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Group/Presentation Title Agilent Restricted Month ##, 200X Page 1 GSM/TD-SCDMA UE Test & Measurement Techniques Bai Ying ([email protected] ) Application Engineer Signal Sources Division Agilent Technologies,Inc.

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Page 1: GSM/TD-SCDMA UE Test & Measurement  · PDF fileGSM/TD-SCDMA UE Test & Measurement ... 14.9 Paging performance at high input level * * ... Huawei Corporation, Motorola ,Nortel and

Group/Presentation TitleAgilent Restricted

Month ##, 200XPage 1

GSM/TD-SCDMA UE Test & Measurement Techniques

Bai Ying ([email protected])Application EngineerSignal Sources DivisionAgilent Technologies,Inc.

Page 2: GSM/TD-SCDMA UE Test & Measurement  · PDF fileGSM/TD-SCDMA UE Test & Measurement ... 14.9 Paging performance at high input level * * ... Huawei Corporation, Motorola ,Nortel and

TD-SCDMA UE TestingAgilent Restricted

July 18, 2006Page 2

Agenda of Today

•GSM UE Test principle and challenge

•GSM UE Test Solutions Introduction

•TD-SCDMA BTS/Repeater/UE Test Solutions Introduction

•Q&A

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TD-SCDMA UE TestingAgilent Restricted

July 18, 2006Page 3

3GPP 51.010 GSM/GPRS/EGPRS Standard Test Compliance(formerly ETSI GSM 11.10)

Available 3GPP TS 51.010

Test Description E1968A

TA E6701D/ E

LA

Comments

13.1 Frequency error and phase error Yes Yes 13.3 Transmitter output power and burst timing Yes Yes 13.4 Output RF spectrum Yes Yes 13.6 GPRS transmitter test Yes Yes 13.7 EGPRS transmitter test Yes Yes 14.1 Bad frame indication Yes Yes 14.2 Reference sensitivity Yes Yes 14.3 Usable receiver input level range Yes Yes 14.4 Co-channel rejection * * 14.5 Adjacent channel rejection * * 14.6 Intermodulation rejection * * 14.7 Blocking and spurious response * * 14.8 AM suppression * * 14.9 Paging performance at high input level * *

Need extra signal generator, spectrum analyzer or fading simulator

14.10 Performance of the Codec Mode Request Generation for Adaptive Multi-Rate Codecs

No * LA support AMR

14.16 GPRS receiver tests Partial Partial 14.18 EGPRS receiver tests Partial Partial

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TD-SCDMA UE TestingAgilent Restricted

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Micro-Controller

Keyboard& Display Battery

PA

LNA Dup

lexe

r

Speech&ChanCoders

Modulated Synthesiser

Downconvert& Demod

TestPort

AntennaGSM Mobile Block Diagram

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TD-SCDMA UE TestingAgilent Restricted

July 18, 2006Page 5

Power Up & CampCall Set UpAudio LoopbackMeasurement ReportsChanging ChannelsOutput PowerPower vs. TimePhase & FrequencyBit Error RateOutput RF Spectrum

GSM UE Test contents

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TD-SCDMA UE TestingAgilent Restricted

July 18, 2006Page 6

Power Up &Camp

1. Find Broadcast Channel2. Decode Broadcast Channel

SynchronizeAdjust TimingCheck Network

3. Location UpdateSend RACHAssigned SDCCHSend Identity

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TD-SCDMA UE TestingAgilent Restricted

July 18, 2006Page 7

Call Setup

Send RACH

Assigned SDCCH

Assigned TCH

Monitor BCHs

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TD-SCDMA UE TestingAgilent Restricted

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Audio Loopback

Speaker

Microphone

Speech Coder

Audio Circuits

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Power Versus Time

- 1.0 dB

+ 1.0 dB

Power

Time10μS 8μS 10μS

- 6.0 dB

- 30.0 dB

10μS 8μS 10μS

- 30.0 dB

- 6.0dB

+ 4.0 dB

X dB X dB

X dB On/Off Ratiotypically 59 dB, butdepends on Powerand Radio type

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TD-SCDMA UE TestingAgilent Restricted

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Measuring Phase and Frequency Error

+20+10

0-10-20

Frequency Error (mean Δφ/ΔΤ)Δφ GSM900 < 90 Hz

DCS1800 < 180 Hz

ΔΤPhase Error

Peak < 20 deg.RMS < 5 deg.

