high stability, low noise vibration rejecting yaw rate ......performance gyroscopes, but in...
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High Stability, Low NoiseVibration Rejecting Yaw Rate Gyroscope
Data Sheet ADXRS646
Rev. C Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.Tel: 781.329.4700 ©2011–2017 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com
FEATURES 12°/hr bias stability Z-axis (yaw rate) response 0.01°/√sec angle random walk High vibration rejection over wide frequency Measurement range extendable to a maximum of ±450°/sec 10,000 g powered shock survivability Ratiometric to referenced supply 6 V single-supply operation −40°C to +105°C operation Self-test on digital command Ultrasmall and light (<0.15 cc, <0.5 gram) Temperature sensor output Complete rate gyroscope on a single chip RoHS compliant
APPLICATIONS Industrial applications Severe mechanical environments Platform stabilization
GENERAL DESCRIPTION The ADXRS646 is a high performance angular rate sensor (gyroscope) that offers excellent vibration immunity. Bias stability is a widely-recognized figure of merit for high performance gyroscopes, but in real-world applications, vibration sensitivity is often a more significant performance limitation and should be considered in gyroscope selection. The ADXRS646 offers superior vibration immunity and acceleration rejection as well as a low bias drift of 12°/hr (typical), enabling it to offer rate sensing in harsh environments where shock and vibration are present.
The ADXRS646 is manufactured using the Analog Devices, Inc., patented high volume BiMOS surface-micromachining process. An advanced, differential, quad sensor design provides the improved acceleration and vibration rejection. The output signal, RATEOUT, is a voltage proportional to angular rate about the axis normal to the top surface of the package. The measurement range is a minimum of ±250°/sec. The output is ratiometric with respect to a provided reference supply. Other external capacitors are required for operation.
A temperature output is provided for compensation techniques. Two digital self-test inputs electromechanically excite the sensor to test proper operation of both the sensor and the signal condi-tioning circuits.
The ADXRS646 is available in a 7 mm × 7 mm × 3 mm CBGA chip-scale package.
FUNCTIONAL BLOCK DIAGRAM
Figure 1.
VDD
AGND
PGND
AVCC
ST2 ST1 TEMP VRATIO
ROUT
CP1 CP2 CP3 CP4 CP5 SUMJ RATEOUT
DEMOD
180kΩ ±1%
22nF100nF
22nF
100nF
100nF
100nF
DRIVEAMP
MECHANICALSENSOR
CHARGE PUMPAND VOLTAGEREGULATOR
COUT
6V
6V
3V TO 6V(ADC REF)
ACAMP
VGA
25kΩ@ 25°C
ADXRS646
25kΩSELF-TEST
097
71-0
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ADXRS646 Data Sheet
Rev. C | Page 2 of 12
TABLE OF CONTENTS Features .............................................................................................. 1
Applications ....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications ..................................................................................... 3
Absolute Maximum Ratings ............................................................ 4
Rate Sensitive Axis ....................................................................... 4
ESD Caution .................................................................................. 4
Pin Configuration and Function Descriptions ............................. 5
Typical Performance Characteristics ............................................. 6
Theory of Operation .........................................................................9
Setting Bandwidth .........................................................................9
Temperature Output and Calibration .........................................9
Supply Ratiometricity ................................................................ 10
Null Adjustment ......................................................................... 10
Self-Test Function ...................................................................... 10
Continuous Self-Test .................................................................. 10
Modifying the Measurement Range ........................................ 10
Immunity to Vibration .............................................................. 11
Outline Dimensions ....................................................................... 12
Ordering Guide .......................................................................... 12
REVISION HISTORY 1/2017—Rev. B to Rev. C Changes to Initial Parameter, Table 1 ............................................ 3 1/2014—Rev. A to Rev. B Changes to Table 1 ............................................................................ 3 Changes to Figure Captions, Typical Performance Characteristics Section ..................................................................... 6 Replaced Figure 8 ............................................................................. 6 Changes to Continuous Self-Test Section ................................... 10
9/2012—Rev. 0 to Rev. A Changes to Figure 1 ........................................................................... 1 Changes to Figure 9 ........................................................................... 6 9/2011—Revision 0: Initial Version
Data Sheet ADXRS646
Rev. C | Page 3 of 12
SPECIFICATIONS All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed.
