introduction to the new agilent 7900 - alfresco.ubm...

Introduction to the New Agilent 7900 Redefining ICP-MS Performance

Spectroscopy Webinar

February 2014

Presenter: Ed McCurdy – ICP-MS Product

Marketing, Agilent Technologies

Agilent 7900 ICP-MS Introduction - Agenda

• ICP-MS Market and Agilent Technologies ICP-MS

• Introduction to the new Agilent 7900

- Development

- Key Performance Illustrations

- Unique new Hardware Features

- New MassHunter 4.1 software

- Support, Maintenance and User Training

• Q&A

Agilent 7900 ICP-MS Introduction - Agenda

Or:

• What it is

• Where it comes from

• What it does

• How it works

• What it’s like to use

Agilent’s History of Innovation in ICP-MS The first 25 years - 1987 to 2012

1987 2000 2009 1994

First computer-controlled ICP-MS

PMS series

4500

7500

Enabling high

sensitivity

metal analysis

Enabling routine

robust ICP-MS

analysis

Enabling a new level

of interference

management

First benchtop ICP-MS

Enabling a new

level of ease of

use in ICP-MS

First effective He mode collision/reaction cell

First high-matrix (HMI) ICP-MS

Enabling a new era

in ICP-MS analysis

8800 ICP-QQQ

2012

World’s First ICP-QQQ

February 2014

4

7700

ICP-MS Market Summary ICP-MS now a mainstream analytical technique in many regions

Worldwide ICP-MS market was estimated at ~$275M in 2013

(~1700 instruments)

ICP-MS has moved beyond the research lab and been adopted

for routine trace metals analysis in high throughput labs

For many of these labs, the key analytical requirements are:

- Low detection limits (requires high sensitivity and low background)

- Robustness (tolerance of complex or difficult samples)

- Accuracy (freedom from interferences)

- Dynamic range (ability to measure high & low concentrations in 1 run)

- Productivity (sample run time; fewer sample reruns)

- Ease of use (quick training of new/occasional users)

- Flexibility (ability to handle a wide range of sample types)

- Low Detection Limits – (requires high sensitivity and low background)







So How are ICP-MS Manufacturers Responding? Current Technology to Address Routine Labs’ Performance Needs

- Low Detection Limits – (requires high sensitivity and low background)







Low Detection Limits – Sufficient for ppt level analysis

Accuracy – He mode provides simple removal of most

polyatomic overlaps in most sample types

Flexibility – interfaces for organic solvents, aggressive

acids, HF, small samples volumes; easy coupling to

alternative sample intro devices (LC, GC, FFF, Laser

Ablation, etc.)

Existing instruments (Agilent 7700) already addressed many of these requirements:

Agilent’s ICP-MS Product Development Focus Recent ICP-MS Launches

7700 Series quadrupole ICP-MS – launched 2009 • Unrivalled He mode performance for multi-element interference removal • Unmatched matrix tolerance with HMI (up to 2% TDS) • 9 Orders dynamic range at the detector

8800 triple quadrupole ICP-MS – launched 2012 • Unique QQQ configuration allows operation in MS/MS mode • MS/MS mode provides the only reliable way to remove interferences in complex

or variable samples using reactive cell gases

8800 ICP-QQQ Won Four Industry Awards

Within a Year of Launch Divergence between:

• High-throughput, more routine analysis

(quadrupole ICP-MS with He mode)

• Ultra-flexible, ultra-high performance for

advanced applications, semicon, materials,

ultra-low DLs (ICP-QQQ in reaction mode)

Let’s see what else we’ve been working on

since the 7700 was launched…

7700 had:

Better matrix tolerance than any other ICP-MS

• More robust plasma (lower CeO/Ce ratio) than any other system under standard tuning conditions , plus HMI for routine analysis of % level dissolved solids

Best interference removal with Helium cell gas – eliminates need for reaction gases in all common applications

• 7700 ORS3 improvements - removes all polyatomics in He mode, giving accurate results in complex or variable sample types – impossible on ICP-MS systems that use reactive cell gases or mixtures

Wider dynamic range than any other quadrupole ICP-MS

• Full 9 orders dynamic range at the detector – linear to 500ppm without changing conditions or hardware

Why Introduce another new ICP-MS? Building on the success of the Agilent 7700 Series:

Low Detection Limits – (requires high sensitivity and low background)

Robustness (tolerance of complex or difficult samples)

Accuracy (freedom from interferences)

Dynamic range (ability to measure high & low concentrations in 1 run)

Productivity (sample run time; fewer sample reruns)

Ease of use (quick training of new/occasional users)

Flexibility (ability to handle a wide range of sample types)