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Bit Error Rate is a measure of how well a receiver can ‘discern’ what is being sent to it. A bad receiver will cause poor connection.

Bit Error Rate

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TD-SCDMA UE TestingAgilent Restricted

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Output RF Spectrum (ORFS)

ORFS due to Modulation

Tests the spectral interference cause by the .3GMSK modulation

ORFS due to Ramping

Tests the spectral interference ramping profile of the burst

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TD-SCDMA UE TestingAgilent Restricted

July 18, 2006Page 13

Frequency

Amplitude

Time

Overshoot

Lobes due tomodulation

Raised lobes dueto ramp up

Output RF Spectrum

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July 18, 2006Page 14

Output RF Spectrum Due to Modulation

Power

Time

Offset kHz

Channel Center

Specification dBc

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Freq.Time

Power

Channel Center

Offset kHz

Specification dBc

Output RF Spectrum Due to Ramping

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ORFS SpecificationsORFS due to Modulation:

ORFS due to Ramping: (differ by power level)

+/- Offset Modulation

100kHz <+0.5dBc

200kHz <-30dBc

250kHz <-33dBc

400kHz <-60dBc … etc.

+/- Offset Ramping (e.g. Power level 5)

400kHz <-19dBc

600kHz <-21dBc

1200kHz <-21dBc

1800kHz <-24dBc

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TD-SCDMA UE TestingAgilent Restricted

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Agenda of Today

GSM UE Test principle and challenge

GSM UE Test Solutions Introduction

TD-SCDMA BTS/Repeater/UE Test Solutions Introduction

Q&A

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8960 Functional Overview

System Simulationprovides automatic

features like Registration, Calls,

Channel changes, etc

Measurements available from Calibration with

Dynamic Power Analysis through Final Test with BER/BLER

Instrument can be run from the Front Panel or over GPIB using

your own software, or our Wireless Test

Manager

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8960 Measurement CapabilitiesReceiver Test

– Block Error Rate– Fast Bit Error Rate– GSM Bit Error Rate– GPRS Bit Error Rate– EGPRS SRB Bit Error Rate

Transmitter Test– I/Q Tuning– Output RF Spectrum – EGPRS Modulation Accuracy– Phase and Frequency Error– Power vs. Time – RACH– Transmit Power

Others– Frequency Stability– Phase and Amplitude vs Time– GSM/GPRS Dynamic Power– EGPRS Dynamic Power – Spectrum Monitor– Multi-tone Audio

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8960 Measurements Phase and Frequency Error Measurement

Key Features, Specifications:Input Signal Requirement

• Total Range: -15 dBm to +43 dBm• ±3 dB of expected input level• ±100 kHz of expected input frequency (GSM/GPRS), ±1 kHz(EGPRS)

Accuracy• Frequency Error <±12Hz+ timebase reference(±18Hz for RACH bursts)• RMS Phase Error < ±1 degree• Peak Phase Error < ±4 degrees

8960 Implementation:• DSP-based waveform measurement• Narrow-band(<200 kHz) measurement

3GPP Standard TS 51.010 Applicability:• Phase Error and Frequency Error [13.1], [13.16.1]

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8960 Measurements Power vs. Time Measurement

Key Features, Specifications:Input Signal Requirement

• Total Range: -15 dBm to +43 dBm• ±3 dB of expected input level• ±10 kHz of expected input frequency

Accuracy• Meet Standard Requirement

8960 Implementation:• Narrowband point by point measurement• 2220 samples are measured across the burst

3GPP Standard TS 51.010 Applicability:• Transmitter output power and burst timing [13.3]

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8960 Measurements Output RF Spectrum Measurement (Analog ORFS)

