Keysight TechnologiesApplication Solution Guide

January–May 2016

IN THIS ISSUE

PAGE 04: Applying Five Techniques that Improve Sensitivity or Sweep Rate

PAGE 10: Making Better Ripple and Noise Measurements on DC Voltage Rails

PAGE 16: Using Permittivity Measurements to Determine Soil Composition

PAGE 22: Thoroughly Characterizing and Validating PCI Express Receiver Designs

US +1 800 829-4444 Canada +1 877 894-4414

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02 | Application Solution Guide | January–May 2016

Table of Contents What’s New

For more details and to see

our complete list of current

promotions visit:

www.keysight.com/ind/promotions

3 Featured Power Products

4-5 Challenge: Making Better Measurements In Noise

6-7 Signal Analyzers

8 Signal Analyzer/Signal Generator Apps and Software

9 Signal Generators

10-11 Challenge: Measuring Noise & Ripple On DC Rails

12-13 Oscilloscopes and Oscilloscope Software

14 Type-C Test Fixtures and Logic Analyzers

15 Pulse Function and Arbitrary Waveform Generators

16-17 Challenge: Measuring Composite Materials

18 Impedance Analyzers

19 Bit Error Ratio Testers

20-21 Network Analyzers

22-23 Challenge: PCIe® Receiver Testing

24 PCI Receiver and Transmitter Test

25 PCIe Interconnect Test

26-27 PXI and AXIe Modular Instruments

PA2200 Series IntegraVision Power Analyzers

Combine accurate power measurements and touch-driven oscilloscope visu-

alization capability in a single power analyzer. Available for single-phase and

three-phase measurements.

SEE PAGE 3

X-Series Measurement Applications

Add analog demodulation (N9063C) and noise igure (N9069C) measurement applications to our lagship UXA X-Series signal analyzer. In the PXA, MXA, and EXA signal analyzers, perform standard-compliant 802.11ah measurements with the WLAN measurement application (N/W9077A).

SEE PAGE 8

N7015A and N7016A Type-C Test Fixtures

The N7015A and N7016A Type-C test ixtures are designed for minimum loss and are carefully characterized using S-parameters to ensure greater

accuracy through de-embedding.

SEE PAGE 14

M8196A Arbitrary Waveform Generator

Generate high-speed, wide-bandwidth, digital and multi-level (e.g., PAM-4, PAM-8, DMT) signal scenarios at 8-bits of vertical resolution. Test electrical and optical links with complex modulated signals up to 64 GBaud.

SEE PAGE 15

RF and Microwave Test AccessoriesQuickly identify and thoroughly research the industry’s highest-quality

RF and microwave test accessories.

RF and Microwave Test Accessory Catalog

Download a free copy: www.keysight.com/ind/MTAcatalog

Keysight software is downloadable expertise. www.keysight.com/ind/software

Featured Power Products

N8900 Series Autoranging High-Power System Supplies

Do the job of multiple power supplies with a single high-power

autoranging DC supply. Autoranging output—like having many

power supplies in one!

– 15 kW single-output, autoranging programmable DC power for ATE applications

– Just the right amount of performance at just the right price

– 10 models with up to 1500 V or 510 A

To learn more, visit www.keysight.com/ind/N8900

N6900 and N7900 Series Advanced Power System (APS)

VersaPower architecture delivers the fastest and most accurate

integrated power system. Overcome your power test challenges

with the Advanced Power System family.

– 1 and 2 kW models (parallel expandable to 10 kW); up to 160 V and up to 200 A

– Increase system throughput (programming speeds up to 350 μs) – N7900 for high-speed dynamic sourcing and measurement

To learn more, visit www.keysight.com/ind/APS

NEW PA2200 Series IntegraVision AC Power Analyzers

See, measure and prove the performance of your design with an intuitive combination of accurate power measurements and

touch-driven oscilloscope visualization for both single-phase

and three-phase AC measurements.

– Basic accuracy of 0.05% (@ 50/60 Hz)

– 5 MSa/s at 16 bits on every waveform simultaneously

– Voltage: Measures 1000 Vrms with bandwidth up to 2 MHz

– Current: Measures current directly using two internal shunts

To learn more, visit www.keysight.com/ind/integravision

Application Solution Guide | January–May 2016 | 03

04 | Application Solution Guide | January–May 2016

CHALLENGE: MAKING BETTER MEASUREMENTS IN NOISE

Applying Five Techniques that Improve Sensitivity or Sweep Rate

In electronic circuitry, inherent noise can cause random disturbances that affect the

information sent from a transmitter to a

receiver. Because noise typically limits the

overall performance of any wireless system, it’s a fundamental parameter to be tested

in all transmitter and receiver components.

The signal and spectrum analyzers used

to make those measurements are also

high-performance broadband receivers.

The presence of any internal noise affects

the analyzer’s ability to measure low-level

signals while maintaining high accuracy

and fast sweep rates. Five techniques can

help improve accuracy and sensitivity when

characterizing small signals, especially those near the noise loor.

Reduce the resolution bandwidthFigure 1 shows several measurements of

the same low-amplitude signal, each made with different settings intended to reduce

the noise loor. The upper trace (yellow) shows a typical measurement using a

signal analyzer conigured with 100 kHz resolution bandwidth (RBW) and 10 dB

of front-end attenuation. Here, the signal amplitude is very close to the displayed

noise loor. At the signal peak, marker 1 shows an amplitude reading of –85.1 dBm.

When comparing the peak to the displayed

noise loor, this baseline measurement has a signal-to-noise ratio (SNR) of about 5 dB.

This low SNR value will affect the accuracy

of amplitude measurements.

In Figure 1, the blue trace shows a 10 dB improvement in noise loor after reducing

the RBW from 100 kHz to 10 kHz. Further

reductions in RBW will continue to lower

the noise loor, but at the expense of longer sweep times. In analyzers that use

analog RBW ilters, sweep rate is inversely proportional to the square of the RBW.

Reduce signal analyzer attenuationOther techniques will improve analyzer

sensitivity without increasing sweep time.

One example: reducing the front-end

attenuation setting, which can be manually adjusted down to 0 dB. Referring back to

Figure 1, the middle (magenta) trace shows the resulting improvement in the noise

loor. Please note that any reduction of front-end attenuation should be done with

caution: if a high-power signal is present

alongside the signal of interest, it’s possible to overdrive the analyzer input.

Use a preampliierThis requires an analyzer conigured with an internal or external broadband

preampliier. A preampliier improves the system’s noise igure and lowers the displayed noise loor. In Figure 1, the green trace shows another 15 dB reduction in

noise loor due to the internal preampliier. This improvement reveals a spurious

tone that was previously hidden by noise

(marker 2).

100k 10

10

0

0

0

`

` `

10k

10k

10k

10k

RBW

(Hz)

Atte

nuat

or (d

B)Pr

e-Am

pNFE

2

1

CW Signal

Noise Floor

FIGURE 1. Adjusting a few essential settings will improve analyzer sensitivity.

www.keysight.com/ind/switch2exa

Application Solution Guide | January–May 2016 | 05

CHALLENGE: MAKING BETTER MEASUREMENTS IN NOISE (CONTINUED)

Remove analyzer noise from the measured signalA feature called Noise Floor Extension

(NFE), available on Keysight’s X-Series signal analyzers, improves analyzer sensitivity. The NFE process does this

by identifying the instrument’s noise

contribution at speciic settings and then subtracting that noise from the

measurement. In Figure 1, the red trace shows a measurement with NFE activated:

the displayed noise loor is improved by another 8 dB.

Use oversweep to accelerate sweep timeTo maintain a calibrated display, conventional signal analyzers will

automatically couple the sweep time to

the frequency span and selected RBW.

Increasing the sweep speed beyond

an acceptable rate will cause errors in

amplitude and frequency. In Figure 2, the blue trace shows a measurement made

using the proper sweep-time setting, and the red trace shows the amplitude and

frequency errors that result when sweep

time is too low.

In analyzers that use a fully digital IF

section, a technique called oversweep characterizes and corrects for the digital

RBW response, enabling faster sweep rates than are possible with traditional

analog RBW ilters. This “fast sweep” technique, as Keysight calls it, provides sweep rates that are up to 50 times faster

than traditional methods but still retain

measurement accuracy (Table 1). Fast

sweep is available in all PXA models and

in EXA and MXA models conigured with options MPB (preselector bypass), DP2 (digital processor) or B40 (40 MHz analysis

bandwidth).

Highest sensitivity and fastest sweep rates in a midrange analyzerIt’s possible to apply these techniques

separately or in combination using a

Keysight EXA X-Series signal analyzer

(N9010A). This makes it easier to ind and analyze signals, spurs and anomalies that may otherwise be hidden in noise.

The EXA provides sensitivity that ranges

from–165 dBm/Hz to –153 dBm/Hz, for lexibility to address a wide variety of challenging noise and spurious

measurements. Coniguring the EXA with one of the internal preampliier options and the industry’s only smart USB

preampliier (U7227A/C/F) provides further improvement in noise performance. With

built-in Fast Sweep and the optional NFE

capability, the EXA provides the highest sensitivity and fastest sweep rates of any

midrange analyzer.

