certain semiconductor memory devices and products containing same, 337-470, no. 65959-1 (u.s.i.t.c....
TRANSCRIPT
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
1/179
Appendix A
D 9 ?
3
ECRETARY
CUMMISSION
ppen ix
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
2/179
UNITED STATE S DEPARTMENT OF COMMERCE
United States Patent and Trademark Office
February
OS, 2002
TH IS IS
TO
CERTIFY TH AT ANNEXED IS A TRUE COPY FROM THE
IRECORDS
OF THIS OFFICE OF THE FILE WRAPPER AND CO NTENTS
OF:
APPLICATION NUM BER:
08/265 535
FILING DATE:
June 24,1994
PATENT NUMBER:
5,452,261
ISSUE DATE: September 19,1995
IW 507655
By Authority of the
'COMMISSIONER OF PATENTS AND TRADEMARKS
P.
R.
GRANT
Certifying Officer
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
3/179
E R l A L N U M B E R F I L I N G D A T E C L A S S G R O U P A R T
l . - l N | T >
e : 3 x 2 5 5 , 5 3 5 -
as /24 /94
.
. .
2 5 1 1
I -
-
:5 :
: 4 :
4 : 4 : :1 : .1 : 4 : - 4 : : ; : 4 : : ;: :5 :
4 :
: y .
:p . A
VERIFIEP mu?
\ .
- _ _ x E 7 . 7 . _ _
1 :
. * -
I
3
= 5
* F C 5 R E
I
E i N / F C - T
A F F L I
E A T
I
B N 5 F 3 h *
P
3
J :
fEF{'IF'IED
g 2
M N O N ?
n _ _ _ _ .
, _ _ . _ . _ _ . . . ( A :
F B I - ; \ E I C 1 ' N F I L I N 1 3 L I C I E N S E 3 3 H i N T E i . . * I
* 3
/
I 3 : ? _ / 3 4
F o r e i g n
p r i o r i t y
c l a i m e d i
y e s ' o F I L I N G F E E A T T O R N E W 3
3 5 us e 1 1 9 c o n d m o m me D
y e s
'-"W 5 E 5'V 5
, oocnsr N o . ._
|
vormou
a n d A k k n o w la d g au
mm
n g r
. um
NURMAN R KLIVANS .
fg
. E ? } < . J E R V E I \I MCIRRILL M r - C F H E F . E 2 L IN
:
/
F R : I N K L I N -3 : FRIEL.
:- 1 H
a s m * : r = . 4 : := : I
n : . -
2 5 METRE
DRIVE
SUITE 701:
SAN-._TEI.'-SE
CH
95 ?
R _ 1 r : : _ x r : E . - r : - 1 E r ~ 1 : : m
H L : r r . o 1 c o M u . m . r m o m i a - n ' o - 4 ; L h t t 0 - 7 _ | _ :
T I T L E
n A \ u b c
PRlM7\RY EXAMINE
,
GROUP2500
. Pfimary Examiner
W A R N I N G : Th e I n f o r m a t i o n d i s c r o s d
h
b y
th e U n i t e d States
Code I
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
4/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
5/179
..
At t y. Docket No. : M- 2595US
081265535
.AW OFFICES
OF
J une 24, 1994
Our Case Docket No. M- 2595
US
Comm ssi oner of Patent s and Tr ademarks
Washi ngt on, D. C. 20231
Transmt t ed herew th f or f i l i ng i s a pat ent appl i cati on, as f ol l ows:
I nvent or( s)
:ET.,L,
Li gxosg Bu n g and M chael A. Mur r ay
Ti t l e:
-
SERI ALAPDRESS
. ENERATOR .
FO
... VR..M.~-OR~
. Encl osed. al so are:
heets of dr aw ngs:
-
Formal ) X I nf ormal )
- n Assi gnment of t he I nvent i on
t o
-
cert i f i ed copy of a Appl i cat i on.
CLAI MS AS FI LED
Number Number
E a Filed Rate
Basi c Fee
$ 710. 00
Tot al Cl ai ms 10 - 20 - 0 x $22 - 00. 00
Gl ai ms 3 - 3 - 0
x $74
-
00.00
dependent cl ai ms ( $230 t otal f ee)
- 00,oo
Tot al fi l i ns f ee: 710. 00
I ndependent
-
Appl i cati on cont ai ns one or more mul t i pl e
Pl ease make t he f ol l ow ng char ges to Deposi t Account 19- 2386:
XX Fee f or f i l i ng the patent appl i cat i on i n the amount of
$
710. 00
The Comm ssi oner i s hereby authori zed t o char ge any addi t i onal
f ees whi ch may be r equi r ed, or cr edi t any overpayment t o Deposi t
Account 19- 2386.
A Return Post Card and t hi s s heet i n tr i pl i cat e ar e encl osed.
I
hereby certify that this correspondence is being
deposited with he United States Postal
Service
a6 expresa
mail
In
an enveloDe
addressed to: Comnissioner o f Patents
Respectf ul l y subm t t ed,
3
Pw dA4
R.
4L. Y(/-
Nor man R. Kl i vans
Reg.
No.
33, 003
At t orney f or Appl i cant( s)
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
6/179
. I
' A '
...
5
10
15
20
25
3 0
35
: r/.-
.,
SERI AL ADDRESS GE N E WmF OR BURSTMEMORY
__.
J i nyong chung
/
./
M chael A. Mur r ay
BACKGROUND
OF
THE
I NVENTI ON
Fi el d of t he I nvent i oq
Thi s di scl osur e r el ates t o random access memory
and speci f i cal l y t o a ser i al addr ess gener at or f or a
bur st - t ype r andom access memory.
Descri pt i on of t he Pr i or Art
Vi deo
RAM
( r andomaccess memor y) , synchr onous RAM
and bur st RAM each r equi r e a sequence of i nt e r nal l y
generat ed addresses f or f ast er cycl i ng and pr event i on
of t he external addr ess bus l i nes
from
f ast swi t chi ng
t o
suppr ess sw t chi ng noi se i n t he syst em Typi cal l y
t he st art addr ess
of
a par t i cul ar addr ess bur st i s
provi ded f r om an ext ernal sour ce ( a host computer or a
pr ocessor ) and as subsequent cl ock si gnal s arr i ve at
t he addr ess generator , t he f ol l owi ng addr esses i n the
bur st are generat ed cont i nuousl y i n sequence f or t he
dur at i on
of
t he burst .
addr ess sequencer ( t ypi cal l y a count er)
to
t he
ext ernal l y pr ovi ded st ar t addr ess (A) i n r esponse t o a
PRESET
si gnal . The address sequencer out put i s updat ed
wi t h each
@clock
r i si ng edge, and t he out put s of t he
address gener ator ar e sequent i al l y A, An+ Anp
,
etc.
Such a pr i or art address generat or i s shown i n
Fi g. 1A i ncl udi ng address sequencer
12
out put t i ng t he
sequence of address es t o an out put buf f er
14.
The
t hree i nput si gnal s t o the addr ess sequencer 12 are t he
i nput addr ess si gnal ( t he st art addr ess A), t he @clock
si gnal , and t he PRESET si gnal . Addi t i onal l y, a
The pr i or ar t preset s t he
-1-
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
7/179
sequence cont r ol si gnal contr ol s whet her t he address
sequencer
12
count s up or down. I n most appl i cati ons,
upcount i ng i s used, and t hi s f uncti on i s bui l t i n,
r ather t han bei ng a cont r ol f unct i on. The associ ated
5 t i m ng di agram i s shown i n Fi g. 2A.
Typi cal l y t he addr ess sequencer
12
( Count er)
i ncl udes a mast er si de and a sl ave si de, each i ni t i al l y
set t o the start addr ess A,,.
t hat t he devi ce of Fi g. 1A i s a par al l el devi ce, where
t he st ar t addr ess A, i s a mul t i - bi t addr ess pr ovi ded by
a pl ur al i t y of l i nes, i .e. an addr ess bus. The addr ess
out si gnal i s al so pr ovi ded on a mul t i - l i ne bus.
out put t o buf f er 14 when the Pr eset si gnal
i s
appl i ed,
second addr ess out A+1
i s out put t o buf f er 14 at t he
t r ai l i ng edge of @clock and t he f ol l owi ng addresses ar e
updat ed at ever y t r ai l i ng edge of t he
@clock
s i gnal .
The addr ess generat or of Fi g. 1A f unct i ons
20
adequat el y; however i t i s sl ower t han desi r ed. Fast er
operat i on i s desi r abl e t o i mpr ove syst emper f ormance
such as needed i n a t ypi cal bur st DRAM ( dynam c r andom
access memor y) chi p. The Fi g. 1A addr ess gener at or
del i ver s t he f i rs t addr ess l at e, due t o t he pr opagati on
sequencer . Thi s means a shor t er st art address dur ati on
t i me
.
