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Group/Presentation TitleAgilent Restricted
Month ##, 200XPage 1
GSM/TD-SCDMA UE Test & Measurement Techniques
Bai Ying ([email protected])Application EngineerSignal Sources DivisionAgilent Technologies,Inc.
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Agenda of Today
•GSM UE Test principle and challenge
•GSM UE Test Solutions Introduction
•TD-SCDMA BTS/Repeater/UE Test Solutions Introduction
•Q&A
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3GPP 51.010 GSM/GPRS/EGPRS Standard Test Compliance(formerly ETSI GSM 11.10)
Available 3GPP TS 51.010
Test Description E1968A
TA E6701D/ E
LA
Comments
13.1 Frequency error and phase error Yes Yes 13.3 Transmitter output power and burst timing Yes Yes 13.4 Output RF spectrum Yes Yes 13.6 GPRS transmitter test Yes Yes 13.7 EGPRS transmitter test Yes Yes 14.1 Bad frame indication Yes Yes 14.2 Reference sensitivity Yes Yes 14.3 Usable receiver input level range Yes Yes 14.4 Co-channel rejection * * 14.5 Adjacent channel rejection * * 14.6 Intermodulation rejection * * 14.7 Blocking and spurious response * * 14.8 AM suppression * * 14.9 Paging performance at high input level * *
Need extra signal generator, spectrum analyzer or fading simulator
14.10 Performance of the Codec Mode Request Generation for Adaptive Multi-Rate Codecs
No * LA support AMR
14.16 GPRS receiver tests Partial Partial 14.18 EGPRS receiver tests Partial Partial
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Micro-Controller
Keyboard& Display Battery
PA
LNA Dup
lexe
r
Speech&ChanCoders
Modulated Synthesiser
Downconvert& Demod
TestPort
AntennaGSM Mobile Block Diagram
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Power Up & CampCall Set UpAudio LoopbackMeasurement ReportsChanging ChannelsOutput PowerPower vs. TimePhase & FrequencyBit Error RateOutput RF Spectrum
GSM UE Test contents
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Power Up &Camp
1. Find Broadcast Channel2. Decode Broadcast Channel
SynchronizeAdjust TimingCheck Network
3. Location UpdateSend RACHAssigned SDCCHSend Identity
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Call Setup
Send RACH
Assigned SDCCH
Assigned TCH
Monitor BCHs
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Audio Loopback
Speaker
Microphone
Speech Coder
Audio Circuits
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Power Versus Time
- 1.0 dB
+ 1.0 dB
Power
Time10μS 8μS 10μS
- 6.0 dB
- 30.0 dB
10μS 8μS 10μS
- 30.0 dB
- 6.0dB
+ 4.0 dB
X dB X dB
X dB On/Off Ratiotypically 59 dB, butdepends on Powerand Radio type
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Measuring Phase and Frequency Error
+20+10
0-10-20
Frequency Error (mean Δφ/ΔΤ)Δφ GSM900 < 90 Hz
DCS1800 < 180 Hz
ΔΤPhase Error
Peak < 20 deg.RMS < 5 deg.
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Bit Error Rate is a measure of how well a receiver can ‘discern’ what is being sent to it. A bad receiver will cause poor connection.
Bit Error Rate
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Output RF Spectrum (ORFS)
ORFS due to Modulation
Tests the spectral interference cause by the .3GMSK modulation
ORFS due to Ramping
Tests the spectral interference ramping profile of the burst
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Frequency
Amplitude
Time
Overshoot
Lobes due tomodulation
Raised lobes dueto ramp up
Output RF Spectrum
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Output RF Spectrum Due to Modulation
Power
Time
Offset kHz
Channel Center
Specification dBc
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Freq.Time
Power
Channel Center
Offset kHz
Specification dBc
Output RF Spectrum Due to Ramping
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ORFS SpecificationsORFS due to Modulation:
ORFS due to Ramping: (differ by power level)
+/- Offset Modulation
100kHz <+0.5dBc
200kHz <-30dBc
250kHz <-33dBc
400kHz <-60dBc … etc.
