determining accuracy of measurements at high frequencies

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1 Uncertainty and Modulated Signals Focus on Traceable Measurements Dominique Schreurs K.U.Leuven, Div. ESAT-TELEMIC, Leuven, Belgium [email protected] and Kate A. Remley NIST, Boulder CO, USA [email protected] WORKSHOP WSF13 (EuMC/EuMIC) Determining Accuracy of Measurements at High Frequencies – from Error to Uncertainty

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Page 1: Determining Accuracy of Measurements at High Frequencies

1

Uncertainty and Modulated SignalsFocus on Traceable Measurements

Dominique SchreursK.U.Leuven, Div. ESAT-TELEMIC, Leuven, Belgium

[email protected]

and

Kate A. RemleyNIST, Boulder CO, [email protected]

WORKSHOP WSF13 (EuMC/EuMIC)Determining Accuracy of Measurements at High Frequencies – from Error to Uncertainty

Page 2: Determining Accuracy of Measurements at High Frequencies

2

Outline

• Introduction: Traceable Measurements

• Measuring modulated signals: Scalar• traceable instruments• example: NPL peak power meter calibration

• Measuring modulated signals: Vector• traceable instruments• calibration signals• example I: NIST oscilloscope calibration• example II: uncertainty in determining phase

• Conclusion

Page 3: Determining Accuracy of Measurements at High Frequencies

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Measuring Modulated SignalsModulated signal: A signal containing

multiple frequency components

Key: Instruments with traceability to fundamental physical units

– National Metrology Institutes certify traceability– Uncertainty statement provides limits on expected

range of measured values

frequency

Page 4: Determining Accuracy of Measurements at High Frequencies

4

Fundamental Measurement Traceability

Electro-optic sampling systems: Calculable electrooptic effect in materials

Calibrations tending toward fundamental traceabilityto SI units or calculable physical phenomena

Vector Network Analyzers:Dimension of an air-dielectric transmission line

Power Meters, Noise sources:Temperature

AC Voltage:Josephson junction arrays

+

-E

LiTaO3

Page 5: Determining Accuracy of Measurements at High Frequencies

5

Derived Measurement Traceability

Calibrations that use a series of transfer standards:

Oscilloscope calibrationsDigital sampling oscilloscopeTransfer standard: Photodiode

Source calibrationsVector signal generator, pulsed source, comb generatorTransfer standard: Oscilloscope

Receiver calibrationsLSNA, peak-power meters, VSA, antennasTransfer standard: Calibrated source

Page 6: Determining Accuracy of Measurements at High Frequencies

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Derived Measurement TraceabilityCommonly used for modulated signal traceability

Issues:

+• Can provide traceability to many types of instruments• Same methods can be applied across instruments: Almost a black-box approach

-• Higher uncertainties• Sometimes difficult to combine uncertainties• Instrument-specific issues:

• timebase distortion (oscilloscope)• IF calibration (LSNA)

Page 7: Determining Accuracy of Measurements at High Frequencies

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Measuring Modulated Signals

Measurement of square wave: fundamental and harmonics

Scalar: Accurate power in all measured frequency components

0 5 10 15 20

-80

-60

-40

-20

0

Frequency (GHz)

Mag

nitu

de (d

Bm

)LSNA: No Phase CorrectionScope: With Correction

Page 8: Determining Accuracy of Measurements at High Frequencies

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Spectrum Analyzer

Instruments for ScalarModulated-Signal Measurements

LO

ADCInput signal Sample

and hold

VBWEnvelope detector

Log amp

RBWDisplay

Diagram after [RFDesign]

• Good dynamic range• Readily available, inexpensive

• Higher uncertainties due to system drift and repeatability

• Diode detector: temperature sensitive

+ _

Page 9: Determining Accuracy of Measurements at High Frequencies

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Block diagram of peak power meter, after [NPL1]