Key Features, Specifications:Input Signal Requirement

• Total Range: -10 dBm to +43 dBm(GSM); -10 dBm to +37(GPRS and EGPRS) • ±3 dB of expected input level• ±200 Hz of expected input frequency

Accuracy• Meet Standard Requirement

8960 Implementation:• DSP based narrowband measurement • Using a 30 kHz IF bandwidth, 5-pole synchronously tuned filter

3GPP Standard TS 51.010 Applicability:• Transmitter output power and burst timing [13.4], [13.6.3], [13.7.3]

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8960 Measurements GSM BER Measurement

Key Features, Specifications:• Loopback A, B• Residual or Non-residual• Type IA, IB, II • Type Data for GSM CSD BER

8960 Implementation:• During BER measurements, the test set generates a downlink TCH with pseudo-random binary sequence, PRBS-15, data at a known power level. The mobile station receives the data, loops it back to its transmitter, and returns the data to the test set. The test set compares data sent to data received, and BER is calculated.

3GPP Standard TS 51.010 Applicability:• Reference Sensitivity [14.2]

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Agenda of Today

GSM UE Test principle and challenge

GSM UE Test Solutions Introduction

TD-SCDMA BTS/Repeater/UE Test Solutions Introduction

Q&A

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Background-Specifications of ITU

• TDMA: UMC136(FDD), E-DECT(TDD)

• CDMA FDD

• 3GPP: DS CDMA

• 3GPP2: MC CDMA

• UTRA TDD

• 1.28Mcps TDD(TD-SCDMA)

• 3.84Mcps TDD

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Background-Spectrum allocationSpectrum allocation

TD-SCDMAW-CDMA

Air interface

TDDFDD

Mode

20 + 15 MHz60 MHz

Frequency Band

1.6 MHz5 MHz

RF Bandwidth Availability

From 2003 on (today: WLL)

1900 1920 1980 2010 2025

60 MHz60 MHz20 MHz

15 MHz

30MHz

FDD (uplink) FDD (downlink)TDDTDD Satellite Void

2110 2170

Void

1885

85 MHz15 MHz

Now

Duplex Spacing 190 MHz

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Background of TD-SCDMA

• Chinese contribution to the international family of Mobile Radio Systems for 3G services of UMTS and IMT 2000.

• Harmonize with UTRA-TDD in 3GPP and became one option of UTRA-TDD, called as 1.28Mcps TDD or low chip rate (LCR) TDD.

• Mainly supported by CATT and Siemens, from standardization to prototype.

• Most of standardization work is carried out in CWTS and 3GPP.

• TD-SCDMA forum was founded in 2000 by 8 companies, including China Mobile ,China Telecom, China Unicom, Datang Group, Huawei Corporation, Motorola ,Nortel and Siemens. The governing body of the Forum is the China Mobile Association Committee(CMAC). Agilent is the member of Forum (http://www tdscdma-forum org)

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Advantages of TDD

• Flexible in spectrum: Requires unpaired frequency bands only

• It is difficult to find paired frequency bands under 2GHz

• Same frequency for uplink and downlink: Smart antenna can be used

• Support asymmetric service

• Low cost for Node B

• Lower power PA with smart antenna

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TD-SCDMA Technical OverviewTD-SCDMA technology- Frame structure

TD-SCDMA Frame Structure

2 subframes

7 slots + 3 special slots

6400 chips

864 chips Structure on each code

SP: Switching point

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TD-SCDMA Technical OverviewTD-SCDMA technology-DwPTS&UpPTS

DwPTS: Downlink synchronization, Cell searchUsed for downlink synchronization and cell initial search

32 group different SYNC-DL codes, used to distinguish different BS

Transmit in all direction and no beam formingUpPTS: Uplink Synchronization, Random Access

There are 256 different codes for SYNC, which can be divided into 32 groups and each g

includes 8 different SYNC codes, i.e., each BS has 8 determinate SYNC codes.

BTSC get initial parameters of beam forming from the uplink signal of terminal

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TD-SCDMA Technical OverviewTD-SCDMA technology-channel mapping/multiplexing

• Data arrives to the coding/multiplexing unit in form

of transport block sets, once every transmission time interval.