+/- Offset Ramping (e.g. Power level 5)
400kHz <-19dBc
600kHz <-21dBc
1200kHz <-21dBc
1800kHz <-24dBc
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Agenda of Today
GSM UE Test principle and challenge
GSM UE Test Solutions Introduction
TD-SCDMA BTS/Repeater/UE Test Solutions Introduction
Q&A
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8960 Functional Overview
System Simulationprovides automatic
features like Registration, Calls,
Channel changes, etc
Measurements available from Calibration with
Dynamic Power Analysis through Final Test with BER/BLER
Instrument can be run from the Front Panel or over GPIB using
your own software, or our Wireless Test
Manager
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8960 Measurement CapabilitiesReceiver Test
– Block Error Rate– Fast Bit Error Rate– GSM Bit Error Rate– GPRS Bit Error Rate– EGPRS SRB Bit Error Rate
Transmitter Test– I/Q Tuning– Output RF Spectrum – EGPRS Modulation Accuracy– Phase and Frequency Error– Power vs. Time – RACH– Transmit Power
Others– Frequency Stability– Phase and Amplitude vs Time– GSM/GPRS Dynamic Power– EGPRS Dynamic Power – Spectrum Monitor– Multi-tone Audio
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8960 Measurements Phase and Frequency Error Measurement
Key Features, Specifications:Input Signal Requirement
• Total Range: -15 dBm to +43 dBm• ±3 dB of expected input level• ±100 kHz of expected input frequency (GSM/GPRS), ±1 kHz(EGPRS)
Accuracy• Frequency Error <±12Hz+ timebase reference(±18Hz for RACH bursts)• RMS Phase Error < ±1 degree• Peak Phase Error < ±4 degrees
8960 Implementation:• DSP-based waveform measurement• Narrow-band(<200 kHz) measurement
3GPP Standard TS 51.010 Applicability:• Phase Error and Frequency Error [13.1], [13.16.1]
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8960 Measurements Power vs. Time Measurement
Key Features, Specifications:Input Signal Requirement
• Total Range: -15 dBm to +43 dBm• ±3 dB of expected input level• ±10 kHz of expected input frequency
Accuracy• Meet Standard Requirement
8960 Implementation:• Narrowband point by point measurement• 2220 samples are measured across the burst
3GPP Standard TS 51.010 Applicability:• Transmitter output power and burst timing [13.3]
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8960 Measurements Output RF Spectrum Measurement (Analog ORFS)
Key Features, Specifications:Input Signal Requirement
• Total Range: -10 dBm to +43 dBm(GSM); -10 dBm to +37(GPRS and EGPRS) • ±3 dB of expected input level• ±200 Hz of expected input frequency
Accuracy• Meet Standard Requirement
8960 Implementation:• DSP based narrowband measurement • Using a 30 kHz IF bandwidth, 5-pole synchronously tuned filter
3GPP Standard TS 51.010 Applicability:• Transmitter output power and burst timing [13.4], [13.6.3], [13.7.3]
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8960 Measurements GSM BER Measurement
Key Features, Specifications:• Loopback A, B• Residual or Non-residual• Type IA, IB, II • Type Data for GSM CSD BER
8960 Implementation:• During BER measurements, the test set generates a downlink TCH with pseudo-random binary sequence, PRBS-15, data at a known power level. The mobile station receives the data, loops it back to its transmitter, and returns the data to the test set. The test set compares data sent to data received, and BER is calculated.
3GPP Standard TS 51.010 Applicability:• Reference Sensitivity [14.2]
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Agenda of Today
GSM UE Test principle and challenge
GSM UE Test Solutions Introduction
TD-SCDMA BTS/Repeater/UE Test Solutions Introduction
Q&A
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Background-Specifications of ITU
• TDMA: UMC136(FDD), E-DECT(TDD)
• CDMA FDD
• 3GPP: DS CDMA
• 3GPP2: MC CDMA
• UTRA TDD
• 1.28Mcps TDD(TD-SCDMA)
• 3.84Mcps TDD
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Background-Spectrum allocationSpectrum allocation
TD-SCDMAW-CDMA
Air interface
TDDFDD
Mode
20 + 15 MHz60 MHz
Frequency Band
1.6 MHz5 MHz
RF Bandwidth Availability
From 2003 on (today: WLL)
1900 1920 1980 2010 2025
60 MHz60 MHz20 MHz
15 MHz
30MHz
FDD (uplink) FDD (downlink)TDDTDD Satellite Void
2110 2170
Void
1885
85 MHz15 MHz
Now
Duplex Spacing 190 MHz
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Background of TD-SCDMA
• Chinese contribution to the international family of Mobile Radio Systems for 3G services of UMTS and IMT 2000.
• Harmonize with UTRA-TDD in 3GPP and became one option of UTRA-TDD, called as 1.28Mcps TDD or low chip rate (LCR) TDD.
• Mainly supported by CATT and Siemens, from standardization to prototype.