TA = 25°C, VS = AVCC = VDD = 6 V, VRATIO = AVCC, angular rate = 0°/sec, bandwidth = 80 Hz (COUT = 0.01 µF), IOUT = 100 µA, ±1 g, unless otherwise noted.
Table 1. Parameter Test Conditions/Comments Min Typ Max Unit SENSITIVITY1 Clockwise rotation is positive output
Measurement Range2 Full-scale range over specifications range ±250 ±300 °/sec Initial 7.5 9 10.5 mV/°/sec Temperature Drift3 ±6.5 % Nonlinearity Best fit straight line 0.01 % of FS
NULL1 Null −40°C to +105°C 2.7 3.0 3.3 V Temperature Drift3 ±3 °/sec Linear Acceleration Effect Any axis 0.015 °/sec/g Vibration Rectification 25 g rms, 50 Hz to 5 kHz 0.0001 °/sec/g2
NOISE PERFORMANCE Rate Noise Density TA ≤ 25°C 0.01 °/sec/√Hz Rate Noise Density TA ≤ 105°C 0.015 °/sec/√Hz Resolution Floor TA = 25°C, 1 minute to 1 hour in-run 12 °/hr
FREQUENCY RESPONSE Bandwidth4 ±3 dB user adjustable up to specification 1000 Hz Sensor Resonant Frequency 15.5 17.5 20 kHz
SELF-TEST1 ST1 RATEOUT Response ST1 pin from Logic 0 to Logic 1 −50 °/sec ST2 RATEOUT Response ST2 pin from Logic 0 to Logic 1 50 °/sec ST1 to ST2 Mismatch5 −5 ±0.5 +5 % Logic 1 Input Voltage ST1 pin or ST2 pin 4 V Logic 0 Input Voltage 2 V Input Impedance ST1 pin or ST2 pin to common 40 50 100 kΩ
TEMPERATURE SENSOR1 VOUT at 25°C Load = 10 MΩ 2.8 2.9 3.0 V Scale Factor6 25°C, VRATIO = 6 V 10 mV/°C Load to VS 25 kΩ Load to Common 25 kΩ
TURN-ON TIME6 Power on to ±0.5°/sec of final with CP5 = 100 nF 50 ms OUTPUT DRIVE CAPABILITY
Current Drive For rated specifications 200 µA Capacitive Load Drive 1000 pF
POWER SUPPLY Operating Voltage (VS) 5.75 6.00 6.25 V Quiescent Supply Current 4 mA
TEMPERATURE RANGE Specified Performance −40 +105 °C
1 Parameter is linearly ratiometric with VRATIO. 2 Measurement range is the maximum range possible, including output swing range, initial offset, sensitivity, offset drift, and sensitivity drift at 5 V supplies. 3 From +25°C to −40°C or +25°C to +105°C. 4 Adjusted by external capacitor, COUT. Reducing bandwidth below 0.01 Hz does not result in further noise improvement. 5 Self-test mismatch is described as (ST2 + ST1)/((ST2 − ST1)/2). 6 Based on characterization.
ADXRS646 Data Sheet
Rev. C | Page 4 of 12
ABSOLUTE MAXIMUM RATINGS Table 2. Parameter Rating Acceleration (Any Axis, 0.5 ms)
Unpowered 10,000 g Powered 10,000 g
VDD, AVCC −0.3 V to +6.6 V VRATIO AVCC ST1, ST2 AVCC Output Short-Circuit Duration
(Any Pin to Common) Indefinite
Operating Temperature Range −55°C to +125°C Storage Temperature Range −65°C to +150°C
Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operating conditions for extended periods may affect product reliability.
Drops onto hard surfaces can cause shocks of greater than 10,000 g and can exceed the absolute maximum rating of the device. Care should be exercised in handling to avoid damage.
