1,5 2,00

    2

    4

    6

    8

    10

    12

    Nb1,68MeV

    Au1,84MeV

    Lic

    zb

    a z

    liczen / 1

    03

    Lic

    zba z

    licze

    n / 1

    03

    0,0 0,5 1,0 1,5 2,00

    5

    10

    15

    20

    25

    Energia / MeV

    Przed siarkowaniem

    Po siarkowaniu

    SNb/NbS2

    SNbS /S2 2

    NbNb/NbS2

    NbNb/NbS

    1,68 MeV2

    Au1,48MeV

    Z. Grzesik, K. Takahiro, S. Yamaguchi, K. Hashimoto and S. Mrowec, Corrosion Science, 37, 801-810 (1995)

    RBS spectrum (4He - 2 MeV) of an Nb sample

    marked with Au, before and after sulphidation

    Before sulfidation

    After sulfidation

  • Cross-section of an MoS2 scale formed on Mo

    with an indicated marker location

    correctly

    performed

    experiment

    Z. Grzesik, M. Migdalska, S. Mrowec, High Temperature Materials and Processes, 26, 355-364 (2007)

  • incorrectly

    performed

    experiment

    Cross-section of an MoS2 scale formed on Mo

    with an indicated marker location

  • Cross-section of an TaS2 scale formed on Ta

    with an indicated marker location

    correctly

    performed

    experiment

  • metal

    zewnętrznawarstwa zwarta

    utleniacz

    pośrednia warstwa porowatawewnętrzna warstwa porowata

    X2

    Me

    e

    +

    -

    MECHANIZM POWSTAWANIA TRÓJWARSTWOWEJ

    ZGORZELINY W OBSZARZE POWIERZCHNI PŁASKICH

    Marker

    Cross-section of a triple-layer scale on a flat

    surface with an indicated marker location

    metal

    External

    compact layer

    oxidant

    Intermediate

    porous layer

    Internal porous layer

  • OBRAZ SZCZELIN DYSOCJACYJNYCH W ZGORZELINIE

    SIARCZKOWEJ NA STOPIE Cu-9%Zn, UZYSKANEJ

    W PROCESIE DWUETAPOWEGO SIARKOWANIA

    Autoradiogram

    S. Mrowec, An Introduction to the Theory of Metal Oxidation, National Bureau of Standards and National

    Science Foundation, Washington D.C., 1982.

    Picture of dissociation crevices in a sulfide scale

    on Cu-9%Zn alloy, obtained in a two-stage

    sulphidation process

  • Cross-section of a sulfide scale on copper,

    obtained at 444 oC

    reaction time: 25 s reaction time: 9 min

    compact scale

    layer

    marker

    porous scale

    layer

    Cu

    S. Mrowec, An Introduction to the Theory of Metal Oxidation, National Bureau of Standards and National

    Science Foundation, Washington D.C., 1982

  • Marker method in a system

    with a ceramic substrate

    a) „classic” results interpretation

    b) point defect concentration in studied materials and the

    result of the marker experiment

    c) nuclei of the reaction product inside the substrate and

    the result of the marker experiment

    d) physical microdefects of the substrate and the result of

    the marker experiment

  • Schematic illustration of using the marker method

    in an oxide – oxidant system

    X2

    MeX

    Markers

    X2 diffusion Me diffusion Me and X2 diffusion

    X2

    MeX

    MeX2

    X2

    MeX

    MeX2

    X2

    MeX

    MeX2

  • Marker experiment interpretation

    in an oxide – oxidant system

    X2

    MeaXb

    MecXdd

    bMe X Me X

    d a

    bc Me n

    d a

    bc ea b c d

    n

    d a

    bc Me

    d a

    bc n e

    d d a b c

    b cX

    d a b c

    b cMe Xn c d

    2 2

    Ratio of external thickness to the internal part of the MecXd oxide layer

    d a b c

    b c

    Z. Grzesik, Termodynamika i kinetyka defektów w kryształach jonowych, WN Akapit, Kraków 2011

  • Methods of depositing markers on

    the surfaces of ceramic substrates

    • depositing a marker (Pt, Au) through an appropriate mesh

    (Cu – SEM; Al)