• The total number of basic physical channels per frame is given by the maximum number

of time slots and the maximum number of CDMA

codes per time slot.

• An alternative way of multiplexing services is to use multiple CCTrCHs (Coded Composite Transport Channels), which corresponds to having several parallel multiplexing chains, resulting in several data streams, each mapped to one or several physical channels.

• Radio frame equalization performs padding of bits.

• Interleaving: 10, 20, 40, 80ms

• Repetition coding and/or puncturing is used for rate meatching.

PhCH

#1PhC

H#2

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BTS Transmitter RF Testing ItemsTS 34.142-V5.5.0 (2003-6):Sub-clause

Name of Test Item Test Limit TestConfiguration

Agilent TestInstruments

SupplementalInformation

6.2 Maximum Output Power vary by power class andsingle/mutil codes

Α.1 PSA opt 211

6.3 Frequency Stability ±0.05 ppm Α.1 PSA SA Mode6.4.1 Inner Loop Power Control vary code domain power

by SIR meas and TPC fromBTS

Α.1 manual test using89601+PSA or VXI HWwith deep memory

6.4.5 Primary CCPCH Power vary by PRAT (manufacturerated output power)

Α.1

6.4.6 Differential accuracy of PrimaryCCPCH Power

<+/-0.5dB Α1

6.4.4 Minimal Transmit Power < Maximum Power-30dB Α.1 PSA opt 2116.5.1 Transmit OFF Power < -82 dBm Α.1 PSA opt 2116.5.2 Transmit ON/OFF Time Mask below defined mask Α.1 PSA opt 2116.6.1 Occupied Bandwidth < 1.6 MHz Α.1 PSA opt 2116.6.2 Spectrum Emission Mask below defined mask Α.1 PSA opt 211

6.6.2.2 ACLR (Adjacent Channel LeakagePower Ratio)

< 40 dB for 1st adj ch< 45 dB for 2nd adj ch

Α.1 PSA opt 211

6.6.3 Spurious Emissions below defined mask Α.1 PSA opt 2116.7 Transmit Intermodulation doesn't exceed SEM and

Spurious Emission at 1.6M,3.2M and 4.8MHz offset

Α.2 PSA SA Mode manual test using PSAopt 211 also possible

6.8.2 EVM (Error Vector Magnitude) < 12.5% Α.1 PSA opt 212/2136.8.3 Peak Code Domain Error < -28dB Α.1 PSA opt 212/213

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Base Station Receiver RF Testing ItemsTS 34.142-V5.5.0 (2003-6):Sub-claus

Name of Test Item Test Limit Agilent TestInstruments

SupplementalInformation

7.2 Reference Sensitivity Level BER < 1e-3 at -110/-96dBm / 1.28MHz

ESG/MXG+N7612B

7.3 Dynamic range BER < 1e-3 at -80/66dBm / 1.28MHz withAWGN -76/-62dBm/1.28MHz

ESG/MXG+N7612B

7.4 Adjacent Channel Selectivity(ACS)

BER < 1e-3 in presenceof unwanted signal at adjch

ESG/MXG + N7612B,2nd ESG/MXG + N7612BBasic

+/-1.6 MHz,modulated

7.5 Blocking Characteristics BER < 1e-3 in presenceof unwanted signal in-band

ESG/MXG + N7612B,2nd ESG/MXG + N7612BBasic

+/-3.2 MHz and+/-4.8 MHz,modulated

7.6 IntermodulationCharacteristics

BER < 1e-3 in presenceof unwanted 2 signals

ESG/MXG + N7612B,2nd ESG/MXG + N7612Bbasic,3rd ESG/MXG

7.7 Spurious Emissions below defined mask PSA opt 211

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TD-SCDMA Tx and Rx Test

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Repeater Testing ItemsTD-SCDMA直放站测试行标 (2007-4):

