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है”ह”ह

IS 15262 (2002): Geometrical Product Specifications (GPS) -Surface Texture: Profile Method - Terms, Definitions andSurface Texture Parameters [PGD 25: Engineering Metrology]

IS 15262:2002ISO 4287:1997

Indian Standard

GEOMETRICAL PRODUCT SPECIFICATIONS(GPs)– SURFACE TEXTURE: PROFILEMETHOD — TERMS, DEFINITIONS AND

SURFACE TEXTURE PARAMETERS

ICS 01 .040.17; 040.20

@ BIS 2002

BUREAU OF INDIAN STANDARDSMANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG

NEW DELHI 110002

December 2002 Price Group 7

Engineering Metrology Sectional Committee, BP 25

NATIONAL FOREWORD

This Indian Standard which is identical with ISO 4287 : 1997 ‘Geometrical Product Specifications( GPS ) — Surface texture : Profile method — Terms, definitions and surface texture parameters’issued by the International Organization for Standardization ( ISO ) was adopted by the Bureau ofIndian Standards on the recommendation of the Engineering Metrology Sectional Committee and approvalof the Basic and Production Engineering Division Council.

The text of ISO Standard has been approved as suitable for publication as an Indian Standard withoutdeviations. In the adopted standard, certain conventions are, however, not identical to those used inIndian Standards. Attention is particularly drawn to the following:

a) Wherever the words ‘International Standard’ appear referring to this standard, they should beread as ‘Indian Standard’.

b) Comma ( , ) has been used as a decimal marker while in Indian Standards, the current practiceis to use a point ( . ) as the decimal marker.

Technical Corrigendum 1 to the above International Standard has been incorporated,

In this adopted standard, reference appears to certain International Standards for which Indian Standardsalso exist. The corresponding Indian Standards which are to be substituted in their place are listedbelow along with their degree of equivalence for the editions indicated:

International Standard Corresponding Indian Standard Degree of Equivalence

ISO 3274:1996 Geometrical Product IS 15261 :2002 Geometrical Product IdenticalSpecifications ( GPS ) — Surface Specifications ( GPS ) — Surfacetexture : Profile method — Nominal texture : Profile method — Nominalcharacteristics of contact ( stylus ) characteristics of contact ( stylus )instruments instruments

ISO 4288:1996 Geometrical Product IS 15263:2002 Geometrical ProductSpecifications ( GPS ) — Surface Specifications ( GPS ) — Surfacetexture : Profile method — Rules texture : Profile method — Rulesand procedures for the assessment and procedures for the assessmentof surface texture of surface texture

do

The concerned Technical Committee has reviewed the provisions of the following International Standardsreferred in this adopted standard and has decided that they are acceptable for use in conduction withthis standard:

International Standard Title

ISO 11562:1996 Geometrical Product Specifications ( GPS ) — Surface texture : Profilemethod — Metrological characterization of phase correct filters

Addifiona/ /nforrnation — This standard is the national adoption of ISO 4287:1997, as such only theEnglish text has been reproduced. If the French text is required, reference should be made to theoriginal ISO publication.

For the purpose of deciding whether a particular requirement of this standard is complied with, the finalvalue, observed or calculated, expressing the result of a test or analysis, shall be rounded off inaccordance with IS 2:1960 ‘Rules for rounding off numerical values ( revised)’. The number of significantplaces retained in the rounded off values should be the same as that of the specified value in thisstandard.

IS 15262:2002ISO 4287:1997

Indian Standard

GEOMETRICAL PRODUCT SPECIFICATIONS(GPS)– SURFACE TEXTURE: PROFILEMETHOD — TERMS, DEFINITIONS AND

SURFACE TEXTURE PARAMETERS

1 Scope

This International Standard specifies terms,definitions and parameters for the determinationof surface texture ( roughness, waviness andprimary profile ) by profiling methods.

2 Normative references

This following standards contain provisions which,through reference in this text, constitute provisionsof this International Standard. At the time ofpublication, the editions indicated were valid. Allstandards are subject to revision, and parties toagreements based on this International Standardare encouraged to investigate the possibility ofapplying the most recent editions of the standardsindicated below. Members of IEC and ISOmaintain registers of currently valid InternationalStandards.