To learn more about the advantages

of Keysight EXA X-Series signal

analyzer (N9010A), visit www.keysight.com/ind/switch2exa

FIGURE 2. With a conventional signal analyzer, sweeping too fast can cause errors in amplitude and frequency.

RBWTraditional methods

Fast Sweep option (FS1)

1 kHz >4000 s 540 s

3 kHz 2710 s 60 s

10 kHz 244 s 5.8 s

30 kHz 27.1 s 0.9 s

TABLE 1. This comparison shows the speed advantages

of fast sweep compared to traditional methods.

www.keysight.com/ind/switch2exa

06 | Application Solution Guide | January–May 2016

Depending on your application and requirements, the X-Series signal analyzers offer migration paths from many of our previous-generation spectrum/signal analyzers.

– To modernize manufacturing test systems, the EXA is an ideal replacement for the ESA-E: www.keysight.com/ind/esa2exa

– To accelerate the development of new wireless devices, the MXA expands on the performance and capabilities of the classic 8560E/EC Series: www.keysight.com/ind/856x_to_X-Series

– To upgrade test systems in R&D, manufacturing and ATE, the PXA is optimized for maximum backward compatibility—and is easily conigured as a replacement for—the E444xA PSA: www.keysight.com/ind/psa2pxa

Migrate to the X-Series

The Keysight X-Series is an evolutionary approach to signal analysis that spans instrumentation, measurements and software. This gives you the lexibility to satisfy business and technical requirements across multiple products and programs—now and in the future. The X-Series also creates a consistent framework that enables you and your teams to move at a faster pace. Stay ready, stay in sync and arrive ahead with the UXA, PXA, MXA, and EXA.

X-Series Signal AnalyzersRF, microwave and millimeter-wave signal analyzers

Signal Analyzers See PXI vector signal analyzer on page 27

EXA MXA PXA UXA

Frequency range10 Hz to 3.6, 7.0, 13.6,

26.5, 32 or 44 GHz10 Hz to 3.6, 8.4, 13.6 or 26.5 GHz

3 Hz to 3.6, 8.4, 13.6,

26.5, 43, 44 or 50 GHz3 Hz to 8.4, 13.6 or 26.5 GHz

Analysis bandwidth25 MHz standard;

40 MHz optional

25 MHz standard;

40, 85, 125 or 160 MHz optional

25 MHz standard;

40, 85 and 160 MHz optional

25 MHz standard;

40, 255 and 510 MHz optional

DANL at 1 GHz with preamp on –165 dBm –166 dBm –172 dBm (NFE on) –172 dBm (NFE on)

Third-order intermodulation

(TOI) distortion+18 dBm at 1 GHz +20 dBm at 1 GHz +22 dBm at 1 GHz +23 dBm at 2 GHz

W-CDMA ACLR dynamic range– 68 dBc (–73 dBc with

noise correction on)–78 dBc with noise correction on

– 83 dBc (–88 dBc nominal)

with noise correction on

- 83 dBc with

noise correction on

Spurious-free dynamic range N/A– 72 dBc over

160 MHz bandwidth

– 72 dBc over

160 MHz bandwidth

– 75 dBc over

510 MHz bandwidth

Phase noise at

1 GHz, 10 kHz offset–106 dBc/Hz –114 dBc/Hz –132 dBc/Hz –136 dBc/Hz

Amplitude accuracy ±0.27 dB ±0.23 dB ±0.19 dB ±0.19 dB

Real-time bandwidth N/A 160 MHz, up to 26.5 GHz 160 MHz, up to 50 GHz 510 MHz, up to 26.5 GHz

Minimal signal duration for

100% probability of intercept

(POI) with full amplitude

accuracy

N/A 3.57 µs 3.57 µs 3.517 µs

www.keysight.com/ind/X-Series

Application Solution Guide | January–May 2016 | 07

Signal Analyzers

Accelerate in wireless with the MXA

The midrange MXA is the optimum choice in wireless as you develop devices and deliver them to manufacturing and the marketplace. It has the lexibility to quickly adapt to your evolving test requirements—today and tomorrow.

– Optimized for fast power measurements such as channel power, adjacent channel power, occupied bandwidth and harmonics

– Shorten test times with rapid local measurements, display updates and marker peak searches

– Achieve low internal error vector magnitude (EVM) loor with best-in-class phase noise of –114 dBc/Hz

MXA X-Series Signal Analyzer

N9020A

Balance the challenges with the EXA

Address dificult noise and spurious measurements with the fast, lexible EXA. With the Fast Sweep and the optional Noise Floor Extension (NFE) capability, the EXA provides the fastest sweep rates and highest sensitivity of any midrange analyzer.

– Minimize the effects of noise: displayed average noise level (DANL) is -165 dBm at 1 GHz, -153 dBm at 44 GHz (preamp on)

– Rapidly measure spurious response with optional fast sweep: 1.5 s for 26.5 GHz full-span measurement with 20 kHz RBW

– Save time with standard PowerSuite one-button measurements

– Get power meter-class level precision with ±0.27 dB absolute amplitude accuracy

Improve the noise performance of your EXA:

– Internal preampliier options: P03, P07, P13, P26, P32, P44 – External smart USB preampliier: U7227A/C/F – Find more low-level signals with up to 9 dB improvement in DANL with

Noise Floor Extension (Option NFE)

EXA X-Series Signal Analyzer

N9010A

As featured in

CHALLENGE: MAKING BETTER MEASUREMENTS IN NOISE page 4

The UXA is the lagship of our X-Series signal analyzers. It provides wider, deeper views of elusive and wideband signals --known or unknown --and enables you to see more and take your design farther. The high-performance PXA provides advanced lexibility and expandability to address applications up to 50 GHz. To help you see, capture and understand the most elusive signals, both analyzers can be conigured with real-time spectrum analyzer (RTSA) capability.

For detailed analysis of complex modulated signals, the UXA and PXA are also compatible with the 89600 VSA software (page 8).

See even more with the UXA and PXA X-Series Analyzers

www.keysight.com/ind/X-Series

08 | Application Solution Guide | January–May 2016

Signal Analyzer/Signal Generator Apps and Software

Keysight software is downloadable expertise. www.keysight.com/ind/software

– Supports over 40 signal types including cellular, wireless connectivity, digital video and general purpose

– Install at time of instrument purchase or order as an upgrade for an existing instrument

– Run applications such as MATLAB and 89600 VSA software inside an X-Series or modular signal analyzer

X-Series Measurement ApplicationsX-Series measurement apps transform X-Series and modular signal analyzers into standards-based RF transmitter testers. They provide fast, one-button RF conformance measurements to help you design, evaluate, and manufacture devices and equipment.

Featured apps Complete offering available at www.keysight.com/ind/x-series_apps

Cellular

LTE/LTE-Advanced FDD & TDD, Multi-Standard Radio (MSR), W-CDMA/HSPA+,

TD-SCDMA/HSPA, GSM/EDGE/EDGE Evo, cdma2000®/cdmaOne, 1xEV-DO,

iDEN/WiDEN/MotoTalk

Wireless

connectivityWLAN 802.11a/b/g/n/ac/ah, Bluetooth® BR/EDR/LE, Mobile/Fixed WiMAX™

Digital video CMMB, digital cable TV, DTMB (CTTB), DVB-T/H T2, ISDB-T/Tmm

General

purpose

Analog demodulation for AM, FM or PM signals, phase noise, noise igure, VXA vector signal analysis, EMI, MATLAB, pulse, SCPI command language

compatibility, remote language compatibility

– Measure your signal: supports over 75 signal types for cellular, wireless connectivity, aerospace, defense and general purpose applications

– Verify signal performance quickly with multiple simultaneous views in time, frequency and modulation domains

– Pinpoint the answers to signal problems with troubleshooting tools like coupled markers, advanced triggering, record and playback

89600 VSA SoftwareThe 89600 VSA software is a comprehensive set of tools for demodulation and vector signal analysis. These tools enable you to explore virtually every facet of a signal and optimize your most advanced designs.

Featured apps Complete offering available at www.keysight.com/ind/VSA

CellularLTE/LTE-Advanced FDD & TDD, W-CDMA/HSPA+, GSM/EDGE/EDGE Evo,

cdma2000®, 1xEV-DO, TD-SCDMA/HSPA, MIMO

Wireless

connectivity

WLAN 802.11a/b/g/n/ac/ah, Bluetooth®, Mobile/Fixed WiMAX™, ZigBee,

RFID, Wi-SUN

General purposeCustom IQ, custom APSK, FSK, BPSK, QPSK, QAM, StarQAM, APSK, VSB,

Custom OFDM, SOQPSK, AM/AM, AM/PM, channel quality measurements

Radar analysis Pulse analysis, FMCW radar analysis, satellite group delay

Other DOCSIS 3.1 downstream

– Generate application-speciic test signals, at baseband, RF, and microwave frequencies – Conigure signals in an easy-to-use, application-speciic graphical interface – Scale capability and performance to meet your speciic test needs

Signal Studio SoftwareSignal Studio software, reduces the time you spend on signal simulation and simpliies signal creation. Its performance-optimized reference signals—validated by Keysight— enhance the characterization and veriication of your devices.