Low Detection Limits – (requires high sensitivity and low background)

Robustness (tolerance of complex or difficult samples)

Accuracy (freedom from interferences)

Dynamic range (ability to measure high & low concentrations in 1 run)

Productivity (sample run time; fewer sample reruns)

Ease of use (quick training of new/occasional users)

Flexibility (ability to handle a wide range of sample types)

Areas Where Even Better Performance was Needed Focus for next generation ICP-MS after 7700

Robustness – Nominal limit of 0.2% (2000ppm) total dissolved solids (2% with

HMI) – not sufficient for routine direct analysis of some sample types

Dynamic range – sub-ppt DLs adequate at the low end, but over-range at a few

100ppm – not sufficient for majors and traces in same run

Productivity – Faster analysis needed: 60 seconds per sample or less, with

optimum cell gas mode for all elements

Ease of use – Simpler user interface, intelligent method setup and user training

Requirements to improve on existing performance and extend ICP-MS scope into

new applications & sample types:

Presenting Agilent’s Game-Changing 7900 ICP-MS

We took the world’s best-

selling, highest performing

quadrupole ICP-MS, and

made it 10x better!

Agilent 7900 ICP-MS Key Performance Gains “10x better performance” than the Agilent 7700 ICP-MS

10x higher matrix tolerance – handles even tougher samples than the 7700/HMI - Patented HMI is still unique to Agilent. On the Agilent 7900, the optional ultra-HMI (UHMI)

extends capability to matrix levels of up to 25% TDS

10x wider dynamic range – increases upper measurement limit - 7700 had 9 orders (class-leading). 7900 extends this by at least an order of magnitude (up

to 11 orders measurement range), allowing % levels to be quantified - a first for ICP-MS

10x better signal to noise – lower Detection Limits - Higher ion transmission lens and interface, with orthogonal detector for low background

Improved productivity – faster analysis even when switching cell gases - New ultra fast ORS4 with less than 3 seconds switching time between modes

- New ISIS-3 for fast unattended start-up, autotune and sample delivery; full EPA-6020 analysis with 2 gas modes for optimum measurement in <1 minute per sample

30x faster detector –faster transient signal measurement (TRA) - 0.1ms integration time means more flexibility in single nanoparticle analysis

Easier to use – new software user interface, plus advanced usability tools - Method Wizard and remote monitor/control from tablet or Smartphone

New 7900 ICP-MS; New Technology

Components retained from 7700 Series:

• RF generator

• Sampling cone and retaining ring

• Quadrupole (still the only hyperbolic profile quad in ICP-MS)

• Agilent Mass Flow Controller (AMFC) gas control module

• Turbo pump

… That’s it!!

Everything else is new or re-engineered for the 7900!

You may think (or be told!) that Agilent 7900 as “just a facelift”

In fact it’s almost completely new!

How Much is Really New?? Easier to say “what did we keep from the 7700?”

New 7900 ICP-MS Performance Highlights

February 2014

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Illustrations of Performance Improvements

• Robustness (matrix tolerance)

• Dynamic Range

• Productivity

- Faster discrete sampling

- Faster cell gas switching

• Ease of Use

- New software UI and features

- User training; routine maintenance

Introducing the Ground-Breaking Agilent UHMI

UHMI – much more than

just a simple T-piece

UHMI uses optimized gas mixing

geometry and sophisticated

plasma/gas-flow tuning algorithm

to set reproducible conditions for

predictable aerosol dilution rate

UHMI gas port

NEW 7900 Ultra High Matrix Introduction (UHMI) What’s different compared to HMI on 7700 and 8800?

Increased dilution range to x100 – even higher matrix capability

Less matrix loading to interface, so better long-term stability

Maintain high carrier gas flow through spray chamber, so faster

gas replacement and washout

7700 HMI New UHMI

HMI-4 (HMI-L) 0.6 L/min 0.8 L/min

HMI-8 (HMI-M) 0.35 0.68

HMI-25 (HMI-H) 0.23 0.5

HMI-50 N.A. 0.4

HMI-100 N.A. 0.33

UHMI

Dilution

Gas Port

Test of Real-World Matrix Tolerance with UHMI

• 7900 with UHMI autotuned as normal

• Argon gas humidifier used – normal for high salt matrices

• Multi-element calibration in simple aqueous standards

• Variable NaCl matrices were then run, each spiked with multi-

element QC spike

- Check recovery of spike level in each NaCl matrix

0

5

10

15

20

25

30

35

40

45

50

spike 0%

Spike Recovery at 0% NaCl (first point is true spike amount)

