journal club presentation – march 26 th , 2007 suraj bramhavar
DESCRIPTION
Apertureless Scanning Near-field Optical Microscopy: a comparison between homodyne and heterodyne approaches. Lewis Gomez et al. , J. Opt. Soc. Am. B , Vol. 23, No. 5, 823-833 (2006). Journal Club Presentation – March 26 th , 2007 Suraj Bramhavar. Outline. Background SNOM, ASNOM - PowerPoint PPT PresentationTRANSCRIPT
Apertureless Scanning Near-field Optical Microscopy: a comparison between homodyne and heterodyne
approaches
Journal Club Presentation – March 26th, 2007
Suraj Bramhavar
Lewis Gomez et al.,
J. Opt. Soc. Am. B, Vol. 23, No. 5, 823-833 (2006).
Outline
• Background– SNOM, ASNOM
• Problems– Background suppression– Interferometric effects– Possible solutions
• Heterodyne vs. Homodyne ASNOM– Experimental Results– Conclusions
Near-Field Optical Techniques
a)Aperture probe (SNOM) – Evanescent waves from tapered fiber probe are used either to illuminate sample or couple near-field light from sample into fiber
b)Apertureless probe (ASNOM) – Small (sub-wavelength) tip scatters near-field variations into far field
Pictures courtesy of --- Hecht et al. (2000)
ASNOM
Tip scatters both illuminated near field of sample (a) and incident far field (b)
Pictures courtesy of Hecht et al. (2000), Greffet et al. (1997)
ASNOM
• Advantages– Far field illumination and detection
allows for use of conventional optics– High resolution achievable through
smaller tip fabrication
• Drawbacks– Reflection from surface creates strong
background – Background field causes interference
effects that are hard to suppress
ASNOM
• Possible solutions– Fluorescent active centers at tip
extremity– Local tip field enhancement at apex– Tip-modulation harmonics– Heterodyne configuration
Eb = Background light scattered from sample
Et = Light elastically scattered by near-field interaction of tip and evanescent field from sample
Theory – Homodyne ASNOM
)cos(222
bttbtb EEEEI
)cos(222
bttbtb EEEEI
**tbtb EEEEI
bttbt EEEI cos22
After tip modulation and lock-in detection
Homodyne ASNOM
Aubert et al. (2003)
• Measurement includes subtle mix of both field intensity (1) or complex field amplitude (2)
• Small variation in sample leads to change in background field (Eb , ϕb)
• Determines which term dominates measurement
bttbt EEEI cos22
(1) (2)
Theory – Heterodyne ASNOM
trrt
brrb
tbtb
t
r
b
rtbrtb
tEE
tEE
EE
E
E
E
EEEEEEI
cos2
cos2
cos2
2
2
2
***
(1)
(2)
(3)
(4)
(5)
(6)
• (1 , 2) – Not time varying
• (3 , 4) – Time varying at tip modulation frequency
• (5) – Time varying at beat frequency (Δω). Used to align interferometer
Theory – Heterodyne ASNOM trrt tEEI cos2)6(
...
cos3cos
cos2cos
coscos
3
2
1
trrt
trrt
trrt
tEtEA
φφΔωtEΩtEA
tEtEA
With tip modulation
Ai = Fourier term weights
Ω = Tip modulation frequency
Pure amplitude (Et) and phase (ϕt) information can be extracted through lock-in detection
2
tnsfrequencie in lock
Experimental Setup
a) Reflection-mode backscattered heterodyne setup
b) Heterodyne setup for evanescent illumination of tip-sample through total internal reflection
Results - Nanowells• Reflection mode configuration used
• Nanowells fabricated using nanoimprint lithography method
• Well diameter = 500nm
• Well spacing = 800nm (center to center)
• Well depth = 450nm
SEM
AFM
ASNOM (Ω)
ASNOM (2Ω)
Results - Nanowells
ASNOM (2Ω – Δω) ASNOM (2Ω – Δω)
• Heterodyne measurements using p-polarized incident field shows improved contrast with no fringes (a)
• Contrast fades with s-polarized incident field (b)
Simulation - Nanowells• FDTD simulation run on nanowell array with same properties as experimental configuration
• Simulations used to calculate both magnitude (a,c) and normal component (b,d) of electric field at sample surface
• Calculations made using both p-polarized (a,b) and s-polarized (c,d) incident light• Results show strong normal components surrounding nanowells for p-polarized incident light, but not for s-polarized incident light
Results – Approach Curves• ASNOM experiments performed on evanescent waves generated in prism (n = 1.5) by total internal reflection
• Measurements made as function of distance between tip and surface
pdz
eEzE 0)(
Amplitude
pdz
eEzI2
20)(
Intensity
21
222 sin2 airp
p
nnd
Under current experimental configurations –- dp ≈ 144 nmIf true electric field amplitude is being measured by
amplitude channel of lock-in, approach curve should reveal correct value for dp
z = tip-sample distance
dp = penetration depth
Results – Approach Curves
(a) Ω – Δω (b)
Ω
Heterodyne approach curve (a) gives correct penetration depth: dp ≈ 145 + 5 nm
Homodyne approach curve (b) gives incorrect penetration depth: dp ≈ 65 + 5 nm
• Homodyne measurement describes subtle mix of intensity and complex field amplitude
• Dominant value is dependant on sample surface
Results - Waveguide• ASNOM experiment was repeated with 1.55μm laser light launched into integrated waveguide instead of prism
• AFM tip scanned over top of waveguide scattering evanescent field generated from within the guide
AFM ASNOM (Ω)
ASNOM (Ω-Δω)
ASNOM (Ω-Δω)
• Homodyne measurement (b) results in convoluted mixture of both complex amplitude and intensity
• Heterodyne measurement shows true amplitude (c) and phase (d) of laser light
• Wavefront of guided field clearly visible
• Reference field enhances total optical power at photodetector improving SNR and allowing for use of GaAs photodiode instead of PMT
Conclusions
• Problems with homodyne ASNOM measurements were demonstrated
• Significant background suppression was achieved with heterodyne technique
• True amplitude and phase information detected with sub-wavelength resolution and improved SNR
• Heterodyne-homodyne comparison demonstrated on nanowells as well as integrated waveguide
Questions?