Peak Power Meter

RF Detector Dynamic biasand digitization

• Relatively inexpensive and straightforward to use

• Traceability derived from complex scope cal

• Diode detector: temperature sensitive

+ _

Displayand interface

RF source under test

Instruments for Scalar Modulated-Signal Measurements

Page 10: Determining Accuracy of Measurements at High Frequencies

10

Example: NPL peak power meter calibration [NPL1]

Separating response of signal generator from peak-power meter provides traceability

calibratedoscilloscope

Reference source

Step 1: Characterize the reference source

peak-powermeter

Reference source

Step 2: Use reference source as transfer standard to calibrate peak-power meter

Calibration of Instruments for Scalar Modulated-Signal Measurements

Page 11: Determining Accuracy of Measurements at High Frequencies

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Measuring Modulated Signals

Vector: Accurate relative phase of all measured components

Enables time-domain representationGraph from [RF Book]

0 0.5 1 1.5 2-0.8

-0.6

-0.4

-0.2

0

0.2

0.4

Time (ns)

Ampl

itude

(vol

t)

LSNA: No Phase CorrectionLSNA: Phase CorrectionScope: With Correction

Page 12: Determining Accuracy of Measurements at High Frequencies

12

Vector Measurement of Modulated Signals

Key: Accurate magnitude and relative phase of

Bandpass signal: frequencies around the carrier

Broadband signal: fundamental and harmonics

f0 2f0 3f0 4f0 5f0 frequency

frequency

Page 13: Determining Accuracy of Measurements at High Frequencies

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Relative Phase

-2

-1

0

1

2Am

plitu

de

100ms9080706050403020100

Time

t

φ

ref tM

φ

0

1

φ1 φ0- = Δφ

Measured phases may appear random unless sampled simultaneously

Page 14: Determining Accuracy of Measurements at High Frequencies

14

Instruments for VectorModulated-Signal Measurements

• Broadband acquisition: relative phase maintained

• Aperiodic signals OK

• Broadband acquisition: low dynamic range

• Calibration difficult• Single (or two) channel

Digital Sampling Oscilloscope: Good for waveformmeasurements

+ _DUTExternal

Source

Trigger and trigger delay

Page 15: Determining Accuracy of Measurements at High Frequencies

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Instruments for VectorModulated-Signal Measurements

• RT sampling maintains relative phase

• No harmonics• Calibration difficult

+_

LO

DUTExternal Source

××Real-time sampler

Vector Signal Analyzer: Good for modulated measurements

Page 16: Determining Accuracy of Measurements at High Frequencies

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Instruments for VectorModulated-Signal Measurements

• Test set calibration• Two-port measurement• RT sampling

• Narrow IF bandwidth• Expensive

+ _DUTLO

Internal or External Source

Sampling downconverter

Large Signal Network Analyzer: Good for multisine measurements

Page 17: Determining Accuracy of Measurements at High Frequencies

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Modulated versus Multisine Signals

… … …

f0 f0 2f0

… … …

f0 f0 2f0

approximated by multisines

[Myslinski]

Page 18: Determining Accuracy of Measurements at High Frequencies

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Instruments for VectorModulated-Signal Measurements

• Traceable to VNA• High dynamic range• Wide full bandwidth

(0.3 MHz - 20 GHz)

• 4-channel VNA required+ _

Phase Quattro: Good for multisine measurements

From [Blockley1]

Page 19: Determining Accuracy of Measurements at High Frequencies

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Calibration Signals

Well-established “known pulse” scope calibration [pulse]: Differences between “known” and “measured” = calibration coefficients

digital sampling oscilloscope

known pulse

source

• Many NMIs have pulse calibration services• Pulses have energy over broad bandwidth: For wireless, we want a signal whose bandwidth better matches instrumentation

Page 20: Determining Accuracy of Measurements at High Frequencies

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“Known Spectrum” Multisine Calibration

Used by manufacturers to calibrate vector receivers

0°0 dBm

phasemagnitude

frequency

time

multisine signal generator

vector signal analyzer

Calibration Signals

Page 21: Determining Accuracy of Measurements at High Frequencies

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Multisine Calibration Example