RATE SENSITIVE AXIS This is a Z-axis rate-sensing device (also called a yaw rate-sensing device). It produces a positive going output voltage for clockwise rotation about the axis normal to the package top, that is, clockwise when looking down at the package lid.
Figure 2. RATEOUT Signal Increases with Clockwise Rotation
ESD CAUTION
RATEAXIS
LONGITUDINALAXIS
LATERAL AXIS
+
A B C D G1
7
E FA1
RATE OUT
RATE IN
4.75V
0.25V
AVCC = 5V
VRATIO/2
GND
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Data Sheet ADXRS646
Rev. C | Page 5 of 12
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
Figure 3. Pin Configuration
Table 3. Pin Function Descriptions Pin No. Mnemonic Description 6D, 7D CP5 HV Filter Capacitor, 100nF (±5%). 6A, 7B CP4 Charge Pump Capacitor, 22 nF (±5%). 6C, 7C CP3 Charge Pump Capacitor, 22 nF (±5%). 5A, 5B CP1 Charge Pump Capacitor, 22 nF (±5%). 4A, 4B CP2 Charge Pump Capacitor, 22 nF (±5%). 3A, 3B AVCC Positive Analog Supply. 1B, 2A RATEOUT Rate Signal Output. 1C, 2C SUMJ Output Amp Summing Junction. 1D, 2D DNC Do Not Connect to this Pin. 1E, 2E VRATIO Reference Supply for Ratiometric Output. 1F, 2G AGND Analog Supply Return. 3F, 3G TEMP Temperature Voltage Output. 4F, 4G ST2 Self-Test for Sensor 2. 5F, 5G ST1 Self-Test for Sensor 1. 6G, 7F PGND Charge Pump Supply Return. 6E, 7E VDD Positive Charge Pump Supply.
09
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PGND
ST1
ST2
TEMP
AGNDVRATIO DNC SUMJ
RATEOUT
AVCC
CP2
CP1
CP4CP3CP5VDD
G F E D C B A
7
6
5
4
3
2
1
NOTES1. DNC = DO NOT CONNECT TO THIS PIN.
BOTTOM VIEW
ADXRS646 Data Sheet
Rev. C | Page 6 of 12
TYPICAL PERFORMANCE CHARACTERISTICS N > 1000 for all typical performance plots, unless otherwise noted.
Figure 4. Null Bias at 25°C
Figure 5. Null Drift over Temperature
Figure 6. Null Output over Temperature, 16 Parts in Sockets
Figure 7. Sensitivity at 25°C
Figure 8. Sensitivity over Temperature, 16 Parts in Sockets
Figure 9. Typical Root Allan Deviation at 25°C vs. Averaging Time
30
0
5
10
15
20
25
PE
RC
EN
T O
F P
OP
UL
AT
ION
(%
)
RATEOUT (V)
2.75
2.80
2.85
2.90
2.95
3.00
3.05
3.10
3.15
3.20
3.25
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30
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5
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15
20
25
PE
RC
EN
T O
F P
OP
UL
AT
ION
(%
)
DRIFT (°/sec/°C)
–0.3
0
–0.2
5
–0.2
0
–0.1
5
–0.1
0
–0.0
5 0
0.05
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3.5
2.5
2.6
2.7
2.8
2.9
3.0
3.1
3.2
3.3
3.4
NU
LL
(V
)
TEMPERATURE (°C)
–60 –40 –20 0 20 40 60 80 100 120 140
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35
30
25
20
15
10
5
0
PE
RC
EN
T O
F P
OP
UL
AT
ION
(%
)
SENSITIVITY (mV/°/sec)
8.5 8.6 8.7 8.8 8.9 9.0 9.1 9.2 9.3 9.4 9.5
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7.5
8.0
8.5
9.0
9.5
10.0
10.5
–50 –30 –10 10 30 50 70 90 110
SE
NS
ITIV
ITY
(m
V/°
/sec
)
TEMPERATURE (°C) 09
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1-1
05
1k
100
1
10
RO
OT
AL
LA
N D
EV
IAT
ION
(°/
Ho
ur
rms)
AVERAGING TIME (Seconds)
0.01 0.1 1 10 100 1k
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Data Sheet ADXRS646
Rev. C | Page 7 of 12
Figure 10. ST1 Output Change at 25°C
Figure 11. ST1 Output Change vs. Temperature, 16 Parts in Sockets
Figure 12. Self-Test Mismatch at 25°C
Figure 13. ST2 Output Change at 25°C
Figure 14. ST2 Output Change vs. Temperature, 16 Parts in Sockets