Featured apps Complete offering available at www.keysight.com/ind/signalstudio

Cellular LTE/LTE-Advanced FDD & TDD, W-CDMA/HSPA+, GSM/EDGE/Evo,

TD-SCDMA/HSPA, cdma2000®/1xEV-DO, 5G, envelope tracking/DPD

Wireless

connectivity

WLAN 802.11a/b/g/n/ac/ah, Bluetooth®, Mobile/Fixed WiMAX™,

DFS, Wi-SUN, ZigBee

Audio/video broadcasting Broadcast radio, digital video

Detection, positioning,

tracking and navigation

Global Navigation Satellite Systems (GNSS: GPS, GLONASS, Galileo,

and Beidou), pulse building

General RF & microwaveCustom IQ, custom OFDM, custom multi-carrier, jitter injection,

multitone distortion

www.keysight.com/ind/free_trials

Application Solution Guide | January–May 2016 | 09

Signal Generators

EXG MXG PSG UXG

Model NumbersN5172B RF vector

N5173B μW analogN5182B RF vector

N5183B μW analog

E8257D μW analog E8267D μW vector E8663D RF analog

N5193A

Frequency rangeN5172B: 9 kHz to 3 or 6 GHzN5173B: 9 kHz to 13, 20,

31.8 or 40 GHz

N5182B: 9 kHz to 3 or 6 GHzN5183B: 9 kHz to 13, 20,

31.8 or 40 GHz

E8257D: 100 kHz to 13, 20, 31.8, 40, 50 or 67 GHz

E8267D: 100 kHz to 13, 20, 31.8 or 44 GHz

E8663D: 100 kHz to 3.2 or 9 GHz

10 MHz to 20 or 40 GHz

Phase noise (20 kHz offset)

–122 dBc/Hz (at 1 GHz) –146 dBc/Hz (at 1 GHz) –143 dBc/Hz (at 1 GHz) –146 dBc/Hz (at 10 GHz)

Spurious (non-harmonic) –72 dBc at 1 GHz –96 dBc at 1 GHz –88 dBc at 1 GHz –65 dBc at 18 GHz

Output power (1 GHz) +27 dBm +27 dBmE8257D: +28 dBm, E8267D: +18 dBm, E8663D: +23 dBm

+10 dBm

Switching speedN5171B: ≤ 800 µs, N5173B: ≤ 600 µs , N5172B: ≤ 800 µs

N5181B: ≤ 800 µs, N5183B: ≤ 600 µs, N5182B: ≤ 800 µs

< 8 ms ≤ 250 ns

Generate true performance with the MXG

Take your devices and designs to the limit with the MXG X-Series signal generators: they’re ine-tuned to be your “golden transmitter” in R&D. Whether you’re pushing for a linear RF chain or an optimized link budget, the MXG delivers phase noise, ACPR, channel coding, and more.

– Test radar receiver sensitivity with best-in-class phase noise and spurious performance

– Compensate for system loss, stimulate remote DUTs, and drive high-power ampliiers while retaining signal integrity

– Simulate multi-channel composite analog modulation with integrated multifunction generation

– Create variable radar PRI and pulse width with integrated pulse train generator

MXG X-Series Signal Generators

Generate faster throughput with the EXG

The cost-effective EXG X-Series signal generators are optimized for manufacturing test. With analog and vector models, the EXG provides the signals you’ll need for basic parametric testing of components and functional veriication of receivers. Get “just enough” test with the EXG.

– Conidently test components with excellent level accuracy and repeatability – Compensate for test system losses with best-in-class output power

– Maximize throughput with fast switching speed

– Shrink your test stand with two rack-unit height

– Get the performance and capabilities you need today and easily upgrade later

EXG X-Series Signal Generators

Our RF and microwave signal generators (9 kHz to 67 GHz) reliably produce the signals you need—from simple to complex. Generate true performance at RF with the MXG, ine-tuned for the highest levels of performance, or the EXG, a cost-effective choice for essential signals. For advanced microwave measurement systems, generate trusted performance with the metrology-grade PSG, or choose the MXG and EXG when you need alternatives in size, speed, and cost. The UXG agile signal generator addresses complex multi-emitter scenarios with switching speed of less than 250 ns.

Analog, vector and agile signal generators at RF and microwave frequencies

Keysight’s microwave signal generators are an essential part of today’s most advanced measure-ment solutions. The PSG is the industry’s most trusted model, with thousands of units deployed around the world. With metrology-grade performance and evolving capabilities, it continues to enable new, leading-edge designs.

The UXG agile signal generator is a powerful building block, whether you need a dependable LO or a scalable signal-scenario simulator. By blurring the lines between analog and vector technologies, the UXG lets you generate increasingly complex simulations that get closer to reality.

Master your most complex microwave signal requirements

www.keysight.com/ind/signal_generators

10 | Application Solution Guide | January–May 2016

Making Better Ripple and Noise Measurements on DC Voltage Rails

In every integrated circuit (IC), power is a tightly controlled commodity. As demand

for longer battery life, more features and improved performance increase, the burden falls to designers to reduce power

consumption on their internal power

distribution network (PDN).

To reduce power consumption, voltages and tolerances have gotten smaller: many

of today’s designs have 3.3 V, 1.8 V and even 1.1 V supplies. As output voltages

have become smaller, so have their tolerances, dropping from 10% to as low as 1%. Ensuring a clean power rail that stays

within the tolerance band depends on the

ability to identify and reduce ripple, noise and transients—and this requires tools that

make it possible to see and characterize

small signals riding on the DC power rails.

A key test challenge: Measuring small AC signals riding on DCEvery circuit that depends on DC power

has a tolerance band around the expected

value of the supply voltage. As long as

ripple, noise or transients stay within the band, the PDN will pass tolerance testing.

If the unwanted signals exceed

the band limit, then it’s time to investigate the problem.

An oscilloscope is often the best

way to measure small AC signals

riding on a DC level. To ensure

accurate measurements, the noise in the total oscilloscope

measurement system—

instrument, cable and probe—needs to be well below the

signal level. The following tips

will help improve your resolution

on AC signals.

Use a 1:1 probeOscilloscope probes are available

in a variety of attenuation ratios, and the ratio indicates the

division factor applied by the

probe. For example, a 10:1 probe divides the input by 10, enabling measurements of signals that

might otherwise exceed the

oscilloscope’s maximum input

level.

Unfortunately, attenuating the input signal increases the relative magnitude of any

noise present inside the instrument. In

Figure 1, 1:1 and 10:1 probes are used to measure the same 20 MHz signal. The

actual peak-to-peak amplitude is 50 mV

but the 10:1 probe overstates the measured

value by at least 25 percent due to the

reduced signal-to-noise ratio (SNR) caused

by divide-by-10 attenuation.

Connect through the 50 Ω input path

The oscilloscope measurement path

includes the probe, the instrument, and the input termination, which is either 50 Ω or 1 MΩ. In many oscilloscopes, the 50 Ω input is the lower-noise path.

This is the case in Figure 2, which shows the baseline noise for 50 Ω and 1 MΩ inputs. Clearly, the 50 Ω input is the better choice when measuring small AC signals

riding on a DC level.

CHALLENGE: MEASURING NOISE & RIPPLE ON DC RAILS

FIGURE 1. Measuring the same small signal, the 1:1 probe provides a better signal-to-noise ratio and a more accurate voltage reading.

FIGURE 2. The lower-noise 50 Ω input path is the better choice when measuring low-level signals.

www.keysight.com/ind/switch2sseries

Application Solution Guide | January–May 2016 | 11

Increase dynamic range with probe offsetRipple and noise are likely to be quite

small compared to the DC level. Some

oscilloscopes and active probes provide an

offset feature that enables removal of DC

content from the measured signal. Figure

3 shows the results of measurements on a

1.5 V supply with and without probe offset.

Although most active probes provide offset, many have large attenuation ratios. As

mentioned above, this increases the size of the oscilloscope system noise relative to

the signals of interest. In addition, while a DC block removes DC content, it may also block low-frequency signal content.

Minimize loading When a probe makes electrical contact with

a system, it becomes a part of the system. It also adds resistive loading, which has the potential to change system behavior.

Minimizing this loading is essential when

measuring small signals.

In the context of measuring DC power

rails, excessive loading can happen when a 50 Ω coaxial cable is connected between the supply and the 50 Ω input of the oscilloscope. Figure 4 shows a comparison

of power-rail measurements. As a baseline

for comparison, measuring with a DMM produced a reading of 3.31 V. Probing with

a 50 kΩ input impedance produced an

identical reading. When the supply was

probed by connecting directly to a 50 Ω oscilloscope input, the reading fell to 3.25 V.