RF (multisine)

LO sweep (single tone)

Downconverter(sampler)

IF (multisine)

2 GHz 10-20 MHz

4 MHz

~0.2 dBm

4 MHz

• “Known spectrum”: 2000-component Schroeder multisine, VSG-generated, VSA-measured (VSA previously calibrated)

• Measure same multisine on LSNA

• Differences between VSA-measured and LSNA-measured are correction coefficients

A multisine is used for the “IF Cal” of the LSNA:

Page 22: Determining Accuracy of Measurements at High Frequencies

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Multisine Calibration Example“Known Spectrum”: 2000-component Schroeder multisine

measured on the VSA

• Center frequency is 2 GHz, 4 MHz modulation bandwidth• Measured uncertainty is ~0.11dB, LSNA resolution is ~0.2 dB

Page 23: Determining Accuracy of Measurements at High Frequencies

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Multisine Calibration Example

Magnitude Phase

It is obvious that the downconverter does need calibration!

• ~0.2 dB magnitude variation, ~110° phase variation over 4 MHz

• Negligible variation with LO sweep

• Measured by Don DeGroot and Jan Verspecht

Typical IF Cal Results:

Page 24: Determining Accuracy of Measurements at High Frequencies

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Example I: NIST oscilloscope calibration

Calibration of Instruments for Vector Modulated-Signal Measurements

EOS systemPresent capability:•FD to 110 GHz•TD to 15 ps•60 dB dynamic range

Variable optical delay

Voltage waveformmeasured here

LiTaO3 wafer

PulsedLaser

OpticalPolarization-state

Analyzer

Photo-receiver

WaferProbe

Diagram courtesy Dylan Williams of NIST

Photodiode is transfer standard for oscilloscope calibration

Page 25: Determining Accuracy of Measurements at High Frequencies

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Example I: NIST Oscilloscope Calibration

CH3

CH1

CH2

0

90

Trigger

modulatorSIGNALSOURCE

modulated signal

reference

scope90

hybrid

0 1 2 3 4 5-120-100

-80-60-40-20

frequency (GHz)

ampl

itude

(dB

m)

0 1 2 3 4 5-120-100

-80-60-40-20

frequency (GHz)

ampl

itude

(dB

m)

In-phase/quadrature reference signals create new time base

Page 26: Determining Accuracy of Measurements at High Frequencies

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Example I: NIST Oscilloscope Calibration

The relationship between the sine and cosine is known. Correct the timebase for jitter, then correct the multisine.

A calibrated VSG could be used to independently calibrate VSAs, receivers, mixers, other sources

-100

-50

0

50

100

Ampl

itude

(m

V)

43210

Time (ns)

-100

-50

0

50

100Am

plitu

de (

mV)

43210

Time (ns)

Jitter Correction

Page 27: Determining Accuracy of Measurements at High Frequencies

27

Example II: Determining Phase

2.0

1.5

1.0

0.5

0.0

-0.5

-1.0

Ampl

itude

100ms9080706050403020100

Time

At t = tM:

θ1 = 115o

θ2 = 345o

θ3 = 280o

t

t

ref tM

tP P

Graph from [detrendo]

• Characterized comb generators are often used to calibrate measurements of signals consisting of a fundamental and harmonics.

• Post-processing methods often used for finding the relative of bandpass signals.

