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Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann RWTH Aachen University MOS-AK 2013

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Page 1: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Current and Future Challenges for TCAD

C. Jungemann and C. Zimmermann

RWTH Aachen University

MOS-AK 2013

Page 2: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Introduction

Page 3: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSome examples for current or future devices

Intel TriGate

Kuhn et al., IEDM2012

Tunnel FET Nanorelay (NEMS)

Page 4: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Introduction

Example: 0.5µm SOI NMOSFET

B

G

S Dn+ n+p

0 0.5 1 1.5 2 2.50

10

20

Drain voltage [V]

Dra

incu

rren

t[A

/m]

DDHD

TCAD simulation without II

Difficult to simulate by classical TCAD (DD, HD)

Until recently could not be accurately simulated

Page 5: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Introduction

Example: 0.5µm SOI NMOSFET

B

G

S Dn+ n+p

0 0.5 1 1.5 2 2.50

10

20

Drain voltage [V]

Dra

incu

rren

t[A

/m]

DDHD

TCAD simulation without II

Difficult to simulate by classical TCAD (DD, HD)

Until recently could not be accurately simulated

Page 6: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Introduction

Example: 0.5µm SOI NMOSFET

B

G

S Dn+ n+p

0 0.5 1 1.5 2 2.50

10

20

Drain voltage [V]

Dra

incu

rren

t[A

/m]

DDHD

TCAD simulation without II

Difficult to simulate by classical TCAD (DD, HD)

Until recently could not be accurately simulated

Page 7: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 8: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 9: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 10: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 11: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 12: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 13: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 14: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 15: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 16: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 17: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 18: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 19: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 20: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 21: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionTCAD becomes more complex and difficult

I Materials (often multi-dimensional configuration space)I SiGeI III-V, II-VI, CNT, graphene, 2D crystalsI Organic semiconductorsI Metal oxide systems, phase change materials

I PhysicsI Electron transportI Quantum effects (bandstructure, scattering, tunneling, size

quantization etc.)I Multi-physics (mechanics, phonons, electromagnetics, chemicals,

interaction with biological matter etc.)I Device types

I FET, BJTI Tunnel FET, 1D devices, spin torque devices etc.I RRAM, MRAM, PCRAM, NEMS, sensors, bio, ....

I New technologies and materials are often proprietary or kept secret

Page 22: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 23: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 24: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 25: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 26: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 27: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 28: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 29: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 30: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 31: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 32: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 33: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 34: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 35: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 36: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 37: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionSimulation models

I Quantum transport+ Best physics, close to "first principles"- Limited device size and problem complexity- CPU months, only DC

I Boltzmann equation+ Semiclassical physics with lots of quantum mechanics+ Large devices, coupled problems, DC, AC, noise, (HB or transient)- CPU hours, bulk model required

I Drift-diffusion, hydrodynamic model+ Semiconductor equations and multi-physics+ Very large devices or small circuits, coupled problems, DC, AC,

noise, HB, transient, CPU seconds- Transport parameters, limited accuracy

I Compact models+ CPU milliseconds, large circuits, DC, AC, noise, HB, transient- Analytical equations with device parameters, limited physics

Page 38: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 39: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 40: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 41: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 42: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 43: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 44: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 45: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 46: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 47: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 48: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

IntroductionConsistent simulation hierarchy

I Quantum transportI Boltzmann equationI Drift-diffusion modelI Compact models

Speed

Acc

urac

y

Com

plexity

AdvantagesI Lower levels are based on approximations of the upper levels

E.g.: DD is based on the first two moments of the BEI Parameter generation for lower levels (table models or analytical

expressions)⇒ ConsistencyE.g.: Mobility for the DD model by BE bulk simulations

I Higher levels require fewer parameters and are easier to match tobasic experiments

I Benchmark simulations by higher levels to assess accuracy ofapproximations (not measurements)

Page 49: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Simulation hierarchy at ITHE for SiGe devices

I Quantum mechanics for band structure calculations (EPM)I Boltzmann equation solvers

I Full-band Monte Carlo simulator (Elwomis), transientI Spherical harmonics expansion solver (SPRING), DC, AC, noise

