ddr3 impact of_gnd_pth_stitches_package_routing_guidelines_may_30th_2011_rev1-high-quality
TRANSCRIPT
Impact of GND-PTH Stitches in
DDR3/GDDR3/GDDR5 Memory Controller
Packages
Hany Ahmad and Amolak Badesha
Agilent Technologies Inc.
5301 Stevens Greek Boulevard, Santa Clara, California, 95050
Abstract— DDR3 and GDDR3/5 memory technology running in
the Giga-bit range require 3D EM accurate modeling of RF
phenomena such as the impact of GND-PTH stitches (Ground
Plated Through Hole) used to connect reference ground-planes in
the Memory controller packages (MCH-PKG). Cost-reduction
requires minimizing the number of layers and vias on MCH-
PKG (micro-vias and PTH). Layout-Designers usually revert to
reduce the GND-PTH without studying the impact on the
performance. In this paper, Method of Moments (MoM) is used
to study the impact of GND-PTH on data eye-opening as well as
on Radiated-Emission of a DDR3 two-SODIMMs/channel
running at 1.33GB/s.
Keywords-component; DDR3, GDDR3/5, Memory-controller-
package, Method of Moments, GND-PTH, Radiated-Emission, eye-
diagram, Radiated-Emission of memory-channel, Antenna-Gain,
Convolution time-domain ADS engine.
I. INTRODUCTION
High-Speed-Digital Designers face every day a
tremendous challenge of high-performance interconnect-
channel design constrained by low-cost products while
pushing for speed-of-light time to market. Top-notch memory
technology (Rambus, DDR3, GDDR3 and GDDR5) running at
above 1.067GB/s with mm-wave spectral-content (<100ps
rise/fall-times) needs full-wave EM modeling of Return-path-
discontinuity (RPD) such as the impact of data-signals
changing layers and changing reference ground-planes in the
MCH-PKG. Layout-Designers tend to reduce the cost of
MCH-PKG by reducing the number of layers and also the
number of vias including GND-PTH. No single
process/method can model the complete memory channel
accurately: Frequency-domain full-wave EM modeling is
required to capture RF effects of the memory channel and is
used to optimize the channel performance in terms of ISI, x-
talk, jitter, monotonicity, eye-opening as well as Radiated-
Emission. Method of Moments (MoM) is best to model
accurately the interconnects on multi-layer structures in the
MCH/SDRAM package, Motherboard (MB), and Memory-
modules (DIMM) while FEM or VNA measurements are best
for modeling DIMM connectors. Transistor models (BSIM4)
are best to capture the I/O buffers’ critical parameters
including dynamic-I/O-buffer impedance. In this paper, we
combine the different technology-models (MoM S-parameters
of MCH-PKG, MB & DIMM + BSIM4 models of the I/Os +
VNA measured S-parameters of DIMM-connector) in the
time-domain convolution-engine of ADS (Agilent EEsof
Advanced Design System) to study the impact of GND-PTH
on data eye-opening as well as on Radiated-Emission of a
DDR3 two-SODIMMs/channel running at 1.33GB/s.
II. METHOD OF MOMENTS PROVIDING DESIGN-
GUIDELINES FOR MEMORY-CONTROLLER LOW-COST
PACKAGES
A. Memory System Definition and Establishing Correlation
Cutting corners, caused by speed-of-light products,
during the design process may result in neglecting to model
critical phenomena such as GND-PTH causing eye-collapse
and loss of memory performance due to Return-Path-
Discontinuity (RPD). In this paper we will show the
importance of GND-PTH on MCH-PKG for DDR3 two-
SODIMMs/channel in a notebook memory system as shown in
Figure 1. We used frequency-domain MoM [1] to study the
sensitivity of RPD in terms of proximity and number of GND-
PTH. As a result, we can develop routing guidelines for the
minimum GND-PTH requirements on MCH-PKGs for data
signals of the memory channel enabling cost-reduction.
Fig. 1 Notebook with two-SODIMMs/channel. Increased Density and pressure
for cost-reduction leads to high-risk design especially for memory-channel.