Try a specialized power-rail probeAll of the preceding techniques are even

more effective when combined with a

specialized tool designed to measure noise

and ripple on a power rail . For example, the N7020A power rail probe is the irst probe designed for measuring noise on

DC voltage rails (Figure 5). It has a 1:1

attenuation ratio, ±24 V of offset, 2 GHz bandwidth and 50 kΩ input impedance; it also connects to a 50 Ω oscilloscope input.

When used with the

Keysight Ininiium S-Series oscilloscope, the N7020A has 2 GHz

bandwidth to capture

high-frequency noise

and transients that cause

clock and data jitter.

To learn more about the

N7020A and S-Series

oscilloscopes, visit: www.keysight.com/ind/switch2sseries

CHALLENGE: MEASURING NOISE & RIPPLE ON DC RAILS (CONTINUED)

FIGURE 3. Using probe offset (right) to focus on the small AC signal reveals detail that can help pinpoint the cause.

FIGURE 4. Comparison of noise on 3.3 V power rail measurements, showing input impedance of 50 kΩ on the left and input impedance of 50 Ω on the right.

FIGURE 5. The purpose-built N7020A probe

enhances techniques described in the article.

www.keysight.com/ind/switch2sseries

N7020A 50 kΩ at DC 50 Ω cable to oscilloscope (50 Ω at DC)

3.61 V

3.13 V

2.63 V 3.00 V

3.20 V

3.40 VDCVrms = 3.31 V DCVrms = 3.25 V

Note: 50 Ω at DC pulled this supply down ~60 mV (changed

the target this much)

12 | Application Solution Guide | January–May 2016

Oscilloscopes

The most advanced oscilloscope platform on the market with

industry-leading signal integrity.

Best signal integrity

– 10-bit analog-to-digital converter (ADC) for high vertical resolution

– Low-noise front end with system ENOB up to 8 bits

Broadest range of capability

– Removable solid-state drive for fast boot up

– Instant software upgrade to a higher bandwidth

– Capture long records with 50 Mpts/channel standard memory depth

– Choose from a wide range of protocol, compliance, and analysis options

– Supports a wide variety of voltage, current, differential, single-ended, active, and passive probes

Ininiium S-Series Oscilloscopes

The N7020A power rail probe, when used with the S-Series, provides a proven solution to measure power rails.

As featured in

CHALLENGE: MEASURING NOISE & RIPPLE ON DC RAILS page 10

Keysight is a leader in oscilloscope innovation, and we are proud to hold a host of industry irsts including the irst Mixed Signal Oscilloscope (MSO). Our Ininiium oscilloscopes offer the industry’s deepest memory and lowest noise loor. Our capacitive touch-screen oscilloscopes, combined with IniniiScan Zone touch trigger, are the only scopes that let you trigger on areas of interest with a swipe of the inger. This innovation leadership carries over to our probes and accessories with breakthroughs such as the industry’s highest sensitivity, highest dynamic range AC/DC current probes that can measure currents as low as 50 μa.

S-Series 90000A Series V-Series Z-Series 86100D DCA X-Series

Bandwidth 500 MHz to 8 GHz 2.5 to 13 GHz 8 to 33 GHz 20 to 63 GHz 70 GHz optical* 93 GHz electrical*

Channels 4, 4+16 4 4, 4+16 4 Up to 16

Sample rate Up to 20 GSa/s Up to 40 GSa/s Up to 80 GSa/s Up to 160 GSa/s Up to 250 kSa/s*

Memory depth

Up to 800 Mpts Up to 1 Gpts Up to 2 Gpts Up to 2 Gpts Up to 128M samples/waveform**

ADC bits 10 8 8 8 14 to 16*

Special triggers

– IniniiScan – Digital channels – Serial protocol – A-B HW

– IniniiScan – A-B HW

– IniniiScan – A-B HW – Digital channels – HW serial

– IniniiScan – A-B HW

None

Key Features

– 16 independent/cascaded math functions – 15-inch capacitive touch display – Low-noise front-end – More than 42 applications for compliance, debug and analysis

– Ideal for high-speed digital and RF applications – More than 38 applications for compliance, debug, and analysis

– Best-in-class signal integrity – Longest 160-bit hardware serial trigger – More than 50 applications for compliance, debug, and analysis

– Best-in-class signal integrity – Industry’s lowest noise and jitter measurement loors – More than 50 applications for compliance, debug, and analysis – RF, optical applications and emerging technologies analysis

– Multi-function sampling scope – Digital communications analyzer – Automated eye diagram analysis – Jitter and interference analyzer – TDR/TDT for impedance and S-parameter analysis

* Module dependent ** Maximum number of samples depends on pattern, number of active channels and available memory.

www.keysight.com/ind/oscilloscopes

Application Solution Guide | January–May 2016 | 13

Oscilloscopes

Whether you’re analyzing wide-bandwidth RF signals, validating your digital designs, or investigating transient phenomena, the combination of correct bandwidth and high signal integrity is critical. For these applications, Z-Series oscilloscopes deliver.

– Up to 63 GHz true analog bandwidth

– Up to 160 GSa/s sample rate for ultra-low noise

– Jitter measurement loor: 75 fs – Full 30 GHz probing system

– Comprehensive selection of debug, analysis, and compliance software

Ininiium Z-Series Oscilloscopes

Oscilloscopes engineered for unmatched real-time measurement accuracy. Pass today’s demanding compliance tests more quickly, debug your toughest designs with conidence, and use your jitter budget in your design, not on your oscilloscope.

– Unmatched real-time measurement accuracy, based on combination of bandwidth and the industry’s lowest noise loor

– The deepest memory in the industry (up to 1 Gpts)

– Generous 12.1-inch display with color-coded channel controls for easier operation and viewing

– Full-bandwidth probing solutions and hardware-accelerated de-embedding and equalization techniques

– Streamline your debug and analysis tasks with the industry’s widest selection of application software, including a wide range of complete compliance measurement applications

Ininiium 90000A Series Oscilloscopes

The V-Series provides best-in-class signal integrity, maximizing margins for design validation, supporting wideband RF applications and spectral analysis of transients.

– True analog bandwidth to 33 GHz

– Lowest noise loor: 2.10 mV at 50 mV/div, 33 GHz – Flattest frequency, magnitude and phase response

– Spurious-free dynamic range (SFDR) >50 dBc

– Full 30 GHz probing system

– Comprehensive selection of debug, analysis and compliance software

Ininiium V- Series Oscilloscopes

Keysight software is downloadable expertise. www.keysight.com/ind/software

The Ininiium Series oscilloscopes are supported by the largest range of application software packages in the industry, giving you multiple ways to extend your oscilloscope’s capability. These applications are engineered to quickly and easily provide exceptional insight into your signals.

Ininiium Software Applications

Protocol decode and triggering Compliance Analysis

I2C, SPI, RS-232, CAN,

LIN, FlexRay, JTAG, USB,

PCI Express, MIPI, SVID,

SATA, DDR, 8B/10B, MHL

DDR, Ethernet, USB, PCI

Express, DVI, DisplayPort,

HDMI, SATA, BroadR-Reach,

MOST150, MIPI, SD-UHS

IniniiScan, Serial Data Analysis (eye), jitter, equalization, de-embedding,

FPGA dynamic probing, power

analysis, MATLAB

www.keysight.com/ind/oscilloscopes

14 | Application Solution Guide | January–May 2016

Logic Analyzers

Timing analysis (asynchronous sampling)

– 2.5 GHz/5 GHz (400 ps/200 ps) conventional and transitional timing analysis in deep memory (full/half channel)

– Up to 128 M/256 M deep memory (full/half channel)

– 12.5 GHz (80 ps) Timing Zoom with 256 K memory

State analysis (synchronous sampling)

– 350 MHz state clock/700 Mbps data rate (standard)

– 700 MHz state clock/1400 Mbps data rate (optional)

– Up to 128 M deep memory

– Reliable measurements on eye openings as small as 200 ps by 100 mV

Probing

– Single-ended direct connect lying lead, Mictor, and Soft Touch Pro connectorless probes – Compatible with U4201A cable plus any 90-pin header single-ended or differential probes

Applications

– General digital debug and validation

– FPGA debug (automated analyzer setup for Xilinx ISE designs and Altera Quartus designs)

– DDR2/3 1333 ADD/CMD/Data Decode, Debug, Functional Compliance test, and Performance Analysis

– LPDDR/2/3 1333 ADD/CMD/Data Decode, Debug, Functional Compliance test, and Performance Analysis

– Digital I/Q baseband signal capture and 89600 VSA software for signal demodulation and vector signal analysis

Portable Logic Analyzer 16850 Series

The industry’s fastest timing capture with deep memory—for fast digital system debug.