To
i mpr ove t he st art addr ess del i ver y, i n a second
pr i or ar t addr ess gener ator t he star t addr ess i s
3 0
pr ovi ded f r om t he Addr ess I nput di r ect l y, i nstead of
goi ng t hr ough t he count ers. ( See Fi g.
lB,
and
cor r espondi ng t i m ng di agr am Fi g.
2B).
Rather t han pr ovi di ng t he st art address
A
t o the
address s equencer as i n Fi g. 1A, t he addr ess sequencer
12
of Fi g.
1B
i s bypassed bef or e and duri ng t he preset
per i od by means of ext ernal addr ess enabl e swi t ch 24
I t i s
t o
be under st ood
10
A s seen i n Fi g.
2A, t he f i r st addr ess out A, i s
15 and kept unti l l eadi ng edge of
@=lock
arr i ves. The
25
del ay t hr ough t he count ers i nsi de t he address
3 5
-2-
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
8/179
and i nt ernal address enabl e swi t ch 26, and t he st art
addr ess i s pr ovi ded di r ect l y t o t he out put buf f er vi a
ext ernal address enabl e swi t ch 2 4 . Thi s ( s t a r t )
addr ess A i s t her ef ore avai l abl e al most i mmedi at el y as
5 t he addr ess out at buf f er 1 4 , wi t hout pr ocessi ng by t he
addr ess sequencer 12.
hi gher speed) i s desi r abl e i n t erms of addr ess out put .
However , f urt her perf ormance i mprovement (i . e. ,
10 SUMMARY OF THE I NVENTI ON
I n t he above descri bed pr i or art , t he second
address
A,+1 i s
del i ver ed by t he address sequencer t o
t he out put buf f er at t he t i me of t he t r ai l i ng edge of
t he f i r s t Gclock ycl e.
t o the out put buf f er at t he l eadi ng edge of t he @clock
si gnal . Thus one hal f of a cl ock cycl e i s gai ned or
each addr ess bur st .
I n accordance wi t h t he
15
i nvent i on, i nst ead t he second addr ess A,+1 i s del i ver ed
Af t er provi s i on t o t he out put buf f er of t he f i r s t
2 0 address A, ( whi ch i s ext er nal l y suppl i ed as i n Fi g. 1B)
t he external addr ess l i ne i s di sconnect ed f r omt he
out put buf f er
by
an ext ernal address enabl e swi t ch, and
an i nter nal addr ess enabl e swi t ch whi ch connect s t he
addr ess sequencer t o t he out put buf f er i s cl osed,
subsequent i nt er nal l y generat ed addr ess A,+1 t o t he
' out put buf f er , al so as i n Fi g. 1B. Then, dur i ng t he
t i me t hat t he st ar t addr ess A, i s bei ng pr ovi ded t o the
out put buf f er, t he addr ess s equencer oper ates t o
address es of each bur st are t her eby each provi ded t o
t he out put buf f er appr oxi matel y 1/ 2 of a c l ock cycl e
ear l i er t han i n t he pr i or ar t of Fi g.
IB.
The ext ernal l y provi ded addr ess and t he addr ess
out bot h begi n wi t h t he same addr ess A, whi ch i s t he
i ni t i al addr ess i n t he bur st , whi l e us i ng t he pr eset
25
al l owi ng t he address sequencer t o pr ovi de t he
3 0
cal cul at e t he subsequent address A +1. The out put
3 5
-3-
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
9/179
si gnal t o advance t he counti ng of t he sequence by one
count .
Theref ore,
t he address sequencer i s pr eset t o
address
A,+1
( t he second addr ess i n the bur st) f ol l owi ng
f i r st c l ock s i gnal ar r i ves at t he addr ess sequencer ,
t he address sequencer output i s sampl ed by enabl i ng t he
i nt ernal address enabl e ( second) swi t ch and di sabl i ng
t he ext ernal addr ess enabl e ( f i rs t ) sw t ch. The
10 addr ess sequencer output i s updat ed wi t h each ri si ng
edge of t he cl ock si gnal @clock.
Ther eby t he addr ess
sequencer gener at es each addr ess one cl ock cycl e ahead
of t he ti me that address woul d have been generat ed i n
t he pr i or ar t ,
and t he addr ess out put i s suppl i ed t o
t he out put buf f er
1/2
cl ock cycl e ahead of t he pr i or
ar t ( Fi g. 2B) t i m ng. As i n t he pr i or ar t , t he addr ess
sequencer i ncl udes a mast er/ sl ave count er. However, i n
accor dance w t h t he i nvent i on and i n order t o set t he
addr ess sequencer i ni t i al l y to t he second addr ess
A n + l ,
t he master si de of t he counter
i s
i ni t i al l y
set
t o
val ue An,
and t he sl ave si de of t he count er i s
i ni t i al l y set t o val ue
A,+1.
i ncr ement al t i m ng advant age over t he pr i or art .
5
t he ext ernal l y pr ovi ded st art address A,. When t he
15
2 0
Thi s pr ovi des t he desi r ed
The pr esent i nvent i on i s appl i cabl e speci f i cal l y
25 t o bur st DRAM ( dynamc RAM) oper at i ng i n page mode, and
i s
al so appl i cabl e t o ot her t ypes of bur st memory usi ng
sequent i al t ype addr essi ng.
I n accor dance w t h the i nvent i on, operati on of t he
addr ess generator i s t he same as i n t he pr i or art
3 0
except dur i ng t he preset cycl e. Thus t he per f ormance
advantage i s gai ned dur i ng t he pr eset por t i on of t he
address bur st .
cycl e ahead of t hat provi ded i n t he pr i or art , t hi s
i mproves t he oper ati onal per f ormance of t he syst em i n
whi ch t he burs t memor y is i ns t al l ed.
Si nce t he addresses ar e output one- hal f
35
-4-
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
10/179
BRI EF DESCRI PTI ON OF THE
DRAWNGS
Fi gs.
IA, I B
show pr i or art addr ess gener ator s.
Fi gs .
2 A ,
2B
show t i m ng di agr ams
f o r
t he pr i or
"
art address generat ors of r espect i vel y Fi gs .
lA,
1B.
wi t h t he pr esent i nvent i on.
generat or of Fi g. 3 .
an
v
5 Fi g.
3 '
shows f l Aaddr ess gener at or i n accor dance
. /
Fi g.
4
shows
a
t i m ng di agram f or t he addr ess
Fi g. 5 shows a schemati c of t he i nter nal addr ess
10 enabl e swi t ch, ext ernal address enabl e swi t ch, and
out put buf f er i n accor dance wi t h t he pr esent i nvent i on.
Fi g.
6
shows a count er i n accordance wi t h t he
pr esent i nvent i on.
Fi g.
7
shows det ai l of one cel l
of
t he count er
of
Fi gs .
8 ,
9 ,
and
10
show ci r cui t r y
or
generat i on
15
Fi g. 6 .
of t he t i m ng s i gnal s f or t he addr ess generat or i n
accor dance w t h he r esent i nvent i on.
Fi qs 11 show$ a t i m ng di agr amf or an addr ess
d
enst
11
Pb
A
20
generat or i n accor dance w t h t he pr esent i nvent i on.
DETAI LED DESCRI PTI ON OF THE I NVENTI ON
Fi g. 3 shows i n a bl ock di agr am seri al addr ess
generat or
18
i n accor dance wi t h t he i nvent i on. Addr ess
buffer 2 2 ,
ext ernal address enabl e swi t ch
2 4
(as
i n
Fi g.
1B)
act uated by an ext ernal address enabl e contr ol
s i gnal
2 8 ,
and i nt ernal address enabl e swi t ch
26 (as
i n
Fi g.
1B)
act uated by an i nt ernal address enabl e contr ol
3 0
s i gnal
30.
Thus t he seri al addr ess generat or
of
Fi g.
3
appear s i n t he bl ock di agr amt o
be
s i m l ar t o t he
ser i al addr ess gener at or of Fi g.
1B;
t he di s t i nct i on i s
i n t he i nt er nal st r ucture and oper at i on
of
address
sequencer
20,
whi ch di f f ers s i gni f i cant l y
from
address
25
generat or
18
i ncl udes address sequencer
20,
out put
35
sequencer
12
of Fi gs .
1 A
and
1B.
/
i
/
. I ,
- 5 -
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
11/179
5
10
15
20
2 5
i
30
J
35
Sequence cont r ol si gnal 32 (as i n t he pr i or art )
det er m nes whet her address sequencer 20 i s an up or
down count er . I nput si gnal s on l i nes 34, 36 and 38 are
convent i onal ( as i n t he pr i or art) . The out put addr ess
( I f addressoutt l ) i s pr ovi ded on l i ne
40 .
Thi s ci r c ui t ,
l i ke t hat of Fi gs .