First, a correlation of the MoM S-parameter model
for a GDDR3 data-signal on 12-layer PCB is performed:
comparing to VNA measurements up to 20GHz on the data-
signals as shown in Fig. 2-a.
Fig. 2-a S-parameter Insertion-Loss Correlation of VNA measurements with Momentum Simulations on a data-signal for the GPU-card up to 20GHz.
Establishing correlation for S-parameter modeling of passive-interconnects sets up the required discretization parameters of MoM to extract accurate models for PCBs and packages in the frequency range of interest.
The interconnecting system of the memory channel in
Figure 2-b is consisted of: The controller package,
Motherboard (MB) and SODIMMs (each is 8-layers) are all
modeled using S-parameters with MoM. The connector S-
parameter is obtained from VNA measurements noting that it
can be also modeled accurately using FEM [2].
Fig. 2-b Interconnecting system for two-SODIMMs/ch. MOM used for the
multi-layer PCBs while VNA measurements is used for the connector.
B. Memory-Controller Package Modeling
A 3D EM modeling of the package is performed using
MoM as shown in Figure 3. We selected a portion of the
package encompassing a byte-lane (11-signals: 8-data-signals
and Strobe-deff-signals: DQS/DQS# and Data-Mask: DM)
that is at least 5λ away from all signals and vias where λ is
computed at the main harmonic of the channel (0.8GB/s:
minimum frequency of DDR3 technology). Data nets are
routed from the die-bump on layer-1 to layer-3 as shown in
Figure 4 where the ports are extended from the signal nets to
the ground-bumps on layer-1. Data nets are majorly routed as
symmetric-stripline with 30um referencing both ground-planes
on layers 2 and 4 to achieve the required impedance target of
40-ohms.
Fig 3 cookie cutter of the 8-layers controller package with MOM.
Fig. 4 data signals (blue 11-signals) routed from die-bumps on layer-1 to
layer-3 as symmetric-Stripline referencing ground planes layers-2 (red plane)
and 4 (brown plane).
Then the data nets are routed on layer-6 changing
reference ground-plane from layers-2/4 to ground-plane layer-
5 with ground stitches GND-PTH as shown in Figure 5 where
the core of 800um is located between layers-4 and 5.
Fig 5 data nets change routing from layer-3 to layer-6 (blue routing) and
changing referencing from ground-planes layers-2/4 to ground-plane layer-5
(red plane). GND-PTH are shown as blue-squares on the brown ground-plane
layer-4.
Accurate 3D EM modeling of the pads, micro-vias, GND-
PTH, interconnects, reference ground planes with layer
transition along with ground stitching are all required in such
data rates where the rise/fall times are in the range of mm-
wave power-spectral-density < 100ps at the die-bump.
III. GND-PTH IMPACT ON INSERTION-LOSS, NEXT (NEAR-
END CROSS-TALK0 AND FEXT (FAR-END CROSS-TALK)
We will study the impact of ground stitching required
on the controller package when data-nets change reference
planes across the core of the MCH-PKG to reach the MCH-
balls from the die-bumps as these signals are routed as single-
ended even running at such Giga-bit data rates to drive low-
cost memory technology. How many ground stitching is
required around signal transitions? How far need they be
away from signal transition? This is an important design
guideline for memory channel designers as it has a direct
implication on the performance (eye-opening and radiated-
emission) and cost of the controller package.
Figure 6 shows the Insertion-Loss (IL) of the data-
nets for the controller package when all GND-PTH stitches
(15 GND-PTH) exist (red signals) compared to the case of all
GND-PTH removed (pink) and compared to the case of only
3-PTH exist (blue). We can see almost 0.5dB delta when all
GND-PTH removed for the IL at 2.5GHz which may seem
fine compared to the cost-saving of removal of 15 GND-PTH
for an 8-layers 800um package technology. However, a look at
the near-end (NEXT) and far-end x-talk (FEXT) as shown in
Figures 7 and 8 clarifies the destructive impact of lack of
GND-PTH on the x-talk.
