Upload File

lensafm - atomic force microscopy - home - nanosurf c3000 measurement modes lensafm scan head...

  • Home
  • Documents
  • LensAFM - Atomic Force Microscopy - Home - Nanosurf C3000 measurement modes LensAFM scan head specifications Scan head type 110-µm 70-µm Maximum scan range (XY) (1,2) 110 µm 70
2
swiss quality Next-Level Nanotechnology Tools [email protected] / www.nanosurf.com AFM for upright microscopes and 3D profilometers 3-D surface structure data Material property information Nanometer resolution LensAFM

Upload: vumien

Post on 29-Jun-2018

215 views

Category:

Documents


0 download

Report

TRANSCRIPT

Page 1: LensAFM - Atomic Force Microscopy - Home - Nanosurf C3000 measurement modes LensAFM scan head specifications Scan head type 110-µm 70-µm Maximum scan range (XY) (1,2) 110 µm 70

swiss qualityNext-Level Nanotechnology Tools [email protected] / www.nanosurf.com

AFM for upright microscopes and 3D profilometers

3-D surface structure data Material property informationNanometer resolution

LensAFM

Page 2: LensAFM - Atomic Force Microscopy - Home - Nanosurf C3000 measurement modes LensAFM scan head specifications Scan head type 110-µm 70-µm Maximum scan range (XY) (1,2) 110 µm 70

2

Close-up of the area directly above the cantilever as observed through a 100× microscope objective lens (NA 0.9). A defect is observed, but its nature and exact structure remain unclear.

LensAFM — AFM for upright microscopes and 3D profilometersThe Nanosurf LensAFM is an atomic force microscope that can be used instead of a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well.

Key Features

• Mountable on virtually any optical microscope or 3D optical profilometer

• Equipped with an objective lens for a clear view of sample and cantilever

• Simple sample positioning using the optical microscope position manipulators

• Integrated motor for automated cantilever approach: Just bring your sample into optical focus and let the LensAFM do the rest

• Large AFM Z-range allows measurement of high structures

• Wide range of AFM modes available through the C3000 controller

• Simply intuitive: Nanosurf’s well-known “ease of use” will have you performing measurements in minutes!

Defects in a hard-coated metal surface as observed through the LensAFM‘s built-in 8× objective lens. The AFM cantilever is visible in the optical image and allows easy positioning of the sample before measurement.

LensAFM

2 Nanosurf and the Nanosurf Logo are trademarks of Nanosurf AG Copyright © 2016 Nanosurf AG, Switzerland — BT04898-04

Compatible options and accessoriesAdvanced C3000 measurement modes

LensAFM scan head specificationsScan head type 110-µm 70-µm

Maximum scan range (XY) (1,2) 110 µm 70 µm

Maximum Z-range (1) 22 µm 14 µm

XY-linearity mean error < 0.6% < 1.2%

Z-measurement noise level (RMS, Static mode) (3) typ. 350 pm (max. 500 pm)

Z-measurement noise level (RMS, Dynamic mode) (3) typ. 90 pm (max. 150 pm)

Automatic sample approach Built-in motorized parallel approach with 4.5 mm travel

Cantilever alignment Automatic self-adjustment through alignment chip technology

Sample observation (4) Built-in 8× objective lens with 45 or 60 mm parfocal distance

AFM measurement repositioning precision ±10 µm (including cantilever exchange, scan head remounting, and approach)

(1) Manufacturing tolerances are ±10% for 110-µm scan heads and ±15% for 70-µm scan heads(2) Maximum scan range at 45° rotation of the AFM scan direction(3) Measured using the C3000 controller, with active vibration isolation on a stable desk, and in a low-noise laboratory environment (no air conditioning)(4) Adapters with a correct parfocal distance are available for the different optical microscope types

AFM topograph of the same defect recorded by the LensAFM. 3D data of the area clearly identify the defect as a hole in the coating layer, partially filled with debris. Such data is used to improve the coating process and to measure the quality of the result.