NEW N7015A High-speed Type-C Test Fixture

– Provides 20 GHz bandwidth (at -3 dB) and delivers best-in-class performance with up to 30 GHz of de-embedding bandwidth

– Makes signals accessible for probing to the device and host ports (upstream and downstream)

– Breaks out four high-speed lanes for signal injection and measurement

NEW N7016A Type-C Low-speed Signal Access and Control Fixture

– Manages low-speed power and control lines from the N7015A to support termination requirements

– Handles test coniguration and connections to third-party power-delivery controllers – Enables system diagnosis and control as well as probing and in-depth signal analysis

Oscilloscope Type-C Test Fixtures

When testing device performance at high data rates, the effects of cabling and test ixtures cause signal loss and impair measurement accuracy. To enhance accuracy through de-embedding, the N7015A and N7016A Type-C test ixtures are designed for minimum loss and are carefully characterized using S-parameters. This helps you make the most accurate measurements with the best signal integrity.

– Enables signal veriication and debug of USB 3.1, DisplayPort 1.3, Thunderbolt 3 and MHL 3.3/SuperHML – Provides the elements to seamlessly leverage Keysight’s compliance test applications

– Utilizes a durable design that ensures reliable operation after multiple connections and disconnections

– Works with Ininiium 90000 X-Series, V-Series, Z-Series and Q-Series oscilloscopes

www.keysight.com/ind/logic

Application Solution Guide | January–May 2016 | 15

Pulse Function and Arbitrary Waveform Generators

These single- and dual-channel precision pulse generators provide versatile signal-generation, modulation, distortion and pattern generation (optional). With all these tools at your disposal, you can create the unique and complex signals needed to stress your designs to the limit.

– High-precision pulses with unbeatable timing stability

– Versatile arbitrary waveforms and modulation using internal or external sources

– Deterministic white Gaussian noise with selectable crest factors

– Arbitrary bit-shaped pattern generator (optional) to create both ideal and real-world patterns

– Glitch-free change of timing parameters: delay, frequency, transition time, width, duty cycle

Pulse Function-Arbitrary-Noise Generators

81150A, 81160A

Pulse-Function-Arbitrary-Noise Generators and Arbitrary Waveform Generators

The ability to fully characterize and stress device behavior depends on lexible and exceptional waveform generation. Keysight’s arbitrary waveform generators (AWGs) and pulse-function-arbitrary-noise generators deliver optimum signal idelity for a variety of scenarios: analog, digital, signal simulation, stimulus/response, and more.

AXIe Arbitrary Waveform Generators

M8190A, M8195A, M8196A

From low-observable systems to high-density communications, testing is more realistic with precision arbitrary waveform generation. Now you can take reality to the extreme. A Keysight AWG is the source of greater idelity, delivering high resolution and wide bandwidth—simulta-neously. This unique combination lets you create signal scenarios that push your designs to the limit and bring new insights to your analysis. Get bits and bandwidth—enhance your reality.

81150A 81160A

Pulse generation1 µHz to 120 MHz with variable

rise / fall time

1 µHz to 330 MHz

with variable rise / fall time

Sine waves 1 µHz to 240 MHz 1 µHz to 500 MHz

Arbitrary waveforms14-bit, 2 GSa/s with 512k samples

of memory per channel

14-bit, 2.5 GSa/s with up to

256k samples of memory / chan

Noise Selectable crest factor, signal

repetition time of 26 days

Selectable crest factor,

signal repetition time of 20 days

Output amplitude

(50 Ω into 50 Ω)50 mVpp to 5 Vpp (high-BW amp)

100 mVpp to 10 Vpp (high-voltage amp)50 mVpp to 5 Vpp

Transition time range

(10/90)

2.5 ns to 1000 s (high-BW amp)

7.5 ns to 1000 s (high-voltage amp)1.0 ns to 1000 s

M8190A M8195A M8196A

Size 2-slot 1-slot 1-slot

Channels 1 or 2 1, 2 or 4 1, 2 or 4

Sample rate Up to 12 GSa/s Up to 65 GSa/s Up to 92 GSa/s

Resolution 12 bits to 12 GSa/s

14 bits to 8 GSa/s

8 bits 8 bits

Analog bandwidth 5 GHz 20 GHz 32 GHz

Transition times 50 ps (20/80) 18 ps (20/80) 9 ps (20/80)

Memory depth Up to 2 GSa Up to 16 GSa Up to 512 kSa

Impedance 50 Ω 50 Ω 50 Ω

NEW

www.keysight.com/ind/pulse_generators

16 | Application Solution Guide | January–May 2016

Using Permittivity Measurements to Determine Soil Composition

Whenever the price of crude oil rises, so does the interest in alternative energy

sources. One form of alternative energy

comes from oil shale, a ine-grained sedimentary rock containing a solid

mixture of organic compounds that

can be processed to produce the liquid

hydrocarbon called shale oil. Shale oil is a

substitute for crude oil but the extraction

process is more costly. So, it is important to test shale rock samples and characterize

the oil content.

A key test challenge: Characterizing complex materialsSoil materials, such as rock and clay, have electrical and mechanical properties that

depend on their organic and inorganic

composition, as well as the binding conditions. They often exhibit insulating

and conducting properties consistent with

dielectric materials. This makes it possible

to measure and determine the dielectric

constant or permittivity of a sample, and the permittivity of every material has a

characteristic frequency response.

These measurements can be made

electrically but there are several important

challenges. One is the need to make

measurements that may range from tens

of hertz to a few gigahertz, to better understand the distinctive features that

correspond to a material’s physical

properties. The other is the availability of

suitable test ixtures and sample holders that ensure high-quality measurements.

Deriving physical properties from electrical measurementsRocks and clay are composite materials

that contain moisture in the grain

boundaries, and that’s where dissolved conductive ions reside. Applying an electric

current creates conductivity by causing the

ions to move through the water (Figure 1).

As the water molecules change their

orientation, they exhibit some level of polarization. The relative permittivity of this

polarization is large compared to that of

vacuum, reaching about 80 below 100 MHz.

Conductivity and permittivity values

depend on the types of ions and molecules

present in the sample. They also depend on

characteristics such as porosity and ease

of movement. From this, a measurement of permittivity can be transformed into useful

information about physical properties such

as material composition and moisture

content—water, oil, and other luids.

Coniguring a dependable measurement solution

A variety of techniques are commonly used

to measure the permittivity of electronic

material. Some of these can be used to

characterize soil material .

At low frequencies, the parallel-plate capacitance method is widely used. A

capacitor is formed by sandwiching the

sample between two electrodes, and the permittivity is derived from an impedance

measurement (Figure 2).

For frequencies up to 30 MHz, one proven solution is the Keysight E4990A impedance

analyzer combined with the 16451B

dielectric test ixture and a dielectric sample holder from Material-Wave

Interaction Laboratories (MWI Lab). This

coniguration can measure powder samples and sheet formed solid samples that have

polished surfaces.

Open-ended coaxial probes are well-suited

to measurements of complex permittivity at

higher frequencies. The Keysight N1501A

CHALLENGE: MEASURING COMPOSITE MATERIALS

FIGURE 1. This igure illustrates the inner workings of soil material and the electrical properties that enable permittivity measurements.

www.keysight.com/ind/materials

Application Solution Guide | January–May 2016 | 17

Learn more:

Keysight Material Measurement Solutions:

www.keysight.com/ind/materials

Material-Wave Interaction Laboratories

(MWI Lab)

www.mwilab.com

of ground-penetrating radar systems, usually from 10 MHz to 10 GHz.

Base on the properties of soil material, ixturing and analysis method are required to Keysight and our solution partners’

ixtures and software along with technical experience in the electronic measurement

area will help the customers in these

research areas characterize materials.

dielectric probe kit with the N1500A option

004 materials measurement software can

be conigured to cover frequencies from 10 MHz up to 50 GHz. No special ixturing is required: measurements are made by

pressing the probe tip onto the surface of

the sample or by immersing the probe into

a liquid or semi-solid material. In this case, the recommended impedance analyzer is

the E4991B, which has a frequency range that covers 1 MHz to 500 MHz, 1 GHz or 3 GHz. The Keysight PNA, ENA and FieldFox network analyzers can be used for higher

frequency measurements using the N1501A

dielectric probe kit. The E4991B is also

compatible with the 16453A test ixture for dielectric materials (1 MHz to 1 GHz).

Extracting information from the resultsAs frequency increases, molecular dipoles cannot follow the changes in the electrical

ield. As a result, the real part of the relative complex permittivity ([’) rolls off and the

imaginary part of the loss factor ([’’) shows

a peak at each critical frequency.

For water molecules, that frequency is around 22 GHz. If the surface of a grain is

electrically charged, then water molecules are tightly bound to the surface. Because

the critical frequency of bound water is

lower than that of free water, a broad frequency measurement will reveal two

separate peaks (Figure 3).

These same characteristics apply to the

analysis of oil shale because the complex

permittivity depends on its physical

composition. As a result, its frequency response is similarly sensitive to factors

such as moisture content, organic compounds and salinity.

