electronics for first beam tests of diamond sensors
DESCRIPTION
Electronics for first beam tests of diamond sensors. Presented by: Igor Emeliantchik. Current Status of Diamond Sensors Research. Laboratory tests with 90 Sr: Charge collection efficiency of 20%. Next step: first prototype for beam tests. Beam tests planned: PITZ ate first, then - PowerPoint PPT PresentationTRANSCRIPT
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Electronics for first beam tests of diamond sensors
Presented by: Igor Emeliantchik
NC PHEP, Minsk: Konstantin Afanaciev,
Igor Emeliantchik
Alexander Ignatenko
Alexander Solin
DESY Zeuthen: Hans Henschel
Instrumentation of the Forward Region
for a Linear Collider Detector
Prague
April 15 – 17, 2004
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Current Status of Diamond Sensors Research
Laboratory tests with 90Sr:Charge collection efficiency of 20%
Next step:first prototype for beam tests
Beam tests planned:PITZ ate first,
thenCERN, HERA, TTF2
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Typical spectrum of x-ray tube.Something similar can be expectedat sensor location
What should we expect at PITZ?
5MeV
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Diamond Sensor and -quanta
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
1 10 100 1000
E, keV
Pro
ba
bil
ity
of
inte
rac
tio
n
Probability of photon interaction within300 m of diamond sensor
Calculations are based on data compiled by W. H.McMaster et. al. Compilation of X-ray Cross-Sections, National Bureau of Standards, for calculation of x-ray cross sections,http://www.csrri.iit.edu/periodic-table.html
Photons with energies of several keV are expectedto give main contribution.
13 eV are needed for 1 e-hole production.
Thus 1 photon will give about 100e.
So, if PITZ halo contains a dozen or more photons with energy of several keV per bunch, we havea chance to register it with our diamond sensor
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Time Structure of the Beam at PITZ
So, we need fast electronics, able to operate at 100ns bunch rate with minimum noise
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Readout Electronics for Beam Tests of Diamond Sensors
Diamond
Metallized plastic box
CSP“Tetrod”
Rfb
Cfb
Ccal 50
OpAmpAD829
Test
Output
Charge-sensitive preamplifier “Tetrod” is a low-noiseone-channel monolythic IC, developed at NC PHEP (Minsk), and produced by microelectronics plant “Integral” (Minsk)
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Two Types of “Tetrod” Preamplifier IC
CTRL_I(BT)
3
2
1
C_SH2
C_SH1
OUT-
OUT+
C_FB
R_FB
IN_T BT
GND
IN
Tetrod-JFETpreamplifier
Tetrod-BJTpreamplifier
Tetrod preamplifierswere designed forcalorimetric applications,so they have big dynamic range,at least 13 bits
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Tetrod-BJT amplifier
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Oscillograms of Tetrod-BJT Amplifier
20ns/div
20ns/div
Preamp output
Shaper output
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Performance of Tetrod-BJT Amplifier
Noise
Linearity
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Performance of Tetrod-jFET amplifier
Noise
Linearity
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Instrumentation of the Forward Region for a Linear Collider Detector Prague, April 15 - 17, 2004
Conclusions
Two amplifiers, Tetrod-BJT and Tetrod-jFET aredesigned, produced, and tested.
Tetrod-jFET has slightly better noise performance.
Tetrod-BJT is faster
Both amplifiers seem to be suitable for beam tests