1A
and
1B,
i s a par al l el devi ce
pr ovi di ng a mul t i - bi t addr ess. Hence addr ess l i ne 34,
t he out put f r omt he address sequencer on l i ne
42,
and
t he addr ess out l i ne
40
each repr esent mul t i - l i ne
busses wi t h as many l i nes
as
t here are addr ess bi t s i n
t he par t i cul ar appl i cat i on.
Fi g.
4
i l l us t r at es t i m ng f or t he address
generator of Fi g.
3 ,
and spec i f i cal l y t he t i m ng for
ext ernal addr ess swi t ch 24 and i nt ernal address swi t ch
26
as cont r ol l ed r especti vel y by t hei r cont r ol s i gnal s
28,
30 of Fi gur e 3 . I ni t i al l y, external addr ess enabl e
swi t ch
24
i s cl osed ( t he ext ernal addr ess enabl e
cont r ol s i gnal
28
i s hi gh) t hus pr ovi di ng t he
ext er nal l y pr ovi ded addr ess on l i ne
34
di rect l y to
buf f er
2 2 .
Af t er t he i ni t i al addr ess A ( whi ch i s
external l y pr ovi ded) i s pr ovi ded t o buf f er 22, t he
s i gnal
@clock
goes l ow, and t he ext ernal address enabl e
cont r ol s i gnal
28
goes l ow, t hen t he i nt er nal addr ess
enabl e si gnal 30 goes hi gh, cl osi ng swi t ch 26. At t h i s
t i me t he addr ess s equencer
20
has gener at ed t he second
address A,+1.
As
seen i n t he t i m ng di agr am of Fi g.
4 ,
gener ati on of t he second address A+1 overl aps wi t h
provi si on of t he st ar t addr ess A. Thus wi t hi n t he
f i r s t t wo
clockkar
l l of s ta r t address
A,
and
second addr ess
A,+1
ar e out put t o buf f er
22,
i n cont rast
to
t he pr i or art of
Fi g.
2B
i n whi ch onl y
1 1/2
addr esses are out put t ed i t hi n t he f i r st t wo
occur r ences of cl ock&%
* clock-
Thi s hal f - c l ock
cycl e advant age i s t he chi ef benef i t of t he pr esent
i nvent i on. Thus t he gener ati on of addr esses ( Addr ess
-6-
?
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
12/179
sequencer out " i n Fi g. 4 ) i s one cl ock cycl e ahead
of
t hat i n t he pr i or ar t , and t here i s al so a hal f c l ock
t i m ng advantage i n t he out put addr esses ( "Addr ess
out" ) i n cont rast t o t he pr i or ar t
o f
Fi g. 2B.
I n one embodi ment t he seri al addr ess generat or of
Fi g.
3
i s f or use i n a burst
RAM
operat i ng i n page
mode, wi t h t he ext ernal l y pr ovi ded addr ess bei ng t he
f i r s t ( s t ar t ) address f or each page. Ther ef or e f or
exampl e a RAM chi p havi ng 512 wor ds per page r equi r es
sequencer i s a ni ne-bi t count er .
generator i n accor dance w t h t he i nvent i on i s al so be
sui t abl e f or ot her ( non- page mode) t ypes
of
s er i al l y
generat ed addr esses, wi t h t he addi t i on of convent i onal
st op c i rcui t ry t o term nat e a burst of predet erm ned
l engt h.
I t i s t o be appreci at ed t hat t he ser i al addr ess
generat or
o f
Fi g.
3
i s
used i n pl ace of convent i onal
seri al addr ess generator of Fi gs . 1A,
1B
as a port i on
pr ovi ded on l i ne
4 0
i s convent i onal l y connect ed t o an
address decoder whi ch sel ect s t he desi r ed memory cel l
or cel l s t o be wr i t t en t o or r ead f r o m
of t he RAM chi p i s not i l l ust r at ed herei n as bei ng
5
10
ni ne bi t addr esses, i .e. , 29 = 512. Thus, t he address
The ser i al addr ess
15
20
t ypi cal l y of a chi p. The addr ess out si gnal
( The r emai nder
25 convent i onal .
)
Fi gs . 5 t hr ough 10 show a det ai l ed schemat i c
of
one embodi ment of t he present i nvent i on,
corr espondi ng
t o t hat shown i n t he bl ock di agr amof Fi g. 3 except
t hat t he sequence cont r ol i s not shown, due t o onl y
3 0
upcount i ng bei ng avai l abl e. I n Fi gs.
5
t hrough
10
t he
Smal l number s adj acent each l ogi c gat e
i ndi cat e t he
wi dt h ( i n m cromet ers) of each t ransi st or gat e of t he
l ogi c gat e. Thus, llPlr i ndi cat es t he wi dt h of a
P
channel t r ansi st or gat e and llN1lndi cat es t he wi dt h of
3 5 an N channel t r ansi st or gat e. The gate l engt h i s equal
for al l t r ansi st ors except wher e a t wo number not at i on
-7-
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
13/179
5
10
BLOCK DI AGRAM
-
FI G. 3
St art addr ess
( An)
PRESET
External
Address
I nte rnal
Addr ess
i s used i . e. , t t48 /211means t he t r ansi st or gat e wi dt h i s
48
m cr ometers and t he t r ansi st or gate l engt h i s
2
m cromet ers. The st andar d ( def aul t ) t r ansi st or gat e
l ength i s 1.2 m cr ometer s, f or t hi s embodi ment .
di agramFi g.
3
and t he corr espondi ng si gnal
desi gnati ons i n schemati c Fi gs.
5
t o
IO,
and i n t he
cor r espondi ng t i m ng di agr am
of
Fi gs
1s;
t her e i s no schemati c equi val ent
to
t he sequence
cont ro l s i gnal i n Fi g. 3 si nce as expl ai ned above the
ci r cui t s hown i n t he schemati c
of
Fi gs . 5 t o IO uses
"up count i ng" onl y and does not have a down count i ng
mode opt i on.
Tabl e 1 shows t he si gnal desi gnati ons i n t he bl ock
(AI, 1::L:
I n Tabl e 1
SCHEMATI C - FI GS. 5-10 TI M NG CHART
- FI G. 11
Same Yn
Same Same
Addr ess
BN, ( Burst Address
N)
Addr ess
An
Sequencer
15
Sequence
cont ro l
Ext erna
1
Addr ess
Enabl e
I nte rnal
Addr ess
Enabl e
Address Out
25
( up count i ng i s i nherent
so
th i s cont r ol i s not
r equi r ed)
AH ( address Hol d) AH
[ f unct i ons as external
address l atchi ng and
di sabl e at s ame t i me]
BAEN- ( Burst Addr ess BAEN-
Enabl e- )
Y,-L,
YmLl
Y,-R,
YmR
( t wo Addr ess Out
pai r s per s i ngl e
address)
, i
30
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
14/179
( Not Shown)
Tabl e
2
shows t he ext ernal l y pr ovi ded i nput
5
s i gnal s / l i nes f o r t he ci r c ui t
of
Fi gs .
5
t o
10.
TABLE 2
- -
-
-
BCn ( Burst Count er Car r y
-
Output) BCN- 1 ( Burs t
10
N ME DESCRI PTI ON
A,
Ext ernal address
vcc power
L l ef t decoder address enabl e
R r i ght decoder address
YS
AS Addr ess Sense
enabl e
col umn addr ess power up
f-
c.
BE/ OE
AH
ATDOE
WE-
WE1
15
~-
mu1 pl ex
Burst enabl e/ out put enabl e
i nput
Ext ernal address enabl e
Output enabl e contr ol
W i t e Enabl e-
W i t e Enabl e
20
ROW - col umn address
25
-9-
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
15/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
16/179
ext er nal addr ess enabl e si gnal , cont r ol l i ng swi t ch
5 0
i n Fi g.
5
whi ch cor r esponds to swi t ch 2 4 i n Fi g. 3 .
42
of Fi g.
3
i s desi gnat ed si gnal BN i n Fi g. 5, and i s
swi t ch
26
i n Fi g.
3 .
Sw t ch
52
i s cont ro l l ed
by
t he
i nt ernal addr ess enabl e si gnal whi ch i n Fi g. 5 i s
desi gnat ed BAEN- . ( The i nver se of si gnal BAEN. )
It
i s
t o be under st ood t hat t he si gnal BN i s pr ovi ded f r om
bel ow.
Buf f er
22
of Fi g.
3
cor r esponds t o t he buf f er
ci r c ui t r y 5 6 of Fi g. 5. The out puts of t he buf f er
c i r c ui t r y of Fi g. 5 ar e des i gnat ed as a ' t l ef t l lnd
(Yn-=,
Y Yn R and Y m R . ( Note t her e ar e t wo decoders ,
one f or t he l ef t memory bl ock and t he other f or t he
r i ght memor y bl ock. ) The out put of buf f er
56
cor r esponds t o one bi t of t he addr ess out si gnal of
Si m l ar l y , t he i nt er nal addr ess suppl i ed on l i ne
5 pr ovi ded as an i nput
t o
swi t ch 52 corr espondi ng
to
10 t he count er por t i on of t he address generat or, descr i bed
15
" r i ght " Y ( col umn addr ess) and t he i nverses t hereof
2 0 Fig. 3 .
