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Microelectronics Design GroupRAL - Microelectronics Open Day 28th June 2005
Intelligent Digital Sensors
Jamie Crooks
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RAL - Microelectronics Open Day 28th June 2005 Microelectronics Design Group
Active Pixel Sensors: Challenges
• High speed region of interest– [1st talk this session]
• High dynamic range, adaptive imaging– [2nd talk this session]
• In-pixel “intelligence”– Sparse readout– ADC and storage in each pixel– Threshold + functionality
• High frame rates
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RAL - Microelectronics Open Day 28th June 2005 Microelectronics Design Group
The digital pixel
• Conventional APS pixel• Sampling node• Comparator (ADC)• Digital memory• Digital readout
architecture• A 10000 Frames/s CMOS Digital Pixel
Sensor. Kleinfelder et al, Stanford University. IEEE JSSC Dec 2001.
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RAL - Microelectronics Open Day 28th June 2005 Microelectronics Design Group
Advanced digital pixel capabilities
• Threshold sensing– ”Hit” status / timing
• Self-select readout
(sparsification at pixel level)
• Multiple registers• Address ROM• Image pre-processing
…intelligence…
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RAL - Microelectronics Open Day 28th June 2005 Microelectronics Design Group
On-Pixel-Intelligent-CMOS (OPIC)
• Feasibility study: CFI grant (Centre-For-Instrumentation)
• RAL test structure for MI3 collaboration
BASIC
PIXELSADVANCED
PIXELSADVANCED
PIXELS4mm
10mm
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RAL - Microelectronics Open Day 28th June 2005 Microelectronics Design Group
On-Pixel-Intelligent-CMOS (OPIC)
• 30um pixels (64x64 arrays)• Full frame imaging (up to 10k frame/s)• Sparse (threshold defined) frame imaging• In-pixel 8-bit ADC + Threshold timing• Extended dynamic range coding • Optical imaging (~10% fill factor)• Charged particle imaging applications• Due back: July 2005!
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RAL - Microelectronics Open Day 28th June 2005 Microelectronics Design Group
Conclusion
• Example applications– Pulsed laser imaging– Collider detector physics
• Constraints• 800Mb/sec max. output data rate• Data acquisition, processing, and
storage challenges!• Acknowledgements
– MI3(Basic Technology),CFI,Stanford(CA)