ISO 3274 : 1996, Geometrical ProductSpecifications ( GPS ) — Surface texture: Profilemethod — Nomina/ characteristics of contact( sty/us) instruments.

ISO 4288 : 1996, Geometrical ProductSpecifications ( GPS ) — Surface texture: Profilemethod — Ru/es and procedures for theassessment of surface texture.

ISO 11562 : 1996, Geometrical ProductSpecifications ( GPS ) — Surface texture: Profile

method — Metrological characterization of phasecorrect filters.

3 Terms and definitions

3.1 General terms

3.1.1profile filterfilter which separates profiles into longwave andshortwave components [ ISO 11562 ]

NOTE —There are three filters used in instrumentsfor measuring roughness, waviness and primaryprofiles (see figure 1), They all have the sametransmission characteristics, defined in ISO 11562,but different cut-off wavelengths.

3.1.1.1k profile filterfilter which defines the intersection between theroughness and the even shorter wave componentspresent in a surface ( see figure 1 )

3.1.1.2kc profile filterfilter which defines the intersection betweenthe roughness and waviness components( see figure 1 )

3.1.1.3If profile filterfilter which defines the intersection between thewaviness and the even longer wave componentspresent in a surface ( see figure 1 )

As Ac Af

Wavelength

Figure 1 —Transmission characteristic of roughness and waviness profiles

1

IS 15262:2002ISO 4287:1997

3.1.2coordinate systemthat coordinate system in which surface textureparameters are defined

NOTE — It is usual to use a rectangular coordinatesystem in which the axes form a right-handedCartesian set, the X-axis being the direction of tracingcolinear with the mean line, the Y-axis also nominallylying on the real surface, and the Z-axis being in anoutward direction (from the material to the surroundingmedium ). This convention is adopted throughout therest of this International Standard,

3.1.3real surfacesurface limiting the body and separating it fromthe surrounding medium

3.1.4surface profileprofile that results from the intersection of thereal surface by a specified plane

See figure 2,

NOTE — In practice, it is usual to choose a planewith a normal that nominally lies parallel to the realsurface and in a suitable direction.

z

k Y

3.1.5primary profileSee ISO 3274.

NOTE —The primary profile is the basis for evaluationof the primary profile parameters.

3.1.6roughness profileprofile derived from the primary profile bysuppressing the longwave component using theprofile filter Ac; this profile is intentionally modified

See figure 1.

NOTES

1 The transmission band for roughness profilesis defined by the k and kc profile filters ( seeISO 11562 :1996,2.6 and 3.2).

2 The roughness profile is the basis for evaluationof the roughness profile parameters.

3 The default relationship between kc and k is givenin ISO 3274: 1996, 4.4.

—.—. —-—-.- ._. J

Figure 2 — Surface profile

2

IS 15262:2002ISO 4287:1997

3.1.7waviness profileprofile derived by subsequent application of theprofile filter Af and the profile filter kc to the primaryprofile, suppressing the longwave componentusing the profile filter kf, and suppressing theshortwave component using the profile filter xc;this profile is intentionally modified

NOTES

1 The nominal form should first be removed fromthe total profile by best-fit least-squares methods,before applying the Af profile filter for separating thewaviness profile. For circular nominal form, it isrecommended that the radius should also be includedin the least-squares optimization and not held fixedto the nominal value. This procedure for separatingthe waviness profile defines the ideal wavinessoperator.

3.1.10evaluation lengthinlength in the direction of the X-axis used forassessing the profile under evaluation

NOTES

1 The evaluation length may contain one or moresampling lengths.

2 For default evaluation lengths, see ISO 4288:1996,4.4. ISO 4288 does not give default evaluation lengthfor W-parameters.

