fundamentals of thermal conductivity measurement via astm 5470

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Fundamentals www.analysistech.com 1 Fundamentals of Thermal Conductivity Measurement via ASTM 5470 by Dr. John W. Sofia Analysis Tech Inc. 2016

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Definition of Apparent Thermal Conductivity ASTM 5470 is Ohms law applied to one-dimensional heat flow. Conductivity defined only for heat flow between parallel, isothermal surfaces (ASTM 5470) Fundamentals www.analysistech.com

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Page 1: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 1

Fundamentals of Thermal Conductivity Measurement via ASTM 5470

byDr. John W. Sofia

Analysis Tech Inc.2016

Page 2: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 2

Definition of Apparent Thermal Conductivity

AL*

TTk

21

app

Q

Conductivity defined only for heat flow between parallel, isothermal surfaces (ASTM 5470)

ASTM 5470 is Ohms law applied to one-dimensional

heat flow.

Page 3: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 3

Sample

Apparent versus Actual Thermal Conductivity

QT

sampR

ARRRL

*)(k

bsamptapp

sampactual *

kRAL

Actual conductivity of sample equals apparent conductivity only if contact resistances are zero

Hot Test Surface

Cold Test Surface

Contact Resistance = Rt

Contact Resistance = Rb

L

kactual = kapp If Rt & Rb = 0

Q

Q

Q

Page 4: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 4

Best Method for Conductivity Measurement

ARRRL

RAL

RAL

*)(**k

bsamptsampsampactual

Sample Thickness

RA

slope1 kactual

Intercept = (Rt + Rb)*A

- best-fit

data lin

e -

Page 5: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

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Best Method for Conductivity MeasurementRequirements:

Sum of Contact resistances must be the same for all samples

(stacked samples have higher total contact resistance)

Fractional composition must be the same all samples

(supporting matrices or meshes cause problems here)

Variable thicknesses must have uniform bulk properties

(fabrication can yield thickness-dependent properties)

Page 6: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

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Test Error: Failure to Use Constant Pressure (Type 2 Material)

Page 7: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 7

Contact Impedance Versus Pressure (Type 3 material, hard rubber, dry contact)

Page 8: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

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Characteristics of Surface Contact Resistances

Behavior

Inversely related to contact pressure

Time and pressure dependent

Unpredictable if untreated

Causes

Foreign substances trapped on surfaces

Surface roughness details

Surface flatness details

Page 9: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

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Treating Surface Contact Resistances

Treatments

Liquid to eliminate air on surfaces

Thermal grease to lower surface resistance

Control of contact pressure & time

Goals

Minimize contact resistances

Make them consistent & repeatable

Determine time / pressure dependency

Page 10: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

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Type 1 Samples (ASTM 5470)

Test Method

Controlled thickness test mode

Care for elimination of air bubbles

Avoid very thin samples

Remove excess material

Character

Fluidic: greases, gels, liquids

No deformation limits; viscosity

Near zero contact resistances

Page 11: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 11

Best Method for Conductivity Measurement(Type 1 Materials)

Page 12: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 12

Sample

Testing of Thin Type I Samples(“bond-line” testing)

)*ARRRRA bsampt (

ALR

*ksamp

Hot Test Surface

Cold Test Surface

Top-Contact Rt

BottomContact Rb

L

Q

Q

Q

a) For small L, uncertainty, ε, dominates Rsamp measurement.

b) For small L and large k, Rsamp is small: yields low delta T and poor measurement accuracy

c) Hidden information about the test surfaces dominates RA

Page 13: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 13

Difficulties with Thin Type I Sample Testing

Accuracies

Sample thickness rivals measurement error

Higher power to maintain ΔT accuracy

Hidden Information

Test surface flatness & coplanarity

Filtration of grease: k change

Application details in production

Surface micro-details dominate results

Page 14: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 14

Type 2 Samples (ASTM 5470)

Character

Elastic & plastic deformations combined

Elasticity increasing with deformation

Low contact resistances

Test Method

Use controlled contact pressure

Check pressure and time effects

Fixed-thickness for very soft samples

Page 15: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 15

Best Method for Conductivity Measurement(Type 2 Materials)

Page 16: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

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Type 3 Samples (ASTM 5470)

Character

Very Stiff / hard; near-zero deformation

Surface preparation is critical

High contact resistance without treatment

Test Method

Use high contact pressures

Use oil or grease surface treatment

Smooth, flat, and parallel surface prep.

Page 17: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

Fundamentals www.analysistech.com 17

Best Method for Conductivity Measurement(Type 3 Materials)

Page 18: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

TIM Tester Training www.analysistech.com 18

Accuracy of TIM Measurements

Dependencies

Δ-temperature across sample (low RA)

Heat flow measurement (high RA)

Environment temperature stability

Impedance variation with time

Sample area measurement & mounting Thickness measurement accuracy

Page 19: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

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Repeatability of TIM Measurements

Contact Resistances

Variations due to sample mounting

Variation with time and pressure

Variation in surfaces of samples

Others Sources

Convergence of final result

Inherent measurement variation

Bulk material variations

Page 20: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

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TIM Tester Pressure Range Options

Kit 1: 5 to 95 psi (60 to 650 kPa) +/- 3 psiKit 2: 10 to 170 psi (100-1100 kPa) +/- 5 psi Kit 3: 10 to 380 psi (100-2600 kPa) +/- 10 psi

Kit 3: recommended for mostly type 3 materialsKits 1 & 2: recommended for mostly type 1 & 2 materialsPressure accuracy is +/-2.7% of maximum pressureKits can be changed by end-user and are available in complete set of 3 kits.

Page 21: Fundamentals of Thermal Conductivity Measurement via ASTM 5470

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