DataView

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DataView

DataView

DataView

DataView is a fast, easy-to-use data analysis tool for evaluating semiconductor test data.

DataView is ideal for test or product engineers who need a quick, powerful, and intuitive tool for analyzing production and characterization data.

In addition to generating reports, DataView allows you to easilynavigate your data and understand process performance.

DataView

Whether you are developing a new test program, optimizing an existing program, or evaluating characterization data, DataView allows you to visualize what’s happening with your data.

DataView

DataView is a powerful, easy-to-use data processor geared for the busy Test Engineer. DataView helps to quickly identify test issues such as site-to-site variation, current/voltage range problems, repeatability/reproducibility issues, problematic tests, data integrity issues and more.

DataView

DataView: Process View

View all Data File Information such as total device records, passing & failing record count, unique device ids, active test sites, lot id, part type, and more.

Test Data Info and Warnings - identify possible duplicate test numbers, inconsistencies with test limits, names and units, tests with no limits, alarms, zero standard deviations and low Cpks.

View average test time information as well as lot processing statistics.

DataView

DataView

DataView: Record View

Group devices from any file, by site, wafer, etc. into analysis DataSets.

View the high-level test information for all device test records, such as Device ID, Pass/Fail status, Site, Soft and Hard Bin, and DataSet.

Easily exclude or include test records for analysis. Select test records by file, bin, pass/fail status, site or pick

and choose test records individually. One click removal of all failing devices or retested devices. Identify soft and hard bin types, counts, and percentages. Double-click on any record to see the detailed test results in

the Table View.

DataView

DataView

DataView: Table View

Provides a spreadsheet view of all test data. View the statistics and/or test values for each test. View the individual test record for any device. View the stats and/or values for all test data, by site, by wafer, or by

defined DataSet. Sort the table by any column, hide tests and columns. Quickly produce an Excel spreadsheet of any Table View or select

multiple spreadsheets for saving into a report. Compare individual device test records and compare any DataSet

to another set (Site to Site, Site to All, Wafer to DataSet, etc…). Select and copy/paste any subset of values to/from the Table View

to Excel, text file, email, etc. Select tests from Table View for quick generation of Histograms into

a report. Double-click on any test to jump to the histogram in the Histo View.

DataView

DataView

Data View: Bin View

View soft or hard bin paretos for all test data, by site, wafer or any defined DataSet.

Compare different paretos by site, wafer, or defined DataSet.

Save the bin paretos to file for easy insertion into an email or select multiple paretos for saving into a report.

View and sort all bins by count, percentage, and bin number.

DataView

DataView

DataView: Bin View

High quality wafermaps for each wafer. View wafermaps by soft or hard test bins. View soft/hard binning information for each wafer

directly within each wafermap. Easily identify any retested die. Hover the mouse over any die to see the X-Y

coordinates, binning and site information. Double-click on any die and jump to the device test

record in the Table View.

DataView

DataView

DataView: Histo View Produce high-quality Histograms for all parametric

data. Adjustable X-axis scale and histogram bins for

optimum viewing. Detailed test data and statistics are provided in the

Histo View. View histograms for multiple sites, wafers, or

DataSets in the same image. Quickly produce an image file for insertion into an

email or select multiple images for saving into a report.

Hover over any histogram bin to see the value, bin number, bin count, and site/wafer/DataSet info.

DataView

DataView

DataView: Trend View

Produce high-quality Trend Charts for all parametric data.

Adjustable Y-axis scale and X-axis zoom capabilities allow for optimum viewing.

View multiple sites, wafers, and DataSets in the same chart.

Double-click on any data point to view the test record for that device in Table View.

DataView

DataView

DataView: Reports and Images

Generate histograms, box plots, cumulative densityplots, trend charts, bin paretos, wafer maps,parametric wafer maps and more.Generate statistical tables for each site, wafer, processand custom DataSets or include tables of the rawvalues for any DataSet.Customize reports to include what you considerimportant – select tables, graphs, and images asyou analyze your data.Select desired parameters for each table and graph –arrange and align items to present data the wayyou want it to be seen.

DataView

Bin View

Wafer View

Trend View

Histo View

Table View

Process View

Da t a V ie w: R e p o r t s a n d I ma g e s

DataView

For a complete demo on DataView please let us know and we will be happy to schedule a full demo with you.

You can also download a working demo of DataView from our web site at http://testspectrum.com.

DataView

For more information on all of our Test Tools please visit our web site at http://testspectrum.com/home/solutions/tools/