测试项 测试模式 Agilent仪器 说明

6.1 标称最大线性输出功率 B1 MXG, PSA6.2 自动电平控制(ASLC) B2 MXG, PSA6.4 频率误差及频率步进值 B4 MXG, PSA6.5 调制准确度 B4 MXG, PSA6.11 杂散 (频谱发射模板、杂散发射) B1 MXG, PSA6.12 ACLR B3 MXG, PSA6.13 输出互调 B1,B1 MXGx2, PSA

6.14 阻塞 B1 MXGx2, PSA6.15 直放站功放启动灵敏度及门限调整范围 B1 MXGx4, PSA

6.16 直放站开关时间准确度 B1 MXGx4, PSA

6.17 直放站功率开关抗外界干扰能力 B1 MXGx4, PSA

6.18 直放站时隙调节能力 B1 MXGx4, PSA

7 直放站功放开关同步控制功能 B1 MXG, PSA

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Repeater Test Setup

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Agilent TD-SCDMA SolutionsSignal Source

Signal Analysis

N7612B: TD-SCDMA Signal Studio

+ESG

MXG

PSA

MXA

EXA

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Signal Sources solutions for TD-SCDMA

Component test solution

-- Industry leading ACLR -76dBc@1carrier -70dBc@6Carriers

-- Up to 12 Multi carriers

Receiver test solution

–N7612B ARB based multi-carrier LCR/HSDPA –Non truncated PN series to BER test with E4438C-UN7

E4438C ESGLAN or GPIB

N5182A MXG

DUT

UN7 BERT PN9/15

or

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Signal Analysis Solutions for TD-SCDMA

• PSA with TD-SCDMA options or MXA with TD-SCDMA options

• Supported test items• Transmit Power• Power vs. Time (Time Mask, OFF Power) • Adjacent Channel Power (ACP), Multicarrier ACP• Spurious Emissions• Spectrum Emission Mask (SEM)• Occupied Bandwidth (OBW)• CCDF• Composite EVM• Peak Code Domain Error (PCDE)• Rho, Freq error, I/Q offset, Gain Imb., Quad error• Code Domain Power (CDP)• Demod bits

PSA TD-SCDMA personality

MXA TD-SCDMA personality

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Reference Specifications for Mobile Testing

3GPP 2004-3 release 5 / 3GPP TDD 1.28 Mcps option:1. TS 25.102-V5.6.0(2003-12) User Equipment (UE) radio transmission and

reception (TDD)

2. TS 34.122-V5.0.0(2003-12) Terminal conformance specification; Radio transmission and reception (TDD)

3. TS 25.221-V5.5.0(2003-09) Physical channels and mapping of transport channels onto physical channels (TDD)

4. TS 25.222-V5.6.0(2003-12) Multiplexing and channel coding (TDD)

5. TS 25.223-V5.3.0(2003-03) Spreading and modulation (TDD)

6. TS 25.224-V5.7.0(2003-12) Physical layer procedures (TDD)

7. TS 25.225-V5.7.0(2004-03) Physical layer – Measurements (TDD)

8. TS 25.105-V5.5.0(2003-12) Base Station (BS) radio transmission and reception (TDD)

9. TS 25.142-V5.6.0(2003-12) Base Station (BS) conformance testing (TDD)

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PSA/XA TD-SCDMA : Transmit Power Test

• Measure traffic time-slots, UpPTS, and DwPTS

• View a single burst or a complete 10ms frame

• Display results as minimum, maximum, and mean values

• Trigger from RF burst for UE signal

• Enable RMS or log averaging

Used for sub-clause 5.2 (Max Tx Pwr), 5.4.2 (Min Tx Pwr) and 5.4.1.3 (Open Loop PwrCtrl) 5.4.1.4 (Close loop Pwr Ctrl,SCPI use)Quickly and accurately measure the transmit power

XA

PSA

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PSA/XA TD-SCDMA : Power vs. Time TestUsed for sub-clause 5.4.3 (Tx OFF Pwr) and 5.4.4 (Tx ON/OFF Time Mask)Excellent solution to provide standard-compliant dynamic range for ON/OFF ratio using 2 sweeps with different atten/preamp setups

• Use a standard-compliant, consecutive timeslot power vs. time mask (95dB for UE)