The l ef t and r i ght (L, R s i gnal s of Fi g. 5
cont r ol t he buf f er 56 out put s, t o pr ovi de address
s i gnal s
to
l e f t
or
r i ght decoder s r especti vel y.
provi ded i s col umn address power up si gnal
YS,
whi ch
di sabl es t he i nput addr ess pass when t he chi p i s i n the
pr echar ge st at e.
t he c i r c ui t of Fi g.
5
( desi gnat ed BA,) i s an i nput t o
t he associ ated Count er Cel l , as descri bed bel ow.
30
addr ess sequencer
20
of Fi g.
3
pr ovi di ng
a
ni ne- bi t
Al so
25
The i nt er nal st art addr ess out put by
Fi g.
6
shows t he counter ( cor r espondi ng t o t he
count .
60-2,
...,
60- 9 connect ed as shown. Each cel l has as a
f i r st i nput t he i nt er nal st art addr ess BA. The second
c el l i nput i s the Carr y si gnal desi gnat ed BC,l f r om t he
si gnal PRESET, and a second t i m ng si gnal
qclock.
The count er has ni ne i dent i cal cel l s
60-1,
35 pr i or cel l . Each Cel l al so recei ves a f i r s t t i m ng
The
-11-
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
17/179
cv
out put of each count er cel l i s an out put addr ess bi t BN
( whi ch i s t he address out)
whi ch t hen goes t o buf f er 5 6
of Fi g.
5, and a second out put BC, whi ch i s t he car r y
val ue
to
t he subsequent cel l .
occur s onl y once i n t he addr ess sequencer 20 and
ser v i ces al l ni ne addr ess buf f er c i r cui t s ,
of
whi ch
onl y one i s shown i n Fi g.
5 .
5
I t i s t o be under st ood t hat t he count er of Fi g. 6
Fi g. 7 shows det ai l s of one of t he cel l s of Fi g.
10 6 . Si gnal BC,,l i s the car ry i nput s i gnal , whi l e s i gnal
BA, i s t he external addr ess s i gnal .
are @clock and PRESET ( and t hei r i nverses). The cel l
out put i s t he t t r eal l tddr ess BN and a carr y val ue Bc,
t o t he next cel l . The cel l of F i g. 7 i ncl udes
15
convent i onal l y a l ef t - hand s i de whi ch i s t he 9ts l ave11
s i de 70 and a r i ght hand si de whi ch i s t he 9nast ert 9
s i de 72 ( i ndi cat ed by the br oken l i ne). Thus, t here
are t wo l at ches 70a, 72a one or each si de of t he
count er cel l , w t h one l atch at any one ti me updat i ng
i t s val ue whi l e t he second l at ch i s hol di ng t he
pr evi ousl y cal cul at ed dat a and tr ansm t t i ng i t as
out put .
Fi gs . 8 , 9 and
10
show ci r cui t r y for gener ati ng
t he t i m ng s i gnal s
f o r
t he ser i al addr ess generator .
The t wo exter nal l y pr ovi ded ti m ng si gnal s are RAS and
CAS-PAD. These i n t ur n gener at e as shown t he i nter nal
t i m ng si gnal s. The sequence i s t hat t he i nput c l ock
s i gnal CAS-PAD gener at es t i m ng si gnal C A S l b whi ch i n
t urn generat es si gnal BAEN- whi ch i n t urn generat es
30 s i gnal @clock. The @clock s i gnal
of
Fi g. 3 i s shown i n
t he t i m ng di agr amof Fig&
1 1 .
t i m ng s i gnal CAS1b whi ch i s a t i m ng si gnal
for
t he
above- descri bed count er ci r cui t r y. Note t hat si gnal
CASlb
i s i n par t det er m ned by t he si gnal BM (burst
The t i m ng s i gnal s
20
2 5
)J
/ l ( b l
Fi g.
8
shows t he ci r cui t r y whi ch pr ovi des t he
3 5
-12-
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
18/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
19/179
CL AI M S
.. -. .
We claim:
5
i
10
15
2 0
25
3 0
3 5
generator; and
inal of the address
generates a second
+r il e a first
generator;
switch.
comprising:
enable switch; and
enable switch, wherein
duration
o f
the first: a
addresses, and
enable switch is closed
addresses.
-14-
,,
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
20/179
3 . The addr ess gener at or of Cl ai m 1, wher ei n t he
second addr ess i s out put t o t he out put t erm nal
of
t he
addr ess sequencer onl y when t he i nter nal addr ess enabl e
swi t ch i s cl osed.
5
4 .
The addr ess gener at or
of
Cl ai m
1,
f ur t her
compri si ng a buf f er seri al l y connect ed bet ween t he
out put t er m nal of t he addr ess s equencer and t he out put
t erm nal
of
t he address generator .
1 0 .
Cl ai m 2 , further
7 . The addr ess gener at or
of
Cl ai m
2 ,
wher ei n t he
25 address sequencer i ncl udes a count er havi ng a mast er
por t i on and a sl ave por t i on.
8 .
The addr ess gener at or of Cl ai m
1,
f ur t her
compri si ng means f or pr ovi di ng an exter nal l y gener at ed
ext ernal l y generat ed address i s a f i r s t addr ess of a
page of t he r andom access memory.
30
addr ess t o the addr ess i nput t er m nal , wher ei n t he
f o r a ser i al l y addr essed
-15-
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
21/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
22/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
23/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
24/179
Atty. Docket No. M-2595 US
I hereby appoint the following attorney(s)
and/or agent(s) t o prosecute th is application anc
to transact all businesa in th e United States Patent and Trademark Offic e connected
therewitht
Alan H. MacPherson (24,425); Thomas S . MacDonald (17,774); Richard Franklin
(19,128)r Kenneth E. Leeds (30,566); Paul J. Winters (25,246); Brian D. Ogonowsky
(31,988); David W. Heid (25,875); Guy W. Shoup (26,805); Forrest E . Gunnison
(3 2, 89 9) ~ orman R. Klivans
3 3 . 0 0 3 ) ;
David
I.
arroll (29,903); Edward c. Kwok
(33,938); Patrick T. Bever (33,834); David E. Steuber (25,557); Michael Shenker
(34,250); Laura Terlizzi (31,307); T. Lester Wallace (.34,748)1 Ronald J. Meetin
(29,089); James D. Ivey (37,016); Andrew C. Graham (36,531); Ken Jo hn Koestner
(33,004); Hark P. Kahlar (29,178); and Stephen A. Terrile (32,946).
Address all teleph one calls to porman R. Klivans at telephone no. (408) 283-1222
Address all correspondence to Norman R. Klivans
SKJERVEN, MORRILL, MacPHERSON, FRANKLIN & FRIEL
25
METRO
DRIVE. SUITE 700
SAN JOSE, CALIFORNIA 95110
I hereby declare that all statements made herein of my own knowledge are true and that all
statements made on information and belief are believed to be true; and further that thes e
Statements were made with t he knowledge that willful false statements and t he lik e so made
are punishable by fine or imprisonment, o r both, under Title 18, United States Code,
s
1001
and that such willful false statements may jeopardize the validity of the application or any
patent issued thereon.
Full name of sole or first inventor Jinvonq Chuna
Inventor's signature Date
Residence
LOB
Altos Hills.
Post Office Address 12445 Robleda Road
California U.S.A. Citizenship U.S.A.
Los Altos Hills. CA 94022
Full name of second joint inventor, if any Michael A. Murrav
Inventor's signature Date
Post Office Addrese 16432 NE 1 th Street
Citizenship
U.S.A.
esidence
ellevue. Waehinaton 9800 2
Rev.
931109
- 2 -
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
25/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
26/179
Fig. 2B
(prior
art)
-
.
...
..-.
.
-.
.c i .
- - . .
. _
. . .
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
27/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
28/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
29/179
v
R
.%J
7 8 26
5 5
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
30/179
08/265535
c
t
P
3
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
31/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
32/179
F8/265535
l l
P a
M 65535
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
33/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
34/179
I
\
/
:
I
J
I
X
3
.e
7
\
08/265535
v,
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
35/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
36/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
37/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
38/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
39/179
the undersigned at (408: 283-1222, if there are any questions.
This form is being submitted in triplicate.
Respectfully submitted,
Norman
+ P . D w - d
. livans
Attorney
for
Applicants
Reg. NO. 33,003
1 ereby certify that this correspondence is being deposited with the
United States Postal Service ae flrst cla ss mail In en envelope
cddressed to: Commissioner
of
Patentsand
Trademarks,
Washington,
D.C., 20231,on
- 2 -
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
40/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
41/179
. .
