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PROPRIETARY MATERIAL. 2009 The McGraw-Hill Companies, Inc. All rights reserved. No part of this PowerPoint slide may be displayed, reproduced or distributed in anyform or by any means, without the prior written permission of the publisher, or used beyond the limited distribution to teachers and educators permitted by McGraw-Hill for their

individual course preparation. If you are a student using this PowerPoint slide, you are using it without permission.

METROLOGY & MEASUREMENT

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Anand K Bewoor & Vinay A Kulkarni

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Chapter 8

Interferometry

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The sizes of end standards can also be determined by interferometry

principles very accuratelyProf. M G Bhat, Professor Emeritus and Technical Director, Sinhgad College of Engineering.,

Pune University, Pune, India

UNDERSTANDING INTERFEROMETRY

In recent years industrial demand has resulted in a number of innovations in interferometry.

Simultaneously, advances in basic science have posed new requirements for measurements

with very low uncertainty.

To understand the interferometry phenomenon, it is necessary to study the nature of light. To

observe the phenomenon of continuous interference of light waves, the two light sources

should be coherent, they should be very narrow and the sources emitting a set of interfering

beams should be very close to each other. A monochromatic light source is allowed to fall on

the optical flat, which is placed on the surface under test to get fringe patterns. These

interference fringe patterns are used to measure flatness by comparing the fringe pattern

obtained from the master flat surface of known flatness and the surface under test. The NPLFlatness Interferometer is one of the most popular types of interferometers used for flatness

testing.

In the testing of optical components and optical systems, there are many requirements of

precision and accuracy, measurement time, ease of use, dynamic range, and environmental

conditions. But, nowadays interferometry techniques in conjunction with modern electronics,

computers, and software are used as an extremely powerful tool in many fields including the

testing of optical components and optical systems.

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