I Drift-diffusion and hydrodynamic modelsI Galene III (TU BS), table model, DC, AC, noise, transientI Sdevice (Synopsys), limited table model, DC, AC, noise, transient,

HBI Compact models

I HiCum (TUD) with Aperitif

Page 50: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Simulation hierarchy at ITHE for SiGe devices

I Quantum mechanics for band structure calculations (EPM)I Boltzmann equation solvers

I Full-band Monte Carlo simulator (Elwomis), transientI Spherical harmonics expansion solver (SPRING), DC, AC, noise

I Drift-diffusion and hydrodynamic modelsI Galene III (TU BS), table model, DC, AC, noise, transientI Sdevice (Synopsys), limited table model, DC, AC, noise, transient,

HBI Compact models

I HiCum (TUD) with Aperitif

Page 51: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Simulation hierarchy at ITHE for SiGe devices

I Quantum mechanics for band structure calculations (EPM)I Boltzmann equation solvers

I Full-band Monte Carlo simulator (Elwomis), transientI Spherical harmonics expansion solver (SPRING), DC, AC, noise

I Drift-diffusion and hydrodynamic modelsI Galene III (TU BS), table model, DC, AC, noise, transientI Sdevice (Synopsys), limited table model, DC, AC, noise, transient,

HBI Compact models

I HiCum (TUD) with Aperitif

Page 52: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Simulation hierarchy at ITHE for SiGe devices

I Quantum mechanics for band structure calculations (EPM)I Boltzmann equation solvers

I Full-band Monte Carlo simulator (Elwomis), transientI Spherical harmonics expansion solver (SPRING), DC, AC, noise

I Drift-diffusion and hydrodynamic modelsI Galene III (TU BS), table model, DC, AC, noise, transientI Sdevice (Synopsys), limited table model, DC, AC, noise, transient,

HBI Compact models

I HiCum (TUD) with Aperitif

Page 53: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Simulation hierarchy at ITHE for SiGe devices

I Quantum mechanics for band structure calculations (EPM)I Boltzmann equation solvers

I Full-band Monte Carlo simulator (Elwomis), transientI Spherical harmonics expansion solver (SPRING), DC, AC, noise

I Drift-diffusion and hydrodynamic modelsI Galene III (TU BS), table model, DC, AC, noise, transientI Sdevice (Synopsys), limited table model, DC, AC, noise, transient,

HBI Compact models

I HiCum (TUD) with Aperitif

Page 54: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Simulation hierarchy at ITHE for SiGe devices

I Quantum mechanics for band structure calculations (EPM)I Boltzmann equation solvers

I Full-band Monte Carlo simulator (Elwomis), transientI Spherical harmonics expansion solver (SPRING), DC, AC, noise

I Drift-diffusion and hydrodynamic modelsI Galene III (TU BS), table model, DC, AC, noise, transientI Sdevice (Synopsys), limited table model, DC, AC, noise, transient,

HBI Compact models

I HiCum (TUD) with Aperitif

Page 55: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Simulation hierarchy at ITHE for SiGe devices

I Quantum mechanics for band structure calculations (EPM)I Boltzmann equation solvers

I Full-band Monte Carlo simulator (Elwomis), transientI Spherical harmonics expansion solver (SPRING), DC, AC, noise

I Drift-diffusion and hydrodynamic modelsI Galene III (TU BS), table model, DC, AC, noise, transientI Sdevice (Synopsys), limited table model, DC, AC, noise, transient,

HBI Compact models

I HiCum (TUD) with Aperitif

Page 56: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Simulation hierarchy at ITHE for SiGe devices

I Quantum mechanics for band structure calculations (EPM)I Boltzmann equation solvers

I Full-band Monte Carlo simulator (Elwomis), transientI Spherical harmonics expansion solver (SPRING), DC, AC, noise

I Drift-diffusion and hydrodynamic modelsI Galene III (TU BS), table model, DC, AC, noise, transientI Sdevice (Synopsys), limited table model, DC, AC, noise, transient,

HBI Compact models

I HiCum (TUD) with Aperitif

Page 57: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Simulation hierarchy at ITHE for SiGe devices

