ee600 lab3 hal9000_grp
TRANSCRIPT
Dan Wehnes, Loren Schwappach, Tom Thede
EE600: Modern Solid State Devices
Colorado Technical University
15 September 2011
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Presentation Overview HAL 9000
System Description
Input / Output Requirements
Performance Requirements
Test Procedures / System Responses
Analysis of HAL 9000 Inverters
Critical Characteristics
Schematic
DC Analysis
Frequency Analysis
Propagation & Time Delays
Comparison
Conclusion
2
System Description
3
HAL 9000 Computer
System Description
4
HAL – (H)euristically Programmed
(AL)gorithmic Computer (Robot Hall of Fame, 2003)
Brain of the Space Ship Discovery in 2001: A
Space Odyssey (Robot Hall of Fame, 2003)
Robot that Controls/Uses Mechanical,
Sensing, and Information Systems of the
Spaceship (Robot Hall of Fame, 2003)
Capabilities (Robot Hall of Fame, 2003):
Controls/Communicates with All Systems onboard
Spaceship Discovery
Speech Output and Speech Recognition
Natural Language Understanding
Lip reading
Thinking Faster and Better than Humans
Primary Input / Output
Requirements
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Inputs Outputs
Auditory EM Waves
(Allows Speech Recognition)
Capable of Life-Like Human Speech
Visual EM Waves
(Allows Visual Recognition and Lip
Reading)
Visual Identification / Recognition
of Crew / Discovery’s Systems and
Exterior Objects.
Uses: Red Camera Eye
Discovery’s Interior (Environmental)
Conditions
Controls all of Discovery’s
Environmental and Life Support
Systems
Discovery’s Exterior (Space-Time)
Conditions
Can Control all Mechanical
Systems/Vehicles that are part of
Discovery
Discovery’s System Outputs Controls All of Spaceship
Discovery’s Functions to Include
Electronics and Navigation
Performance Requirements
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Ensure Mission’s Success At Any Cost
Perform Advanced Artificial Intelligence (AI)
Functions (Such as Decision Making and
Emotional Awareness)
Operate in a Variety of Environments
Process Information at High Speeds
Control all Interior/Exterior Spaceship Functions
Test Procedures / System Responses
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Set Up
Scenario-Based Testing at System Level – Mission
Success Defined
Component Level
○ Power and Grounding Requirements, Electro-Static
Discharge (ESD) Protection
○ Lab Environment with Extreme Temperatures (space)
○ Durability – Shake, Rattle and Roll (Launch Simulation)
Action
System Level – Reaction to Anomalous Situations
(asteroid belt)
Component Level - Switch Control Signals and Evaluate
Test Procedures / System Responses
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Reaction
System Level - Response to All Inputs from Spacecraft & Humans
Component Level - Correct Outputs Based on Inputs
Pass/Fail Criteria
System – Supportive of Humans and Their Directions
Clock Speed Measurements – Response Times to Inputs
Operating Region Evaluation – Controlled/Non-Controlled
Environment
Environmental Testing – Entire Range of Launch and Space
Environment
Failure Modes and Effects – Triple Redundancy for Human Space
Flight
Power Usage Evaluation – Total vs. Allocated per Component
Use of Allocated Space and Weight on Discovery Spacecraft
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Inverter Selection – Critical
Characteristics
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Critical Factors (Importance From Greatest to Least):
Performance: Clock Speed –Fast Switching Speeds (GHz / THz)
Noise Immunity-NM
Minimum Power Usage
Reliability: Resistance to Electrostatic Discharge (Ionization effects)
Minimal Repair Capability and Human Space Flight Rated – NASA and AFIT Certified
Robustness: Maximum Durability
Schematic
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R2
1.6k
Q5Q2N3904
R4
130
D1
D1N4002
Vdd2
5Vdc
0
R3
1k
Q6Q2N3904
C3
90p
NMOSMbreaknNMOS
L = 1uW = 24u
PMOSMbreakpPMOSW = 14uL = 1u
C1
90p
Vdd1
5Vdc
0
Vdd3
5Vdc
0
TTL_Out
CMOS Circuit BiCMOS Circuit
CMOS_Out
TTL Circuit
Shared
Input
Source
Vin
0Vdc
PMOS2MbreakpPMOSW = 14uL = 1u
NMOS2MbreaknNMOS
L = 1uW = 24u
Q1Q2N3904
Q2Q2N3904
0
C2
90p
BiCMOS_Out
Q3
Q2N3904
Q4Q2N3904
R1
4k
DC Analysis – Output Slope
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Vin(low) = 606 mV
Vin(high) = 1.437 V
TTL
Vin(low) = 1.922 V
Vin(high) = 2.494 V
BiCMOS
Vin(low) = 1.364 V
Vin(high) = 2.078 V
CMOS
Using Slope =-1
Points
DC Analysis – Threshold Voltage