Applying these techniquesGiven the ease of transporting an

impedance analyzer and the necessary

accessories, this solution lends itself to onsite determination of the oil content of oil

shale. The ability to measure the dielectric

properties of soil also lends itself to

analyzing the propagation characteristics

CHALLENGE: MEASURING COMPOSITE MATERIALS (CONTINUED)

GCp

Fixture(16451B)

Sample Sample

Impedance Analyzer(E4990A)

Coaxial Probe(N1501A)

Impedance Analyzer(E4991B)

or Network Analyzer(ENA / PNA )

FIGURE 2. These typical solution conigurations use either a dielectric sample ixture (left) or dielectric coaxial probe (right).

FIGURE 3. The imaginary part of the permittivity response reveals two peaks that indicate the

presence of bound and free water in the sample. (This is a conceptual diagram.)

www.keysight.com/ind/materials

18 | Application Solution Guide | January–May 2016

Impedance Analyzers

See the real characteristics of complex materials and devices

The E4990A provides an industry best 0.045% (typical) basic accuracy over a wide impedance range, with a built-in 40 V DC bias source. Building on our long tradition of innovation and excellence in impedance analysis, it also provides all the functionality of the industry-standard 4294A impedance analyzer.

– Five frequency options: 20 Hz to 10/20/30/50/120 MHz, upgradable

– Basic accuracy ±0.08% (typical ±0.045%)

– Wide impedance measurement range 25 mΩ to 40 MΩ (10% measurement accuracy range) – Built-in DC bias range: 0 V to ±40 V, 0 A to ±100 mA

– Equivalent circuit analysis function including seven different multi-parameter models

– Four-channel and four-trace on 10.4-inch color LCD with touch screen

Impedance Analyzer

E4990A

The E4991B impedance analyzer has a frequency range of 1 MHz to 3 GHz. The E4991B provides 0.65% basic accuracy over a wide impedance range with a 40 V built-in DC bias source. The E4991B includes all the functionality of the industry-standard E4991A RF impedance/material analyzer.

– Three frequency options: 1 MHz to 500 MHz/1 GHz/3 GHz, upgradable

– Basic accuracy ±0.65%

– Impedance range 120 mΩ to 52 kΩ (10% measurement accuracy range) – Built-in DC bias (Option 001): 0 V to ±40 V, 0 A to ±100 mA

– Dielectric/magnetic material measurement (Option 002)

– Temperature characteristics measurement (Option 007) and reliable on–wafer measurement (Option 010) capabilities

– Equivalent circuit analysis function (seven different multi-parameter models)

– Four-channel and four-trace on 10.4-inch color LCD with touch screen

Impedance Analyzer

E4991B

As featured in

CHALLENGE: MEASURING COMPOSITE MATERIALS page 16

www.keysight.com/ind/E4990A | www.keysight.com/ind/E4991B

Application Solution Guide | January–May 2016 | 19

Bit Error Ratio Testers

Fast, accurate receiver characterization of single and multilane devices. The J-BERT M8020A streamlines receiver test setup by providing the highest level of integration, ensures accurate and repeatable measurements by automating stressed eye calibration, and supports interactive link training for increased eficiency.

– Data rates up to 16 or 32 Gb/s

– 1 to 4 channels in a 5-slot AXIe chassis

– Integrated and calibrated jitter and level interference

– 8 tap de-emphasis up to 20 dB

– Interactive link training for PCIe

– Built-in clock data recovery and equalization

– Integrated jitter and ISI

J-BERT High-Performance BERT

M8020A

This affordable and compact serial BERT is available in 4 to 17 Gb/s and 5 to 32 Gb/s conig-urations. It is the perfect solution to test multiple channels from 25 to 32 Gb/s for 100 gigabit ethernet applications and other multi-channel high-data rate devices operating either synchro-nously or asynchronously.

– Available for 4 to 17 Gb/s or 5 to 32 Gb/s conigurations – Pattern generation and error detection

– Integrated clock source with jitter injection capability

– PRBS and user deinable pattern, common telecom/datacom test patterns – Remote heads place the signal very close to DUT

Serial BERT 32 & 17 Gb/s

N4960A

These 12.5 Gb/s serial BERTs are single-channel or multi-channel pattern generators and error detectors. They are ideal for cost-effective test in manufacturing of optical transceivers up to 12.5 Gb/s and other high-speed digital communication components and systems.

– Up to 12.5 Gb/s pattern generator and error detector

– Differential or single-ended inputs and outputs

– Selectable PRBS pattern length, mark-space density

– 1 to 4 channels (N4965A)

– Integrated clock recovery (N4906B-102)

Serial BERTs up to 12.5 Gb/s

N4906B, N4962A, N4965A

As featured in

CHALLENGE: PCIe RECEIVER TESTING page 22

www.keysight.com/ind/BERT

20 | Application Solution Guide | January–May 2016

Network Analyzers

The PNA-X is the world’s most highly integrated and lexible microwave test engine for measuring active devices such as ampliiers, mixers and frequency converters. You can replace an entire rack of equipment with a single network analyzer that includes two internal signal sources; a signal combiner; S-parameter and noise receivers; pulse modulators and generators; and a lexible set of switches and RF access points.

– Make a wide range of linear and nonlinear measurements with a single set of connections to your DUT

– 128 dB system dynamic range at 10 GHz

– +13 dBm output power at 10 GHz

PNA-X Series Network Analyzers

The PNA provides the industry’s highest performance for the testing of microwave passive and active devices. You can use its combination of superior hardware and powerful measurement applications to quickly and accurately characterize a broad range of devices. All models are available in 2-port single-source and 4-port dual-source versions.

– Utilize the industry’s most accurate S-parameter measurements

– Get the industry’s widest power range, up to +13 dBm output power at 10 GHz

– 128 dB system dynamic range at 10 GHz

PNA Series Network Analyzers

Budget-friendly, general-purpose, midrange PNA-L microwave network analyzers are optimized for S-parameter and simple nonlinear testing to 50 GHz. The enhanced user interface, crisp touchscreen display and lexible remote interfaces maximize productivity in design and production environments.

– Measure S-parameters, gain compression and conversion gain/loss

– Compatible with Keysight physical layer test system (PLTS) system software, material test equipment and scanning microwave microscope

– 128 dB system dynamic range at 10 GHz, 124 dB receiver dynamic range at 10 GHz

– +10 dBm output power at 10 GHz

PNA-L Series Network Analyzers

PNA-X PNA PNA-L

Model N5241A, N5242A, N5244A,

N5245A, N5247A, N5249A

N5221A, N5222A, N5224A,

N5225A, N5227A

N5231A, N5232A, N5234A,

N5235A, N5239A

Maximum frequency range 10 MHz to 8.5, 13.5, 26.5,

43.5, 50 or 67 GHz

10 MHz to 13.5, 26.5, 43.5,

50 or 67 GHz

300 kHz to 8.5, 13.5 or 20 GHz;

10 MHz to 43.5 or 50 GHz

Number of ports 2 or 4 2 or 4 2 or 4

ECal support

Power meter cal

Frequency offset mode

Probe, ixture features

Support for mm-wave modules Up to 1.1 THz with extenders Up to 1.1 THz with extenders

In R&D, the PNA family provides a level of measurement integrity that helps you transform deeper understanding into better designs. On the production line, our PNAs deliver the throughput and repeatability you need to transform great designs into competitive products.

PNA Series Network Analyzers

See PXI vector network analyzer on page 27

www.keysight.com/ind/pna | www.keysight.com/ind/pxivna

Application Solution Guide | January–May 2016 | 21

Network Analyzers

Experience the standard in RF component testingThe Keysight E5080A is our next-generation ENA network analyzer, providing best-in-class performance, lexible functionality and advanced usability. With its intuitive, touch-based inter-face, the E5080A streamlines your measurement low and helps you get better results in less time. The E5080A combines the proven measurement capabilities of the ENA and the outstand-ing functional lexibility of the PNA, offering comprehensive functionality when measuring active and passive components such as ampliiers, mixers, ilters, antennas and cables, including balanced devices-under-test.

– Choose two or four test ports and frequency coverage from 9 kHz to 4.5, 6.5 or 9 GHz with bias-T

– Get best-in-class performance in ive key areas: – Wide dynamic range: 152 dB (typical) – Low trace noise: 0.0005 dBrms (typical) – High temperature stability: 0.005 dB/°C – Wide power range: -90 to +15 dBm (speciication) – Fast measurement speed: 3 ms (401 points)

– Make measurements more easily with lexible, intuitive operation – Address a variety of applications with powerful measurement capabilities

– Enhance measurement accuracy and conidence with advanced calibration tools

ENA Series Network Analyzer

E5080A

E5071C/72A E5063A E5061B

ENA Series Network Analyzers When you need to measure basic S-parameters, the right mix of speed and performance gives you an edge. On the production line, our ENAs provide the throughput, repeatability and reliability you need to create accurate, dependable test stations—and transform parts into competitive components. Add the ENA to your line—and drive down the cost of test.