1.5µm

20µm

20 µm

0

Applications

• Roughness measurements • Defect analysis• Sharp edge radius• Step heights

• Material properties: – hardness variations – conductance/resistance – magnetism

Areas

• Research and Development• Teaching and Training• Quality Assurance

Nanosurf AGGräubernstrasse 124410 LiestalSwitzerland+41 61 927 47 47 (phone)+41 61 927 47 00 (fax)

Nanosurf Inc.300 Trade Center, Suite 5450Woburn, MA 01801United States of America781 549 7361 (phone)781 549 7366 (fax)

Nanosurf GmbHRheinstrasse 563225 LangenGermany+49 6103 202 7163 (phone)+49 6103 202 7182 (fax)

Nanosurf 中国 Nanosurf China, Shanghai上海市天宝路578号 (200086)飘鹰世纪大厦703室, 中国+86 18621896399 (电话)+86 21 5512 7698 (传真)

Nanosurf AGGräubernstrasse 124410 LiestalSwitzerland+41 61 927 47 47 (phone)+41 61 927 47 00 (fax)

Nanosurf Inc.300 Trade Center, Suite 5450Woburn, MA 01801United States of America781 549 7361 (phone)781 549 7366 (fax)

Nanosurf GmbHRheinstrasse 563225 LangenGermany+49 6103 202 7163 (phone)+49 6103 202 7182 (fax)

Nanosurf 中国 Nanosurf China, Shanghai上海市天宝路578号 (200086)飘鹰世纪大厦703室, 中国+86 18621896399 (电话)+86 21 5512 7698 (传真)


Fluke 971Temperature Humidity Meter - AresAgante, Lda. · 2015-01-12 · Specifications Six size channels 0.3 µm, 0.5 µm, 1.0 µm, 2.0 µm, 5.0 µm, 10.0 µm Flow rate 2.83 L/min

The World`s First True Disposable Hemocytometer · DHC-B01 DHC-B02 DHC-M01 Neubauer Improved Fuchs Rosenthal Burker Burker Turk Malassez 100 µm 200 µm 100 µm 100 µm 200 µm …

P1 – Silicon Superjunction and GaN HEMT Power DevicesMay 09, 2016  · LS = 0.1 µm LGS =1.5 µm LG =1.5 µm LGD = 3 or 9 µm LD = 0.1 µm Nitride thicknes = 0.05 µm Al0.2Ga0.8N

Dr. Christian E. BUTZKE Enology Professor PURDUE UNIVERSITY · 10 µm10 µm 1 µm1 µm 100 nm100 nm 10 nm10 nm.45 µm.45 µm .2 µm.2 µm Particle Size

Intimidator Scan 110 User Manual, Rev. 2 · Intimidator Scan 110 User Manual Rev. 2 Page 3 of 15 Introduction 2. Introduction Product Overview Product Dimensions Mounting Bracket

The DØ Level 2 Trigger - Michigan State University · tent 11 120 µm 0.96 0.91 nominal 4.6 108 µm 0.96 0.91 ideal 1 96 µm 1.00 1.00 1.5 tent 19 110 µm 0.94 0.88 nominal 8 94

2k, 4k, 8k and 16k Monochrome CMOS Line Scan · (2k, 4k, 8k) or 3.52 µm x 3.52 µm (16k) pixel array, delivering both speed and responsivity at a competitive price. These small,

水質與水產生物之關係 - aquamed.nvri.gov.twaquamed.nvri.gov.tw/Module/PageContent/PageFile/110.pdf · Silicate 220 µM < 3 µM 30 µM 150 µM Ammonia 0-10 µM < 0.5 µM

Dimatix Materials Printer DMP-2850 - Fujifilm · 2019-03-15 · Drop W atc her View Fiducial Camer a View Dimatix Materials Printer DMP-2850 0 µm 100 µm 200 µm 300 µm 400 µm

Key players of the phytoplankton communities 5 µm 50 µm 0.5 µm50 µm

Optimization of SLM Process Parameters for Ti6Al4V Medical ...€¦ · (laser power = 110 W, scan speed = 400 mm/s, scan spacing = 40 µm, and layer thickness = 50 µm). Sun et al

E-TCT measurements of irradiated HV-CMOS test structures€¦ · LFoundry: 2000 Ohm-cm, ... th Laser beam direction Chip surface Scan across pixel: •2.5 µm steps in y •5 µm

EKOL s.r.o. - Membranes and ModulesSupport: monolithic TiO 2 – Al 2O 3 Microfiltration External diameter/length: 25 mm / 1178 mm 1,0 µm 0,8 µm 0,45 µm 0,2 µm 0,1 µm HR Number

volume ~ 1 µm x 1 µm x 1 µm

CATÁLOGO DE PRODUTOS ROLAND ELECTRONIC€¦ · Precisão +/- 6 µm Precisão +/- 1.0 µm Precisão +/- 0.5 µm (LTM-SMART) , +/- 1.0 µm (LTM-MAXI) Área de travessia -- (Medição

Más de 110 nuevas configuraciones: para que nunca tenga ... · PW = 197 ms 5 µm: Rs(4,5)=3,63 1,8 µm: Rs(4,5)=5,45 +50% Resolución. La más amplia selección de columnas de LC