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Using Slope =1 (line)
TTL
BiCMOS
VThreshold = 1.854 V
CMOS
VThreshold = 2.316 V
VThreshold = 1.393 V
DC Analysis – Noise Margins
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Noise MarginsResults
TTL
BiCMOS
NMH = 2.759 V
CMOS
NML = 1.018 V
NMH = 1.734 V
NML = 990 mV
NMH = 3.305 V
NML = 583 mV
DC Analysis – Power Used
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Power UsedResults
TTL
BiCMOS
At Vin=0V: 25 pW
CMOS
At Vin=5V: 25 pW
At Vin=1.88V: 216 uW
At Vin=0V: 453 pW
At Vin=5V: 453 pW
At Vin=2.34V: 17.5 mW
At Vin=0V: 5.38 mW
At Vin=5V: 16.8 mW
At Vin=1.43V: 165 mW
Frequency Analysis
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Corner FrequencyResults (f3dB)
TTL
BiCMOS
6.09 kHz
CMOS
68.55 kHz
5.86 MHz
Propagation & Time Delays
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Propagation Delays
tPLH = t3-t1 = 1.232 us
CMOS
tPHL = t7-t5 = 230 ns
tP = tPLH + tPHL = 1.462 us
Rise & Fall Times
tR = t4-t2 = 2.869 us
tF = t8-t6 = 565 ns
Max Frequency
Fmax = 1/(TR+TF) = 291.2 kHz
Propagation & Time Delays
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Propagation Delays
tPLH = t3-t1 = 74 ns
BiCMOS
tPHL = t7-t5 = 23 ns
tP = tPLH + tPHL = 97 ns
Rise & Fall Times
tR = t4-t2 = 212 ns
tF = t8-t6 = 46 ns
Max Frequency
Fmax = 1/(TR+TF) = 3.876 MHz
Propagation & Time Delays
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Propagation Delays
tPLH = t3-t1 = 268 ns
TTL
tPHL = t7-t5 = 3 ns
tP = tPLH + tPHL = 271
Rise & Fall Times
tR = t4-t2 = 35 ns
tF = t8-t6 = 5 ns
Max Frequency
Fmax = 1/(TR+TF) = 25 MHz
Comparison of CMOS, BiCMOS, TTL
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Evaluation Procedure
ParameterIdeal
InverterCMOS
InverterBiCMOS Inverter
Lab 2d TTL
Transfer Characteristic
VThreshold 2.5 V 1.854 V 2.316 V 1.393 V
Noise MarginsNMH 2.5 V 2.759 V 1.734 V 3.305 V
NML 2.5 V 1.018 V 990 mV 582 mV
Power Used
P @ Vin = 0 V 0W 25 pW 453 pW 5.38 mW
P @ Vin = 5 V 0W 25 pW 453 pW 16.8 mW
PMax 0W 216 uW 17.5 mW 165 mW
Propagation Delays
tPDHL 0 s 230 ns 23 ns 3 ns
tPDLH 0 s 1.232 us 74 ns 268 ns
tP 0 s 1.462 us 97 ns 271 ns
Rise Time tR 0 s 2.869 us 212 ns 35 ns
Fall Time tF 0 s 565 ns 46 ns 5 ns
3dB Corner Frequency
f3dB inf. 6.09 kHz 68.6 kHz 5.86 MHz
Max Frequency fMax inf. 291 kHz 3.88 MHz 25 MHz
Conclusions
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Analysis Results:
Performance:
Clock Speed –Fast Switching Speeds (GHz / THz)
○ WINNER: TTL
Noise Immunity
○ WINNER: CMOS
Minimum Power Usage
○ WINNER: CMOS
Reliability:
Resistance to Electrostatic Discharge (Ionization effects)
○ WINNER: TTL
Robustness:
Maximum Durability
○ WINNER: TTL
Our Conclusion: Although TTL Won the Majority of Critical
Requirements We Will Need to Analyze Additional Technologies
Before Making a Final Decision
Questions
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References
Neamen, D. (2007). Microelectronics: Circuit Analysis and Design (3rd ed.). New York, NY: McGraw-Hill.
Robot Hall of Fame. (2003). 2003 Inductees: HAL 9000. Retrieved September 15, 2011 from: http://www.robothalloffame.org/hal.html
2001 Space Sounds. (2003). 2001 A Space Odyssey Internet Resource Archive.Retrieved September 15, 2011 from: http://www.palantir.net/2001/sounds.html
Movie Sounds. (2003). 2001: A Space Odyssey. Retrieved September 15, 2011 from: http://www.moviesounds.com/2001.html
[Illustration of a HAL 9000]. (n.d.). Retrieved September 15, 2011, from: http://bugtraq.ru/library/underground/.keep/compscifi.hal9000.jpg
[Picture of Dave, 2001 A Space Odyssey]. (n.d.). Retrieved September 15, 2011, from: http://www.google.com/imgres?q=2001+a+space+odyssey&hl=en&biw=1020&bih=891&tbs=isz:l&tbm=isch&tbnid=aV_lO0M1jkRAFM:&imgrefurl=http://proverbsofhell.tumblr.com/post/1982878211/inspcollection-2001-a-space-odyssey-dave&docid=Rh2O6pBSIEt57M&w=1920&h=1080&ei=CVtyTvenD7KmsQLrtITfCQ&zoom=1 23
References
[Illustration of a Pilot at Console of Discovery Spaceship]. (n.d.). Retrieved September 15, 2011, from:
http://4.bp.blogspot.com/_7J_WGI7Jygw/S45l1Tq6wPI/AAAAAAAAEtk/gddgrGLNXKw/s1600/2001%2BA%2BSpace%2BOdyssey%2BPic%2B046.jpg
[Illustration of a Man in Discovery Spaceship’s HAL Memory Array]. (n.d.). Retrieved September 15, 2011, from: http://wodumedia.com/wp-content/uploads/HAL-9000-is-about-to-get-his-hard-drive-fried-by-a-seriously-pissed-off-Dave.jpg
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