E5080A E5072A E5071C E5063A E5061B

Frequency range 9 kHz to 4.5, 6.5

or 9 GHz

30 kHz to 4.5 or

8.5 GHz

9 kHz to 4.5, 6.5,

8.5, 14 or 20 GHz

100 kHz to 500 M, 1.5,

3, 4.5, 8.5, 14 or 20 GHz

5 Hz to 3 GHz,

100 kHz to 1.5 or 3 GHz

Number of ports 2 or 4 2 2 or 4 2 2

Dynamic range 152 dB 130 dB /151 dB

(Direct receiver access)

130 dB 122 dB 130 dB

Ecal support

Power sweep

Frequency offset

www.keysight.com/ind/ena

22 | Application Solution Guide | January–May 2016

Thoroughly Characterizing and Validating PCI Express Receiver Designs

The graphics and video subsystems inside

today’s PCs rely on the PCI Express® (PCIe)

high-speed serial bus to handle massive

data transfers. For hardware developers, testing PCIe receiver performance has

become especially dificult because fast signals passing through printed-circuit

traces deteriorate so much, that eye diagrams measured at the receiver input

may be completely closed. This poses

new problems in the process of ensuring

interoperability, backward compatibility and compliance with the latest version of

the PCIe standard. The answer is a solution

set that supports thorough characterization

and validation of the parametric and

protocol aspects of a design.

A key test challenge: Characterizing receiver performanceIn any serial bus, higher data rates often lead to issues with signal integrity—

relections, crosstalk, and more—that cause signal degradation and create timing

problems. For example, a shorter clock cycle means a smaller jitter budget, which makes it much more dificult to reduce jitter in a design.

Focusing on PCIe, every design can be separated into three layers: physical, data-link and transaction. At the physical

or PHY layer, it’s necessary to perform interconnect, transmitter and receiver testing. Among these, receiver testing at high data rates is the most challenging

process.

In a digital transmission system, the receiver must extract the digital content

from its input signal while maintaining a

very low bit error ratio (BER). The more

robust a receiver design, the greater its ability to tolerate distorted signals and

make the correct bit decisions.

Making quick, accurate jitter tolerance testsTo qualify receiver performance, PCIe uses a jitter tolerance test based on a calibrated

stress signal. Fully characterizing jitter

tolerance requires a pattern generator that

can create signals that put the receiver

into loop-back mode and also produce

a reference clock with spread-spectrum

capability. The generator must also create

calibrated, compliant jitter injection and de-emphasis to emulate receiver stress

conditions.

The extent to which the pattern generator

allows control of these attributes is

essential to determining measurement

accuracy. Greater precision enables better

understanding of receiver performance.

The Keysight J-BERT M8020A and

J-BERT N4903B offer fully integrated and

calibrated precision jitter sources. Both

CHALLENGE: PCIe RECEIVER TESTING

FIGURE 1. This example setup shows a typical setup for jitter tolerance testing using the J-BERT M8020A.

www.keysight.com/ind/PCIe-insight

Application Solution Guide | January–May 2016 | 23

models provide quick, authentic, worst-case jitter, and amplitude signals. These include random, sinusoidal and periodic jitter—plus inter-symbol interference (ISI)—

to emulate motherboard conditions.

Built-in test routines enable rapid testing

of a receiver’s jitter tolerance (Figure 1)

and the M8020A also has the ability to be

used for link equalization testing. To further

characterize a receiver, both J-BERT models can emulate a transmitter with de-

emphasized PCIe signals. This capability

is integrated into the J-BERT M8020A, simplifying test setup; the J-BERT N4903B

requires the addition of the N4916B de-

emphasis converter.

Simplifying complex tasksThe versatility of PCIe is apparent in multi-

lane designs. The good news: additional

lanes increase throughput. The bad:

receiver design is more complicated and

debug becomes more dificult.

To facilitate multi-lane receiver testing, the J-BERT M8020A is a modular platform

that can be conigured with multiple data generators and data analyzers. With

the N5990A software (Figure 2), it also supports automated receiver testing and

complete transmitter/receiver compliance

testing. The software can control the

J-BERT M8020A and J-BERT N4903B as

well as Ininiium oscilloscopes and other Keysight solutions.

Applying the J-BERT M8020ATo date, most solutions for receiver test require additional instruments to complete

the stressor set offered by the BERT. This

includes the J-BERT N4903B.

In contrast, the J-BERT M8020A offers built-in common-mode and differential-

mode sinusoidal interference (CM-SI and

DM-SI, respectively). This eliminates the need for additional non-ISI stressors.

The J-BERT M8020A also has an integrated

PCIe-compliant reference clock multiplier

that can generate the necessary clock

for the BERT from the system’s 100 MHz

reference clock. Because the multiplier

uses a phase-locked loop (PLL) with

enough bandwidth to transfer spread-

spectrum clock (SSC), the J-BERT M8020A can test systems with SSC turned on.

The M8041A BERT module offers data

ranges up to 8.5 Gb/s or 16.2 Gb/s. The

16.2 Gb/s version supports testing of

receivers at all four transfer rates.

Realizing your best designIn digital standards, every new version puts unfamiliar risks in the design path.

Keysight sees this irsthand when designing new products and when working with

customers. The Keysight solution set for

high-speed digital test is a combination

of software, instrumentation and broad expertise built on early and on-going

involvement with industry experts. By

capturing these capabilities in the high-

performance J-BERT M8020A, Keysight enables developers to characterize, validate and master their PCIe receiver designs.

For more information regarding

Keysight’s PCIe solutions, visit www.keysight.com/ind/PCIe-insight

Keysight offers solutions to meet your

needs in the electrical physical layer, protocol layer, and functional test . See an overview of these solutions in

the following pages.

CHALLENGE: PCIe RECEIVER TESTING (CONTINUED)

FIGURE 2. Automated PCI Express receiver test using the N5990A test automation software.

www.keysight.com/ind/PCIe-insight

24 | Application Solution Guide | January–May 2016

Solutions for PCIe – Receiver and Transmitter Test

Accelerate receiver characterization in single- and multi-lane devices

The J-BERT M8020A streamlines your test setup with today’s highest level of integra-

tion. It ensures accurate and repeatable measurements by automating stressed-eye

calibration, and it also increases eficiency with support for interactive link training.

– Data rates up to 16 or 32 Gb/s

– One to four channels in a ive-slot AXIe chassis – Integrated and calibrated jitter and level interference

– Eight-tap de-emphasis up to 20 dB

– Built-in clock data recovery and equalization

J-BERT

M8020A High-Performance BERT

The J-BERT N4903B provides complete jitter tolerance test for embedded and forward

clocked devices.

– Data rates 150 Mb/s to 7 or 12.5 Gb/s pattern generator and error detector (Option to extend data rate to 14.2 Gb/s pattern generator)

– >0.5 UI calibrated, compliant and integrated jitter injection: RJ, RJ-LF, RJ-HF, PJ1, PJ2, SJ, BUJ, ISI, sinusoidal interference, triangular and arbitrary SSC and residual SSC

– Excellent signal performance and sensitivity

– Built-in clock data recovery with tunable and compliant loop bandwidth

J-BERT

N4903B High-performance

serial BERTwith N4916B de-emphasis

signal converter

Simplify veriication and debug of PCI Express designsThe N5393D software for Ininiium 90000 Series oscilloscopes enables you to automat-ically execute electrical checklist tests and display the results in a lexible report for-mat. The report also includes an analysis that shows the margin by which your design

passed or failed each test.

Oscilloscope Software

N5393D PCI Express Electrical

Performance Validation and

Compliance Software

Achieve clarity faster with the V-Series

The Ininiium V-Series is more than just a great oscilloscope. With superior measure-

ment accuracy, enhanced analysis tools and advanced probing systems, it helps you move rapidly from irst silicon to crucial insights.

– Highest performance MSO channels at 20 GSa/s

– Longest 160-bit, 12.5 Gb/s hardware serial trigger

– Broadest range of software and application solutions

Ininiium High-Performance Oscilloscopes

V-Series

Our solution set for PCIe includes the hardware and software you need to thoroughly characterize and validate the parametric and protocol aspects of your design.

