conceptual design for the damic-m cryostat
TRANSCRIPT
June 27, 2018 1
DAMIC-M Cryostat Conceptual Design, ULB Materials Production and Fabrication,Recent ULB Cryostat Examples
TODD HOSSBACHwith contributions from my PNNL colleagues
DAMIC-M Collaboration Meeting – June 2018 – Paris
PNNL-SA-135464
Outline
Review of the conceptual DAMIC-M cryostat design
Copper electroforming capabilities
Clean fabrication and assembly
Examples of recent ultra-low-background cryostats produced at PNNL
Design, fabrication, assembly
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 2
Conceptual Design Principles
Guiding principles
Begin with what we know works
Minimize complexity
Focus on background control
DAMIC-M design particulars
Use of electroformed copper important in achieving background goal
To achieve our timeline and stay within budget (background and €/$), high-quality OFHC copper should be used in non-
critical components of cryostat
Flex cable management and associated background mitigation
Vacuum feedthroughs
Stable experimental operation
Good thermal contact between CCDs and heat conductors
Minimize IR load on sensors
Re-condense N2 boil-off gas from Dewar
Critical for us to define the CCD packaging and detector module as soon as possible.
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 3
DAMIC-M Cryostat Design Concept –From ERC/NSF Proposal
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 4
DAMIC-M Cryostat Design Concept –Some recent updates
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 5
• 33 x 33 x 38cm inner volume
• Cu, within shield, is OFHC
• Alternative location for vacuum feedthrough
• Sterling/PT cooler for N2
reliquification
Shielding design based on C4 Dark Matter Experiment• Graded Pb purity• Optional inner Cu
liner for support• Neutron moderator /
borated poly
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 6
Electroforming
AC plating process
Copper growth ~0.0015” (38
microns) per day
Have grown large pieces >1”
(25mm) thick
Begin with highest purity OFHC
starting stock
Uses Optima-grade acid
Typically growth on cylindrical
and hexagonal mandrels.
Routine assay of electrolyte
Electrochemical Purification of Copper
Originally developed in the 1980’s as a method to reduce trace radioactive impurities in HPGe copper cryostats
Significant improvements to electroforming methods in early 2000’s
Reduced U/Th levels, better materials properties, reproducible growth, new cleaning and surface passivation
Most radiopure copper available <0.1 µBq U or Th/kg Cu
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 7
H2SO4
Man
dre
l(c
ath
od
e)
OFH
C C
u (a
no
de)
Power SupplyPUMP
Filt
er
Eric HoppeElectroforming Lead
Copper Electroforming at PNNL
Electroforming occurs at 35 mwe in dedicated Class 1000 cleanroom – 10x reduction in production
of cosmogenics
14 Electroforming Baths
8 small baths – mandrels up to 6” (15cm) diameter and 16” (40cm) long
6 large baths – mandrels up to 13” (33cm) diameter and 24” (60cm) long
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 8
Copper Electroforming at PNNL
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 9
https://tour.pnnl.gov/shallow-lab.html
Physical Properties of Electroformed Copper
10
Electroformed copper shows consistency in mechanical response from tensile and hardness testing on different regions across the material profileCurrently developing radiopureCu/Cr alloy with mechanical properties of mild steel
Electroformed copper is evaluated for grain size, hardness, and tensile strength(most commercial OFHC copper is <10 ksi)
0
50
100
150
200
250
0 0.08 0.16 0.24 0.32 0.4 0.48
Stress vs. Strain
First Thick Majorana Plate
T1T2T3M1M2M3B1B3
S1 Strain mm/mm
Yield Strength: 13.78 ± 0.58 ksiUltimate Tensile Strength: 31.2 ± 0.73 ksiYoung’s Modulus: 9.34E3 ± 1.74E3 ksi
• Significant Strain hardening • Significant Ductility
Growth Direction
µm
HV
Hardness measured across a surface Hardness contour map across a surface
Photo of microindent
Consistent tensile strength from multiple samples
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 11
Fabrication
Clean Fabrication of Copper and Polymers
Three specially trained professional machinists
Follow defined handling protocols – gloved hands, face masks, etc.
Two dedicated clean (low-background) machine shops
CNC mill, knee mill, lathe, EDM (electrical discharge machining) hole-drilling/die-sinking
One general purpose machine shop
CNC mills, knee mills, lathes, wire EDM, band saw, electron-beam welder, etc.
Aggressive cleaning of existing tools, tooling, fixtures, etc. prior to use in low-background applications
Fixtures made of compatible materials (e.g. avoid Al if cutting Cu)
Vacuum fixtures used to produce DAMIC parts
Alternative cutting fluids and coolants
Propylene glycol, cryo-machining (liquid nitrogen), vortex coolers (-46C)
Proper storage between fabrication steps
Post-fabrication cleaning – acidified peroxide solution (removes 1 micron/min)
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 12
Clean Fabrication of Copper and Polymers
Machine tools located in typical laboratory environment – not a cleanroom
Access to tools strictly controlled
Only low-background raw materials permitted in shop
Final parts marked with a unique identifier using laser engraving system
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 13
Clean Fabrication of Copper and Polymers
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 14
EDM fine-hole drilling and die sinking• New capability at PNNL• EDM process can be extremely clean • Only 75 units produced by
manufacturer• Capable of drilling extremely fine
holes in all metals• Die-sinking enables production of
parts/finishes not possible with conventional machining methods
• Pipes for drilling or electrodes for die-sinking can be made from high-purity copper
Fabrication of OFHC Copper Cryostat Parts and DAMIC Electroformed Copper CCD Modules
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 15
1% H2SO4 (optima)3% H2O2 (optima)
CLEANING!