Atty. Docket
No.
M-2595 US
I 'hereby appoint the following attorney( ) and/or agent(s) t o prosecute this' application and
to transact all business i n the United States Patent and Trademark Office connected
therewithr
Alan H. MacPherson (24 423 ; Thomas
5 .
MacDonald (17,7741; Richard Franklin
(19,128); Kenneth
E.
&
$0,5661; Paul
J.
Winters
( w ) t
rian D. Ogonoweky
(31,988)j David W. Held (25, 75); Guy W. Shoup ( 2 6 , 8 0 5 ) t Forrest E. Gunnison
(32,899); Norman
R.
Klivana J;003 ; avid H. Carroll -3); Edward C. Kwok
(33,938); Patrick
T.
Bever 33 8 3 4 ) ; David E. Steuber t u ) ; Michael Shenker
'
d
34,250); Laura Terlizzi ,J07);
T.
Lester Wallace w);onald
J.
Meetin
(29,089); James D. Ivey
( 3 m ;
ndrew
C.
Graham (1 Ken John Koestner
(33,004); Mark P. Kahlerm ;nd Stephen A. Terrile (-6),.
I
.,
one no. (408) 283-1222
..-
A --.-
the like
so
made
Full name of sole or first inventorw
-
-,..-.
or's
nce
ffic
3v. 931109
- 2 -
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
42/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
43/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
44/179
Ser i al Number : 0 8 / 2 6 5 5 3 5
Art Uni t : 2511
-3-
Claim I i e j e c t i o n s
- 35
USC
102
4. The fo l l ow ng i s a quotat i on of t he appr opr i at e par agr aphs
of 35
U. S. C.
102 that form t he basi s f or t he r ej ecti ons under
t hi s sect i on made i n thi s Of f i ce act i on:
A
person shal l be ent i t l ed t o a pat ent unl ess --
(a)
t he i nvent i on was known
or
used
by
ot hers i n t hi s
count r y,
or pat ent ed or descr i bed i n a pr i nt ed publ i cat i on
i n thi s or a f or ei gn count r y, bef ore t he i nvent i on t her eof
by t he appl i cant f or a patent .
5. Cl ai ms 1 - 4 ,
8 -10
are r ej ect ea under
35
U. S.C.
102(a)
as
bei ng ant i ci pat ed by t h e Pr i or ar r
as
shown i n Fi gs. 1B and
2B).
The Pr i or art d i s c l o s e a s er i al il ic i e s s yener at or havi ng al l t he
f eatures as rec i t ed i n c l a i m
1-4
9 - 9
and met hod
of
gener ati ng a
sequence
o f
address as
r e c i i 4
i r i c l a i l ?
10.
Allowable
S u b j e c t
Matter
6.
re j ected base c l ai m b u t would be al l ovabl e i f r ewr i t t en i n
i ndependent f o rm i nc l udi ng a i l
of.
the l i m ta t i ons o f t he base
cl ai m and any i nt erveni nq cl ai ms.
Cl ai ms 5-7 are obj ected t o a s bei ng dependent
upon
a
Conclusion
7 .
The pri or ar t made of r ecor d dnd r:ot r el i ed upon i s
consi dered per t i nent t o appl i cant ' s di scl osure.
Ogawa (5,097,4471,
Ehy
c-t a.
[5,:46,431)
and Mor i
(5,260,905)
di scl ose sem conduct or i w m o r y de-^ I rv:: I I ~ I V ny ser i al access
memor y.
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
45/179
.----- - -
Serial Number: 08/265,535 -4-
Art Unit: 2511
8 .
to
S. M a i at telephone number (703) 305-3497.
Any
inquiry concerning this communlcation should be directed
S .M. PRMARY EXAMINER
December 4, 1994
GROUP
2500
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
46/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
47/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
48/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
49/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
50/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
51/179
...
F G.3A
F
G.3B
r
SAS
S AS
S A T
S A D
MAD
S A
S O M
Sbeet
3.
of 12, 5,Q97.,$47
I I
I
I
I
...
CAD n - l
x n X n+l
.
I I
i
I I
t
I
SA
t I '
I I
SOM
I
L A t
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
52/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
53/179
US. atent
Sheet
5
of 12 5,097,447
-
m
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
54/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
55/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
56/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
57/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
58/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
59/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
60/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
61/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
62/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
63/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
64/179
7
5,097,447
8
flops 330
-33m. and a group-B redundancy address
supplied from the ROM.
h e
decision results AG and
B G which are derived from the redundancy decision
circuits
36
and 37, respectively,
are
supplied
to
a gate
and latch circuit
38,
which outputs the redundancy
switching signal SOM blued on he results AG and BO
when the serial access strobe signal SAS rises.
Refemng
IO
FIG S. 7(A), 7(B).
7(C), 7@),
7 E ) . 7 0 ,
7(G), 7 a ) . 7(1). 7(J). and 7(K). the slave address S AD
related
to
the group
A s
renewed each time the clo ck
signal
81 rises,
that
is,
the
serial
access strobe signal
SAS
falls.
T h e
master
address
MAD
related
to
the
group
A
is renewed eac h time the cloc k signal
@I
rim.
that
is,
the serial access strobe signal
SAS
ises. When
the group-A counter 300 makes a round
of
counting, the
carry circuit 32 outputs
the
carry
QA. n
esponse
to
the
carry
QA.
he slave address
SAD
related
to
the group
B
is renewea when the clo ck signal G2 rim hat is. when
the serial
access
strobe signal SAS falls, and the master
address MAD related
to
the group
B
is renewed when
the clock signal
@Irises.
that is, the serial acccss strobe
signal SAS r k s .
FIG. 8 ir a diagram of he entire structure of a semi-
...
signal
SAT.
a clo ck signal cO5~shaving he m e iming
as
the serial access strobe signal SAS, and a clock signal
CpSAj
which
is
M
nverted signal
of
the signal SAS. An
address counter 50 rcceives the column address signal
J and all the clock signals supplied from the clock genera-
tor 496, and outputs the slave address S AD and the
ms ter address MAD. A redundancy decision circuit 51
compares the slave address signal
SAD
with a redun-
dancy address
signal
supplied from a read only memory
10
@OM) 49c. and outpuls a redundancy decision signal
Sx.
h e
edundancy address
signal
indicates the redun-
dancy
cells
provided in the memory
cell
m a y
43.
A
gate and latch circuit
52
temporarily
stores
the redun-
dancy decision circuit
SH,
nd outputs the same s the
T h e
decoder
54
consists
of fust
and second decoders
5 Q
and
5 4 6 BS
shown
in FIG. 9.
When
the redundancy
switching signal SOM
s
inactive, the
f i t
d d e r 4 0
is selected.
On
the other hand, when the redundancy
20 switching signal SOM
is
act ive, the xc ond decoder
5 4 6
is
wlected. Each bit of the decoder output
is
supplied
with the gates of two
MOS
ransistors
T1
and T2,
which
arc
coupled to corresponding signal
lines
ofa bus
15
redundancy switching signal
SOM
to
a
decoder 5 4 .
conductor memory device according
to a
preferred
58. A
data rcgisler 53 has
a
storage capacity equal
to
embodiment
of the
present invention. Referring
toFIG.
25
one line of the memory
cell
array
43,
and includes a
8, the memory device includes a R A M 40 and a SAM group 530 of register
cells
and a group 536 of redun-
(%rial acccss memory) 41.
T h e
RAM
40
is configured dancy register
cells.
ach
of
which is coupled lo a corrc-,
BI follows.
The RAM 40
is supplied with an external sponding pair o f
MOS
ransistors such
as T1
and
T2.
address signal which has
been
multiplexed.
An
address
T h e
edundancy register
cells a re
coupled
to
the con e.
huller
42 receives the
externa l
address signal and sepa-
30
sponding redundancy
cells
provided in the memory Cell
rarely outputs
a
row address signal and a column ad- array
43. T h e
decoder
54 selectsoneof
the register
cells
dress signal.
A
row decoder
44
decodes the row address on the basis of the supplied master address
MAD. ' Ihe
signal, and selects one word line from among
a
plurality data register 53
is
connected
to
the bit lines
of
the mem-
of word liner provided in
a
memory cell array where a
o ry
cell array
43.
Turning
to
FIG . 8. a
serial
input/out-
plurality of memory ce lls MC arc arranged in an array.
35
put buffer
56 is
interposed betwee n a serial input/output
Some ofth e memory cells arc redundancy cells located terminal
55
coupled to an external data line not shown)
at a prcdctermined area in the memory cell array
43.
and the data register
53,
and passes serial data
in
the
The redundancy
cells
are replaceable with (is.. used in
bidirection.
place of) defective cells in the memory cell array 43. A
FIG.