• Most of standardization work is carried out in CWTS and 3GPP.
• TD-SCDMA forum was founded in 2000 by 8 companies, including China Mobile ,China Telecom, China Unicom, Datang Group, Huawei Corporation, Motorola ,Nortel and Siemens. The governing body of the Forum is the China Mobile Association Committee(CMAC). Agilent is the member of Forum (http://www tdscdma-forum org)
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Advantages of TDD
• Flexible in spectrum: Requires unpaired frequency bands only
• It is difficult to find paired frequency bands under 2GHz
• Same frequency for uplink and downlink: Smart antenna can be used
• Support asymmetric service
• Low cost for Node B
• Lower power PA with smart antenna
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TD-SCDMA Technical OverviewTD-SCDMA technology- Frame structure
TD-SCDMA Frame Structure
2 subframes
7 slots + 3 special slots
6400 chips
864 chips Structure on each code
SP: Switching point
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TD-SCDMA Technical OverviewTD-SCDMA technology-DwPTS&UpPTS
DwPTS: Downlink synchronization, Cell searchUsed for downlink synchronization and cell initial search
32 group different SYNC-DL codes, used to distinguish different BS
Transmit in all direction and no beam formingUpPTS: Uplink Synchronization, Random Access
There are 256 different codes for SYNC, which can be divided into 32 groups and each g
includes 8 different SYNC codes, i.e., each BS has 8 determinate SYNC codes.
BTSC get initial parameters of beam forming from the uplink signal of terminal
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TD-SCDMA Technical OverviewTD-SCDMA technology-channel mapping/multiplexing
• Data arrives to the coding/multiplexing unit in form
of transport block sets, once every transmission time interval.
• The total number of basic physical channels per frame is given by the maximum number
of time slots and the maximum number of CDMA
codes per time slot.
• An alternative way of multiplexing services is to use multiple CCTrCHs (Coded Composite Transport Channels), which corresponds to having several parallel multiplexing chains, resulting in several data streams, each mapped to one or several physical channels.
• Radio frame equalization performs padding of bits.
• Interleaving: 10, 20, 40, 80ms
• Repetition coding and/or puncturing is used for rate meatching.
PhCH
#1PhC
H#2
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BTS Transmitter RF Testing ItemsTS 34.142-V5.5.0 (2003-6):Sub-clause
Name of Test Item Test Limit TestConfiguration
Agilent TestInstruments
SupplementalInformation
6.2 Maximum Output Power vary by power class andsingle/mutil codes
Α.1 PSA opt 211
6.3 Frequency Stability ±0.05 ppm Α.1 PSA SA Mode6.4.1 Inner Loop Power Control vary code domain power
by SIR meas and TPC fromBTS
Α.1 manual test using89601+PSA or VXI HWwith deep memory
6.4.5 Primary CCPCH Power vary by PRAT (manufacturerated output power)
Α.1
6.4.6 Differential accuracy of PrimaryCCPCH Power
<+/-0.5dB Α1
6.4.4 Minimal Transmit Power < Maximum Power-30dB Α.1 PSA opt 2116.5.1 Transmit OFF Power < -82 dBm Α.1 PSA opt 2116.5.2 Transmit ON/OFF Time Mask below defined mask Α.1 PSA opt 2116.6.1 Occupied Bandwidth < 1.6 MHz Α.1 PSA opt 2116.6.2 Spectrum Emission Mask below defined mask Α.1 PSA opt 211
6.6.2.2 ACLR (Adjacent Channel LeakagePower Ratio)
< 40 dB for 1st adj ch< 45 dB for 2nd adj ch
Α.1 PSA opt 211
6.6.3 Spurious Emissions below defined mask Α.1 PSA opt 2116.7 Transmit Intermodulation doesn't exceed SEM and
Spurious Emission at 1.6M,3.2M and 4.8MHz offset
Α.2 PSA SA Mode manual test using PSAopt 211 also possible
6.8.2 EVM (Error Vector Magnitude) < 12.5% Α.1 PSA opt 212/2136.8.3 Peak Code Domain Error < -28dB Α.1 PSA opt 212/213
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Base Station Receiver RF Testing ItemsTS 34.142-V5.5.0 (2003-6):Sub-claus