75 As [ 25 ppb ] 114 Cd [ 50 ppb ] 208 Pb [ 50 ppb ] 201 Hg [ 1 ppb ]

0g / 100ml = 0%

Demonstration of UHMI Performance NaCl matrix analysis with calibration against simple aqueous standards

Data supplied by Wim Proper, Eurofins Analytico, NL

0

5

10

15

20

25

30

35

40

45

50

spike 0% 0.5% 1% 1.5% 2% 5% 10% 25%

Spike Recovery at 0, 0.5, 1, 1.5, 2, 5, 10 and 25% NaCl

75 As [ 25 ppb ] 114 Cd [ 50 ppb ] 208 Pb [ 50 ppb ] 201 Hg [ 1 ppb ]

25g / 100ml = 25%

“Big Four” Toxic Elements in Variable NaCl Matrices – 25% is 125 times the recommended maximum for typical (non-HMI) ICP-MS


NaCl Amount 75 As [ 25 ppb ] 114 Cd [ 50 ppb ] 208 Pb [ 50 ppb ] 201 Hg [ 1 ppb ]

0% 26.9 49.2 49.7 0.85

0.5% 24.2 49.0 50.1 0.99

1% 24.8 51.5 50.2 0.93

1.5% 25.5 50.0 50.5 0.88

2% 24.6 50.0 49.7 1.03

5% 25.4 48.7 50.7 0.89

10% 22.8 46.1 49.8 0.91

25% 26.2 45.4 49.0 0.96

Average 25.1 48.7 50.0 0.93

% Recovery 100% 97% 100% 93%

% RSD 5% 4% 1% 6%

0.5g / 100ml = 0.5% 1g / 100ml = 1% 1.5g / 100ml = 1.5% 2g / 100ml = 2% 5g / 100ml = 5% 10g / 100ml = 10% 25g / 100ml = 25% 0g / 100ml = 0%

“Big Four” Spiked into Different Salt Matrices


Interfered Elements in Variable NaCl Matrices V-51 (ClO), Cr-52 (ClOH), Ni-60 (NaCl) and Cu-63 (ArNa)

0

10

20

30

40

50

60

70

spike 0%

Spike Recovery at 0% NaCl

51 V [ 50 ppb] 52 Cr [ 50 ppb ] 60 Ni [ 50 ppb ] 63 Cu [ 50 ppb ]

0g / 100ml = 0%


0

10

20

30

40

50

60

70

spike 0% 0.5% 1% 1.5% 2% 5% 10% 25%

Spike Recovery at 0, 0.5, 1, 1.5, 2, 5, 10 and 25% NaCl

51 V [ 50 ppb] 52 Cr [ 50 ppb ] 60 Ni [ 50 ppb ] 63 Cu [ 50 ppb ]

25g / 100ml = 25%

Interfered Elements in Variable NaCl Matrices – 25% is 125 times the recommended maximum for typical (non-HMI) ICP-MS


NaCl Amount 51 V [ 50 ppb ] 52 Cr [ 50 ppb ] 60 Ni [ 50 ppb ] 63 Cu [ 50 ppb ]

0% 49.2 49.1 49.9 49.6

0.5% 47.3 50.3 48.3 48.6

1% 49.5 49.3 48.8 48.8

1.5% 50.5 50.3 49.9 49.6

2% 49.7 49.1 49.4 48.7

5% 48.9 50.3 47.2 47.7

10% 47.8 50.3 46.3 47.7

25% 48.0 48.7 50.9 50.5

Average 48.9 49.7 48.8 48.9

% Recovery 98% 99% 98% 98%

% RSD 2% 1% 3% 2%

0.5g / 100ml = 0.5% 1g / 100ml = 1% 1.5g / 100ml = 1.5% 2g / 100ml = 2% 5g / 100ml = 5% 10g / 100ml = 10% 25g / 100ml = 25% 0g / 100ml = 0%

Interfered Elements Spiked into Different Salt Matrices


Performance Highlights


• Dynamic Range

• Productivity



• Ease of Use



Far Wider Measurement Range Than Any Other ICP-MS 11 orders - low and high level calibrations in a single run

Cd (1ppt - 1ppb) and Na (100ppb - 10,000ppm (1%)) in the same run

Concentration range (11 orders)

and upper measurement limit

(>1%) are at least 10x better

than any other ICP-MS

Both calibrations are linear.