Clean Joining of Detector Elements –Electron-Beam Welding
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 16
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 17
Examples of Recent ULB Germanium Spectrometer Production
RECENT PRODUCTION OF ULB HPGe SPECTROMETERS
In 2012 and 2017, we produced two ultra-low-background HPGe
spectrometers
C4 dark matter experiment, ULB gamma assay
First cryostats produced at PNNL to involve significant mechanical,
thermal, and electrical modeling prior to beginning production.
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 18
radius
7.830
6.264
4.698
3.132
1.566
0.000
3500
2800
2100
1400
700
0
Voltage U (V)
Strength E (105 V/m)
cry
stal
cyli
ndri
cal
axis
COMSOL Model with Resistive Joints
Horizontal Cold Finger (HCF)
Vertical Cold Finger (VCF)
Cold Plate (CP)
90.5
90
89.5
89
Kelvin
91
91.5
92
(not visible)
Model components
and sensor locations
C4 Cryostat - 2012
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 19
CRYOSTAT
DIPSTICK
PREAMPLIFIER
CROSS ARM ENDCAP
ENTRANCEWINDOW
Anatomy of a Germanium Spectrometer
C4 Cryostat – 2012Step 0 – Perform calculations / modeling
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 20
COMSOL FEM Model
COMSOL FEM modeling was used to
determine how changes to the
thermal path could lower the
operating temperature of the crystal in
future cryostats.
1-D Model – Electrical Analogy
1- 0 1 2 3 4 5 6 7 8 9 10 11 12 13 1470
72
74
76
78
80
82
84
86
88
90
92
94
96
98
100
0
2
4
6
8
10
Nodal Temperature Distribution
Node Number
Tem
pera
ture
(K
)
Tem
pera
ture
Dif
fere
nti
al
(K)
A one dimensional model was used to
estimate the various thermal loads and
final crystal temperature.
C4 Cryostat – 2012Step 1 – Electroformed copper growth, fabrication of components
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 21
C4 Cryostat – 2012Step 2 – Test assembly of thermal path and vacuum jacket followed by leak testing
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 22
C4 Cryostat – 2012Step 3 – Electrical wiring
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 23
Low Voltage High Voltage
Stainless fasteners used only in test assemblies. Replaced with copper in final assembly.
Brass blank used as surrogate for Ge crystal in test assembly.
C4 Cryostat – 2012Step 4 – Thermal testing
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 24
C4 Cryostat – 2012Step 4 – Thermal testing
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 25
Final crystal temperature of 91.5K reached in 8 days.
Crystal reaches 100K in ~3.5 days
C4 Cryostat – 2012Step 5 – Germanium integration
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 26
ULB Gamma Spectrometer– 2017
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 27
The image shown at the right is a
thermal profile of the cryostat that
indicates a ~6K temperature variation
along the length of the cryostat.
Modeling Case:
1-1/8” thermal conductor diameters
Modeling Outcomes:
Cold-plate temperature: 84K
IR loading: 1.6W
Total LN load: 3.7W
LN Consumption: 2L/24hr
ULB Gamma Spectrometer– 2017Improving thermal performance
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 28
Cryostat thermal performance had to be improved due to the higher IR load (larger HPGe crystal) and longer horizontal cross arm
ULB Gamma Spectrometer– 2017Critical design feature to eliminate thermal resistance of joints
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 29
No measurable thermal resistance with tapered joints
ULB Gamma Spectrometer– 2017Blending electroformed and OFHC copper
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 30
By using OFHC copper where possible, cryostat production time
can be significantly reduced
OFH
C C
u
E-Cu
ULB Gamma Spectrometer– 2017Electrical wiring
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 31
ULB Gamma Spectrometer– 2017Lower background electronics
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 32
PNNL developed low-background front-end electronics for use in HPGe spectrometers. Use small electronic components to limit background contribution. For ultimate background performance, bare-die JFETs and wire bonding are used.
CuFlon circuit boards
Canberra bare-die JFET configuration in C4
Screened polymer and cabling
ULB Gamma Spectrometer– 2017Germanium crystal integration
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 33
• Custom 2.7kg Canberra XtRa crystal (partial wrap-around Li contact)• 143% relative efficiency
Summary
Recent successes with the production of HPGe cryostats gives me confidence that we (The
Collaboration) can design and build a cryostat capable of achieving the background goals of
DAMIC-M.
Significant ultra-low-background capabilities and expertise exist at PNNL and are available to
DAMIC-M
There is a lot of work to be done before we will have a 90% cryostat design
For DAMIC-M to be successful the individual tasks will need to work together closely!
cryostat, shielding, CCD packaging, and electronics tasks
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 34
Questions?
June 27, 2018DAMIC-M Collaboration Meeting – June 11-13, 2018 – Paris 35
Heart of the Hill Vineyard – Red Mountain – Benton City, Washington