cheminform abstract: plasma-assisted mocvd growth of superconducting nbn thin films using nb...

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2001 technology of materials, lasers, semiconductors, superconductors technology of materials, lasers, semiconductors, superconductors V 1500 18 - 216 Plasma-Assisted MOCVD Growth of Superconducting NbN Thin Films Using Nb Dialkylamide and Nb Alkylimide Precursors. Compound (IIIb) is characterized by single crystal XRD. It crystallizes in the monoclinic space group P2 1 /c with Z = 4. The precursor complexes (IIIa–c) and Nb(NEt 2 ) 4 are used to grow high-quality superconducting NbN thin films at low temperatures in a pulsed organometallic beam epitaxy reactor using a N 2 H 4 plasma (85–135 C precursor reservoir temp., 750 C substrate temp., He carrier gas). The obtained films are characterized by XRD, SEM, and scanning Auger spectroscopy. The highest critical temperature of 12.9 K is achieved with an annealed film grown from Nb(NEt 2 ) 4 . — (LIU, XIANG; BABCOCK, JASON R.; LANE, MELISSA A.; BELOT, JOHN A.; OTT, ANDREW W.; METZ, MATTHEW V.; KANNEWURF, CARL R.; CHANG, ROBERT P. H.; MARKS, TOBIN J.; Chem. Vap. Deposition 7 (2001) 1, 25-28; Dep. Chem., Northwest. Univ., Evanston, IL 60208, USA; EN) 1

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Page 1: ChemInform Abstract: Plasma-Assisted MOCVD Growth of Superconducting NbN Thin Films Using Nb Dialkylamide and Nb Alkylimide Precursors

2001 technology of materials, lasers, semiconductors, superconductors

technology of materials, lasers, semiconductors, superconductorsV 1500

18 - 216Plasma-Assisted MOCVD Growth of Superconducting NbN ThinFilms Using Nb Dialkylamide and Nb Alkylimide Precursors. —Compound (IIIb) is characterized by single crystal XRD. It crystallizes in themonoclinic space group P21/c with Z = 4. The precursor complexes (IIIa–c)and Nb(NEt2)4 are used to grow high-quality superconducting NbN thin filmsat low temperatures in a pulsed organometallic beam epitaxy reactor using aN2H4 plasma (85–135 ◦C precursor reservoir temp., 750 ◦C substrate temp., Hecarrier gas). The obtained films are characterized by XRD, SEM, and scanningAuger spectroscopy. The highest critical temperature of 12.9 K is achievedwith an annealed film grown from Nb(NEt2)4. — (LIU, XIANG; BABCOCK,JASON R.; LANE, MELISSA A.; BELOT, JOHN A.; OTT, ANDREW W.;METZ, MATTHEW V.; KANNEWURF, CARL R.; CHANG, ROBERT P. H.;MARKS, TOBIN J.; Chem. Vap. Deposition 7 (2001) 1, 25-28; Dep. Chem.,Northwest. Univ., Evanston, IL 60208, USA; EN)

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