fabrication of patterned ferromagnetic shape memory thin films
DESCRIPTION
Main results of our study on the martensitic transformation of ferromagnetic NiMnGa thin films patterned by nanospheres lithography.TRANSCRIPT
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FABRICATION OF PATTERNED FERROMAGNETIC SHAPE MEMORY THIN
FILMS
Pablo Álvarez-Alonso
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Group of Magnetism and Magnetic Materials I
http://gmmmt.net
Objetives: New magnetic materials: from preparation and characterization to applications.
Research lines:MagnetoelasticityMagnetoimpedance and magnetoresistanceMagnetocaloric materials Nanopatterned magnetic materialsFerromagnetic Shape Memory Alloys
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BCMaterialsII
http://www.bcmaterials.net/
Objetives: Functional Materials with advanced Mechanical, Thermal, Electric, Magnetic, and Optical properties- from basic aspects to applications.
Research lines:Active (smart) materials
Advanced functional materials
Nanopatterned magnetic materials
Ferromagnetic Shape Memory AlloysSmart Polymers and compositesHybrid multiferroics (magnetoelectric) materials
Materials for EnergyMaterials for Sensors and Bio-Sensors.Materials for Particle accelerators
Magnetic Nanoparticles-Biomedical and Industrial Applications.Magnetic Nanostructures
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OUTLINE
1.INTRODUCTION
2.ANTIDOTS FABRICATION
2.1 High temperature method
2.2 Low temperature method
3. RESULTS
3.1 Microstructure
3.2 Phase transitions
3.3 Magnetic properties
4. CONCLUSIONS
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INTRODUCTION1
MINIATURIZATION
MEMS (Micro-Electro-Mechanic System)
Driving force of technological and social changeMoor’s law: the number of transistors in a circuit doubles each two years
* Inkjet-printer cartridges* Accelerometers* Micromirrors
* Microtransmissions* Chemical, pressure, and flow sensors* Microactuators
Multifunctional materials Weight-efficient Volume-efficient performance flexibility Less maintenance
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INTRODUCTION1
Magnetic Shape memory Alloys
Austenite
Martensite
y-variant
x-variant
Martensitic transformation
(1st order) Direct (A M) Indirect (M A)
SMA (T)MSMA (T,H)
Changes in shape
Variant Equivalent structures with different orientations
Magnetic field-induced strain
(MFIS) in Ni-Mn-Ga
1-10% Single crystal Sensors and Actuators! <0.01% Polycrystalline (suppression of the twin-boundaries motion)
7
INTRODUCTION1
Ni-Mn-Ga micropillars [3]
[1] M. Chmielus et al., Nat. Mater. 8 (2009) 854 - 855[2] N. Scheerbaum et al., Acta Mater. 55 (2007) 2707[3] M. Reinhold et al., J. Appl. Phys. 106 (2009) 053906[4] M. Schmitt et al., Microelectron. Eng. 98 (2012) 536–539
Ni-Mn-Ga microfibers [2]
Ni-Mn-Ga grain size ~ Characteristic sample size
Increase of the free space Increase of the MFIS
Fabrication of Ni–Mn–Ga nanostructures is a challenging task
Ni-Mn-Ga foams [1]
Ni-Mn-Ga cantilevers [4]
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ANTIDOTS FABRICATION2