Total concentration range

covered from Cd blank (BEC

of <0.1ppt) to Na top

standard (1%) is 11 orders

NEW 7900 Orthogonal Detector System Improved signal to noise

Higher sensitivity

• High sensitivity EM (increase secondary electron generation by higher

voltage at the 1st dynode)

Lower background

• Off-axis from Q-pole to Detector

Improved S/N (average 10x better than 7700 ICP-MS)

• Reduced noise on pulse signal

• New advanced discriminator system to identify and separate noise

Agilent 7900 Capable of Very High Signal/Noise High sensitivity combined with low background (and noise)

Tuned like “typical” ICP-MS –

CeO/Ce <2.5%

Uranium calibration in No Gas

mode:

Ultra-high sensitivity

1.38 GHz/ppm

Ultra-low background (1cps):

DL: 1.3ppq; BEC: 0.48ppq

Signal (Mcps/ppm) Background (cps) SBR

Example 1 300 1 300

Example 2 500 2 250

Example 3 1000 5 200

Importance of background in

ultra-trace level measurements

Note in most “normal” samples

the background is limited by

contamination

0.1 msec This enables the

measurement of the

single NP peak signal

arriving on the detector.

30 nm Au Nanoparticle

February 2014

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Minimum dwell time for TRA acquisition is shortened to 0.1 msec on the 7900

to allow faster sampling of transient signals.

NEW 7900 Orthogonal Detector System Faster TRA measurement of fast transient signals



• Dynamic Range

• Productivity



• Ease of Use



New Integrated Sample Introduction System (ISIS 3) Fully compliant multi-mode EPA 6020 analysis* in <1 minute

7 port valve (incl.

online

ISTD port)

Piston

pump

3-way

valve

New features in ISIS 3

• Close-coupled valve – very short tube length so minimal stabilization/rinse delay

• Piston pump for faster sample uptake

• 3-way valve to switch between on-line ISTD or tune solution

• ISIS is now compatible with Startup auto-optimization functions and full autotune

* EPA 6020 includes 23 analytes, plus 8 recommended ISTDs, so up to ~40 analytes (2 gas modes gives optimum data in terms of sensitivity and interference removal)

New Integrated Sample Introduction System (ISIS 3)

Increase sample throughput: 30% faster

26+ elements analysis in soils, etc. (e.g. EPA 6020):

• 7700+ISIS 2: ~75 sec.

• 7900+ISIS 3: <60 sec.

February 2014

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7700 H2: 6.0

0 mL/min

10 sec.

7900 H2: 6.0

0 mL/min

2 sec.

Fast Cell Gas Switching – ORS4

Users confirm they can set

0 seconds stabilization

time for switch between no-

gas, He and HE He modes



• Dynamic Range

• Productivity



• Ease of Use



MassHunter 4.1: Simpler and More Powerful Software Dashboard with Gadgets replaces old mixed UI concept

Instrument status monitor (right) can be

displayed on top of DA window, to show status

and access top level functions without the need

to open entire Top Level Application.

• Gadget icons are “live”; change appearance

depending on current status

• Also have short pull-down menus for quick

access to most common functions

Software so Powerful it Can Write Your Methods! A new era in simple method setup and ease of use

Method Wizard – Develops a complete method in three steps!

1. Select pre-set method template and choose matrix level

2. Confirm analytes and internal standards…

Software so Powerful it Can Write Your Methods! A new era in simple method setup and ease of use

Method Wizard – Develops a complete method in three steps!

3. Choose whether to optimize method for speed or DLs

…and click “Optimize”

Select “Speed” or “Low DL”

The new batch is ready to run It can be edited or save as a template for future use

February 2014

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unit DL BEC

Speed Low DL Speed Low DL

Be ppt 2.7 0.3 0.5 0.2

V ppt 1.4 0.0 0.3 0.0

Cr ppt 4.2 1.7 27.8 22.8

Co ppt 1.4 0.4 5.3 5.5

Cu ppt 3.7 2.2 9.3 8.8

As ppt 7.2 0.8 1.4 0.6

Mo ppt 0.8 0.3 0.7 0.4

Ag ppt 1.3 0.7 6.8 5.8

Cd ppt 0.0 0.0 0.0 0.1

Sb ppt 0.2 0.1 0.3 0.2

Ba ppt 7.4 1.8 21.7 17.6

Pb ppt 1.9 0.5 3.6 3.0

U ppt 0.0 0.0 0.0 0.0

Acquisition time

Speed: 2.4 min

Low DL: 5.7 min

Remote Monitor App (iOS and Android devices) View instrument status and perform basic system control

An Industry First!

• View instrument, queue and error status

• Ignite/extinguish plasma

• Pause/resume Queue



• Dynamic Range

• Productivity



• Ease of Use



Improving Installation & Familiarization Installation

• Intuitive Installation Checkout

• Site Prep tool for Software Installation

Familiarization tools

• Familiarization Tutorials

- Familiarization Guide

- Familiarization Video

- Familiarization Slide Set

Plus:

Remote Advisor Now available

for ICP-MS!

