A New Tri Beam Tomography Instrument Interpenetrating W – Cu BiPhasic Structure

Cu

WW

Cu

2-D Optical View

50 mm

Craig J. Hawker, University of California-Santa Barbara, DMR 1121053

The morphological arrangement of materials in a broad array of functional devices (thermoelectrics, fuel cell and battery electrodes, catalysts, ablatives) strongly influences performance. A new “TriBeam” tomography technique has been developed by Echlin, Mottura and Pollock. A femtosecond laser integrated with a focused ion beam platform allows for collection of multimodal (structural, chemical, crystallographic) 3-D information with unprecedented speed. The 3-D dataset of the interpenetrating network of Cu within a Cu-W biphasic material was collected in-situ layer-by-layer in <24 h, with nm-scale resolution at a rate 6 orders of magnitude faster than possible with focused ion beams.

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