3.2 Geometrical parameter terms

3.2.1P-parameterparameter calculated from the primary profile

2 The transmission band for waviness profiles 3.2.2

is defined by the kc and Lf profile filters (see R-parameterISO 11562:1996, 2.6 and 3.2 ). parameter calculated from the roughness profile

3 The waviness profile is the basis for evaluation ofthe waviness profile parameters.

3.1.8 Mean lines

3.1.8.1mean line for the roughness profileline corresponding to the longwave profile

component suppressed by the profile filter kc

( See ISO 11562:1996, 3.2)

3.1.8.2mean line for the waviness profileline corresponding to the longwave profilecomponent suppressed by the profile filter Af

( See ISO 11562:1996, 3.2)

3.1.8.3mean line for the primary profileline determined by fitting a least-squares line ofnominal form through the primary profile

3.1.9sampling lengthlp, lr, lw

length in the direction of the X-axis used foridentifying the irregularities characterizing theprofile under evaluation

3.2.3W-parameterparameter calculated from the waviness profile

NOTE — The parameters defined in clause 4 canbe calculated from any profile. The first capital letterin the parameter symbol designates the type of theprofile evaluated. For example, Ra is calculated fromthe roughness profile and Pt is calculated from theprimary profile.

3.2.4profile peakan outwardly directed ( from material to surroundingmedium ) portion of the assessed profile connectingtwo adjacents points of the intersection of theprofile with the X-axis

3.2.5profile valleyan inwardly directed ( from surrounding mediumto material ) portion of the assessed profileconnecting two adjacent points of the intersectionof the assessed profile with the X-axis

3.2.6height and/or spacing discriminationminimum height and minimum spacing of profilepeaks and profile valleys of the assessed profilewhich should be taken into account

NOTE — The sampling length for the roughness lr NOTE — The minimum height of the profile peaksand waviness profiles ho is numerically equal to the and valleys are usually specified as a percentagecharacteristic wavelength of the profile filters kc and of Pz, Rz, Wz or another amplitude parameter, andLf, respectively. The sampling length for primary profile, the minimum spacing as a percentage of the sampling/p, is equal to the evaluation length. length.

3

IS 15262:2002ISO 4287:1997

3.2.7profile elementprofile peak and the adjacent profile valley

See figure 3.

NOTE — The positive or negative portion of theassessed profile at the beginning or end of thesampling length should always be considered as aprofile peak or as a profile valley. When determininga number of profile elements over several successivesampling lengths, the peaks and valleys of theassessed profile at the beginning or end of eachsampling length are taken into account once only atthe beginning of each sampling length.

3.2.8

ordinate valuez(x)height of the assessed profile at any position x

NOTE — The height is regarded as negative if theordinate lies below the X-axis, and positive otherwise.

3.2.9

local slopedzcl%’

slope of the assessed profile at a position x,

See figure 4.

NOTES

1 The numerical value of the local slope, and thusthe parameters PAq, RAq and WAq, depends criticallyon the ordinate spacing AX.

2 A formula for estimating the local slope is

dz._J = L (Z,+~– 9z,+z+ 45z,+1 – 45z,_1 + 9z,_* - Z,_~)CLx 60AX

The above formula should be used for the samplespacing stipulated in ISO 3274 for the filter used, wherez, is the height of the ith profile point and AA’ is thespacing between adjacent profile points.

3.2,10

profile peak heightZpdistance between the X-axis and the highest point ,of the profile peak

See figure 3.

line

Figure 3 — Profile element

Figure 4 — Local slope

4

3.2.11profile valley depthZvdistance between the X-axis and the lowest pointof the profile valley

See figure 3.

3.2.12profile element heightZtsum of the height of the peak and depth of thevalley of the profile element

See figure 3.

3.2.13profile element widthXslength of the X-axis segment intersecting withthe profile element

See figure 3.

IS 15262:2002ISO 4287:1997

3.2.14material length of profile at the level cMl(c)sum of the section lengths obtained, intersectingwith the profile element by a line parallal to theX-axis at a given level, c

See figure 5.

4 Surface profile parameter definitions

4.1 Amplitude parameters ( peak and valley)

4.1.1maximum profile peak heightPp, Rp, Wp

largest profile peak height Zp within a samplinglength

See figure 6.