Figure 15. ADXRS646 Frequency Response with a 2.2 kHz Output Filter
25
0
5
10
15
20
PE
RC
EN
T O
F P
OP
UL
AT
ION
(%
)
ST1∆ (mV)
–650
–630
–610
–590
–570
–550
–530
–510
–490
–470
–450
–430
–410
–390
–370
–350
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–0.35
–0.40
–0.45
–0.50
–0.55
–0.60
–0.65
–0.70
–0.75
ST
1∆ (
V)
TEMPERATURE (°C)
–60 –40 –20 0 20 40 60 80 100 120 140
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70
60
50
40
30
20
10
0
PE
RC
EN
T O
F P
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(%
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MISMATCH (%)
–4 –3 –2 –1 0 1 2 3 4
09
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25
0
5
10
15
20
PE
RC
EN
T O
F P
OP
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(%
)
ST2∆ (mV)
350
370
390
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430
450
470
490
510
530
550
570
590
610
630
650
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0.75
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0.65
0.70
ST
2∆ (
V)
TEMPERATURE (°C)
–60 –40 –20 0 20 40 60 80 100 120 140
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9
–18
–15
–12
–9
–6
–3
0
3
6
0
–90
–80
–70
–60
–50
–40
–30
–20
–10
MA
GN
ITU
DE
RE
SP
ON
SE
(d
B)
PH
AS
E R
ES
PO
NS
E (
Deg
rees
)
FREQUENCY (kHz)
0.1 1 10
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COUT = 470pF
MAGNITUDE
PHASE
ADXRS646 Data Sheet
Rev. C | Page 8 of 12
Figure 16. VTEMP Output at 25°C
Figure 17. VTEMP Output vs. Temperature
Figure 18. Current Consumption at 25°C
80
70
60
50
40
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PE
RC
EN
T O
F P
OP
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AT
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(%
)
VTEMP OUTPUT (V)
2.70
2.75
2.80
2.85
2.90
2.95
3.00
3.05
3.10
3.15
3.20
3.25
3.30
09
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09
4.5
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
VT
EM
P (
V)
TEMPERATURE (°C)
–100 –50 0 50 100 150
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30
25
20
15
10
5
0
PE
RC
EN
T O
F P
OP
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ION
(%
)
CURRENT CONSUMPTION (mA)
2.8 2.9 3.0 3.1 3.2 3.3 3.4
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Data Sheet ADXRS646
Rev. C | Page 9 of 12
THEORY OF OPERATION The ADXRS646 operates on the principle of a resonator gyroscope. Figure 19 shows a simplified version of one of four polysilicon sensing structures. Each sensing structure contains a dither frame that is electrostatically driven to resonance. This produces the necessary velocity element to produce a Coriolis force when experiencing angular rate. The ADXRS646 is designed to sense a Z-axis (yaw) angular rate.
When the sensing structure is exposed to angular rate, the resulting Coriolis force couples into an outer sense frame, which contains movable fingers that are placed between fixed pickoff fingers. This forms a capacitive pickoff structure that senses Coriolis motion. The resulting signal is fed to a series of gain and demodulation stages that produce the electrical rate signal output. The quad sensor design rejects linear and angular acceleration, including external g-forces, shock, and vibration. The rejection is achieved by mechanically coupling the four sensing structures such that external g-forces appear as common-mode signals that can be removed by the fully differential architecture implemented in the ADXRS646.