As featured in

CHALLENGE: PCIe RECEIVER TESTING page 22

www.keysight.com/ind/PCIe

Application Solution Guide | January–May 2016 | 25

Solutions for PCIe – Interconnect Test

– Precision oscilloscope, eye/mask, jitter and TDR/TDT/S-parameter measurements

– Supports up to 16 channels simultaneously with ultra-low jitter (<100 fs RMS with Option PTB)

– Bandwidth up to 93 GHz (typ.) electrical, 70 GHz (typ.) optical

– Advanced jitter and amplitude analysis, equalization, de-embedding/embedding, PLL analysis

– Jitter analysis on long patterns such as PRBS31

– Comprehensive selection of compliance software

The modular architecture of the 86100D means that the instrument can evolve to meet

your needs. There’s no need to purchase capability until you need it. Choose from a

variety of plug-in modules that perform precision optical, electrical, and TDR/ TDT measurements. Select modules to obtain the speciic bandwidth, iltering, and sensitivity that matches your measurement needs. Plan for the future – the DCA-X supports future

modules and new measurement capability

E5071C-TDR Enhanced Time Domain Analysis

– Analyze time and frequency domains simultaneously

– Remove unwanted ixture effects with gating function – Perform impedance characterization in signal pattern (TDR, TDT)

– Extend accurate vector error calibration to the tip of the test port

– Optimize pulse rise-time effects with window function setting

E5071C ENA Series network analyzer

– Frequency range: 9 kHz to 20 GHz, 2- or 4-port

– Low trace noise: 0.004 dBrms at 70 kHz IFBW

– Wide dynamic range: 130 dB (typical)

– Fast measurement speed: 8 msec @ full 2-port cal, 401 points

– High temperature stability: 0.005 dB/°C

– Balanced measurements with 4-port option

Ininiium DCA-X Series Wide-Bandwidth Oscilloscopes

86100D

This modular platform provides accurate and precise measurements on high-speed digital designs from 50 Mb/s to more than 80 Gb/s. Conigure the 86100D DCA-X mainframe by selecting from a variety of plug-in modules that perform precision optical, electrical, and TDR/TDT measurements.

ENA Series Network Analyzer with Option TDR, Enhanced Time Domain Analysis

E5071C

Enhance interconnect testing by removing unwanted cable and ixture responses with time-domain capabilities

See page 20–21 for more Network Analyzers

PCIe data rates require special attention to board design in order to minimize signal integrity problems. Therefore tools that are more commonly used by high frequency engineers — a time-domain relectometer (TDR) and a vector network analyzer (VNA) — maybe required.

86100D software options (select any)

061/062 Add MATLAB analysis package

200 Enhanced jitter analysis

201 Advanced waveform analysis

202 Enhanced impedance and S-parameters

300 Advanced amplitude analysis / RIN / Q-scale

401 Advanced eye, jitter on PRBS31

500 Productivity package

9FP PAM-N analysis software

SIM IniniiSim-DCA de-embedding / embedding86100DU 400 PLL and jitter spectrum analysis

86100D Ininiium DCA-X mainframe

DCA plug-in modules

86100D hardware options

Trigger options (select one only)

STR: Standard

ETR: Enhanced

Remote connection options (select one only)

GPI: GPIB card interface installed

GPN: No GPIB card

Precision timebase

PTB:Integrated precision timebase (requires option ETR)

www.keysight.com/ind/PCIe

26 | Application Solution Guide | January–May 2016

PXI and AXIe Modular Instruments

Keysight’s growing range of trusted PXI and AXIe modular instruments extends its measurement expertise to PXIe vector network analyzers, vector sig-nal analyzers, vector signal generators and AXIe multi-channel digitizers, arbitrary waveform generators and logic analyzers. Strengthened by Keysight’s world-class software applications, support and services, modular instruments provide trusted measurements from DC to microwave domains.

PXI and AXIe Reference SolutionsReference solutions are a combination of hardware, software and measurement expertise enabling users to more rapidly evaluate a test coniguration for a speciic test application. Two examples are shown, below.

RF PA/FEM Characterization and Test

LTE/LTE-A Multi-Channel Reference Solution

Rapid, full characterization of next-generation power ampliier modules such as PAD devices, including S-parameter, demodulation, power, adjacent channel power and harmonic distortion measurements are provided by this reference solution. Digital pre-distortion and envelope tracking signal generation and analysis are enabled by Keysight’s N7614A Signal Studio for Power Ampliier Test software.

– Fast servo loop convergence: <3 ms

– Fast ACPR measurements: <500 µs

– Fast full 2-port S-parameter measurements: 28-33 ms across 401 points

– Fast DPD open and closed loop measurement: <70 ms

Quickly set up, measure, visualize and characterize your most complicated multi-channel carrier aggregation, beamforming, and MIMO designs. Gain superior design conidence with a combination of phase coherent PXI VSAs and VSGs, available in 2-, 4- or 8-channel conigurations with Keysight’s industry leading application software and multi-channel coniguration and calibration tools.

– Frequency range: 1 MHz to 6 GHz

– RF modulation and analysis bandwidth: up to 160 MHz

– Timing alignment: ≤ 1 ns, nominal – Phase alignment: ≤ 1 degree, nominal

PXI chassis & controllers

PXIe 18-slot chassis with PCI Express Gen 2 performance, 16 PXI hybrid slots, multi-chassis connections, and an innovative

cooling design that saves rack space and lowers maintenance cost. PXIe controller with Intel i7-4700EQ, 2.4 GHz processor,

up to 16 GB RAM and front removable 240 GB solid state drive.

PXI data acquisition

& switching

PXI data acquisition and switch modules with high-speed, 500 μsec multiplexers, 300 W GP switches and high-density 256 2-wire matrix modules. RF and microwave switches up to 40 GHz with low insertion loss and VSWR for excellent signal integrity.

PXI function & arbitrary

waveform generators

High-sampling rate and high-bit resolution provided in a single instrument enable designers to create ideal waveforms for accu-

rate test of radar, satellite, and frequency agile systems. See page 28.

PXIe network analyzers PXI 2-port vector network analyzer performs fast, accurate measurements.

PXI signal analyzers &

signal generators

PXI RF and µW vector signal analyzers (9 kHz to 27 GHz) and PXI RF vector signal generators (1 MHz to 6 GHz) offer high speed,

high performance measurement capability with up to 160 MHz bandwidth.

Other PXI modules – Digitizers

– Digital input output

– Digital multimeters

– Digital to analog converters – Optical extenders

AXIe modules

AXIe modular products are designed for high-performance, scalable instrumentation and offer fast data transfers to the host

controller. AXIe’s product portfolio includes: chassis and controllers, multi-channel digitizers, arbitrary waveform generators, logic

analyzers, PCI Express protocol analyzers, HDMI protocol analyzers, MIPI M-PHY and D-PHY protocol analyzer/exerciser.

www.keysight.com/ind/modular

Application Solution Guide | January–May 2016 | 27

PXI and AXIe Modular Instruments

Experience high speed digital test capabilities at a whole new level.

High speed 16-channel digital stimulus response for fast and lexible digital pattern generation. The powerful pattern cyclizer technology enables on-the-ly pattern cre-

ation for single site, or up to four independent multi-sites, with high-voltage channels and open drain pins for simultaneous device test.

– Emulation of serial and parallel digital device interfaces

– Precise vector time with a powerful combination of waveform tables and up to 250 ns stim-ulus/response delay compensation with 25 ps programming resolution

– Industry-leading 1 ns-per-bit edge placement resolution giving engineers the ability to validate device design with greater accuracy

Drive down the size of test

The M937XA PXI VNA is a full two-port vector network analyzer that its in just one slot. It also performs fast, accurate measurements and reduces your cost-of-test by letting you simultane-ously characterize many devices—two-port or multi-port—using a single chassis.

– Pay for only the frequency range you need with a choice of six models: 300 kHz to 4, 6.5, 9, 14, 20 or 26.5 GHz

– Get the best PXI VNA performance in four key areas: speed, dynamic range, trace noise and stability

– Conigure multiple modules to address multi-port and multi-device applications – Count on the same measurement science and calibration used in the trusted PNA

PXIe Digital Stimulus/Response M9195A

PXIe Vector Network Analyzer

M937XA

Acquire the performance edge in PXI up to 50 Ghz

The M9393A incorporates decades of microwave measurement expertise with performance previously unachievable in modular. Get consistent, accurate results faster with proven Keysight measurement science, including X-Series measurement applications and 89600 VSA software.

– Adapt to changing needs through license key upgrades and the extensible modular architecture

– Frequency coverage from 9 kHz to 27 GHz, 3.6 to 50 GHz (option FRX)

– Analysis bandwidth of up to 160 MHz, wideband IF output (option WB1)

– Absolute amplitude accuracy of ±0.13 dB

– Frequency switching speed less than 135 μs

PXIe Performance Vector

Signal Analyzer

M9393A

www.keysight.com/ind/modular

US +1 800 829-4444 Canada +1 877 894-4414

www.keysight.com

This information is subject to change without notice.

© Keysight Technologies, 2016Published in USA, January 1, 20165992-0114ENUC

www.keysight.com

Technical data and pricing subject to change

without notice.

PCIe® and PCI-SIG® and the PCI SIG design

marks are US registered trademarks and/or

service marks of PCI-SIG.

Bluetooth and the Bluetooth logos are trade-

marks owned by Bluetooth SIG, Inc., U.S.A. and licensed to Keysight Technologies, Inc.

cdma2000 is a US registered certiication mark of the Telecommuncations Industry Association.

WiMAX is a US trademark of the WiMAX forum.

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