GDD - Production guide v41 · 2020. 6. 4. · Shielding Aluminium (10 µm) GDD GEM foils (50 µm) 50 µm thick kapton, 5 µm copper, 70 µm hole diam., 140 µm pitch EST Drift 2 µm

Low Maintenance Filter · 2018. 1. 19. · Approx. 1.8 L (when reservoir is set separately) Approx. 6 L Cylindrical type 5 µm, 20 µm Step type 5 µm Cylindrical type 5 µm, 20 µm

CATALOG - BioClean Essentials Catalog Cleanroom... · BioClean Pharma Covers BPC 57 ... Ms. G. Love the Mother of all ... 0.1 µm 0.2 µm 0.3 µm 0.5 µm 1.0 µm 5.0 µm ISO Class

C190-E206A Shim-pack HPLC Column Guidebook4 5 1.6 µm, 2.2 µm 1.9 µm, 2 µm, 2.2 µm, 3 µm ≥ 3 µm 5 µm, 10 µm 15 µm Analytical Columns High-Speed Analysis Conventional Analysis

Application Note - downloads.leica-microsystems.com EM... · Diamond foils: 15 µm, 9 µm, 6 µm, 3 µm, 1 µm and 0.5 µm at 2200 rpm until the final sample thickness of 30 µm

LumiCam Series - Instrument Systems · Image size (one pixel) at 1 m distance (h x v) 217 µm x 217 µm 119 µm x 119 µm 58 µm x 58 µm Lenses: Overview Optical accessories: Density

180919 stoba Vertreterpräsentation ENFilter sizes 1. Stage 2. Stage Chamber 1 10 µm --Chamber 2 10 µm --Chamber 3 1 µm 5 µm Chamber 4 1 µm 5 µm Filter unit Absolute filter

Portable Surface Texture Measuring Instruments · Tip radius 5 µm Tip radius 2 µm Tip radius 5 µm Tip radius 2 µm Tip radius 5 µm Measurement range Z direction-210 to +160 µm

The World`s First True Disposable Hemocytometer€¦ ·  · 2017-10-07Neubauer Improved Fuchs Rosenthal Burker Burker Turk Malassez 100 µm 200 µm 100 µm 100 µm 200 µm No. Grid

Dimatix Materials Printer DMP-2850 DMP-2850 0 µm 100 µm 200 µm 300 µm 400 µm System Description Flat substrate, xyz stage, inkjet deposition system Low cost, user-fillable piezo-based

CORNINGpolishing pad heat blower consumable items epoxy (epo-tek 353nd) spiral tube lapping film 16 µm lapping film 9 µm lapping film 3 µm lapping film 1 µm lapping film 0.3 µm

Merkel Omegat OMK-E - seal-directSliding surface 0,05 … 0,3 µm ≤2,5 µm Groove base ≤1,6 µm ≤6,3 µm Groove flanks ≤3,0 µm ≤15,0 µm Percentage contact area M r >50%

ETALON HP High precision comparators DIN 879-1 Dimen ... · Total deviation spanl 9 µm 17 µm Repeatability limit 3 µm 3 µm Max. hysteresis 3 µm 3 µm Measuring force – Models

ISO 16890 Get the full picture on filter performance....1 µm and PM10 2 µm 3 µm 4 µm 5 µm 6 µm 7 µm 8 µm 9 µm 10 µm 0 µm 1 µm So you get the full picture of how a filter

Verifying the measurement accuracy for multiple-scan X-ray ... · PDF fileperfect spheres Length measurement ... 200 µm pixel pitch, 800 ms exposure time Voxel pitch 148 µm Source

Coolandfresh - Alfa LavalPre-filtration 0,65 µm Sterile filtration 0,45 µm or 0,65 µm Air and CO Water and CIP filtration 0,65 µm 2 filtration 0,2 µm Water/ CIP Outlet for sterile

MiCRO SYSTEMS · Sensor Hyper energy laser Material Nickel Nickel Nickel Slit Width 5 µm 10 µm 25 µm Thickness 20 µm 23 µm 20 µm Part Diameter 9.5mm 9.5mm 3.5mm // ULTRASONIC

Teatro 11 10 16 00 Arthur Burnett Subs Trinity Bivalacqua · • Strong presence of Schawnn cells Sham BCNI BCNI+Y-27632. 223.52 µm 275.35 µm 314.11 µm 179.21 µm 185.25 µm Incubation

Compania - Proidea...Polyester (lucios de 25 µm sau mat de 35 µm), PVDF (polifluorură de viniliden) de 25 µm, PUR (poliuretan) de 55 µm sau PUR MAT (poliuretan mat) de 50 µm