I Quantum mechanics for band structure calculations (EPM)I Boltzmann equation solvers

I Full-band Monte Carlo simulator (Elwomis), transientI Spherical harmonics expansion solver (SPRING), DC, AC, noise

I Drift-diffusion and hydrodynamic modelsI Galene III (TU BS), table model, DC, AC, noise, transientI Sdevice (Synopsys), limited table model, DC, AC, noise, transient,

HBI Compact models

I HiCum (TUD) with Aperitif

Page 58: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Simulation hierarchy at ITHE for SiGe devices

I Quantum mechanics for band structure calculations (EPM)I Boltzmann equation solvers

I Full-band Monte Carlo simulator (Elwomis), transientI Spherical harmonics expansion solver (SPRING), DC, AC, noise

I Drift-diffusion and hydrodynamic modelsI Galene III (TU BS), table model, DC, AC, noise, transientI Sdevice (Synopsys), limited table model, DC, AC, noise, transient,

HBI Compact models

I HiCum (TUD) with Aperitif

Page 59: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

First example: THz npn SiGe HBT

Page 60: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBT

2D Schematic

I Symmetric structureI Emitter width = 50nmI Spacer = 25nmI Selectively implanted

collector (SIC)

I 148 by 23 grid points

Page 61: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBT

2D Schematic

I Symmetric structureI Emitter width = 50nmI Spacer = 25nmI Selectively implanted

collector (SIC)

I 148 by 23 grid points

Page 62: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBT

1D doping and Ge profiles

I Base thick. = 7nmI Box Ge = 18%

I 5meV, 3rd orderI Galene III for DD/HDI Boltzmann statisticsI No recombinationI No self-heating

Page 63: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBT

1D doping and Ge profiles

I Base thick. = 7nmI Box Ge = 18%

I 5meV, 3rd orderI Galene III for DD/HDI Boltzmann statisticsI No recombinationI No self-heating

Page 64: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBTVCB = 0.1V

Log scale Linear scale

For VBE larger than 0.9V overestimation by DD/HD models

Page 65: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBTVCE = 1.0V

Cutoff frequency

100 101 102

Collector current [mA/µm2]

0.0000

200.00

400.00

600.00

800.00

1000.0

1200.0

Cut

off f

requ

ency

[G

Hz]

DDHDBE

Drift velocity

DD and HD model fail!

Page 66: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBTVCB = 0.1V , BE results

Transit time distribution Extrinsic contributions

Emitter dominates the transit time! Why?

Page 67: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBTVCB = 0.1V

Box and drift Ge profiles

.010 .020 .030 .040

x [µm]

1017

1018

1019

1020

1021

Dopin

g [c

m-3

]

ND

NA

.010 .020 .030 .040

x [µm]

0.00

5.00

10.0

15.0

20.0

25.0

30.0

Ge c

onte

nt [%

]

Drift Ge

Box Ge

Cutoff frequency

101

102

Collector current [mA/µm2]

103

5*102

Cuto

ff fre

quency [G

Hz]

Drift(SHE)

Box(SHE)

Drift(DD)

Box(DD)

Improvement due to bandstructure effects, not drift field!Bandstructure effects not captured by DD or HDOptimization involved three levels of the hierarchy: BE (Spring),TCAD (DD, HD), and compact modeling (HiCum)

Page 68: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBTVCB = 0.1V

Box and drift Ge profiles

.010 .020 .030 .040

x [µm]

1017

1018

1019

1020

1021

Dopin

g [c

m-3

]

ND

NA

.010 .020 .030 .040

x [µm]

0.00

5.00

10.0

15.0

20.0

25.0

30.0

Ge c

onte

nt [%

]

Drift Ge

Box Ge

Cutoff frequency

101

102

Collector current [mA/µm2]

103

5*102

Cuto

ff fre

quency [G

Hz]

Drift(SHE)

Box(SHE)

Drift(DD)

Box(DD)

Improvement due to bandstructure effects, not drift field!Bandstructure effects not captured by DD or HDOptimization involved three levels of the hierarchy: BE (Spring),TCAD (DD, HD), and compact modeling (HiCum)

Page 69: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBTVCB = 0.1V

Box and drift Ge profiles

.010 .020 .030 .040

x [µm]