0 is a circuit diagram o f he address counter 50.
column decoder 45 decod es the column addrcss signal,
40 T h e
ddrers counter 50 is made up ofmluter.slave type
and
relccts
one bit line out of
a
plurality of bit lines in flipflo ps
FFo-FF.
which amount to the
number of
bits
the memory
cell
array
43. A w n w
amplifier and
I/O
of the column address signal.
gate
46
amplifies the potential
of
he selected bit line,
FIG.
11 is a
circuit diagram of the muter-slave type
m d performs data reading and writing. An input/out. flip-flop
FFo
E a c h of the other flip-flops FFl-FF"
s
put buffer
48
is interposed between a random input/out-
45
configured in the
snme
manner
m
he flip-flop
FFo
A
put
terminal 47 and the sense amplifier and
I/Ogale 46
slave part S
of the
flip-flop FFoincludes
a
f irst gate
64 .
and pa w s parallel data in the bidirecrion.
a v c o n d
gate
71
and
a
slave-side flipflop
ED.The
fmt
A clock generator 490 is supplied from an extemsl gate 64
is
made up of two Pchannel MOS ransistors
device such as a
CPU
with
a
row addrtss strobe signal
60
1, and two N-channel MOS transiston 62.
a
m,
column address strobe Signal
m,
write en-
H)
which
are
totem
pole
connactcd.
T h e
econd gate 71 is
able si
nd
m,
nd a
transfer signalm.
he
transfer
made
up
of
three P-channef
MOS
ransistors
65,66
and
signal
h nstructs
the R A M
40
and the SAM 41 to 67, and chree N-channel MOS transiston 68 .69 and 70,
operate
in
synchronism with each other.
T h e
clock which are
totem
pole
Connected. T h e
slave-side flip
generator 494 g e n e n t n the initial counter addreu
set-
flop
80
is made up of four Pchannel
MOS
ransistors
cing signal SAT. which is suppliedto I clock generator 55 72. 73, 74 and 75, and four Nchannel MOS
transiston
49b
related
to
the
serial
access
memory
41.
Further, the
76 .77 ,78
and
79.
T h e
fmt
ate
64
inpuu
a
bit &ofthe
clock
generator
490
generates
various
control signals,
column
ddrers signal when the cl oc k signal aSArb
L
which u e upplied to a
RAM pori 57
coupled
10
the @ow).' and
the
clock
Signal -
is
"H high)
The
slave-side flipflop
80
latches the input addrers bit
erminal 47.
On he other hand, the arid a memory (SAM) 60 when the c lo ck s igna l a m s w it ches
from "H"
o "L"
41 is
configured
as
follows.
Tbe
clock
generator 496
in
othe r words, &e clo ck signal switches from
receives a e nitial counter address setting signal SAT % to
"H),
hat is, when the wrial access strobe signal
from the clock generator 490 and the serial
access
SAS falls. Then the slaveiidc flipflop 80 OU I PU U
the
strobe
signal
supplied from th e CPU Tor example. and
latched bit & a s a bit Ao'
(SAD) o
a
m s t e r
part M of
generates the following cloc k signals. Th at is, the cloc k
65
the flip-flop F Foa nd the redundancy decision circuit
51
generator
496
generales
a
clock signal
Oarof he m e
r b o m
in FIG.
8.
t h i n g as
the
initial cou nter address setting signal SAT,
The
muter part
M
includes a
fmt gate
85. and a
a clock signal which
is an
inverted signal
of
the
master-side flipflop 92.
The first
gate
85 is
made up
of
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
65/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
66/179
5,097,447
11 12
said second serial access addrcsr by a half
ofone
period
of
said pulse signal.
4.
A semiconductor memory device as claimed i n
claim
1,
wherein said selecting means includes gate and
latch means for inputting the comparison result from
5
snid redundancy decision means and outputting the
same
as
a redundancy switching signal in synchronism
with the second edge o f said pulse signal.
5. A semiconductor memory device
as
claimed in
claim
4,
wherein raid gat e and latch means is outputting IO
said redundancy switching signal during one period of
said pulse signal from said second edge thereof.
6.
A semiconductor memory device
as
claimed in
claim 1, funher comprising clock generating means for
generating fin; and second clock pulses which are
180
I5
said serial accesz memory cornprishg:
degrees out of ph ax with each other. and said first and data register means or storing data to be written into
second address generating
mcans
generate said first and
or
read from said random access memory and to
be
second seiial access addresses in synchronism with said input from
or
output to an external signal line in
i r s t and wcond clock pulses. respectively.
serial form,
aid data register
means
including a
first group
of
register
cells
and a xcond group
of
claim 6. wherein said first address generating m a n s redundancy cells:
includes
a
slave flip-flop controlled by said first and
first address generating means. provided for each
of
second clock signals, and raid second
address
generat- . said groups o f address bits, for generating a pan o f
ing means includes a master flip-flop controlled by said
a first serial access address starting from
an
initial
first
and second clo ck signals. address for correspond ing one
of
the groups o f
8. A semiconductor memory device as claimed
in
address bits supplied from an external device;
claim 7. wherein said slave flip-flop provided in said second address generating means, provided for each
first address generating means is connected to said mas- ofsaid groups o f address bits and coupled
to
said
ter flip-flop provided in said second address generating related
i r s t
address generating means,
for
inputting
means.
the related pan of said first serial access address
9. A semiconductor memory device as claimed in and generating a part of
a
F o n d s erial a ccess
claim
I.
wherein said first address generating means address
to be
supplied
to
said data register means.
includes a plurality of slave flip-flops amounting to the said first serial access address having the
m e
number
of
bits forming said lint serial access address. wnten ts as said w o n d serial access address and
and said second address generating means includes a
35
preceding said second serial access address by a
prcdetennined time;lurality
of
master flip-flops amounting to the number
of
bits forming said second serial access address. redundancy decision means, provided for each of said
10. A semiconductor memory device as claimed in groups of address bits and coupled to said first
claim 1.wherein said first serial access address is com- address generating means, for determining whether
posed
of
n bits (n i5
an
integral). and said redundancy
do
the pan o fsaid first
serial
a cc es s a dd re ss is th e m e
address is composed o f n bits, and wherein said redun- as a corresponding part of
a
redundancy address,
dancy decision means includes logic gate means for and
corresponding bits o f aid first serial access address and selecting means. coupled to said redundancy decision
said redundancy address and for outputting th e compar-
means,
for selecting one
of
said first and second
ison result.
groups o f said data register
means
on the basis o f
11. A semiconductor memory device as claimed in the comparison results supplied from said rtdun-
claim 10, wherein said logic gate means includes exclu- dancy decision means provided for the groups of
sive-NOR
gates
provided for the respective bits to be address
bits,
said data registered in said data regis-
compared. and
a
NAND gate which receives output Ler
means
being accessed
in serial
form by said
signals of said exclusive-NOR gates and outputting the x) second
serial
.cccss address.
Comparison result.
wherein when ssid recond serial access address
is
12.
A
semiconductor memory dcvice
as
claimed
in
supplied to said data register means, said da~a
s
c ldm 1. funher comprising generating
means
for gentr - input in or output from said data register
means
in
series.
generating means generates stid fint rerial
access
ad- 55 . 18.
A
emiconductor memory device I L ~ laiared in
dress starting form slid initial address when said indica- claim
17,
wherein said fm t add rss
generating means
tion signal b supplied to said fin1 address generating includes
first
counter mcans for inputting said initid
means.
u~ess
ddress supplied from the external device in
13. A m i c o n d u c t o r memory de*
as
claimed
in
Synchronism with a f i ~ tdge of a pulse signal supplied
'claim 1. wherein said initial address corresponds to a
60
from the exrtmal device and for incrementing the re-
column address to be supplied to said random
-
ted pan of aid
f i t
s e d - addrcss in syn chr e
KIlClTlOry.
nism
with the fubKq uenl first edges
of
said pulse signal,
14. A m ico n duct o r m em o ry device as claimed in m d s ai d m n d d dr es s g en er at in g
means
includes
xc
claim 1 funher comprising a read only memory which and counter means for outputting the related pan of
stores said redundancy address.
65
said
f i rs t
serial access address
as
the related pan
o f
said
IS.
A miconductor memory device
as
claimed
in
sccond serial
a c e s address
in synchronism with a
m -
claim
1.
wherein said semiconductor memow device i~ ond edge of said
pulse
signal following said fmr d g e
UI image memory device which handles image data. thereof So that said
first
serial access address derived
16. A
semiconductor memory device as claimed in
claim 2, wherein the first edge
of
said pulse signal is a
falling edge and th e second edge t hereo f is a rising edge.