Name of Test Item Test Limit Agilent TestInstruments
SupplementalInformation
7.2 Reference Sensitivity Level BER < 1e-3 at -110/-96dBm / 1.28MHz
ESG/MXG+N7612B
7.3 Dynamic range BER < 1e-3 at -80/66dBm / 1.28MHz withAWGN -76/-62dBm/1.28MHz
ESG/MXG+N7612B
7.4 Adjacent Channel Selectivity(ACS)
BER < 1e-3 in presenceof unwanted signal at adjch
ESG/MXG + N7612B,2nd ESG/MXG + N7612BBasic
+/-1.6 MHz,modulated
7.5 Blocking Characteristics BER < 1e-3 in presenceof unwanted signal in-band
ESG/MXG + N7612B,2nd ESG/MXG + N7612BBasic
+/-3.2 MHz and+/-4.8 MHz,modulated
7.6 IntermodulationCharacteristics
BER < 1e-3 in presenceof unwanted 2 signals
ESG/MXG + N7612B,2nd ESG/MXG + N7612Bbasic,3rd ESG/MXG
7.7 Spurious Emissions below defined mask PSA opt 211
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TD-SCDMA Tx and Rx Test
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Repeater Testing ItemsTD-SCDMA直放站测试行标 (2007-4):
测试项 测试模式 Agilent仪器 说明
6.1 标称最大线性输出功率 B1 MXG, PSA6.2 自动电平控制(ASLC) B2 MXG, PSA6.4 频率误差及频率步进值 B4 MXG, PSA6.5 调制准确度 B4 MXG, PSA6.11 杂散 (频谱发射模板、杂散发射) B1 MXG, PSA6.12 ACLR B3 MXG, PSA6.13 输出互调 B1,B1 MXGx2, PSA
6.14 阻塞 B1 MXGx2, PSA6.15 直放站功放启动灵敏度及门限调整范围 B1 MXGx4, PSA
6.16 直放站开关时间准确度 B1 MXGx4, PSA
6.17 直放站功率开关抗外界干扰能力 B1 MXGx4, PSA
6.18 直放站时隙调节能力 B1 MXGx4, PSA
7 直放站功放开关同步控制功能 B1 MXG, PSA
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Repeater Test Setup
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Agilent TD-SCDMA SolutionsSignal Source
Signal Analysis
N7612B: TD-SCDMA Signal Studio
+ESG
MXG
PSA
MXA
EXA
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Signal Sources solutions for TD-SCDMA
Component test solution
-- Industry leading ACLR -76dBc@1carrier -70dBc@6Carriers
-- Up to 12 Multi carriers
Receiver test solution
–N7612B ARB based multi-carrier LCR/HSDPA –Non truncated PN series to BER test with E4438C-UN7
E4438C ESGLAN or GPIB
N5182A MXG
DUT
UN7 BERT PN9/15
or
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Signal Analysis Solutions for TD-SCDMA
• PSA with TD-SCDMA options or MXA with TD-SCDMA options
• Supported test items• Transmit Power• Power vs. Time (Time Mask, OFF Power) • Adjacent Channel Power (ACP), Multicarrier ACP• Spurious Emissions• Spectrum Emission Mask (SEM)• Occupied Bandwidth (OBW)• CCDF• Composite EVM• Peak Code Domain Error (PCDE)• Rho, Freq error, I/Q offset, Gain Imb., Quad error• Code Domain Power (CDP)• Demod bits
PSA TD-SCDMA personality
MXA TD-SCDMA personality
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Reference Specifications for Mobile Testing
3GPP 2004-3 release 5 / 3GPP TDD 1.28 Mcps option:1. TS 25.102-V5.6.0(2003-12) User Equipment (UE) radio transmission and
reception (TDD)
2. TS 34.122-V5.0.0(2003-12) Terminal conformance specification; Radio transmission and reception (TDD)
3. TS 25.221-V5.5.0(2003-09) Physical channels and mapping of transport channels onto physical channels (TDD)
4. TS 25.222-V5.6.0(2003-12) Multiplexing and channel coding (TDD)
5. TS 25.223-V5.3.0(2003-03) Spreading and modulation (TDD)
6. TS 25.224-V5.7.0(2003-12) Physical layer procedures (TDD)
7. TS 25.225-V5.7.0(2004-03) Physical layer – Measurements (TDD)
8. TS 25.105-V5.5.0(2003-12) Base Station (BS) radio transmission and reception (TDD)
9. TS 25.142-V5.6.0(2003-12) Base Station (BS) conformance testing (TDD)
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PSA/XA TD-SCDMA : Transmit Power Test
• Measure traffic time-slots, UpPTS, and DwPTS
• View a single burst or a complete 10ms frame
• Display results as minimum, maximum, and mean values
• Trigger from RF burst for UE signal
• Enable RMS or log averaging
Used for sub-clause 5.2 (Max Tx Pwr), 5.4.2 (Min Tx Pwr) and 5.4.1.3 (Open Loop PwrCtrl) 5.4.1.4 (Close loop Pwr Ctrl,SCPI use)Quickly and accurately measure the transmit power
XA
PSA