    • photolytic method

    • covering the sample surface with a diluted platinum paste

  • Schematic illustration of the marker location

    in Co3O4 resulting from CoO oxidation

    Cation sublattice

    of Co3O4 is defectedAnion sublattice

    of Co3O4 is defected

  • 4 3 4CoO Co O Co nen Co ne O Co On 23 2

    13 3 4

    CoO Co O3 4

    Co+n

    e-

    25 %75 %

    Markery Au

    O2

    Schematic illustration of marker location in Co3O4grown during CoO oxidation, in the case where the

    cation sublattice of Co3O4 exhibits predominant disorder

    Au markers

  • 4 3 4CoO Co O Co nen

    Co ne O Co On 23 213 3 4

    Co3O4 scale cross-section grown CoO

    with an indicated marker location

    Au markers

  • Cu O2

    CuO

    Au-markers

    50 mm

    Cu O CuO Cu e22 2

    Cu e O CuO 2 12 22

    M. Migdalska, Z. Grzesik, S. Mrowec, Defect and Diffusion Forum, 289-292, 429-436 (2009)

    Cross-section of CuO scale grown on Cu2O

    with an indicated marker location

    Au markers

  • Cu O2 CuO

    Cu+2

    e-

    50 %50 %

    Markery Au

    O2

    Cu O CuO Cu e22 2 Cu e O CuO 2 12 22

    Schematic illustration of marker location in CuO grown

    during oxidation of Cu2O, in the case where the cation

    sublattice of CuO exhibits predominant disorder

    Au markers

  • NiS2 scale cross-section grown during NiS sulphidation

    with an indicated marker location

    Au markers

  • Schematic illustration of marker location in NiS2grown during NiS sulphidation

    disordered NiS2anion sublattice

    disordered NiS2cation sublattice

  • Ratio of external thickness to the internal part of NiS2 equals

    around 0,82

    NiS2 scale cross-section grown during NiS sulphidation

    with an indicated marker location

    Au markers

  • Correlation between deviation from stoichiometry

    in Ni1-yS and sulfur vapor pressure

    10-1 100 101 102 103 104 10510-3

    10-2

    10-1

    1073 K1023 K

    973 K

    923 K

    873 K

    Badania własne

    H. Rau, 1975

    1168 K

    1110 K

    1038 K

    986 K

    914 K

    835 K

    Ni1-y

    S

    y

    pS

    2 / Pa

    ymax in Ni1-yS ≈ 0,09

    Z. Grzesik, 2005

  • The experimentally determined ratio between external thickness and the internal

    part of the NiS2 sulfide equal to 0,82 remains in accordance with the theoretical

    value obtained under the assumption that deviation from stoichiometry is present in

    Ni1-yS on the level of 0,91

    e64,1Ni82,0NiSSNi2 2291,0

    222 NiS82,0S82,0e64,1Ni82,0

    NiS2 scale cross-section grown during NiS sulphidation

    with an indicated marker location

    Au markers

  • a

    b

    s

    homogenization: 873 K, 10 Pa, 24 h

    homogenization: 873 K, 200 Pa, 24 h

    sulphidation: 873 K, 1000 Pa, 5 min

    b

    a

    s

    10-1 100 101 102 103 104 105 10610-3

    10-2

    10-1

    H. Rau, 1975

    1168 K

    1110 K

    1038 K986 K

    914 K

    835 K

    Ni1-y

    S

    y

    pS

    2 / Pa

    10 11 12 13100

    101

    102

    103

    104

    1051073 1023 973 923 873 823 773 723

    T-1.104 / K-1

    NiS2

    Ni1-y

    S

    T / K

    pS

    2 /

    Pa

    NiSh2VSNi Ni22

    1xNi

    Influence of NiS homogenization parameters

    on marker location at the initial stage of NiS2 formation

    Au markers

    Ni coating Ni coating

  • Marker location after NiS homogenization

    Au markers

    Ni coating Ni coating

  • Influence of MeX homogenization parameters on

    marker location at the initial stage of MeX2 formation

    Au markers

  • Marker location after MeX homogenization in the case where

    oxidant pressure is lower than MeX2 dissociation pressure

    Au markers

  • Marker location after sulphidation

    of CoS to CoS2 (SEI)

    Au markers

  • CoS2

    CoS

    Au markers

    Marker location after sulphidation

    of CoS to CoS2 (BSE)