• Measure Tx ON/OFF power

• Trigger from RF burst trigger for UE signal

• Trigger delay and ramp-up/down time

• User-adjustable mask delay

• Change X-scale to zoom in for ramp-up/down details

XAPSA

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PSA/XA TD-SCDMA: ACP Test

• Default standard-compliant limit lines

• Limit line customization of up to six offsets (relative and absolute)

• Trigger from RF burst trigger for UE signal

• Absolute, relative, absolute or relative, or absolute and relative fail masks

• The ability to examine traffic time slots or pilot time slots (UpPTS or DwPTS)

Used for sub-clause 5.5.2.2 (ACLR)

Monitor adjacent channel emissions

XAPSA

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PSA/XA TD-SCDMA : SEM Test

•View spectrum and tabular results simultaneously on a single screen

• Trigger from RF burst trigger for UE signal

• Select average and number of averages

• Adjustable offset frequency, reference bandwidth, and limit values (relative and absolute)

• Use a standard-compliant SEM for BTS and MS

Used for sub-clause 5.5.2.1 (SEM) Verify standard compliance of spectrum emissions

XAPSA

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PSA/XA TD-SCDMA : Occupied Bandwidth

• One button OBW measurement with PASS/FAIL

• Trigger from RF burst trigger for UE signal

• Select average and number of averages

• OBW in % or x dB down bandwidth (same as Power Suite)

Used for sub-clause 5.5.1 (OBW) Perform occupied bandwidth measurement

XAPSA

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PSA/XA: Spurious Emissions Test

• Has standard-compliant user-defined Tx band parameters

• Performs measurements conformant to MS General & Additional Spurious Emissions Requirements

• Allows for post-measurement spur examination

• Has a fast spur measure feature

Used for sub-clause 5.5.3 (Spur) Perform fast spur searches and verify standard compliance

MXAPSA

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PSA/XA TD-SCDMA: Demodulation Tests• Demod measurements

• Composite EVM• Peak Code Domain Error (PCDE)• Rho, Freq error, I/Q offset, Gain Imb., Quad error• Code Domain Power (CDP)• Demod bits

• Flexible Time Synchronization

• UpPTS or MidambleThree Levels of Analysis

- Level 1: Sub-frame Overall Analysis

- Level 2: Time Slot Analysis

- Composite EVM

- Code Domain Power/Error

- Level 3: Code Channel Analysis

- Symbol EVM, demod bits

MXA

PSA

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TD-SCDMA Mobile Phone Manufacturing Challenge

Handset shipments remain strongEmerging markets and replacement handsetsTechnology shifts to 3G/3.5G (TD-SCDMA, HSDPA/HSUPA)

Handset trend Low cost, more functionShorter handset life cycle

Intense wireless device competition Continual market share pressureShrinking margins, weakening profits

Manufacturers in face of Time to Profit under cost pressures

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TD-SCDMA is a new 3G technology, the key success factors in face of the mature W-CDMA and cdma2000 include:

High QualityCompared with W-CDMA and cdma2000 mature world-wide market, the quality of TD-SCDMA mobile phone still has some problem.

Low CostTD-SCDMA as a home-grown market, it is mainly in China market at 1st stage.Low-cost/High-performance is key to attract new customers and phone replacementManufacturers need to drive costs down – Bill of Materials and Cost of Test

Time-to-MarketAs planned, TD-SCDMA network deployment in 10 cities will be ready for commercialization this October. So the time is very tight for mobile phone manufacturing.

TD-SCDMA Mobile Phone Manufacturing Challenge

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Lowering the Overall Manufacturing Cost of Test

• Manufacturing Cost of Test = ƒ(test strategy, instrument cost, other non-instrument related tasks)• TD-SCDMA/GSM Dual Mode Test Strategy

8960/E6601A 8960

SS + SAOr other OBT

TD-SCDMAOBT

GSM Cal + GSM Final

TD Cal + TD Final

E6601A

8960

TD-SCDMAOBT

GSM + TDCal

GSM Final

TD FinalMulti-formatHighly fast and accurate

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Typical Mobile Phone Calibration Approach