2 4 6 8 10 12 14 16 180 20
-6
-5
-4
-3
-2
-1
-7
0
freq, GHzdB(M
CH_PKG_0_PTH_Feb_16_2011_4pm
_a..S(1,2))
dB(S
(1,2))
dB(M
CP89E_S1_1437BGA35mm8L_073109_fin
al_release_Feb_25_2011_800um_3PTH_m
om_a..S(1
,2))
Fig. 6 Insertion-Loss and near-end/far-end x-talk studying the effect of GND-
PTH stitches around signal transitions.
2 4 6 8 10 12 14 16 180 20
-80
-60
-40
-20
-100
0
freq, GHzdB(M
CH
_PKG
_0_PTH
_Feb_16_2011_4pm
_a..S(1
,3))
m3
dB(S
(1,3
)) m5
dB(M
CP89E_S1_1437BG
A35m
m8L_073109_fin
al_
rele
ase_Feb_25_2011_800um
_3PTH
_m
om
_a..S(1
,3))
m4
m3ind Delta=dep Delta=27.733Delta Mode ON
-1.916E8m4ind Delta=dep Delta=10.111Delta Mode ON
-3.151E8
m5freq=dB(S(1,3))=-46.210
3.155GHz
Fig. 7 near-end x-talk studying the impact of GND-PTH stitching showing ~
30dB x-talk increase due to lack of GND-stitching at 3GHz.
2 4 6 8 10 12 14 16 180 20
-80
-60
-40
-20
-100
0
freq, GHzdB
(MC
H_P
KG
_0_P
TH
_Feb_16_2011_4pm
_a..S
(1,4
))
m6
dB
(S(1
,4)) m8
dB
(MC
P89E
_S
1_1437B
GA
35m
m8L_073109_fin
al_
rele
ase_Feb_25_2011_800um
_3P
TH
_m
om
_a..S
(1,4
))
m7
m6ind Delta=dep Delta=22.955Delta Mode ON
-5.144E6
m7ind Delta=dep Delta=9.876Delta Mode ON
-1.543E8
m8freq=dB(S(1,4))=-45.739
2.994GHz
Fig. 8 far-end x-talk destructive impact of lack of GND-PTH stitches showing
~ 20dB more x-talk at 3GHz.
Running 3D EM modeling was critical to capture the
destructive impact of lack of GND-PTH stitches pushed by
cost-reduction of the MCH-PKG that shows excessive x-talk
reaching 30dB for near-end and almost 20dB for far-end (at
3GHz). Why does the x-talk deteriorate a lot due to lack of
GND-PTH when signals change layer from layer-3 to layer-6
going to the MCH-balls? Plotting the surface current density
Js (Js = n x H) on the reference planes shows the reason
behind such explosion of the x-talk as we found the return-
current uses the closeby signal-PTHs (least-inductive-path) of
the neighbor data nets to move from ground-plane layer-4 to
ground-plane layer-5. The surface electric-current Js on
GND-plane layer-4 changes into displacement current Jd in
the gap between GND-Plane of layer-4 to the pad of the
Signal-PTH then to surface electric-current Js again on the
Signal-PTH of the signal down to Layer-5 and then move back
with similar mechanism to layer-5 reference GND-plane as
shown in Figures 9-a and 9-b below.
Fig. 9-a shows the surface electric-current Js couples to displacement current
Jd to the PTH of the closeby signal-PTH causing excessive x-talk caused by
the lack of GND-PTH.
Fig. 9-b The surface current on the excited signal-PTH as well as on neighbor
signal-PTH as well as on GND-PTH vias.
IV. EYE-OPENING IMPACT OF EXCESSIVE CROSS-TALK BY
LACK OF GND-PTH ON MEMORY-CONTROLLER-PACKAGES
MoM is also used for 3D EM modeling of the MB
routing as well as the SODIMMs R/C-F which is a heavy
loading memory configuration as shown in Figure 10 below.