Familiarization Tutorial – Over 20 Video Clips Videos show key theory and detailed operation

New Maintenance Intervals Redefined based on actual 7700 user maintenance periods

Item Current (7700) New (7900)

Ar gas filter Replace – 6 months Replace – as needed

Foreline Pump Oil Replace – 3 months Replace – 6 months

Shield Plate Clean – 1 month Replace – as needed

Extraction Lens, Omega Lens Clean – 3 ~ 6 months Clean – as needed

Cell Entrance Lens Clean – 6 months Clean – as needed

Plate Bias Lens Clean – 6 months Clean – as needed

Octopole Replace – 12 months Replace – as needed

Deflect Lens Clean – 6 months Clean – as needed

EM Replace – as needed Replace – as needed

43

Reviewed and agreed by R&D,

Support, and Marketing

• Simpler maintenance

• Less downtime and cost

Summary – New Agilent 7900 ICP-MS Better customer experience

Better Analytical performance experience

Ultra high matrix tolerance

Superior sensitivity and lower background noise

Wider dynamic range

New Productivity Option (ISIS 3)

Ultra fast scan speed for Single Nanoparticle analysis

Better Software experience

ICP-MS MassHunter 4.1

Method Wizard

Mobile device support

Better Support experience

Familiarization Tutorials/Videos

Remote Advisor support

March 26, 2014

Q&A Questions Unanswered at Live Event

Question Response Why is HMI any better than an online auto-dilution system? HMI is in fact a dilution technique. The main difference is that it dilutes the sample aerosol, not the bulk liquid. This has several advantages, but the main

ones are that there are no sample handling steps prior to analysis, so no contamination or dilution errors. And compared to an automatic on-line dilution

system, the main benefits of HMI are the simplicity (no tubing connectors to leak or need maintenance), and the flexibility. With HMI you can run the

sample once and using different tune steps you can measure it at several different dilutions, all from a single visit to the sample. it make method

development really quick and easy. You said that triple quad was the only reliable way to measure

interfered elements when using reactive cell gases. Why? QQQ allows operation in MS/MS mode, which is where the first quadrupole (the one before the cell) operates as a unit mass filter. This means that only

the analyte mass and any on-mass interferences enter the cell, which means the reaction chemistry is really well controlled. In practice this means that

you don't get any cell-formed reaction product ions giving you new interferences on other analytes, and any analyte that you measure as a product ion

itself (such as As-O at m/z 91) is not going to suffer any interferences from another analyte already at the product ion mass (such as Zr91) How often do you calibrate the detectors ? There are 2 sides to this question. The first is how often do you need to calibrate the detector (to ensure linearity between the pulse-count and analog

ranges, so-called P/A Factor calibration). The answer to that would be about once a week if you are routinely working across both detector ranges (ie

calibrating and measuring across the two ranges). But the second part is how often do users typically do the calibration in practice, and that might be

much more frequently because P/A factor calibration can be set to run automatically as part of the system Startup process every time the plasma is lit.

That way you can be sure that it is always calibrated and you don't need to remember to run it as a regular tuning action. Li 6 as internal std is giving us some problems what else can we

use for the low mass calibration? The choice of a really low mass ISTD element can be quite limited because most of the elements in that mass region are either matrix elements or

required analytes. However, if you optimize the instrument to give really robust operating conditions, the mass bias and ionization effects should be quite

limited, and so a higher mass ISTD such as Co or Ge will still correct reasonably well for low mass analytes. The available ISTD elements will depend on

your samples and your method. How long does it take for the vacuum pressure to be back up

after a power interruption? On the Agilent ICP-MS systems the vacuum automatically starts up again after the power is restored, so you just have to wait the normal warmup period

of about 10 minutes. Even if the power is off for a long time, the vacuum in the high vacuum region only takes a few minutes to pump down. It's only a

little longer (maybe 20 minutes) if the vacuum system has been opened for maintenance. Do you have any data that indicates how fast the system rinses

out between two different sample types ? Do you need to clean

the sample interface between different sample types ?

