foracam: a very precise imaging method for …10 mm spot size: phase signal 1d heat flow -> lower...
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FORACAM: A VERY PRECISE IMAGING METHOD FOR THERMAL METAL PROPERTIES CHARACTERIZATION ANDFLAW DETECTION
EDEVIS GMBH
STUTTGART
GERMANY
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OTvis Optical excited Lockin-Thermography
UTvis Ultrasound Thermography
PTvis Pulse Thermography
ITvis Inductive excited Thermography
Software DisplayIMG 6Image processing and excitation controller / real-time
EDEVIS
ForaCAM Photothermal radiometry
Infr
are
d c
ame
ras
Co
ole
dFP
A a
nd
Mic
ro-b
olo
met
er
SHEAROvis Laser-Shearography
PRODUCTS
LTvis Laser Thermography
LITe Electro-Testing
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EDEVIS
APPLICATIONS
Measurement of hardness /hardness profile
► Time-consuming
► Destructive test
State of the art: indentation (Rockwell, Vickers, …)
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EDEVIS
APPLICATIONS
Measurement of carbonized depth
microscopy
State of the art: metallography ► Time-consuming
► Destructive test
embedding, milling, polishing, etching
sampling
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EDEVIS
APPLICATIONS
Detection of grinding burn
► Time-consuming
► Destructive test
sampling
microscopy
embedding, milling, polishing, etching
State of the art: metallography
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EDEVIS
TASK: INCREASE COST-EFFICIENCY
► Non-destructive test: test object can still be used
► Avoid sample preparation: save time to notice weak hardening process muchearlier
sampling
microscopy
embedding, milling, polishing, etching
► Inline measurements: 100% inspection instead of samples, avoidrejection of whole batches
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EDEVIS
SOLUTION: FORATHERM
PHOTOTHERMAL RADIOMETRY
Determination / detection of► layer thicknesses► case hardness depths► nitriding depths► hardness profiles► porosity contents► grinding burn► hidden corrosion
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EDEVIS
FORATHERM: EXAMPLES
Depth [mm]
Ha
rdn
ess
HV
0.2
1000
900
800
700
600
500
400
3000,0 0,5 1,0 1,5 2,0 2,5 3,0
conventionalForatherm
f 0,5 [Hz 0,5]
Ph
ase
co
ntra
st[°
]
250 µm257 µm500 µm
1028 µm
514 µm1000 µm
3000 µm
30
20
10
0
-10
-20
-30
-40
-50300250200150100500
Non-contact determination of hardnessprofile(after calibration with reference body)
Non-contact determination of Invarlayer thickness on silicon substrate
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EDEVIS
FORATHERM: EXAMPLES WITH SCANNING
Welding seam annealed / not annleaded Grinding burn
with grinding burnwithout grinding burn
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EDEVIS
FORATHERM PHOTOTHERMAL RADIOMETRY
► Non-contact► Non-destructive► Inline-testing is possible► Faster than materialographic
analysis
Advantages Drawbacks
► Detectorsize 1 Pixel:Imaging requires time consuming scanning of sample or sensor head
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EDEVIS
1 PIXEL IS ENOUGH?
Why not using an infrared camera?
► Metals have a high thermal diffusivity:Very high frame rates needed
► Layers like grinding burn are verythin:Extremely high frame ratesneeded
► Signals levels are very small:Perfect temporal synchronization needed
► FLIR X8500sc, 180Hz
► Subwindowing✓
► edevis signalgenerator ESG
► edevis softwareDisplayIMG
✓
► FLIR X6900sc, 1003Hz
► Subwindowing► Subsampling
✓
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EDEVIS
FORACAM SETUP
Collinear setup of IR camera and excitation laser with dicroiticmirror
Advantages:► Measurement spot position independent from working distance► No geometrical constraints between camera & lens and laser
excitation
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EDEVIS
FORACAM
Case hardened specimen, tested at different modulation frequencies
3 Hz 18 Hz 88 Hz
10 mm spot size: phase signal 1D heat flow -> lower phase contrast3 mm spot size: phase signal influenced by 3D heat flow -> higher phase contrast
due to lateral heat flux effects Spot size should be optimized For imaging, array of laser spots can be used
-15
-10
-5
0
5
10
15
20
0 5 10
phase c
ontr
ast
[°]
frequency0.5 [Hz0.5]
F4_HT_10mm
F6_HT_10mm
F8_HT_10mm
F4_HT_3mm
F6_HT_3mm
F8_HT_3mm10 mm laser spotsize
3 mm laser spotsize
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EDEVIS
FORACAM CASE-HARDENING CHARACTERIZATION
-0.5
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
0 1 2 3 4 5 6
Phase c
ontr
ast
[°]
frequency0,5 [Hz0,5]
F3 F4 F5 F6 F7 F8
Case hardening depths of 16MnCr5 samples between 0.3 and 2.0 mm
CHD:F3 0.3 mm F4 0.5 mmF5 0.8 mmF6 1.0 mmF7 1.3 mmF8 2.0 mm
Strong signal change -> CHD can be determined quantitatively (requirescalibration)
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EDEVIS
FORACAM VS FORATHERM
Case hardening depths of 16MnCr5 samples between 0.3 and 2.0 mm
ForaTherm (1 pointdetector)
ForaCAM (focal plane arraydetector)
Ph
ase
con
tras
t[°
]
Ph
ase
con
tras
t[°
]
Frequency0.5
[Hz0.5]Frequency0.5
[Hz0.5]
ForaCAM is even more sensitive!