Fig. 10 MOM S-parameter modeling of MB and SODIMMs R/C-F
The different technology models (S-parameters MoM
of MCH-PKG, MB and SODIMMs as well as VNA
measurement of the SODIMM connector) along with BSIM4
modeling of the I/Os are combined in a ADS-schematic editor
enabling to perform: A- voltage transfer function analysis
(AC-sweep) to study the complete channel performance up to
10GHz as shown in Figure 11 below and B-eye-diagram
analysis as shown in Figures 12-a and 12-b .
Fig. 11: Voltage-transfer function for two-SODIMMs/channel with R/C-F
populating both slots.
Figures 12-a & 12-b shows the comparison of eye-
opening impact of GND-PTH running at 1.33GB/s. We can
see clearly the impact of excessive x-talk on eye-opening in
terms of both voltage-margin and timing-margin.
0.2 0.4 0.6 0.8 1.0 1.2 1.40.0 1.6
0.6
0.8
1.0
0.4
1.2
time, nsec
Eye_P
robe1.D
ensity
Eye_P
robe2.D
ensity
Eye_P
robe3.D
ensity
Eye_P
robe4.D
ensity
Eye_P
robe5.D
ensity
Eye_P
robe6.D
ensity
Eye_P
robe7.D
ensity
Eye_P
robe8.D
ensity
Eye_P
robe9.D
ensity
0.2 0.4 0.6 0.8 1.0 1.2 1.40.0 1.6
-0.5
0.0
0.5
-1.0
1.0
time, nsec
EyeD
iff_
Pro
be1.D
ensity
Fig. 12-a showing the eye-opening for the original MCH-PKG with 15 GND-
PTH at 1.33GB/s.
0.2 0.4 0.6 0.8 1.0 1.2 1.40.0 1.6
0.5
0.6
0.7
0.8
0.9
1.0
1.1
0.4
1.2
time, nsec
Eye_P
robe1.D
ensity
Eye_P
robe2.D
ensity
Eye_P
robe3.D
ensity
Eye_P
robe4.D
ensity
Eye_P
robe5.D
ensity
Eye_P
robe6.D
ensity
Eye_P
robe7.D
ensity
Eye_P
robe8.D
ensity
Eye_P
robe9.D
ensity
0.2 0.4 0.6 0.8 1.0 1.2 1.40.0 1.6
-0.5
0.0
0.5
-1.0
1.0
time, nsec
EyeD
iff_
Pro
be1.D
ensity
Fig. 12-b showing the eye-opening for the modified MCH-PKG without
GND-PTH at 1.33GB/s.
Using the JEDEC standard [3] eye-mask for DDR3
memory channel (trapezoid from ViH/L(AC)=Vref+/=175mV
to ViH/L(DC)=Vref+/=100mV) shows that the original
package (15 GND-PTH) passes eye-mask requirements at
1.33GB/s with a minimum of 95ps for DQ-2-DQS setup
margin (Figure 13-a) while the lack of GND-PTH causes
failure of eye-mask which can lead to memory speed down-
binning to 1.067GB/s (as shown in Figures 13-b with worst-
case hold-margin of -30ps), therefore, a big loss of
competitive advantage.
1.5 2.0 2.5 3.0 3.51.0 4.0
100
120
140
160
180
200
220
240
80
260
Index
DQ_DQSSkewHoldRise.D
IMM1_63
m1
m1Index=DQ_DQSSkewSetupFall.DIMM1_62=96.929
2.000
Fig. 13-a DDR3-1.333GB/s eye-mask Setup/Hold margins shows worst setup
margin of ~ 95s with 15 GND-PTH.
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.80.0 2.0
0.5
0.6
0.7
0.8
0.9
1.0
1.1
0.4
1.2
time, nsec
Eye_P
robe1.D
ensity
Eye_P
robe2.D
ensity
Eye_P
robe3.D
ensity
Eye_P
robe4.D
ensity
Eye_P
robe5.D
ensity
Eye_P
robe6.D
ensity
Eye_P
robe7.D
ensity
Eye_P
robe8.D
ensity
Eye_P
robe9.D
ensity
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.80.0 2.0
-0.5
0.0
0.5
-1.0
1.0
time, nsec
EyeD
iff_
Pro
be1.D
ensity
Fig. 13-b DDR3-1.067GB/s data eye for the case of lack of GND-PTH
showing marginality even down-binning at 1.067GB/s.