  • substrate

    product

    Au markers

    Marker location at the initial stage of CoS2 formation

    on the surface of CoS homogenized

    at the CoS2 dissociation pressure

  • CoS cross-section sulphidized at a sulfur vapor pressure

    that enables CoS2 formation

  • Interior of CoS sulphidized at a sulfur vapor pressure

    that enables CoS2 formation

  • CoS

    Co

    Cross-section of a Co sample covered with CoS

  • CoS2

    CoS

    Initial stage of CoS2 formation inside CoS

  • CoS2

    CoS

    Au markers

    Marker location in CoS sulphidized to CoS2

  • Possible marker locations in a CoS-CoS2 system

    depending on the predominant direction

    of reagent diffusion

    Au markers

  • Schematic illustration of marker location

    in CoS sulphidized to CoS2

  • neCoCoSCoS2 n2

    22n CoSSneCo

    Schematic illustration of marker location

    in CoS sulphidized to CoS2

  • Interior of NiS sulphidized at a sulfur vapor pressure

    that enables NiS2 formation

  • NiS2

    NiS

    20 mm

    Interior of NiS sulphidized at a sulfur vapor pressure

    that enables NiS2 formation

  • Co3O4

    CoO

    Cross-section of a CoO sample covered with Co3O4

  • Co3O4

    CoO

    Au markers

    Marker location in Co3O4growing on CoO

  • Surface of CoO formed as a result of Co oxidation

    at 900oC and at 1000 Pa oxygen pressure

  • Surface of NiS formed as a result of Ni sulphidation

    at 700oC and at 1000 Pa sulfur vapor pressure

  • Surface of CoS formed as a result of Co sulphidation

    at 700oC and at 1000 Pa sulfur vapor pressure

  • Marker location on a developed CoS surface

  • Marker method – oxidation of a high entropy oxide

    (Mg, Co, Ni, Cu, Zn) O

    O2

    (Mg, Co, Ni, Cu, Zn) O

    Markers

    O2 diffusion Me diffusion Me and O2 diffusion

    O2 O2 O2

    (Mg, Co, Ni, Cu, Zn) O(Mg, Co, Ni, Cu, Zn) O (Mg, Co, Ni, Cu, Zn) O

  • Marker method – oxidation of a high entropy oxide

    (Mg, Co, Ni, Cu, Zn) O

    Presence of predominant disorder inside the cation sublattice

    O2

    (Mg, Co, Ni, Cu, Zn) O g2'

    i

    x

    X

    x

    MX

    2

    1e2MXM

    xX

    ''Mg2 Xh2VX

    2

    1

    reaction location:h

    mdAh

    where:

    h – thickness of the oxide formed on the marker layer

    A – proportionality coefficient

    d – oxide density

    m – oxide mass change during oxidant pressure change

  • Marker method – oxidation of a high entropy oxide

    (Mg, Co, Ni, Cu, Zn) O

    h = 12 μm

    Conclusion:

    In the case where predominant disorder exists in the cation

    sublattice, markers should be located 12 micrometers below the

    oxide surface.

  • Necessary conditions for obtaining reliable

    results using the modified marker method

    • Before marker deposition the oxide sample must be heated at

    oxygen pressure lower than that used during oxidation of the

    sample covered with markers.

    • The change in deviation from stoichiometry of the studied oxide

    must be large (order of a few percent) during the marker

    experiment.

    • Sample thickness should exceed 1 mm.

    • Reequilibration time of defect concentration during oxygen pressure

    change should be many time greater than around 1 minute (which

    means a small chemical diffusion coefficient for defects and/or a

    large sample thickness).

    Conclusion:

    Complete interpretation of a modified marker experiment is possible

    after finishing both marker studies, as well as point defect

    concentration and mobility studies in a given oxide.

  • Marker experiment – summary

    Obtaining reliable results during predominant disorder studies

    using the marker method in ceramic systems, especially porous

    systems, is a much more difficult task compared to metal-oxidant

    systems. In order to interpret results, precise analysis of the reaction

    product growth location in the substrate is necessary. In the case of

    ceramic substrates with high point defect concentration, the

    materials should be homogenized before the “marking” process at a

    highest oxidant pressure, at which the chemical compound

    constituting the substrate remains stable. In the case of compounds

    exhibiting large deviation from stoichiometry, this should be taken

    into account when writing the appropriate chemical reactions, on the

    basis of which marker locations inside the reaction product can be

    foreseen.

  • Two-stage oxidation method

    Me MeX

    C(*X)

    OUTWARD LATTICE METAL DIFFUSION

    Ideal case(X and *X atoms do not mix together)

    Me MeX

    C(*X)

    Real case(X and *X atoms mix together)

    C(*X) – concentration of the oxidant isotope (tracer)

  • Me MeX

    C(*X)

    INWARD OXIDANT DIFFUSION ALONG GRAIN BOUNDARIES

    Ideal case(X and *X atoms do not mix together)

    Me MeX

    C(*X)

    Real case(X and *X atoms mix together)

    Two-stage oxidation method

    C(*X) – concentration of the oxidant isotope (tracer)

  • SIMULTANEOUS DIFFUSION OF BOTH REAGENTS

    Slow mixing together of X and *X atoms

    Me MeX

    C(*X)

    Me MeX

    C(*X)

    Fast mixing together of X and *X atoms

    Two-stage oxidation method

    C(*X) – concentration of the oxidant isotope (tracer)

  • Cu, O16 and O18 concentration profiles inside a sample obtained

    during Cu2O oxidation at 1273 K and 105 Pa oxygen pressure

    0 500 1000 1500 2000 25000

    10

    20

    30

    40

    50

    60

    70

    Cu2O

    concentr

    ation

    /

    at.