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EDEVIS
FORACAM GRINDING BURN DETECTION
Collinear setup of IR camera and excitation laser with dicroiticmirror
Frame rate 900 HzSubwindow 160 x 160 pixelIFOV 125 µmMeasurement field 20 x 20 mm2
Laser power 200 W
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EDEVIS
FORACAM GRINDING BURN DETECTION
10 Hz 39 Hz 82 Hz 150 Hz
225 Hz
23 Hz 65 Hz 205 Hz
405 Hz
905 Hz
Foracam Specimen 1 (measurement duration: 30s per image)
Foratherm Specimen 1 (scanned, measurement duration ca. 60min per image)
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EDEVIS
FORACAM GRINDING BURN DETECTION
10 Hz 39 Hz 82 Hz 150 Hz
225 Hz
23 Hz 65 Hz 205 Hz
405 Hz
905 Hz
Foracam Specimen 2 (measurement duration: 30s per image)
Foratherm Specimen 2 (scanned, measurement duration ca. 20min per image)
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EDEVIS
FORACAM SYSTEM COMPONENTS
Sensor head with dicroitand IR camera: Foracam
Synchronization: ESG
Laser: LTvis 250 NT
Software: DisplayImg
Optional: LTvis cabinet
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SUMMARY
After a calibration, metallography can often be replaced
For one spot measurements Foratherm is suited perfectly
Imaging photothermal radiometry is now possible withhighspeed IR cameras and edevis hard- and software
Both methods reduce costs and increase reliability
Lab systems and industrial test stands availably
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LOCKIN-THEMOGRAPHYFOR INVESTIGATION OF ELECTRONIC COMPONENTS
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WHY LOCK-IN?
• Lock-In Thermography is well known and widely used in active thermography. Typical applications are non-destructive material testing and material characterization
• This powerful technique can help to see smallest temperature differences in electronic components with increased contrast and improved spatial resolution avoiding thermal undesired dissipation effects
• The technique can be combined with current FLIR cameras such as FLIR A655sc, FLIR A6750sc, or T1030sc with high speed interface.
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SYSTEM CONFIGURATIONFLIR R&D Camera Standard Core i7 computer
Standard power supplyEdevis signal generator
and power switch
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TEMPERATURE IMAGE
Dis
sip
ation H
ots
pots
Vo
lta
ge
regu
lato
r
D/A
co
nve
r
Resis
tor
DC
/DC
co
nve
rte
r
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TEMPERATURE VS. LOCK-IN
Temperature image.
Overall temperature distribution is visible.
Lock-In Amplitude at 0,5 Hz.
Areas of local dissipation are highlighted
selectively.
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TEMPERATURE VS. LOCK-IN
-0.2
-0.1
0
0.1
0.2
0.3
0 50 100 150 200 250 300
Profile
0
0.002
0.004
0.006
0.008
0 50 100 150 200 250 300
Profile
Temperature increase 4s after start of heating Lock-In Amplitude at 0,5 Hz.
Measured difference: 6mK
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CONCLUSIONS
• Lockin technique can significantly increase system sensitivity
• Spatial resolution is increased as well due to reduction of thermal diffusion length
• Emissivity effects are suppressed
• Compatible to many existing cameras