The required wash out time will depend on two things 1) how different the two sample types are and 2) how low you need to measure the analytes in the

second sample type. There are some obvious "worst-case" scenarios such as a lab that measures pure Co and pure Ni and needs to measure each of

the matrix elements as a trace contaminant in the other. In those cases, it would take a very long time to wash out from 1000's ppm level to ppt level,

and it's probably more practical to keep two sets of sample introduction and interface parts, and reserve each set for its own matrix. For other sample

types, such as wastewater and clean drinking water, or clinical labs that run whole blood, urine and plasma, an extended rinse (maybe 10 minutes)

followed by a few repeats of the blank for the new matrix will work fine. by any chance, do you have further data illustrating performance

at lower spike levels? Maybe 1ppb or lower? Hg should be a good indicator for that. hard to analyze for and the recovery at 25% NaCl is phenomenal

What IS was used for the Na study? The ISTD elements used for the NaCl tests were Li6, Sc, Ge, Rh, In and Ir. ISTD assignment was just based on mass. What solid sampling accessories are available and how do they

compare to solution operation ? By far the most common accessory used for solid sampling into an ICP-MS is laser ablation. This is well-established and routine (used for geochemical

dating in prospecting studies, for example), and there are several well-established suppliers of laser ablation systems. It's difficult to compare solution

and laser analysis because there are pros and cons for each. Sample preparation is often much simpler for direct solid samples, but sample

homogeneity can be an issue. Laser gives elemental distribution information on a micron scale, but it can be much more difficult to find or make suitable

standards for the analysis. Other approaches can be used for solid sampling , including ETV introduction of powders, or even slurry nebulization, but

these are much less widely applicable. Will the new hardware features (ISIS 3, UHMI, new detector,

new collision/reaction cell, ion transmission) also be available on

the 8800?

There are no upgrade paths for those hardware parts for the 8800 at the moment, but of course we are always working on future product development

across all our ICP-MS platforms.

How the polyatomic ions are removed in ORS in no gas mode? In no gas mode, there is not a significant reduction in polyatomic ions in the cell, although a little bit of energy discrimination can still take place even

when the cell is unpressurized. But on the Agilent ICP-MS systems, we always focus a lot on making sure the plasma is tuned for very robust conditions,

which means the molecular ions are being decomposed effectively in the plasma. This is monitored using the strongly-bound Ce-O molecule, so reducing

the CeO level indicates that the plasma is working well to dissociate other interfering species (such as CaO, SO, SiO, etc)


Question Response Do you have a method wizard for drinking water, can't use the

ORS. We have pre-set methods for drinking water with He cell mode and without (so the EPA 200.8 pre-set method uses only no gas mode, for example). But

the Method Wizard can build a method even without an appropriate pre-set method. All you need to do is define the analyte and internal standard

masses and the method optimization will still work fine. The pre-set method just saves some time by giving you a template with many parameters already

predefined, but you can still edit the method to suit your specific requirements. And then you can save the modified method as a new template to be used

as the basis for future methods. Is this new software Mas Hunter 4.1. compatible with ICP-MS

7700 yes it is

r s d meaning relative standard deviation With all the capabilities of the 7900, it sounds like you don't need

ICP-AES any more! There's certainly more overlap in capabilities now, especially for high matrix samples and high concentration analyte measurements. But it's wrong to say

that there's no need for ICP-OES anymore. Two of the most important criteria in selecting an analytical instrument are often budget and fitness for

purpose. Many organizations and individuals are aiming to purchase the minimum compliant solution; in other words the lowest cost instrument that is fit

for purpose,. In cases where your analytical method doesn't need particularly low limits of detection, the lower cost of ICP-OES means it is often the

system of choice, even if ICP-MS could also do the analysis. Many standard methods still reference ICP-OES as well, so ICP-MS cannot be used for

those methods. In many laboratories, the switch from ICP-OES to ICP-MS is actually driven by the fact that the ICP-MS can do the measurements that

ICP-OES can't, such as trace analytes that are currently run using GFAAS, or hydride/Atomic Fluorescence for As, Se, Hg, etc). Since ICP-MS can do all

those trace elements in addition to the traditional ICP-OES workload, it often makes sense to consolidate all the analyses onto a single instrument.

Finally, ICP-OES precision is generally better than ICP-MS, so for high-precision major element assays, OES is still superior. Any experience (e.g. application notes) about the direct

detection of metal contaminants in pharmaceutical low molecular

weight compounds directly out of DMSO without further sample

preparation?

Yes, DMSO can be measured directly on the 7900 and this (and other) solvents are commonly used for sample prep for some pharmaceutical materials,

APIs etc. We have a White Paper on Pharmaceutical Analysis by ICP-MS which references some of these methods.

can the new version of Mass Hunter be applied backward to the

7700X Yes it can. There is an upgrade available which can also include the new Win 7 64bit PC, if your 7700 is currently running an earlier 32bit version of

software. For single element, single particle nanoparticle studies, can you

run with no quadrupole settling time? When you measure single nanoparticles, you have to monitor only a single mass, otherwise you could miss the signal for a particle being monitored at

mass a while you were measuring at mass b. In this single ion monitoring time resolved analysis mode, there is no wait time or settling time between

measurements. What are the possible matrix levels with out the ultra HMI

option? On the 7900, the plasma is very robust anyway (<1% CeO), and it can easily tolerate routine analysis of 0.2% total dissolved solids (TDS), even for

materials that are particularly prone to deposit on the interface (so oxides of Al, Si, Ca, etc.). For relatively simple matrices, you can run level sup to