VCO AdjustVCO Adjust

Rx Calibration

Rx Calibration

Mobile TX CalibrationMobile TX Calibration

Self TestsSelf Tests

Verification Tests

Verification Tests

Set DUT Channel

Set DUT Tx Power Level

Set Test Set

Measure Tx Power

Next Power Level

Next Channel

Return Results

Set Test Set Channel

Set Test Set RF Level

Set DUT

DUT RSSI Measurement

Next Power Level

Next Channel

Return Results

Highly RepetitiveMany Channels

Many Levels

CommunicationOverhead

Communication overhead time is significant

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E6835A TD-SCDMA Cal ApplicationProvides TD-SCDMA calibration solution- supporting all major chipsets

CW/AM/FM/TD-SCDMA RF SourceDedicated Physical Channel Measurement Suite:

• Mean and RRC-Filtered Power• Adjacent Channel Leakage Ratio• Error Vector Magnitude• Frequency Error• Peak Code Domain Error• Spectrum Emission Mask

Spectrum MonitorDynamic PowerRF Channel Measurement Suite:

• Channel Power• Frequency Error• Power versus Time• IQ Capture (optional license)

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RF source: • CW/AM/FM/DSB-SC• TD-SCDMA ARB

CW/AM/FM/DSB-SC sources:• Frequency: 380 ~ 2700 MHz• Output Power Level:

-130 to -13 dBm (RF IN/OUT);-120 to -3 dBm (RF OUT Only)

TD-SCDMA ARB source• Frequency: 2010-2025 MHz (TD-

SCDMA band)• Output Power Level:

-120 to -15 dBm (RF IN/OUT)-120 to -5 dBm (RF OUT Only)

RF Generator

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DPCH Measurement Suite

Results Window

Measurement Setup Window

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RF Measurement Suite

Results Window

Measurement Setup Window

Measurement Selection Window

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Advantage of Dynamic Power Technique

VCO AdjustVCO Adjust

Rx Calibration

Rx Calibration

Mobile TX CalibrationMobile TX Calibration

Self TestsSelf Tests

Verification Tests

Verification Tests

Set DUT Channel

Set DUT Tx Power Level

Set Test Set

Measure Tx Power

Next Power Level

Next Channel

Return Results

Set Test Set Channel

Set Test Set RF Level

Set DUT

DUT RSSI Measurement

Next Power Level

Next Channel

Return Results CommunicationOverhead

Highly repetitive many channels, many levels

Dynamic Power can provide dramatic TX test time reduction

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E6601A Dynamic Power MeasurementIncluded in all Calibration Apps• GSM/GPRS/EGPRS• W-CDMA• cdma2000/1xEV-DO• TD-SCDMA

Captures multiple power levels at a single frequency

User defined measurement interval and expected step size

Greatly reduces mobile phone TX power calibration time

Requires chipset support of test waveform Designed for Speed - Fast Calibration Techniques

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E6835A Measurements Adherence to Standard3GPP TS34.122

Test Description Supported?

N/A AFC (frequency calibration) Yes*N/A APC (Tx power calibration) Yes*N/A AGC (Rx power calibration) Yes*N/A Fast Calibration (Dynamic Power) Yes*

5.4.3 Transmit Off Power Yes*5.4.2 Transmit On/Off Time Mask Yes*5.5.1 Occupied BandWidth (OBW) Yes*

5.2 Maximum Output Power Yes* 5.3 Frequency Stability Yes*5.4.2 Minimum Output Power Yes*

5.5.2.1 Spectum Emission Mask (SEM) Yes*5.5.2.2 Adjacent Channel Leakage Power

Ratio (ACLR)Yes*

5.7.1 Error Vector Magnitude (EVM) Yes*5.7.2 Peak Code Domain Error (PCDE) Yes*6.2 Reference Sensitivity Level Test set generates

data pattern, UE 6.3 Maximum Input Level

* Non-signaling mode

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Agenda of Today

GSM UE Test principle and challenge

GSM UE Test Solutions Introduction

TD-SCDMA BTS/Repeater/UE Test Solutions Introduction

Q&A

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