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PSA/XA TD-SCDMA : Power vs. Time TestUsed for sub-clause 5.4.3 (Tx OFF Pwr) and 5.4.4 (Tx ON/OFF Time Mask)Excellent solution to provide standard-compliant dynamic range for ON/OFF ratio using 2 sweeps with different atten/preamp setups
• Use a standard-compliant, consecutive timeslot power vs. time mask (95dB for UE)
• Measure Tx ON/OFF power
• Trigger from RF burst trigger for UE signal
• Trigger delay and ramp-up/down time
• User-adjustable mask delay
• Change X-scale to zoom in for ramp-up/down details
XAPSA
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PSA/XA TD-SCDMA: ACP Test
• Default standard-compliant limit lines
• Limit line customization of up to six offsets (relative and absolute)
• Trigger from RF burst trigger for UE signal
• Absolute, relative, absolute or relative, or absolute and relative fail masks
• The ability to examine traffic time slots or pilot time slots (UpPTS or DwPTS)
Used for sub-clause 5.5.2.2 (ACLR)
Monitor adjacent channel emissions
XAPSA
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PSA/XA TD-SCDMA : SEM Test
•View spectrum and tabular results simultaneously on a single screen
• Trigger from RF burst trigger for UE signal
• Select average and number of averages
• Adjustable offset frequency, reference bandwidth, and limit values (relative and absolute)
• Use a standard-compliant SEM for BTS and MS
Used for sub-clause 5.5.2.1 (SEM) Verify standard compliance of spectrum emissions
XAPSA
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PSA/XA TD-SCDMA : Occupied Bandwidth
• One button OBW measurement with PASS/FAIL
• Trigger from RF burst trigger for UE signal
• Select average and number of averages
• OBW in % or x dB down bandwidth (same as Power Suite)
Used for sub-clause 5.5.1 (OBW) Perform occupied bandwidth measurement
XAPSA
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PSA/XA: Spurious Emissions Test
• Has standard-compliant user-defined Tx band parameters
• Performs measurements conformant to MS General & Additional Spurious Emissions Requirements
• Allows for post-measurement spur examination
• Has a fast spur measure feature
Used for sub-clause 5.5.3 (Spur) Perform fast spur searches and verify standard compliance
MXAPSA
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PSA/XA TD-SCDMA: Demodulation Tests• Demod measurements
• Composite EVM• Peak Code Domain Error (PCDE)• Rho, Freq error, I/Q offset, Gain Imb., Quad error• Code Domain Power (CDP)• Demod bits
• Flexible Time Synchronization
• UpPTS or MidambleThree Levels of Analysis
- Level 1: Sub-frame Overall Analysis
- Level 2: Time Slot Analysis
- Composite EVM
- Code Domain Power/Error
- Level 3: Code Channel Analysis
- Symbol EVM, demod bits
MXA
PSA
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TD-SCDMA Mobile Phone Manufacturing Challenge
Handset shipments remain strongEmerging markets and replacement handsetsTechnology shifts to 3G/3.5G (TD-SCDMA, HSDPA/HSUPA)
Handset trend Low cost, more functionShorter handset life cycle
Intense wireless device competition Continual market share pressureShrinking margins, weakening profits
Manufacturers in face of Time to Profit under cost pressures
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TD-SCDMA is a new 3G technology, the key success factors in face of the mature W-CDMA and cdma2000 include:
High QualityCompared with W-CDMA and cdma2000 mature world-wide market, the quality of TD-SCDMA mobile phone still has some problem.
Low CostTD-SCDMA as a home-grown market, it is mainly in China market at 1st stage.Low-cost/High-performance is key to attract new customers and phone replacementManufacturers need to drive costs down – Bill of Materials and Cost of Test
Time-to-MarketAs planned, TD-SCDMA network deployment in 10 cities will be ready for commercialization this October. So the time is very tight for mobile phone manufacturing.