17. A semiconductor memory device comprising:
a random access memory including a plurality
of
memory cells and parallel rmd/write
means
for
writing data and rending data into and from said
memory cells on the basis of address information;
and
a
serial
access memory coupled
10
said random acce ss
memory,
said address information being divided into groups
each composed of a predetermined number of ad-
dress bits,
..._
7.
A
semiconductor memory device as claimed in
20
25
30
45
ating
an
indication signal, wherein the said first address
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
67/179
,
. . . . . . . . . . . . . . . . . . . .
. . . . . . . . .
. ..t.y
. _ . _ _ ...+.-.:. : < ,;: 'I ;.:'-
.
. . . . . . .
. . . . . . . . . . . .
....
._..
. . ~ ~ , ~ ,
. . . . . . . .
......
. . . . . . . . . . . . . . .
.... .
. . . . . . .
5
...- ...- : ........... .;...
.-...
: $ ;. -1:
ccpyc: 5;i P.: - - %
.- i
. -
.....
,eq F p n n d M.OS t ian -
rter 190. n transmksion'gatk 160,
+=A
2 0 0
goes
back high and
+I,VA
280 goes back
low.
Fro m 17 to,tg (after ts).,another address may be loaded
onto external address pad 100 in preparation for anoth er
connected via inverter 190. he gate of transistor
170
at 19). Thus, instead
of
inputting a new recall address
also receives address enable input +=A 200. from pad
100.
one may choose instead to use the incre-
The output of transmission gate 160 lows through IO mcnted address on counter outputs 20 lo automatically
bvt1W~210'ahd'ppears' output 220 ,.w hic h hput s recall the next consecutiv e page.'ln this case, during the
:rintoedd.r& dad din g &cii tr yZZS ehc% d
to
address
I:
ubiquent page recall operation.
4 1 . ~ ~
80
going
high
'' kl ecto r c i rcui t
90.
.
. .
ai tz'sends address signals (Ai) 230, which now specify
Another input to address selector circuit
90
is input the address o f he next consecutive page.'through trans-
fAi)Z30,-bvH.hich conn ectsf o transmission gate.240. The. Il..mission gates e . y d nverters 210 o address decoding
output of transmission..gate '240-then Tows through circuitry 225.
invener 210 nd ends upon asoutput 220,which is input
In operation, as discussed above, the address decod-
to the address decoding circuit 225,
as
shown in FIG.
4.
ing circuit 225 shown in
FIG.
4 is designed such that
Transmission gate
24-9,
similarly IO transmission gate
only of the word lines WL , and its associated recall line
A60 , . co mpri ses n-channel transistor 250. pchannel tran-
20
RL , wi ll be a logical 1 or a given page recall operation.
: istor
2 6 0
and inverter
270,
and is controlled b y internal
Thus, for instance, word line W L, may be activated,
address enable input (+I,vA) 280 into the gate of transis- and'then all of the bit lines Blthrough B , are also acti-
vated. Th e recall line RL n s utilized to recall the data
dress stored on the entire page o f cells, i.e. all of the cells
is
as
25 along word line WL,. Th e dita .are retrieved by 'the
Gn ie Jmplifiers, which may
be'convenIiorial'in'dc'sjgn.
fa] &&pz
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
77/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
78/179
* '
U.S. Patent ' Sep. 19, 1995 Sheet 9
of 16
5,452,261
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
79/179
(FILE 'USPAT' ENTERED AT
10:
17:28
ON
02 DEC 94)
L1
L 2
L3
L4
L 5
L 6
L 7
8875 S
ADDRESS
(3W) ( COUNTER# OR SEQUENCER#)
7556 S FIRST (2W) ADDRESS
5020 S SECOND (2W) ADDRESS
716 S SERIAL? (2W) ADDRESS?
2084 S L1 AND
L2
1013 S L3 AND L5
30
S
L 4 A N D L 6
FILE
JPOABS' ENTERED AT 10:33:29 ON 02 DEC 94
4257
S L1
8
L 9
L10
L11
L12
L13
L14
L15
L16
L17
721
S
L 2
4 0 9
S
L3
70 S L 4
300 S L 9 A M 3 LID
0 S L11
AND L12
15
S
LS AND L11
30 S
L8
AND L12
62 S
L8
AND L9
4
S
L16 AND PRESET?
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
80/179
=>
d
his
FILE 'USPAT' EN TERED AT 13:48:56 ON 01 DEC 94)
L1
L2
179S SERIAL ADDRESS
353
S
BURST (5w) (MEMORY
OR
RAM OR DRAM)
L3
L4
8508
S
ADDRESS
(3W)
SEQUENCER OR COUNTER)
100
S
L1
AND L3
FILE 'JPOABS' ENTERED AT 14:Ol:ZOON 01 DEC 94
L5 58
S
L1
L6 39SL2
L7 4016SL3
L8 8SL8ANDL9
L9
8 S L8AND LIO
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
81/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
82/179
-
365-230.09
AL;
2 5 1 1 SX
C C C Z l
X R 5 / 2 5 G i O C 5
u . v - - u u U ~ ~ I L I ~A ~ U I V TND TRADEMARK
OFFICE
CERTIFICATE OF CORRECTION
Page
1
of
3
PATENTNO. :
5,260,905
DATED
:
November
9, 1993
INVENTOR(S)
:
Toshi k i Mor i
cnrrerted
asshown below:
Col umn 1, L i ne 28, " i " shoul d read - - i n- - .
Col umn
1,
L i ne
68,
"pr ocess posi t i on" shoul d read - - pr ocess.
The- - .
Col umn 2, L i ne 22, "a re , shoul d read - - are ; - - .
col umn
2 ,
Li ne
2 6 ,
del et e "a" ( f i r s t occurr ence) .
Col umn
2,
L i ne 31, " a" ( second occur r ence) shoul d r ead - - at - - .
Col umn 2, Li ne
49,
af te r "ar ray" i nser t
--1--.
col umn 2, Li ne 57, " comput e" shoul d r ead - - comput er- - .
Col umn 3,
Li ne 61, del et e "t her e".
Col umn
4,
Li ne 61,
59
shoul d r ead --69--.
Col umn
5,
Li ne
5,
" l i es " shoul d read - - l i nes - - .
Col umn
5,
L i ne 11, 56 shoul d r ead --57--.
Col umn 5, Li ne 14, 5 6 shoul d r ead --57--.
Col umn
5,
Li ne
33,
" f or m" shoul d read - - f rom- .
Col umn
5 ,
Li ne
5 3 ,
"count er , " shoul d r ead - - count er
8.--..
Col umn 5, Li ne 55, " i n" shoul d read - - of - - .
Col umn
5,
Li ne 56, "o f " shoul d read - - i n- - .
It K catifid that m o r appears in the aboveidentified patent
and
that said Letters Patent is hereby
-
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
83/179
- I
....
UNITED STATES PATENT
AND
TRADEMARK OFFICE
CERTIFICATE OF CORRECTION
Page
2 of
3
PATENTNO.
: 5,260,9~5
- November 9, 1 9 9 3
ATED
INVENTOR(S)
:
Toshi ki Mor i
torretted
assfiom,
below:
Col umn 5, L i ne
59,
del et e "present ".
itu
certified
that m o r appears
in the above-identified patent
and
that said Letters Patent
is
hereby
-
Col umn 5 , L i ne
60,
af t er " t he" i nser t - - present - - .
Col umn 6, Li ne 26, del et e "a".
Col umn
6,
L i ne 32, del et e "c l ocks" .
Col umn 6 , Li ne 4 1 ,
" i nput t i ng t he" shoul d read - - i nput i nt o- - .
Col umn 7 , Li ne 3 "f or m" shoul d r ead - - f r o m - .
Col umn
7,
Li ne
21,
"t hr ough" shoul d read - - to- - .
Col umn 7, L i ne 2 2 , "t o" shoul d read - - t hr ough- - .
Col umn 7, Li ne
4 0 ,
"out put " shoul d r ead - - out put s- - .
Col umn 7, L i ne 4 1 , af t er "12-1," i nser t - - and- - .
Col umn 7, Li ne
4 2 ,
"one" shoul d r ead - - cor r espondi ng- - ,
Col umn 8, L i ne
19,
af t er " cor r espondi ng" i nser t - - t rans f er - - ,
and del ete "t r ansf er" .
col umn 8, Li ne
25,
"agate" shoul d r ead - - a gat e- - .
Col umn 8 , Li ne 4 3 , "f orm" shoul d read - - f rom- .
Col umn 9, Li ne 1, 13 shoul d read --14--.
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
84/179
. .
.
- -
. .
-
. ...
.
UNITED STATES PATENT AND TRADEMARK OFFICE
CERTIFICATE
OF
CORRECTION
PATENTNO. :
5,260,905
Page 3 of 3
DATED :
November
9, 1993
INVENTOR(S)
: Tbshik i .