Figure 19. Simplified Gyroscope Sensing Structure—One Corner
The electrostatic resonator requires 21 V for operation. Because only 6 V are typically available in most applications, a charge pump is included on chip. If an external 21 V supply is available, the two capacitors on CP1 to CP4 can be omitted, and this supply can be connected to CP5 (Pin 6D, Pin 7D). CP5 should not be grounded when power is applied to the ADXRS646. No damage occurs, but under certain conditions, the charge pump may fail to start up after the ground is removed without first removing power from the ADXRS646.
SETTING BANDWIDTH The combination of an external capacitor (COUT) and the on-chip resistor (ROUT) creates a low-pass filter that limits the bandwidth of the ADXRS646 rate response. The −3 dB frequency set by ROUT and COUT is
fOUT = 1/(2 × π × ROUT × COUT)
and can be well controlled because ROUT is trimmed during manufacturing to 180 kΩ ± 1%. Any external resistor applied between the RATEOUT pin (1B, 2A) and SUMJ pin (1C, 2C) results in
ROUT = (180 kΩ × REXT)/(180 kΩ + REXT)
An additional external filter is often added (in either hardware or software) to attenuate high frequency noise arising from demodulation spikes at the 18 kHz resonant frequency of the gyroscope. An RC output filter consisting of a 3.3 kΩ series resistor and 22 nF shunt capacitor (2.2 kHz pole) is recommended.
TEMPERATURE OUTPUT AND CALIBRATION It is common practice to temperature-calibrate gyroscopes to improve their overall accuracy. The ADXRS646 has a temperature-dependent voltage output that provides input to such a calibration method. The temperature sensor structure is shown in Figure 20. The temperature output is characteristically nonlinear, and any load resistance connected to the TEMP output results in decreasing the TEMP output and its temperature coefficient. Therefore, buffering the output is recommended.
The voltage at TEMP (3F, 3G) is nominally 2.9 V at 25°C, and VRATIO = 6 V. The temperature coefficient is 10 mV/°C (typical) at 25°C; the output response over the full temperature range is shown in Figure 17. Although the TEMP output is highly repeatable, it has only modest absolute accuracy.
Figure 20. Temperature Sensor Structure
X
Y
Z
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RFIXED RTEMP 09
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ADXRS646 Data Sheet
Rev. C | Page 10 of 12
SUPPLY RATIOMETRICITY The null output voltage (RATEOUT), sensitivity, self-test responses (ST1 and ST2), and temperature output (TEMP) of the ADXRS646 are ratiometric to VRATIO. Therefore, using the ADXRS646 with a supply-ratiometric ADC results in self-cancellation of errors resulting from minor supply variations. There remains a small, usually negligible, error due to non-ratiometric behavior. Note that, to guarantee full measurement range, VRATIO should not be greater than AVCC.
NULL ADJUSTMENT The nominal 3.0 V null output voltage is true for a symmetrical swing range at RATEOUT (1B, 2A). However, an asymmetric output swing may be suitable in some applications. Null adjustment is possible by injecting a suitable current to SUMJ (1C, 2C). Note that supply disturbances may cause some null instability. Digital supply noise should be avoided, particularly in this case.
SELF-TEST FUNCTION The ADXRS646 includes a self-test feature that actuates each of the sensing structures and associated electronics in the same manner as if the gyroscope were subjected to angular rate.
Self-test is activated by applying the standard logic high level ST1 pin (5F, 5G), the ST2 pin (4F, 4G), or both. Applying a logic high to Pin ST1 causes the voltage at RATEOUT to change by −450 mV (typical), and applying a logic high to Pin ST2 causes an opposite change of +450 mV (typical). The voltage applied to the ST1 and ST2 pins must never be greater than AVCC. The self-test response follows the temperature dependence of the viscosity of the package atmosphere, approximately 0.25%/°C.
Activating both ST1 and ST2 simultaneously is not damaging. The output responses generated by ST1 and ST2 are closely matched (±2%), but actuating both simultaneously may result in a small apparent null bias shift proportional to the degree of self-test mismatch.
CONTINUOUS SELF-TEST The on-chip integration of the ADXRS646, as well as the mature process with which it is manufactured, have provided the gyroscope with field-proven reliability.