Ml,

b

Sampling length

M (c] = M(l . M(2

Figure 5 — Material length

r-

x

Sampling [ength

-i

Figure 6 — Maximum profile peak height ( example of a roughness profile )

5

IS 15262:2002ISO 4287:1997

4.1.2maximum profile valley depthPv, Rv, WVlargest profile valley depth Zv within a samplinglength

See figure 7.

4.1.3maximum height of profilePz, Rz, Wz

sum of height of the largest profile peak heightZp and the largest profile valley depth Zv withina sampling length

See figure 8.

NOTE — In ISO 4287-1 : 1984, the Rz symbol wasused to indicate the “ten point height of irregularities”.In some countries there are surface roughnessmeasuring instruments in use which measure theformer Rz parameter. Therefore, care must be taken

when using existing technical documents anddrawings because differences between resultsobtained with different types of instruments are notalways negligibly small.

4.1.4mean height of profile elementsPc>Rc, Wcmean value of the profile element heights Zt withina sampling length

Pc, Rc, We = ~ f Zt,m izl

See figure 9.

NOTE — The parameters Pc, Rc, WC require heightand spacing discrimination. It not otherwise specified,the default height discrimination shall be 10% of Pz,F/z, Wz respectively, and the default spacingdiscrimination shall be 1% of the sampling length.Both conditions shall be met.

Figure 7 — Maximum profile valley depth ( example of a roughness profile )

I

—.IIv L— —L

Samp(ing length

. ..- ———-— —.— ——— .

Figure 8 — Maximum height of profile ( example of a roughness profile )

6

IS 15262:2002ISO 4287:1997

,SampUng length

Figure 9 — Height of profile elements ( example of a roughness profile)

4.1.5total height of profilePt,Rt, Wfsum of the height of the largest profile peak heightZp and the largest profile valley depth ZV withinthe evaluation length

NOTES

1 Since Pt, Rt and Wt are defined over the evaluationlength rather than the sampling length, the followingwill always be true for any profile.

pt > p=; Rt > Rz; Wt > Wz

2 In the default case Pz is equal to Pt. In this casethe use of Pt is recommended.

4.2 Amplitude parameters ( average ofordinates )

4.2.1arithmetical mean deviation of the assessed

profilePa, Ra, Wa

arithmetic mean of the absolute ordinate valuesZ(X) within a sampling length

Pa, Ra, Wa=+jlZ(.)l&o

with 1 = lp, lr or lW according to the case.

4.2.2root mean square deviation of the assessed

profilePq, Rq, Wq

root mean square value of the ordinate valuesZ(X) within a sampling length

A

Pq, Rq, Wq =~J-+:@’(X) dx

with 1= lp, h- or lW according to the case.

4.2.3skewness of the assessed profilePsk, Rsk, Wsk

quotient of the mean cube value of the ordinatevalues Z(x) and the cube of Pq, Rq or Wq

respectively, within a sampling length

Rsk= +[+ ~zs(x)dx]

NOTES

1 The above equation defines Rsk; Psk and Wsk are

defined in a similar manner.

2 Psk, Rsk and Wsk are measures of the asymmetryof the probability density function of the ordinatevalues.

3 These parameters are strongly influenced byisolated peaks or isolated valleys.

4.2.4

kurtosis of the assessed profilePku, Rku, Wkuquotient of the mean quartic value of the ordinatevalues Z(X) and the fourth power of Pq, Rq or Wq

respectively, within a sampling length

7

IS 15262:2002ISO 4287:1997

NOTES

1 The above equation defines Rku; Pku and Wku aredefined in asimiiar manner.

2 Pku, Rku and Wku are measures of the sharpnessof the probability density function of the ordinatevalues.

3 These parameters are strongly influenced byisolated peaks or isolated valleys.

4.3 Spacing parameters

4.3.1mean width of the profile elementsPSm, RSm, WSm

mean value of the profile element widths Xs withina sampling length

m

PSm, RSm, WSm = ~ ~ xS,m ,=1

See figure 10.

NOTE — The parameters PSm, RSm, WSm requireheight and spacing discrimination. If not otherwisespecified, the default height discrimination shall be10% of Pz, I&, WZ respectively, and the default spacingdiscrimination shall be 1% of the sampling length.Both conditions shall be met.