GND-PTH on MCH-PKG are shown to be very
critical for enabling DDR3 memory system operation at high-
data rates such as 1.33GB/s. What is the minimum number of
GND-PTH to enable 1.33GB/s operation while performing
cost-reduction on the original-package? Figures 14-a and 14-b
show successful operation at 1.33GB/s with three GND-PTH
reduction down from fifteen GND-PTH with worst-case hold-
margin of 55ps with a loss of 40ps compared to the worst-
setup margin of 95ps with fifteen GND-PTH vias. Figure 16
shows that the GND-PTH is able to carry the return-path
current therefore reducing the amount of x-talk caused by such
return-path current travel through the signal-PTH.
0.2 0.4 0.6 0.8 1.0 1.2 1.40.0 1.6
0.5
0.6
0.7
0.8
0.9
1.0
1.1
0.4
1.2
time, nsec
Eye_P
robe1.D
ensity
Eye_P
robe2.D
ensity
Eye_P
robe3.D
ensity
Eye_P
robe4.D
ensity
Eye_P
robe5.D
ensity
Eye_P
robe6.D
ensity
Eye_P
robe7.D
ensity
Eye_P
robe8.D
ensity
Eye_P
robe9.D
ensity
0.2 0.4 0.6 0.8 1.0 1.2 1.40.0 1.6
-0.5
0.0
0.5
-1.0
1.0
time, nsec
EyeD
iff_
Pro
be1.D
ensity
Fig. 14-a DDR3-1.33GB/s eye diagram for three GND-PTH cost-reduction
down from 15 GND-PTH vias.
1.5 2.0 2.5 3.0 3.51.0 4.0
100
150
200
250
50
300
Index
DQ_DQSSkewHoldRise.D
IMM1_63
m1
m1Index=DQ_DQSSkewHoldRise.DIMM1_61=55.984
4.000
Fig. 14-b DDR3-1.33GB/s eye-mask Setup/Hold margin with worst-case
hold-margin of 55ps.
Figure 15 shows the location of the three GND-PTH
that led to successful operation at 1.33GB/s and also enabled
cost-reduction of twelve GND-PTH per byte-lane, therefore, a
total reduction of ninety-six GND-PTH for the DDR3 memory
channel routing on MCH-PKG (eight-byte-lanes). The cost
reduction can be seen further with multiple channels on the
MCH-PKG.
Fig. 15 showing the location of the most critical GND-PTH per byte lane
reducing 12 GND-PTH vias.
Fig. 16 Surface current on Signal-PTH and return-current on the neighbor
GND-PTH that is enough to provide successful operation with 3 GND-PTH
instead of 15 GND-PTH per byte lane.
Further analysis using MoM will show the comparison of
the Antenna-Gain of the MCH-PKG with 15 GND-PTH vs.
lack of GND-PTH vs. 3 GND-PTH to study the impact on
Radiated-Emission.
V. CONCLUSION
The paper shows the importance of driving design-
guidelines for GND-PTH on MCH-PKG as it has a destructive
impact on x-talk due to the return-current uses the neighbor
Signal-PTH as least-inductive return-path hence causing
excessive x-talk that collapse the data eye at high-data rates.
VI. ACKNOWLEDGEMENT
Special thanks to Giga-Test labs for S-parameter VNA
measurements.
VII. REFRENCES
[1] Harrington RF, Field Computation by Moment Methods, The MacMillan
Co., New York, 1968 .
[2] Yue Yan Pramanick, P., “Finite-element analysis of generalized V- and
W-shaped edge and broadside-edge-coupled shielded microstrip lines on
anisotropic medium,” IEEE-MTT transactions, vol. 49, issue # 9, 2001, pp.
1649-1657.
[3] DDR3 SDRAM JEDEC Standard, JESD79-3E