Fast (parallel) fabrication process Large areas (~1cm2) Low cost technique
APPROACHES
Mix of “Bottom-up” and “Top-down” techniques
* Sputtering* Self-assembled spheres (polystyrene, latex, silica,…)
* Reactive Ion Etching
Nanospheres lithography
4 main stages:
a) Deposit of the spheres (monolayer)
b) Reduction of the spheresc) Metal depositiond) Removal of the spheres
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ANTIDOTS FABRICATION2
Reflux at 60ºC / 18h
N2
Atmosphere
Polymerization
+
Dry in vacuum oven
(12h)
Ingredients:
2g of S (estyrene) monomer 0.04g of AIBN (azobisisobutironitrile)
initiator 0.1g of PVP (polivynilpyrrolidone)
stabilizer 20g of methanol dissolvent
Substrate: Si (100)
COMMON STEPS
PS spheres recipe [1]
[1] J. Lee et al., J. Colloid Interface Sci. 298 (2006) 663–671
Directions:
Centrifuged
Milli-Q water
20 mm
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ANTIDOTS FABRICATION2
Drop-coating [1]
Large-scale monolayered particle mask High hexagonal order Short preparation time
4 stages:
Deposit a dropPS-5% + DI-95%
Vol DI = Vol Ethanol Glass with DI water Consolidation
Triton 2% Liftoff
COMMON STEPS
[1] J. Rybczynski et al., Colloids Surf. Physicochem. Eng. Asp. 219 (2003) 1–6
0.5cm
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ANTIDOTS FABRICATION2
PS reduction: Reactive-Ion Etching
RIE
Conditions for the dry etch
GasesFlow
(sccm)ICP/RF
(W)Pressure
(Torr)Temperature
(oC)Time (min)
PS sphere reduction
O2 120/100 0.1 10 3
Ar 5
Ions and Radicals Physical etch
Chemical (selective) etch
COMMON STEPS
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ANTIDOTS FABRICATION2.1
Conditions for the dry etch
ROUTE 1
GasesFlow
(sccm)ICP/RF
(W)Pressure
(Torr)Temperature
(oC)Time (min)
SiO2 SF6 30150/15
00.1 10 0.3
Si CHF3 10 0/50 0.02 10 15
PS spheres removal with a dissolvent
(Tetrahidrofurane, THF)
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ANTIDOTS FABRICATION2.1
Magnetron DC Sputtering
ROUTE 1
Sputtering conditions
Ar pressure(mbar)
Power(W)
DTarget-Substrate
(cm)Temperature
(ºC)Time(min)
2.6·10-2 150 9 500 5
Ni-Mn-Ga Thickness≈250nm
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ANTIDOTS FABRICATION2.1 ROUTE 1
Si wet etching
KOH 20% 60-100ºC / 1-10min
Potassium hydroxide (KOH) Si and SiO2 etchant
[1] H. Seidel et al., J. Electrochem. Soc. 137 (1990) 3612-3632
KOH (20%) [1]Si (100) SiO2
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ANTIDOTS FABRICATION2.2
Sputtering conditions
PS melting point≈100ºC
ROUTE 2
Dissolvent (THF)
Infrared furnace (P = 10-5 torr) 500ºC / 4h 800ºC / 1h
Enhance the structural order degree [1]
Goal
[1] V.A. Chernenko et al., Mater. Trans. 47 (2006) 619
Ar pressure(mbar)
Power(W)
DTarget-Substrate
(cm)Temperature
(ºC)Time(min)
2.6·10-2 150 9 RT 10
Ni-Mn-Ga Thickness≈500nm
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2.2
-1.5 -1.0 -0.5 0.0 0.5 1.0 1.5
-40
-20
0
20
40
Deposited at 500ºC
Deposited at RT
Annealed at 500ºC
Annealed at 800ºC
Unpatterned films
M (
Am
2 /Kg
)
0H (T)
T = 0ºC
Formation of Ni agglomeratesPre-heated substrate Higher atomic ordering degree
Annealing at 500ºC Enhancement of the magnetic properties
(RT)
Ms =46 Am2/Kg
