Cogent ATE D 100 ™

Raptor Series™ Discrete Test System Cogent ATE’s Raptor Series Discrete Test System represents a transformational change in the testing of discrete semiconductor devices. D-100 is the first tester in its class to perform parallel multi-site testing of up to 4 devices in both wafer and final test. Cogent ATE’s Raptor Series D-100 Discrete Test System provides Floating Quad-SiteTesting™ of MOSFET devices in both wafer and packages. Using Cogent ATE’s provenFloating Test Sites™ (FTS) System Architecture, D-100 provides the most practical and cost-effective test solution for its target devices. DSP, AWG, Memory and other ATE features based Cogent ATE’s Tester-on-a-chip™ (ToC) technology, unseen in traditionaldiscrete test systems; give D-100 an edge in accuracy and throughputs. Raptor Series D-100 is only a fraction of ETS-200T in cost. Floating Quad-Site Testing™ is Real and Guaranteed True parallel testing of up to 4 device-under-test (DUT) sites is not only real but also affordable with Cogent ATE’s Leopard Series Analog and Mixed-Signal Test System. For our targeted device markets, quad-sites parallel testing is most economical and practical solution for both wafer and final tests. Turret based handlers, a popular choice fordiscrete and power management devices are capable of quad-site testing. “Massive Parallelwafer testing is often unrealistic given the cost and technical issues in the interfacetechnology, i.e. probe card. We have achieved the lowest cost-of-test to date for the Discrete Power Semiconductor and Power Management IC markets by making Floating Quad-Site Testing™ a compelling alternative to the non-floating single or dual site testers from our competitions. We intendto maintain this leadership by continuously improving test performance and loweringhardware cost.

Target Devices

Power MOSFET Diodes, Zener diodes Transistors Thyristors Triacs, Varistors, Multi die / function discretes Voltage regulators

Low cost  New technology High performance

    

Low-Cost MOSFET and Discrete test platform

Features

True parallel multi-site testing with Floating Quad-Site Testing architecture

Scale from Single to Multi-Site Testing automatically with Auto Test Replication

SBC Industrial PC, Telescope mounting for Monitor and Keyboard on the manipulator for a compact and ergonomic test cell

Cogent ATE Systems Corporation | Room 705, No.8 Dongdaqiao Road,Chaoyang District,Beijing,China | Tel: +86(10)59000102 | Fax:+86(10)58850677 | www.CogentATE.compage 2

SummaryDesigned for multi-site testing Prior to the introduction of Raptor D series, ETS-200T, a tester designed for multi-site testing of MOSFET devices, is perhaps the only option. Now Raptor D Series is a new option for multi-site testing at a fraction of ETS-200’s cost. While ETS-200 can test up to 16 sites, the cost of the tester and the probe card make 16 sites testing unrealistic and unaffordable. Cogent ATE’s Raptor D series has dramatically reduced the test cost by reducing both testing and tester cost at the same time.

  Fix for multi-handler/prober Now the situation is many customers use the turret-based handlers, such as Ismeca, SRM . which often have quad-site testing capability. Cogent ATE’s Raptor Series Discrete Test System can maximize these equipment’s throughputs without buy new equipments. Cogent ATE’s Raptor Series D-100 Discrete Test System can test a wide range of device from small signal transistors to high power IGBT. A suitable model for your product may be chosen from below. Test System  D‐50© D‐100© D‐120© D‐200©  D220© D‐520©

Current  10A 30A 30A 200A  200A 500AVoltage  1,000V 1,000V 2,000V 1,000V  2,000V 2,000V

Cogent ATE Raptor Series

 

Current Voltage

Measure Range

F.S. Resolution

Measure Range

F.S Resolution

20uA 610pA 20mV 0.61uV

200uA 6.1nA 200mV 6.1uV

2mA 61nA 2V 61uV

20mA 610nA 5V 153uV

200mA 6.1uA 10V 305uV

2A 61uA 20V 610uV

10A 305uA 100V 3.05mV

40A 1.22mA 1000V 15mV

General accuracy: 0.1% of Range to 0.5% + 10 pA/V General accuracy: 0.1% of Range to 0.5% of Range

Specifications

Cogent ATE Systems Corporation Room 705,SOHO Shangdu North Tower B No.8 Dongdaqiao Road,Chaoyang District Beijing 100020, P.R.China Tel: +86(10)59000102 | Fax: +86(10)58850677 World Wide Web | www.CogentATE.com Cogent ATE is a registered trademark; the Cogent ATE logo and Leopard Series are trademarks of Cogent ATE Systems Corporation. All other trademarks are the property of their respective owners. © 2008 Cogent ATE Systems Corporation. All rights reserved.

Power Requirements AC single phase, 110 V, 6 A OR 220 V, 3 A

Width inches (cm) Depth inches (cm) Height inches (cm) 26(66) 24.5(62) 44.5(108)

Operational Dimensions

Cogent ATE Raptor Series

Raptor D series test system software Easy ATE™ has several industry-first features that are very useful for the debug and characterization of power ICs. In most ATEs a simple voltage force and current sense scenario may damage the ATE if the sensed current is large. Some ATEs try to dissipate the sense current with large heat sink. Cogent ATE’s patented technology allows the Power IC designer to observe a static sense a current as large as 2 Amp and 50 Volt.  

Friendly Software for both IC design and Production environment