4.4 Hybrid parameters

4.4.1root mean square slope of the assessed profilePAq, RAq, WAq

root mean square value of the ordinate slopesdZ/dX, within the sampling length

4,5 Curves and related parameters

NOTE — All curves and related parameters aredefined over the evaluation length rather than thesampling length, as this provides more stable curvesand related parameters.

4.5.1material ratio of the profilePmr(c), Rmr(c), Wmr(c)ratio of the material length of the profile elements141(c) at a given level c to the evaluation length

Ml(c)Pmr(c), Rmr(c), Wmr(c) = —

In

4.5.2

material ratio curve of the profile( Abbott Firestone curve)curve representing the material ratio of the profileas a function of level

See figure 11.

NOTE —This curve can be interpreted as the samplecumulative probabilityfunctionof the ordinate valuesZ(x), within an evaluation length.

Sampling length

Figure 10 — Width of profile elements

8

IS 15262:2002ISO 4287:1997

f-lean line

\ ‘1

L Evaluation Length

--------d 020’0 ’0’”’”%

Figure 11 — Material ratio curve

4.5.3 4.5.4profile section height difference relative material ratioP&c, R&, W6C, Pm~ Rm~ Wmrvertical distance between two section levels of meterial ratio determined at a profile section levelgiven material ratio R&, related to a reference CO

Pmr, Rmr, Wmr = Pmr, Rmr, Wmr (Cl)

Rdc =“C(Rmrl ) - C (Rmr2); (Rmrl c Rmr2)where

Cl = CO – R& ( or PI% or W6C )

CO = C ( PmrOj RmrO, WmrO )NOTE — The above equation defines R6c; P6c andJJ’& are defined in a similar manner. See figure 12.

o 10 20 3(J 413 50 .50 70 so 90 100RmrO Rrnr

Figure 12 — Profile section level separation

9

IS 15262:2002ISO 4287:1997

4.5.5profile height amplitude curvesample probabilitydensity function of the ordinateZ(X) within the evaluation length

Il.: 1

See figure 13.

NOTE — For profile height amplitude curve parameters,see 4.2.

Mean Line

\\

441’

———.

P———.—

IEvacuation iength I Amplitude density

Figure 13 — Profile height amplitude distribution curve

10

In order to facilitate alphanumericare recommended :

IS 15262:2002ISO 4287:1997

Annex A

(normative)

Text

notation

equivalents

by means of computers, the following text equivalents

Parameter Text equivalent

PAq Pdq

RAq Rdq

wAq Wdq

I P& I Pdc I

I R& I Rdc Iw& Wdc

as Ls

I Ac I Lc I

I af Lf

11

IS 15262:2002ISO 4287:1997

0Primary profi~e

Flowchart

Annex B

(informative)

for surface assessment

ERoughnessalgorithm

I AC

II

At

_li_.l-profi(e Pecordlng

Characteristic function:

Parameters ofroughness. wavinessand primary profiles

Talgorithm I

I

Figure B.1

12

IS 15262:2002ISO 4287:1997

Annex C

/

(Informative)

Comparison of basic terms and parameter symbols betweenISO 4287-1:1984 and ISO 4287:1997

Table C.1 — Basic terms

Clause in 1997edition

3.1.9

3.1.10

3.2.8

3.2.9

3.2.10

3.2.11

3.2.12

3.2.13

3.2.14

1) The sampli( waviness proi

Basic terms, 1997 edition 1984 edition

“’-’71 I

Sampling length 1 [p, lw, h-’)

Evaluation length I [n I In I

Ordinate value I Y I z(x) ILocal slope &—

z

Profile peak height Y. Zp

Profile valley depth I Y. Zv IProfile element height I — I Zt IProfile element width I — I Xs IMaterial length of profile at the level c Vp Ml(c)

lengths for the three different profiles are named : lp ( primary profile ), /w

), lr ( roughness profile).