Ms =13 Am2/Kg
ANTIDOTS FABRICATIONROUTE 2
0 100 200 300 400-0.2
0.0
0.2
0.4
0.6
0.8
1.0
1.2
Unpatterned film annealed at 800oC
M(A
m2 /K
g)
Temperature (ºC)
0H=10mT
1710µm
3.1
RESULTS
30µm
Mean diameter: 1.35 µmSt. Deviation: 0.04 µm
Mean diameter: 1.00 µmSt. deviation: 0.06 µm
After RIE
Drop-Coating
MICROSTRUCTURE
* PS diameter homogeneity * Large domains size
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3.1
RESULTS
Elements % at
Ni 48 ± 1
Mn 32 ± 1
Ga 20 ± 1
AFM
Height of the Si dots
~250 nm-thick Ni-Mn-Ga Film
* Sidewall deposition of Si dots * Large Ni-Mn-Ga crystalline grains
ROUTE 1 (High temperature)
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100ºC
Film removed in <3 min
Partial Si removal
60ºC
3.1
RESULTS
Colapse of Ni-Mn-Ga
layer
ROUTE 1 (High temperature)
Wet Etching KOH (20%)
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3.1
RESULTS
Continuous film (RT)
Patterned film (RT)
Elements % at % at
Ni 49 ± 1 50 ± 1
Mn 27 ± 1 27 ± 1
Ga 24 ± 1 23 ± 1
Mean diameter: 1.16 µmSt. Deviation 0.07 µm
Similar mean composition but inhomogeneity ~1-2%
2µm
Room temperature
500ºC / 4h
ROUTE 2 (Room temperature)
~500 nm-thick Ni-Mn-Ga patterned and continuous films
* Small crystalline size* Slight increase of the grain size* Deformation of the antidots shape
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3.2
RESULTS
VSM and Four-probe method
0.020
0.025
0.030
Res
iste
nci
e (
)
0
10
20
301
0.008
0.010
0.012
0.014
0.016
Res
iste
nci
e (
)
0
2
4
6
0H = 10mT
2
-100 -50 0 50 100 150
0.015
0.020
0.025
0.030
Re
sis
ten
cie
()
Temperature (ºC)
0.0
0.2
0.4
0.6
0.8
1.0
0H = 10mT
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PHASE TRANSITIONS
1. Unpatterned Ni-Mn-Ga film deposited at 500ºC2. Unpatterned Ni-Mn-Ga film annealed at 500ºC3. Patterned Ni-Mn-Ga film annealed at 500ºC
Route 2
Sharp decrease of magnetization TC ≈100ºC TM≈ -50/25 ºC
TC ≈50ºC. No martensitic transformation
Crystal disorder
Multiple drops of the magnetization TC
≈100ºC TM <-30ºC
1.
2.
3.
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3.2
RESULTS
-1.0 -0.5 0.0 0.5 1.0
-1.0
-0.5
0.0
0.5
1.0
T = 50ºC T= -173ºC
Ni-Mn-Ga antidots (Route 2)
M/M
s
0H (T)
-1.0 -0.5 0.0 0.5 1.0
-1.0
-0.5
0.0
0.5
1.0
Unpatterned Ni-Mn-Ga film (deposited at 500ºC)
T = 50ºC T = -173ºC
M/M
s
0H (T)
Martensite Higher anisotropy Larger coercive field HC
Sample µ0Hc (mT) at -173ºC µ0Hc (mT) at 50ºC µ0ΔHc (mT)
Unpatterned film deposited at 500ºC 120 49 71
Patterned film annealed at 500ºC/4h 84 17 67
MAGNETIC PROPERTIES
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4
CONCLUSIONS
1 Two ways for Ni-Mn-Ga thin-films micropatterning have been developed by using self-assembled polystyrene spheres and reactive ion etching.
Route 1: Si sacrificial layer to deposit Ni-Mn-Ga at
500ºC.
Route 2: Large area of 2D-arrays of Ni-Mn-Ga antidots at room temperature and subsequent annealing in a high-vacuum furnace at 500ºC for 4 hours.
2 Route 1 proved to be promising (optimization is need)
3 Antidots synthesized by Route 2 present functional characteristics: Ferromagnetisms (TC~100ºC) and a spread martensitic transformation.