1017

1018

1019

1020

1021

Dopin

g [c

m-3

]

ND

NA

.010 .020 .030 .040

x [µm]

0.00

5.00

10.0

15.0

20.0

25.0

30.0

Ge c

onte

nt [%

]

Drift Ge

Box Ge

Cutoff frequency

101

102

Collector current [mA/µm2]

103

5*102

Cuto

ff fre

quency [G

Hz]

Drift(SHE)

Box(SHE)

Drift(DD)

Box(DD)

Improvement due to bandstructure effects, not drift field!Bandstructure effects not captured by DD or HDOptimization involved three levels of the hierarchy: BE (Spring),TCAD (DD, HD), and compact modeling (HiCum)

Page 70: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBTVCB = 0.1V

Box and drift Ge profiles

.010 .020 .030 .040

x [µm]

1017

1018

1019

1020

1021

Dopin

g [c

m-3

]

ND

NA

.010 .020 .030 .040

x [µm]

0.00

5.00

10.0

15.0

20.0

25.0

30.0

Ge c

onte

nt [%

]

Drift Ge

Box Ge

Cutoff frequency

101

102

Collector current [mA/µm2]

103

5*102

Cuto

ff fre

quency [G

Hz]

Drift(SHE)

Box(SHE)

Drift(DD)

Box(DD)

Improvement due to bandstructure effects, not drift field!Bandstructure effects not captured by DD or HDOptimization involved three levels of the hierarchy: BE (Spring),TCAD (DD, HD), and compact modeling (HiCum)

Page 71: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBTVBE = 0.84V

Output characteristics with impact ionizationfT ∗ BVCE0 ≈ 1100GHzV

Page 72: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBTVCB = 0.1V

VCB = 0.1V , 100GHz VBE = 0.7V , VCB = 0.1V

Noise characterization

Page 73: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

2D THz SiGe HBT

I (At least) three ordersof magnitude slowerthan DD/HD model

I Dependent on SHEorder

I Dependent on the biasI Dependent on the initial

potential

Page 74: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

OLED

Page 75: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Schematic Structure of an OLED Device and theOrganic Stack

I HTL: hole transport layerI EL: emission layerI ETL: electron transport layerI LUMO: lowest unoccupied molecule orbitalI HOMO: highest occupied molecule orbital

Page 76: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Composition of Efficient OLED Stacks

N N

N N

N

Ir

N

N

N

N

N N

some common organic materials

I huge number of organic materials with specific functionalityavailable with largely unknown parameters

I complex stacks necessary for efficient devicesI small variations in device structure considerably affect color point,

efficiency, life time

Page 77: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Composition of Efficient OLED Stacks

N N

N N

N

Ir

N

N

N

N

N N

some common organic materials

I huge number of organic materials with specific functionalityavailable with largely unknown parameters

I complex stacks necessary for efficient devicesI small variations in device structure considerably affect color point,

efficiency, life time

Page 78: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Composition of Efficient OLED Stacks

N N

N N

N

Ir

N

N

N

N

N N

some common organic materials

I huge number of organic materials with specific functionalityavailable with largely unknown parameters

I complex stacks necessary for efficient devicesI small variations in device structure considerably affect color point,

efficiency, life time

Page 79: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Composition of Efficient OLED Stacks

N N

N N

N

Ir

N

N

N

N

N N

some common organic materials

I huge number of organic materials with specific functionalityavailable with largely unknown parameters

I complex stacks necessary for efficient devicesI small variations in device structure considerably affect color point,

efficiency, life time

Page 80: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Composition of Efficient OLED Stacks

N N

N N

N

Ir

N

N

N

N

N N

some common organic materials

I huge number of organic materials with specific functionalityavailable with largely unknown parameters

I complex stacks necessary for efficient devicesI small variations in device structure considerably affect color point,

efficiency, life time

Page 81: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Characteristics of Carrier Transport

Very strong mobility dependence on temperature, field and carrierconcentration

Page 82: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Challenges for Simulation