IS 15262:2002 .ISO 4287:1997

Table C.2 — Parameters of surface texture

Clause in1997 edition

Parameters, 1997 edition

4.1.1 I Maximum profile height

4.1.2 I Maximum profile valley depth

4.1.3 I Maximum height of the profile

4.1.4 I Mean height of the profile

4.1.5 I Total height of the profile

4.2.1

4.2.2

4.2.3

Arithmetical mean deviation of theassessed profile

Root mean square deviation of theassessed profile

Skewness of the assessed ~rofile

4.2.4

4.3.1

4.4.1

Kurtosis of the assessed profile

Mean width of the profile elements

Root mean square slope of the

assessed profile

4.5.1 I Material ratio of the profile

4.5.3 Profile section height difference

4.5.4 Relative material ratio

— Ten point height ( deleted as anISO parameter)

1984 I 1997 I Determined within

~

!dition edition evaluation

in

RP Rpp) x, , ,

%R+’) x

Ry I R#)I I x

R, I RC2)I I x

— R@ x

R, Rap) x

Rq Rqz) x

Sk Rsk2) x

lx

Sm RSm2~ x

Aq RA@ x

Rmr(c)z) x

— R&#) x

tp Rmr2~ x

R, —

1) This sampling length is h, lW and lp for R-, W- and P- parameters respectively; lp is equal to fn.

2) Parameters which are defined for three profiles: primary profiles, waviness profile and roughnessprofiles. Only the roughness profile parameter is indicated in the table. As an example, the threeparameters are written Pa (primary profile), JVu(waviness profile) and Ra (roughness profile). I

14

IS 15262:2002ISO 4287:1997

Annex D

(informative)

Relationship to the GPS matrix model

For full details about the GPS matrix model, see

lSO/TR 14638.

D.1 Information about this InternationalStandard and its use

ISO 4287 is a major rewrite and reorganizationof ISO 4287-1 : 1984 that, together withISO 11562 and ISO 3274, additionally definesthe waviness profile, the primary profile and theirparameters in a consistent manner,

Fundamental

GPS

standards

I

D.2 Position in the GPS matrix model

This International Standard is a general GPSstandard that influences chain link 2 of the chainsof standards on roughness profile, waviness profileand primary profile in the general GPS matrix,as graphically illustrated in figure D.1.

D.3 Related International Standards

The related International Standards are those ofthe chains of standards indicated in figure D.1.

Global GPS standards

General GPS matrix

Chain link number 1 2 3 4 5 6

Size

Distance

Radius

Angle

Form of line independent of datum

Form of line dependent on datum

Form of surface independent of datum

Form of surface dependent on datum

Orientation

Location

Circular run-out

Total run-out

Datums

Roughness profile

Waviness profile

Primary profile

Surface imperfections

Edges

Figure D.1

Annex E

(informative)

Bibliography

[1] lSO/TR 14638:1995, Geornetrica/ Product [2] VIM :1993, /ntemationa/ vocabdary of basicSpecification (GPS) — Masterplan. arid genera/ terms in rnetro/ogy. 61PM, IEC,

IFCC, ISO, IUPAC, IUPAP, OIML.

15

Bureau of Indian Standards

BIS is a statutory institution established under the Bureau o~Indian Standards Act, 1986 to promoteharmonious development of the activities of standardization, marking and quality certification of goods andattending to connected matters in the country.

Copyright

BIS has the copyright of all its publications. No part of these publications maybe reproduced in any form withoutthe prior permission in writing of BIS. This does not preclude the free use, in the course of implementing the

standard, of necessary details, such as symbols and sizes, type or grade designations. Enquiries relating tocopyright be addressed to the Director (Publications), BIS.

Review of Indian Standards

Amendments are issued to standards as the need arises on the basis of comments. Standards are also reviewed

periodically; a standard along with amendments is reaffirmed when such review indicates that no changes areneeded; if the review indicates that changes are needed, it is taken up for revision. Users of Indian Standards

should ascertain that they are in possession of the latest amendments or edition by referring to the latest issueof ‘BIS Catalogue’ and ‘Standards : Monthly Additions’.

This Indian Standard has been developed from Doc : No. Bp 25 ( O1O4)

Amendments Issued Since Publication

Amend No. Date of Issue Text Affected

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