    %

    Time / s

    Cu

    O16

    O18

    CuO

    M. Migdalska, Z. Grzesik, S. Mrowec, Defect and Diffusion Forum, 289-292, 429-436 (2009)

  • O16 and O18 concentration profiles in an Ni-Cr sample

    after two-stage oxidation at 1323 K

    I stage: Ar-20%16O2; 0,5 h

    II stage: Ar-20%18O2; 2 h

    I stage: Ar-4%H2-2%H216O2; 0,5 h

    II stage: Ar-4%H2-2%H218O2; 2 h

    David J. Young, „High temperature oxidation

    and corrosion of metals”, Elsevier, Sydney 2016

  • Cr, Fe, O16 and O18 concentration profiles

    in 13CrMo4-4 steel after oxidation at 823 K

    Ar / 1% 16O2 / 1% C18O2; 2 h

    T. Olszewski, „Oxidation mechanisms of materials for heat exchanging components in CO2/H2O-containing

    gases relevant to oxy-fuel environments”, Forschungszentrum Jülich GmbH, Jülich, 2012

    Ar / 1% 16O2 / 2% H218O; 2 h

  • Concentration profile of elements in a P92 steel

    sample after oxidation in Ar / 1% 16O2 / 1% C18O2

    atmosphere at 923 K

    T. Olszewski, „Oxidation mechanisms of materials for heat exchanging components in CO2/H2O-containing

    gases relevant to oxy-fuel environments”, Forschungszentrum Jülich GmbH, Jülich, 2012

  • Concentration profile of elements in an INCONEL 617

    sample after oxidation in Ar / 1% 16O2 / 2% H218O

    atmosphere at 1173 K

    T. Olszewski, „Oxidation mechanisms of materials for heat exchanging components in CO2/H2O-containing

    gases relevant to oxy-fuel environments”, Forschungszentrum Jülich GmbH, Jülich, 2012

  • Self-diffusion coefficient studies

    Distribution of the concentration of a tracer inserted into the near-

    surface layer of a MeX crystal (lattice diffusion)

    x x20 0

    c ln c

    cc

    Dt

    x

    Dt

    0

    2

    2 4exp ln lnc

    c

    Dt

    x

    Dt

    0

    2

    2 4

    c – tracer concentration at distance x from the crystal surface,

    c0 – tracer concentration on the surface before beginning the heating process,

    t – heating time

    D – self-diffusion coefficient (tracer)

  • Distribution of the concentration of a tracer inserted into the near-

    surface layer of a MeX crystal (intergranular diffusion)

    x x0 0

    c ln c

    ln

    /c

    D D d

    D tx const

    V g

    V

    2

    4

    c – tracer concentration at distance x from the crystal surface,

    t – heating time

    DV – lattice diffusion coefficient

    Dg – intergranular diffusion coefficient

    Self-diffusion coefficient studies

  • Distribution of tracer concentration in a MeX crystal, when tracer

    concentration on the crystal surface is constant (lattice diffusion)

    x0

    c

    c c erfx

    Dt

    0 1

    2

    c – tracer concentration at distance x from the crystal surface,

    c0 – tracer concentration on the surface before beginning the heating process,

    t – heating time

    D – self-diffusion coefficient (tracer)

    Self-diffusion coefficient studies

  • Scratch method

    Me

    MeX

    Me

    MeX

    Me

    MeX

    Me

    MeX

    Me

    inward diffusion outward diffusion mutual diffusion

  • Wagner’s pellet method

    H. Rickert, Z. Phys. Chem. Neue Folge, 23, 356 (1960)

    The range

    of metal

    loss

    S S

    AgAg

    pellet

    pelletAg S2Ag S2

    scale

    Ag S2Ag+

    e-

    S

    Ag S2

    Ag

    pellet

    Ag S2

    scale

    Ag+

    e-

  • S. Mrowec, An Introduction to the Theory of Metal Oxidation, National Bureau of Standards and National Science

    Foundation, Washington D.C., 1982

    Modified Wagner’s pellet method

    S

    Ag

    pellet

    Ag S2

    Ag S2

    Ag S2

    S

    Ag

    pellet

    Ag S2

    35S

    Ag

    pellet

    Ag S2

    Ag S2

    Ag S2

    Ag S2 *

    Ag S2 *

    Ag S

  • stop Zr-Cu ZrC W WC

    5 mm

    temperature: 1400 oC

    time: 1,5 h

    Cross-section of a WC sample that reacted with Zr

    Z. Grzesik, M. B. Dickerson, K. Sandhage, of Materials Research, 18, 2135-2140 (2003)

  • THE END