TD-SCDMA Mobile Phone Manufacturing Challenge
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Lowering the Overall Manufacturing Cost of Test
• Manufacturing Cost of Test = ƒ(test strategy, instrument cost, other non-instrument related tasks)• TD-SCDMA/GSM Dual Mode Test Strategy
8960/E6601A 8960
SS + SAOr other OBT
TD-SCDMAOBT
GSM Cal + GSM Final
TD Cal + TD Final
E6601A
8960
TD-SCDMAOBT
GSM + TDCal
GSM Final
TD FinalMulti-formatHighly fast and accurate
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Typical Mobile Phone Calibration Approach
VCO AdjustVCO Adjust
Rx Calibration
Rx Calibration
Mobile TX CalibrationMobile TX Calibration
Self TestsSelf Tests
Verification Tests
Verification Tests
Set DUT Channel
Set DUT Tx Power Level
Set Test Set
Measure Tx Power
Next Power Level
Next Channel
Return Results
Set Test Set Channel
Set Test Set RF Level
Set DUT
DUT RSSI Measurement
Next Power Level
Next Channel
Return Results
Highly RepetitiveMany Channels
Many Levels
CommunicationOverhead
Communication overhead time is significant
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E6835A TD-SCDMA Cal ApplicationProvides TD-SCDMA calibration solution- supporting all major chipsets
CW/AM/FM/TD-SCDMA RF SourceDedicated Physical Channel Measurement Suite:
• Mean and RRC-Filtered Power• Adjacent Channel Leakage Ratio• Error Vector Magnitude• Frequency Error• Peak Code Domain Error• Spectrum Emission Mask
Spectrum MonitorDynamic PowerRF Channel Measurement Suite:
• Channel Power• Frequency Error• Power versus Time• IQ Capture (optional license)
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RF source: • CW/AM/FM/DSB-SC• TD-SCDMA ARB
CW/AM/FM/DSB-SC sources:• Frequency: 380 ~ 2700 MHz• Output Power Level:
-130 to -13 dBm (RF IN/OUT);-120 to -3 dBm (RF OUT Only)
TD-SCDMA ARB source• Frequency: 2010-2025 MHz (TD-
SCDMA band)• Output Power Level:
-120 to -15 dBm (RF IN/OUT)-120 to -5 dBm (RF OUT Only)
RF Generator
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DPCH Measurement Suite
Results Window
Measurement Setup Window
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RF Measurement Suite
Results Window
Measurement Setup Window
Measurement Selection Window
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Advantage of Dynamic Power Technique
VCO AdjustVCO Adjust
Rx Calibration
Rx Calibration
Mobile TX CalibrationMobile TX Calibration
Self TestsSelf Tests
Verification Tests
Verification Tests
Set DUT Channel
Set DUT Tx Power Level
Set Test Set
Measure Tx Power
Next Power Level
Next Channel
Return Results
Set Test Set Channel
Set Test Set RF Level
Set DUT
DUT RSSI Measurement
Next Power Level
Next Channel
Return Results CommunicationOverhead
Highly repetitive many channels, many levels
Dynamic Power can provide dramatic TX test time reduction
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E6601A Dynamic Power MeasurementIncluded in all Calibration Apps• GSM/GPRS/EGPRS• W-CDMA• cdma2000/1xEV-DO• TD-SCDMA
Captures multiple power levels at a single frequency
User defined measurement interval and expected step size
Greatly reduces mobile phone TX power calibration time
Requires chipset support of test waveform Designed for Speed - Fast Calibration Techniques
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E6835A Measurements Adherence to Standard3GPP TS34.122
Test Description Supported?
N/A AFC (frequency calibration) Yes*N/A APC (Tx power calibration) Yes*N/A AGC (Rx power calibration) Yes*N/A Fast Calibration (Dynamic Power) Yes*
5.4.3 Transmit Off Power Yes*5.4.2 Transmit On/Off Time Mask Yes*5.5.1 Occupied BandWidth (OBW) Yes*
5.2 Maximum Output Power Yes* 5.3 Frequency Stability Yes*5.4.2 Minimum Output Power Yes*
5.5.2.1 Spectum Emission Mask (SEM) Yes*5.5.2.2 Adjacent Channel Leakage Power
Ratio (ACLR)Yes*
5.7.1 Error Vector Magnitude (EVM) Yes*5.7.2 Peak Code Domain Error (PCDE) Yes*6.2 Reference Sensitivity Level Test set generates
data pattern, UE 6.3 Maximum Input Level
* Non-signaling mode
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Agenda of Today
GSM UE Test principle and challenge
GSM UE Test Solutions Introduction
TD-SCDMA BTS/Repeater/UE Test Solutions Introduction
Q&A
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