improved assessment of voltage dips with common monitoring devices

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1 GOOSSENS (BE) Session 2 – Block 3 Barcelona 12-15 May 2003 Improved Assessment of Voltage Dips with Common Monitoring Devices M. Bollen, A. Robert & P. Goossens Session 2 Paper No5

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Improved Assessment of Voltage Dips with Common Monitoring Devices. M. Bollen, A. Robert & P. Goossens Session 2 Paper No5. Voltage Dip Representation. Why Voltage Phasors? Limitations of RMS-representation. Dip produced by single phase fault. single phase dip. 2-phase dip. Depth = 36 %. - PowerPoint PPT Presentation

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Page 1: Improved Assessment of Voltage Dips with Common Monitoring Devices

1GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Improved Assessment of Voltage Dips with Common Monitoring

Devices

M. Bollen, A. Robert & P. Goossens

Session 2 Paper No5

Page 2: Improved Assessment of Voltage Dips with Common Monitoring Devices

2GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Voltage Dip Representation

Why Voltage Phasors?

Limitations of RMS-representation

Page 3: Improved Assessment of Voltage Dips with Common Monitoring Devices

3GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Dip produced by single phase fault

Depth = 36 % Depth = 16 %

single phase dip 2-phase dip

Page 4: Improved Assessment of Voltage Dips with Common Monitoring Devices

4GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Dip produced by single phase fault

D y

primary side trafo secondary side trafo

MAGNITUDE (PP)-U1 = 94%-U2 = 80%-U3 = 93%

Page 5: Improved Assessment of Voltage Dips with Common Monitoring Devices

5GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Why phasors?

• indication about origin– fault type and characteristics

• dip propagation– through transformers– connection : star or delta

• depth: phase-to-ground phase-to-phase

Page 6: Improved Assessment of Voltage Dips with Common Monitoring Devices

6GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Improved Dip Characterisation (M. Bollen)

Voltage Type: A, B, C, D, E, F & G

Characteristic Magnitude V

Phase Angle Jump

Page 7: Improved Assessment of Voltage Dips with Common Monitoring Devices

7GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

7 Dip Types

4 types of faults– 3-phase faults– 1-phase faults– 2-phase faults– 2-phase-to-ground faults

• propagation through transformers• delta or star connection

Seven types of voltage dips

AB (C, D)C (D)E (F, G)

Page 8: Improved Assessment of Voltage Dips with Common Monitoring Devices

8GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Dip Type A

Origin: balanced three phase fault

« A »

Page 9: Improved Assessment of Voltage Dips with Common Monitoring Devices

9GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Dip type B, C & D« B »

« C » « D »

origin: single phase faultstar connection

origin: 2-phase fault, star connectionor single phase fault, delta connection

2-phase fault, delta connection

Page 10: Improved Assessment of Voltage Dips with Common Monitoring Devices

10GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Dip Type E, F & G

Connection: star

Origin: 2-phase to ground

Connection: delta Connection: delta

Behind Dy or Yd trafo

« E » « F » « G »

Page 11: Improved Assessment of Voltage Dips with Common Monitoring Devices

11GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Propagation of voltage dips

Yd

Dy

I

II

III

Fault Type Dip Location

  I II III

3-phase A A A

3-phase-to-ground A A A

2-phase-to-ground E F G

2-phase C D C

1-phase-to-ground B C D

line & phase voltages are swapped: rms-voltages changes !

Page 12: Improved Assessment of Voltage Dips with Common Monitoring Devices

12GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

V

Characteristic Voltage

Characteristic Magnitude V & Phase Angle Jump A, C, D, F, G: MIN(3 UPN & 3 UPP) B, E: first remove U0

= Invariable of connection type (PP PG) and location (primary secondary trafo)

sincos jVVV V

Page 13: Improved Assessment of Voltage Dips with Common Monitoring Devices

13GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Voltage Dip Conversion Algorithms

RMS PHASORS

Page 14: Improved Assessment of Voltage Dips with Common Monitoring Devices

14GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Why conversion algorithms?

Common power quality monitors only measure rms-voltages during dip

Voltage phasors interesting / required for analysis / statistics

conversion!

Page 15: Improved Assessment of Voltage Dips with Common Monitoring Devices

15GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Rms phasors algorithm

2 STEPS:• step 1: determine type of dip

– from relation between the three rms-voltages– number of possible dips is limited

• step 2: determine dip characteristics & phasors– 3 rms-voltages & dip type the characteristic

voltage V and phase-angle jump can be estimated

Page 16: Improved Assessment of Voltage Dips with Common Monitoring Devices

16GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Step 1: determine dip type (1)

• A : three-phase drops• C, E and G: two-phase drops• B, D and F: single-phase drops

Umin

Umax Voltage Dip Type

Page 17: Improved Assessment of Voltage Dips with Common Monitoring Devices

17GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Step 1: determine dip type (2)

1 & 3 phase drops 2 & 3 phase drops

Page 18: Improved Assessment of Voltage Dips with Common Monitoring Devices

18GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Step 2: determine characteristic voltage & phase angle jump

3 rms voltagesU1, U2, U3

dip type

C

characteristic voltage

&

phase angle jump

voltage phasors

sincos jVVV

Page 19: Improved Assessment of Voltage Dips with Common Monitoring Devices

19GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

RMS Voltage Phasorsfor PP measurements

• no zero-sequence component• 3 phasors makes up closed triangle

phasors can easily be estimated out of 3 rms voltages with trigonometry equations

Page 20: Improved Assessment of Voltage Dips with Common Monitoring Devices

20GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Conclusions

Page 21: Improved Assessment of Voltage Dips with Common Monitoring Devices

21GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Evaluation of algorithms

• check of twenty voltage dips in Belgium HV-stations

• accuracy better than 5% for 95% of dips: acceptable for statistical purposes

• fine tuning of algorithms in progress

Page 22: Improved Assessment of Voltage Dips with Common Monitoring Devices

22GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Monitor spec’s

Best solution: recording of rms & phasor evolution during voltage dip

Alternative: only rms recordings to be able to apply conversion algorithms

– all three rms-voltages must be recorded during voltage dip

– snapshot of three rms-voltages when maximum depth is reached

if necessary: adapt firmware of monitor

Page 23: Improved Assessment of Voltage Dips with Common Monitoring Devices

23GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Connection of monitor (rms)

phase-to-phase measurement (PP)• phasors can be calculated with trigonometry equations

(closed triangle)• propagation of voltage dips can be estimated

accurately • no indication about the origin

phase-to-ground measurement (PN)• often preferable because indication about origin• propagation can be estimated with proposed

algorithms

Page 24: Improved Assessment of Voltage Dips with Common Monitoring Devices

24GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Voltage dip statistics (depth & length)

• phase-to-ground phase-to-phase statistics

– not comparable & should never be mixed

– always mention which connection is considered in tables or statistics (PG or PP)

• avoid phase-to-ground statistics

– too pessimistic view

– especially in impedance grounded systems

– zero-sequence component is removed in Yd and Dy transformers

Page 25: Improved Assessment of Voltage Dips with Common Monitoring Devices

25GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Voltage dip statistics (depth & length)

• phase-to-phase statistics are preferable

– can be derived from phase-to-ground measurements with proposed algorithms

• alternative: statistics with characteristic magnitude

– characteristic magnitude can be estimated with proposed algorithms,

– remains invariable during propagation (primary or secondary side trafo)

– is independant of connection

Page 26: Improved Assessment of Voltage Dips with Common Monitoring Devices

26GOOSSENS (BE) Session 2 – Block 3

Barcelona 12-15 May 2003

Thank You!