MGri
Itk
ertified hat
error appears in
the
ahowidentified patent and that s a i d Letters Patent ishereby
Wrrected
a~ s hm~n
elow:
Column 9, Line 7 ad
should
r e a d
- - a s - - .
Column 9 , Line 53, "on" s h o u l d read --one--.
Column 10, Line
50,-
"form" should read
--from--.
~ .
Signedand
Sealed fflis
Twentyfourth
Day
of May, 1994 I
Attest
BRUCE
LEmUN
Commirrionrr of Parrnrr
and
T r a d r m o r b
ttestirig
Officer
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
85/179
U.S. Patent
Nov.
9, 1993
Sheet 1
of
8 5,260,905
se
RAS.CAS
9
DTOE
DT se,
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
86/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
87/179
U.S.
Patent
5,260,905
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
88/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
89/179
U.S.
Patent
b
iz
Nov. 9,
1993
I
I
___.
Sheet 5 of 8
. #
Y
2
.c
b
cv
5,260,905
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
90/179
U.S.
Patent
....
Nov.
9, 1993
Sheet 6
of
8 5,260,905
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
91/179
U.S.Patent
NOV.8, 1993
Sheet 7 of
8
5,260,905
....
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
92/179
U.S.
Patent
Nov.
9,
1993
Sheet 8
of
8
5,260,905
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
93/179
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
94/179
. 5,260.905
3
the memory itself docs not provide
a
function which
enables the continuous writing of data such 8 5 the dy-
namic image
A
considerably complicated circuit has to
be
nstalled outside the memory in order
to
display the
dynamic
images
by the conventional image display
apparatus.
SUMMARY
OF
THEINVENTION
An
object of the prcsent invention is therefore to
provide
a
multi-port memory capable of transferring
data to 8 m em or y m a y so LE to display
a
dynamic pic-
ture image or the like at an arbitrary position with the
desired size
on
the screen in
a
simple circ uit structure.
In order to achieve the aforementioned objec tive, in
a first embodiment
of
the present invention, a xm ico n-
ductor memory is provided having a memory array
with a random access function, a firstwrial access mem-
ory with at least one serial output function, a second
serial access memory with at least one
xrial
input func-
4
take in the data,
a
serial address counter which counts
the cl ock cycle s after laking an address signal from the
address signal input means and generates a serial ad-
dress moving sequentially from the bit position where
5 the first and second registers start to take in the input
data to a bit position of more significance, B serial bit
selector which selects the bit position indicated by the
scdal address, a transfer gate to transfer the content of
the fmt register to
a
m em ory m y . and control means
' 0 for controlling per every bit
a
transfer control signal
input to the transfer gate in acco rdance with
an
output
of
the sccond register.
Th e semiconductor memory embodied by the prcsmt
invention in the abo vedescrib ed structure can transfer
the data for displayinga window of the dynamic picture
image or the like at a desired position on the screen t o a
memory array in acco rdance with t he input data from a
access memory to the memory array per every bit in BRIEF DES CRIFTION OF T HE DRAWINGS
accordance with an output of the memory means.
According to a second embodiment of the present
invention. a semiconductor memory includes a first
register which takes input data serially in synchroniza-
tion with clocks, input means for inputting transfer
mask data to con trol the transfer
of
serial data. a selec-
tor which selects either the data from the transfer mask
input means or the transfer mask data generated inside
the memory, a second register which takes output sig-
nals
of
the selector, and control means
for
controlling
per very bit a transfer gate to transfer the serial data in
accordance with an output of the sccond register are
aravided.
These and other objects and features of the present
invention will become clear from the following descrip-
tion taken in conjunction with the preferred embodi-
ment thereof with reference to the accomp anying draw-
ings throughout which like parts are designated by like
reference numerals, and in which:
FIG. 1 isa structural diagram of multi-port memory
according
lo
one preferred embodiment
of
the present
invention:
FIG.
2 is
a
circuit diagram of a transfer gate,
a
data
register, a data selec tor and a mask tegister in the multi-
port m em ory of F I G .
1;
r
-
- - -
According to
a
third embodiment of the prwnt in-
vention
a
semiconductor memory includes a a serial
data input means,
a
first register which takes input data
from the serial d ata input means in synchronization w ith
b
of he transfer of da w
clocks, transfer mask data input means for inputting
transfer mask data to control the transfer of serial data,
a second register which takes data from the transfer
mask data input means synchronously when the first
register takes the input data from the serial data input 45
means, address signal input means fo r indicating
a
bit at
the starting position where th e first and second registers
stan to take in the data.
a
serial address counter which
counts the clock cycles after taking an address signal
F I G .
3
is a diagram
of
an example
of
the transfer of
FIG. 4 is
a
diagram explanatory of another example
FIG.
5 is
a timing chart o f the memory of F I G . 1
when serial data is input and transferred;
FIG.
6
a StNCtUral diagram of
a
conventio nal dual-
port memory;
FIG.
7
is a timing chart
of
th e m emory of F I G . 6
when the serial data i5 transferred and output; and
FIG.
8
is
8
block diagram showing an image dirplay-
h g System
10
which a multi-port memory according to
the present invention isapplied.
data;
from the address signal input means and generatis a 5 0
xr ia l address sequentially moving from the bit position
where the
fmt
and second registers start to rake in the
DETAILED
OF
THE
P REFERRED EMBODIMENT
input data to a bit position
of
more significance, a serial The pr m nt invention provides a semiconductor
bit selector which selects the bit position indicated by memo ry dev ice which includes
a
serial
port
for storing
the serial address,
t
transfer gate lo transfer the content 55 the
Serial
data such as dynamic picture image or the like,
of the first register to a memory may. and control
a
dual-port memory which has
a
random
port for
writ-
means for controlling
per
every bit
a
transfer control
ing
and reading
IO
n arbitrary position of
a
memory
signal input to the transfer gate in accordance with m array and a serial port
for
outputting display data to
CRT.
utput
of
the second register.
FIG. 8 shows a system having a color monitor 57
invention,
a
semiconductor memory includes
a
there connected to a color map
56
via a line 59 to which a
serial data input means, a first register which takes input multi-pori memo ry 51 according to the pr mn t inven-
data from the serial data input means in synchronization tion is applied.
with clocks, a second register which t ak a transfer mask In this system, the color map 56
is
connected, via a
data synchronously when the first register takes the 65 video data bus 6 6 , o the multi-port memory 51 and the
input data from the serial data input means, address col or map 56 and the multi.pon memory 51 are con.
signal input means
for
indicating
a
bit Pt the starting trolled by a serial port control circuit 55 through lines
position where the first and second registers start to 66 and
67.
The multi-pori memory 51
is
connected to an
According to
a
founh embodiment Of the prcsent 6 0
-
8/11/2019 Certain Semiconductor Memory Devices and Products Containing Same, 337-470, No. 65959-1 (U.S.I.T.C. Apr. 5,
95/179
5,260,905
6
imaging hard-ware 53 via
data bus 62 and an address data register 11 and mask register 13
in
accordance with
bus
63.
an output of the serial address counter
14.
Both the multi-pon memory 51 and imaging hard- The second
serial
address counter
14
functions in the
ware 53 are controlled by the random port control same manner as the first serial address counter
8.
T h e
circuit
5 4
via lies
64
and
65,
respectively. The imaging
5 second serial data register 11 takes in the data from a
hard-ward
53
is connected, via a line
61,
to an interface serial data input terminal
25
to a bit position indicated
52 which
is
connected t o a standard bus 60. he multi- by an output
of
the
serial
bit selector 12, and the mask
pon
memory 51 is connected to
a
serial data writing register 13 t a k a i n
an
output of the selector 1S to a bit
circuit
70
v a serial data line
71
and serial mask line 72. position indicated by the output
of
the serial bit selector
The multi-port memory 51 stores images to be dis-
lo
12. Th e serial bit selector
12,
similar to the d ata selector
played on the colo r monitor 56. The information stored 3. indicates an arbitrary bit position for the second serial
in the multi-port memory 51 is transmitted, via a video data register
11 in
accordance with an output of the
data bus
68,
to the
color
map
56
sequentially and dis- second serial address coun ter
14
and indicates
also
the
played by the color monitor 56. Th e serial port cont rol same bit position for the mask register 13
as
the second
circuit 55 controls the transfer of the information stored
15
serial data register 11.
A
selector 15 is a circuit
to
switch
in the multi-pon memory 51. T o alter the information the mask data to be input to the mask register 13 be-
stored
in
the multi-pon memory 51 through the imaging tween the data input through a mask data input terminal
hard-ware 5 5 in order to change the image to be dis- 27 and the data fixed to logic
1
in accordan ce with a
played on the color monitor 57, the standard bus 60
signal from a mask selection signal input terminal
2 8
transmits suitable com mands to the imaging hard-ware
20
Terminals of nput/output signals and a control signal
53 via the interface 52. Th e random port control circuit
to
realize input/output means of signal