0.5%, possible a little higher if you tune for extra robustness (so low sample flow rate, lower carrier gas flow, etc.). does the new UHMI still require the argon humidifier? The Ar humidifier is more related to the sample nebulization than the UHMI dilution step. At really high salt levels (and 25% NaCl is a saturated solution),

when the sample reaches the nebulizer tip, the pressure drop causes the salts to crystallize out of solution. Using the Ar humidifier reduces this effect, so

you don't get salt crystals building up on the nebulizer tip or devitrification of the glass. The humidifier for the 7900/UHMI is a different design from the

older one, though. It is now two channel, and it uses gas permeation rather than bubbling, so the internal volume is lower and gas changes don't require

such a long stabilization time. High energy mode - is it equal to current Normal plasma? What

about Cool plasma? Thanks The mode we refer to as "High Energy He mode" or HE He) is a cell gas mode rather than a plasma setting. HE mode uses a higher flow of He cell gas

combined with a higher cell voltage to increase the ion energies in the cell. This helps to reduce some interferences by collisional dissociation. For the

plasma modes, we still have normal plasma (at various levels of robustness or CeO ratios) and cool plasma. Cool plasma requires specific sample

introduction hardware and uses a different ion lens design, which can be added to the 7900 as an optional kit. Does the UHMI come standard when ordering the 7900 or is it

an add on? UHMI is optional for the 7900. That's really only because many labs run relatively clean samples and wouldn't appreciate having to purchase the

hardware that they will never need to use. How is sensitivity affected by use of the HMI system? HMI is a dilution system, so broadly speaking the sensitivity decreases by the UHMI dilution factor you set (100x lower sensitivity at UHMI 100x dilution,

for example). Actually it's not quite as simple as this because, in a matrix, the use of UHMI reduces signal suppression, so the net signal loss is not as

great as the nominal dilution factor. Also, because UHMI increases plasma robustness, it reduces suppression of the poorly ionized elements by an even

greater degree, so when measured in a matrix, the relative signal drop for elements like As, Se, Cd, Hg, etc. is much less than the nominal UHMI dilution

factor.


Question Response

What is the typical effect on LOD/BEC when running in UHMI

mode? For clean samples, the BEC and method DL (i.e. calculated back to the original undiluted sample) will degrade by approximately the same factor as the

UHMI dilution factor (so 100x poorer for UHMI 100). However, this doesn’t apply to high matrix samples, where the use of UHMI makes the plasma

much more robust so signals are not suppressed as much as they are without UHMI. With UHMI, the decomposition of polyatomics is also more

effective (lower CeO/Ce ratio), so some matrix interferences are lower even before the cell processes have their effect. This means that the net effect on

BEC and DL is not as great as the nominal UHMI dilution factor..

How much does it cost to run the instrument per sample if at full

capacity for an 8 hour day? (gas cost, maintenance, etc.) The main running cost is the Argon gas, and an ICP-MS uses approximately one standard (K/L size) cylinder of Ar (10,000 liters of gas) per 8 hours of

operation. Depending on the sample type and the sample introduction you are using, you should expect to get one solution analyzed (uptake,

stabilization, measurement and washout) every 1 to 4 minutes, so in an 8 hour day you’d get between about 100 and 400 samples measured, assuming

around a 15% QC overhead. If you use the instrument a lot (or have multiple ICP instruments) the argon costs less when purchased as liquid Ar, so

many labs use cryo containers or bulk liquid argon tanks. There is the cost of electricity to run the instrument (it draws around 3.5KW when the plasma is

on, plus about 1.3KW for the water recirculator), but maintenance costs on a daily basis are negligible as all the main consumables last many weeks or

months or more (much more in the case of costly items like the EM detector).

How does the 7900 compare with the 8800 from the standpoint

of sensitivity alone. The sensitivity of the 7900 is almost the same as the 8800, but the 8800 probably has slightly lower background.

Our most difficult matrix is CaSO4, rather than NaCl. We

experience severe salt deposition on the nebulizer, with no

notable improvement with the use of an argon humidifier. Has

any work been done on this or other non-NaCl matrices?