Model uncertainties:I transition rates: thermally activated tunnelling, non-adiabatic small

polarons, ...I energetic disorder: deviations from Gausian density of states,

correlated or uncorrelated disorderI spatial/configurational disorder: strength and mathematical

description unknownI additional material-specific effects: e.g. trapsI interaction between different organic molecule typesI dipole formation at electrode-organic and organic-organic

interfacesI influence of deposition parameters

Page 83: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Challenges for Simulation

Model uncertainties:I transition rates: thermally activated tunnelling, non-adiabatic small

polarons, ...I energetic disorder: deviations from Gausian density of states,

correlated or uncorrelated disorderI spatial/configurational disorder: strength and mathematical

description unknownI additional material-specific effects: e.g. trapsI interaction between different organic molecule typesI dipole formation at electrode-organic and organic-organic

interfacesI influence of deposition parameters

Page 84: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Challenges for Simulation

Model uncertainties:I transition rates: thermally activated tunnelling, non-adiabatic small

polarons, ...I energetic disorder: deviations from Gausian density of states,

correlated or uncorrelated disorderI spatial/configurational disorder: strength and mathematical

description unknownI additional material-specific effects: e.g. trapsI interaction between different organic molecule typesI dipole formation at electrode-organic and organic-organic

interfacesI influence of deposition parameters

Page 85: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Challenges for Simulation

Model uncertainties:I transition rates: thermally activated tunnelling, non-adiabatic small

polarons, ...I energetic disorder: deviations from Gausian density of states,

correlated or uncorrelated disorderI spatial/configurational disorder: strength and mathematical

description unknownI additional material-specific effects: e.g. trapsI interaction between different organic molecule typesI dipole formation at electrode-organic and organic-organic

interfacesI influence of deposition parameters

Page 86: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Challenges for Simulation

Model uncertainties:I transition rates: thermally activated tunnelling, non-adiabatic small

polarons, ...I energetic disorder: deviations from Gausian density of states,

correlated or uncorrelated disorderI spatial/configurational disorder: strength and mathematical

description unknownI additional material-specific effects: e.g. trapsI interaction between different organic molecule typesI dipole formation at electrode-organic and organic-organic

interfacesI influence of deposition parameters

Page 87: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Challenges for Simulation

Model uncertainties:I transition rates: thermally activated tunnelling, non-adiabatic small

polarons, ...I energetic disorder: deviations from Gausian density of states,

correlated or uncorrelated disorderI spatial/configurational disorder: strength and mathematical

description unknownI additional material-specific effects: e.g. trapsI interaction between different organic molecule typesI dipole formation at electrode-organic and organic-organic

interfacesI influence of deposition parameters

Page 88: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Challenges for Simulation

Model uncertainties:I transition rates: thermally activated tunnelling, non-adiabatic small

polarons, ...I energetic disorder: deviations from Gausian density of states,

correlated or uncorrelated disorderI spatial/configurational disorder: strength and mathematical

description unknownI additional material-specific effects: e.g. trapsI interaction between different organic molecule typesI dipole formation at electrode-organic and organic-organic

interfacesI influence of deposition parameters

Page 89: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Challenges for Simulation

Model uncertainties:I transition rates: thermally activated tunnelling, non-adiabatic small

polarons, ...I energetic disorder: deviations from Gausian density of states,

correlated or uncorrelated disorderI spatial/configurational disorder: strength and mathematical

description unknownI additional material-specific effects: e.g. trapsI interaction between different organic molecule typesI dipole formation at electrode-organic and organic-organic

interfacesI influence of deposition parameters

Page 90: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Challenges for Simulation

Model uncertainties:I transition rates: thermally activated tunnelling, non-adiabatic small

polarons, ...I energetic disorder: deviations from Gausian density of states,

correlated or uncorrelated disorderI spatial/configurational disorder: strength and mathematical

description unknownI additional material-specific effects: e.g. trapsI interaction between different organic molecule typesI dipole formation at electrode-organic and organic-organic

interfacesI influence of deposition parameters

Page 91: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

Conclusions

Page 92: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

ConclusionsI The full hierarchy of simulation tools is requiredI Hierarchy should be consistentI TCAD becomes more and more complex (e.g. OLED)I Too many choices, TCAD development lags behindI Slow flow of information hinders development