Page 28: Determining Accuracy of Measurements at High Frequencies

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Example II: Determining Phase• Approaches when fundamental tone is present:

– Fundamental alignment= fundamental is aligned to an arbitrary phase

– Time-domain signal alignment= estimate time shift between measured and target signal by

maximising cross-correlation of measured and target signal

– Frequency-domain alignment (= phase detrending)= estimate time shift by minimizing least-squared error between

measured and target phases

– Time-zero cancellation= a linear transform is applied to the phases such that the new phases

are independent of time zero( )'

, , 0k m k m ck mφ φ φ φ= − + , 0k m cf kf mf= +

From [Blockley2]

Page 29: Determining Accuracy of Measurements at High Frequencies

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Example II: Determining Phase

+: frequency-domain alignment: error bar size is fairly constant

x: time-zero cancellation approach: error bar size increases

Experiment: 41-tone multitone, 172 measurement repeats

From [Blockley2]

Page 30: Determining Accuracy of Measurements at High Frequencies

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Example II: Determining Phase

From [Blockley2]

• time-zero cancellation approach:• standard deviation increases for frequencies further away• only arbitrary target phases are required

• time- and frequency alignment approaches:• standard deviation is lower and fairly constant across bandwidth• target time domain signal or target phases have to be known

Page 31: Determining Accuracy of Measurements at High Frequencies

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Summary: Traceable Modulated Signal Measurements

Similarities to uncertainties for single frequencies:• Repeatability, reproducability found in same way as for CW signals

Differences unique to modulated signals:• Multistage derived traceability path• Difficulty separating source response from receiver response (absolute calibrations required)

• Baseband effects can occur when nonlinear detectors and receivers are used

Page 32: Determining Accuracy of Measurements at High Frequencies

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References• [RFDesign]: J. Archambault and S. Surineni, “IEEE 802.11 spectral

measurements using vector signal analyzers,” RF Design, June 2004, pp. 38-49.

• [NPL1]: D.A. Humphreys and J. Miall, “Traceable RF peak power measurements for mobile communications,” IEEE Trans. Inst. and Meas., vol. 54, no. 2, Apr. 2005, pp. 680-683.

• [RF Book]: K.A. Remley, P.D. Hale, and D.F. Williams, “Absolute magnitude and phase calibrations,” from RF and Microwave Handbook, 2nd ed., Mike Golio, editor, to be published in Oct. 2007.

• [Myslinski]: M. Myslinski, K.A. Remley, M.D. McKinley, D. Schreurs, and B. Nauwelaers, “A measurement-based multisine design procedure,” Integrated Non-linear Microwave and Millimetre-wave Circuits (INMMiC) Workshop, pp. 52-55, Jan. 2006.

• [Blockley1]: P. Blockley, D. Gunyan, J.B. Scott, “Mixer-based, vector-corrected, vector signal/network analyzer offering 300kHz-20GHz bandwidth and traceable phase response,” IEEE MTT-S InternationalMicrowave Symp., 4 pp., June 2005

Page 33: Determining Accuracy of Measurements at High Frequencies

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References• [pulse] W. L. Gans, “Dynamic calibration of waveform recorders and

oscilloscopes using pulse standards,” IEEE Trans. Instrum. and Measurement, vol. 39, pp. 952-957, Dec. 1990.

• [NIST1]: D. F. Williams, A. Lewandowski, T. S. Clement, C. M. Wang, P. D. Hale, J. M. Morgan, D. Keenan, and A. Dienstfrey, “Covariance-Based Uncertainty Analysis of the NIST Electro-optic Sampling System,” IEEE Trans. Microwave Theory Tech., vol. 54, no. 1, pp. 481-491, Jan. 2006.

• [NIST2]: P. D. Hale, C. M. Wang, D. F. Williams, K. A. Remley, and J. Wepman, “Compensation of random and systematic timing errors in sampling oscilloscopes,” IEEE Trans. Instrum. Meas., vol. 55, no. 6, pp. 2146-2154, Dec. 2006.

• [detrendo]: K.A. Remley, D.F. Williams, D. Schreurs, G. Loglio, and A. Cidronali, “Phase detrending for measured multisine signals,” 61st

ARFTG Microwave Measurement Conf., pp. 73-83, June 2003.• [Blockley2]: P.S. Blockley, J.B. Scott, D. Gunyan, A.E. Parker, “Noise

considerations when determining phase of large-signal microwave measurements,” IEEE Trans. Microwave Theory Tech., vol. 54, no. 8, pp. 3182-3190, Aug. 2006.