As an additional failure detection measure, self-test can be performed at power-up or occasionally during operation. However, some applications may require continuous self-test while sensing rotation rate.
MODIFYING THE MEASUREMENT RANGE The ADXRS646 scale factor can be reduced to extend the measurement range to as much as ±450°/sec by adding a single 225 kΩ resistor between RATEOUT and SUMJ. If an external resistor is added between RATEOUT and SUMJ, COUT must be proportionally increased to maintain correct bandwidth.
Data Sheet ADXRS646
Rev. C | Page 11 of 12
IMMUNITY TO VIBRATION Gyroscopes are designed to respond only to rotation. However, all gyroscopes respond to linear motion as well, to varying degrees. While bias stability is often used as the primary figure of merit for evaluating high performance gyroscopes, many additional error sources are present in real-world applications. Especially in applications that require motion sensors, vibration and acceleration are present, and the resulting errors often overwhelm bias drift.
Its differential, quad-sensor design makes the ADXRS646 inherently resistant to vibration, without the need for compensation. The excellent vibration immunity of the ADXRS646 is demonstrated in Figure 21 and Figure 22. Figure 21 shows the ADXRS646 output response with and without random 15 g rms vibration applied at 20 Hz to 2 kHz. Performance is similar regardless of the direction of input vibration.
Figure 21. ADXRS646 Output Response With and Without Random Vibration
(15 g RMS, 20 Hz to 2 kHz); Gyroscope Bandwidth Set to 1600 Hz
To further improve immunity to vibration and acceleration, some g-sensitivity compensation can be performed using an accelerometer. This technique is most successful when the response to vibration is constant regardless of vibration frequency. Figure 22 demonstrates the ADXRS646 dc bias response to a 5 g sinusoidal vibration over the 20 Hz to 5 kHz range. This figure shows that there are no sensitive frequencies present and that vibration rectification is vanishingly small. Accordingly, g-sensitivity compensation using an accelerometer is possible where needed, but the inherent device performance is sufficient for many applications.
Figure 22. ADXRS646 Sine Vibration Output Response (5 g, 20 Hz to 5 kHz);
Gyroscope Bandwidth Set to 1600 Hz
1
0.1
0.01
0.001
0.0001
0.00001
(°/s
ec)2
/ H
z
FREQUENCY (Hz)
10 100 1k 10k
09
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WITH VIBRATION
NO VIBRATION
0.12
–0.04
–0.02
0
0.02
0.04
0.06
0.08
0.10
(°/s
ec)
FREQUENCY (Hz)
10 100 1k 10k
09
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ADXRS646 Data Sheet
Rev. C | Page 12 of 12
OUTLINE DIMENSIONS
Figure 23. 32-Lead Ceramic Ball Grid Array [CBGA]
(BG-32-3) Dimensions shown in millimeters
ORDERING GUIDE Model1 Temperature Range Package Description Package Option ADXRS646BBGZ –40°C to +105°C 32-Lead Ceramic Ball Grid Array [CBGA] BG-32-3 ADXRS646BBGZ-RL –40°C to +105°C 32-Lead Ceramic Ball Grid Array [CBGA] BG-32-3 EVAL-ADXRS646Z Evaluation Board 1 Z = RoHS Compliant Part.
A
B
C
D
E
F
G
7 6 5 4 3
TOP VIEW
3.80 MAX
DETAIL A
BALL DIAMETER
0.600.550.50
0.60 MAX0.25 MIN
COPLANARITY0.15
2 1
*A1 CORNERINDEX AREA
3.20 MAX2.50 MIN
*BALL A1 IDENTIFIER IS GOLD PLATED AND CONNECTED TO THE D/A PAD INTERNALLY VIA HOLES.
7.056.85 SQ6.70
A1 BALLCORNER
BOTTOM VIEW
DETAIL A
0.80BSC
4.80BSC SQ
SEATINGPLANE
07-1
1-2
012
-B
©2011–2017 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D09771-0-1/17(C)