I’ve only come across CaSO4 as a matrix component following its use as an extractant for soil sample analysis, but at those concentrations (I think

0.01M) it could be run routinely. Of course handling high matrix samples requires careful method development to ensure the method is compatible with

the instrument hardware and operating conditions being used. Often there’s a balance between modifying the instrument conditions to allow it to handle

an extreme matrix (by using HMI, for example) and modifying the sample to allow it to be measured under more typical operating conditions. In the case

of HMI and UHMI, we have run several other high matrix sample types, including complex salt mixes and digested metals (1% Cu solution, for example),

but I don't remember seeing data on CaSO4. If you make an enquiry through your local Agilent applications person, we can investigate it.

One question: Your talked about 7900, what is 8800 set for?

what is the expectations for 8800? Yes, this webinar was focused on our new 7900 quadrupole ICP-MS system only, but we did several equivalent presentations when we launched the

8800 in 2012. The 8800 works well for all standard applications. However, it sets itself apart when it comes to really problematic analytes in really

difficult sample types. The unique capability of the 8800 is with its MS/MS capabilities, which control the ions that enter the reaction cell, so reactive cell

gases can be used selectively to remove interferences. This is different from normal quadrupole ICP-MS in reaction mode, where all the ions and matrix

elements enter the cell, so the reaction processes can change completely from one matrix (or combination of analytes) to another. The 8800 can

therefore use reaction chemistry to remove interferences much more effectively and reliably, which allows it to measure elements such as S and P at

much lower levels than quadrupole ICP-MS, and measure interfered elements accurately at the ultra-trace levels required in semiconductor or high

performance materials analysis. And unlike quadrupole ICP-MS, the 8800 can also give reliable and accurate data in reaction mode, even when the

sample matrix is complex or variable. There are many examples, but if you search on the Agilent website you should be able to find a link to the 8800

Applications Handbook (publication number 5991-2802EN).

Could you describe the unattended startup with the ISIS-3 in

more detail? During the Startup process for Agilent ICP-MS systems, a series of user-selectable optimization steps can be performed automatically. So things like

torch alignment, EM detector cross-calibration, lens tuning, and generating a standard system performance report can all be run automatically every time

the plasma is ignited. Previously these Startup functions couldn't be used with ISIS in discrete sampling (DS) mode, because DS gives a relatively short-

lived transient signal pulse from the loop injection, so the signal wasn't stable for long enough for the auto-optimization processes to be completed. The

new ISIS includes a T-connector so that the tune solution can be added to the carrier continuously, in place of the ISTD solution that is normally added

online. This means that Startup has a steady-state tune signal to work with so the Startup tasks can be completed just like for normal (non-DS) sample

intro. Can the ECM server handle a 7700 and a 7900 simultaneously? Yes, An ECM server can handle an almost unlimited number of instruments and can even manage electronic records from non-Agilent instruments.

What's the long-term analyte stability (4 hours) running 25%

dissolved solids using the new aerosol dilution system? We didn't have time to show that data, but it will be included in an upcoming application note, For most elements, the stability at the same spike levels

we showed (50ppb for most trace elements) was between 2 and 5% RSD over the 4 hour sequence (alternating 25% NaCl and 25% NaCl plus spike).


Question Response

Does the method wizard include TRA for chromatographic

analyses? Not at the moment, mainly because the instrument doesn’t have a database of the information about all the possible sample introduction types and signal

characteristics (which might be anything from monitoring a steady-state signal to a very rapidly changing transient signal). TRA acquisitions are much

more difficult to define in a way that a software algorithm can work with, because of the additional variable of the signal change with time. We don’t have

pre-set methods for speciation analysis as yet either, although they are on the software development plan.

what sample introduction and hardware has to be separated

going from high matrix method to low matrix method ie. 300g/LZn

matrix to low water matrix

none. there is no need to switch replace or change any HW items from Sample intro.

is there any changes / improvements to Semi Quant methods Semiquant generally works very well on the 7700 already, especially in He mode, but we didn’t make any specific changes to semiquant calibration in the

latest revision., How that compares to what you have now will depend on which revision you are working with at the moment.

Do standards need to be matrix-matched when using HMI

system? No, they don't; that is one of the main benefits of the improved robustness that UHMI provides. The NaCl matrix spike recoveries (up to 25% NaCl matrix)

that we showed were all measured against a calibration in simple aqueous standards (no NaCl matrix matching).

does the ISIS for the 7700 involve 7port valves and piston pump

as well No, ISIS 3 (the close-coupled-valve version with the piston pump) is currently only available for the 7900.

How much was the IS('s) suppressed during the Na study? Around 50% signal loss in 25% NaCl, and reasonably uniform suppression across the mass range. There is an App Note coming that looks into this data

in a bit more detail.

introduction to the new agilent 7900 - alfresco.ubm...

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