Page 93: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

ConclusionsI The full hierarchy of simulation tools is requiredI Hierarchy should be consistentI TCAD becomes more and more complex (e.g. OLED)I Too many choices, TCAD development lags behindI Slow flow of information hinders development

Page 94: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

ConclusionsI The full hierarchy of simulation tools is requiredI Hierarchy should be consistentI TCAD becomes more and more complex (e.g. OLED)I Too many choices, TCAD development lags behindI Slow flow of information hinders development

Page 95: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

ConclusionsI The full hierarchy of simulation tools is requiredI Hierarchy should be consistentI TCAD becomes more and more complex (e.g. OLED)I Too many choices, TCAD development lags behindI Slow flow of information hinders development

Page 96: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

ConclusionsI The full hierarchy of simulation tools is requiredI Hierarchy should be consistentI TCAD becomes more and more complex (e.g. OLED)I Too many choices, TCAD development lags behindI Slow flow of information hinders development

Page 97: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

ConclusionsI The full hierarchy of simulation tools is requiredI Hierarchy should be consistentI TCAD becomes more and more complex (e.g. OLED)I Too many choices, TCAD development lags behindI Slow flow of information hinders development

Page 98: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

-0.30 -0.20 -0.10 0.000 0.10 0.20 0.30

0.00

0.05

0.10

0.15

0.20

0.25

Silicon

Bottom oxide

GS D

Top oxide

Partially depleted SOI NMOSFET

Page 99: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

PDSOI NMOSFET

0 0.2 0.4 0.6 0.8 10

5

10

15

20

25

Drain voltage [V]

Dra

incu

rren

t[A

/m]

with IIw/o II

Kink effect due to impact ionization (II) (Vgate = 1.0V )CPU time: 5h per bias point

Page 100: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

PDSOI NMOSFET

0 0.2 0.4 0.6 0.8 10

5

10

15

20

25

Drain voltage [V]

Dra

incu

rren

t[A

/m]

with IIw/o II

Kink effect due to impact ionization (II) (Vgate = 1.0V )CPU time: 5h per bias point

Page 101: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

PDSOI NMOSFET

0 0.2 0.4 0.6 0.8 10

5

10

15

20

25

Drain voltage [V]

Cur

rent

[A/m

]ID with IIID w/o II

10−16

10−15

10−14

10−13

10−12

10−11

10−10

II-curr.

About 17 orders of magnitude difference in currents at kink

Page 102: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

PDSOI NMOSFET

Ele

ctro

n d

ensi

ty [

/cm

3]

1.0×107

1.0×108

1.0×109

1.0×1010

1.0×1011

1.0×1012

1.0×1013

1.0×1014

1.0×1015

1.0×1016

1.0×1017

1.0×1018

1.0×1019

1.0×1020

Vertical p

osition [u

m]

0

0.1

0.18

Lateral position [um]−0.3 −0.2 −0.1 0 0.1 0.2 0.3

SourceDrain

No problems with stability! (Vgate = Vdrain = 1V )

Page 103: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

PDSOI NMOSFET

0.00 .050 0.10 0.15 0.20 0.25 0.30

Lateral position [µm]

200.00

400.00

600.00

800.00

1000.0

1200.0

1400.0

1600.0

Dyn

am

ic t

em

pe

ratu

re

[K]

dyn. temp.

0.00 .050 0.10 0.15 0.20 0.25 0.30

Lateral position [µm]

1011

1013

1015

1017

1019

II g

en

era

tio

n r

ate

[c

m-3

s-1

]

II rate

No spurious particle heating! (Vgate = Vdrain = 1V )

Page 104: Current and Future Challenges for TCAD - MOS-AKmos-ak.org/munich_2013/presentations/07_Christoph_Jungemann_MO… · Current and Future Challenges for TCAD C. Jungemann and C. Zimmermann

PDSOI NMOSFET

10−1 100 101 102 103 104 105 106

10−22

10−19

10−16

10−13

10−10

Frequency [Hz]

Dra

incu

rren

tnoi

se[A

2 s/c

m] Total

HolesElec.

II

Noise can be calculated for individual sources (Vgate = Vdrain = 1V )