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CCI MP-HSNext generation interferometry at >100 microns/sec.
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Understanding structured surfacesThe large field of view and high resolution of
the CCI MP-HS enable the understanding
of complex structured surfaces.
CCI MP-HS: Non-contact 3D optical profiler
High speed metrology without compromise • Scanspeedupto100microns/secondwithoutanylossofdataquality
• 1024x1024pixelarrayforlargeFOVwithhighresolution
• 2.2mmverticalrangewithclosedlooppiezolessZaxisscanner
• AutoStitchasstandard,measureslargepartsathighresolution
Industry leading data quality • 0.1ångstrom resolution over the entire measurement range
• <0.2ångstromRMSrepeatability,<0.1%stepheightrepeatability
• Integratedantivibrationforoptimumnoiseperformance
• NewClaritas20lightconditioning,increasedanglesensitivityimprovesdataquality
Robust design ensures low cost of ownership • PiezolessZaxisscannereliminatesexpensiverepairbills
• Automaticsurfacedetectionpreventscrashdamagetolens
• NewXLoptionforlargerpartswithoutlossofdataquality
• Easeofoperationreducesthepossibilityofoperatorerror
Windows® 7 (64-bit) software • Multi-languagesupportincludingChineseandJapanese
• Advanced64-bitAutoStitchoffersfaststitchingoverlargeareas
• Newtoolsincluding4Danalysisof3Dsurfacesastheyevolveovertime
• Automaticreportgenerationbasedonbatchesofmeasurementdata
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Threeelementsofsurfaces–dimension,formandtexture–arecriticaltothefunctionofacomponent.Exceptionalroughnesscapabilitycoupledwithlargeareameasurement,advanceddataanalysis(2Dand3D)andTaylorHobson'sexpertiseprovidesindustryleadingmetrology.
ManyuserslooktoCCIMP-HSforsolvingmeasurementproblemsthatotherinstrumentssimplycannothandle.Withoutstandingrange,resolutionandeaseofoperation,theCCIMP-HScaneasilybecomeyouridealtoolforR&Dandqualityassuranceinawidevarietyofapplications.
Unlimited application possibilities
Grinding stones
Ball bearings
Crankshafts
• Materialresearch
• Bearingroughness
• Polishedoptics
• Texturedsteel
• Diamondturnedsurfaces
• Automotiveinjectors
• Structuredsurfaces
• Medicalimplants
• Sealingsurfaces
• Crankshaftfinish
• Fluidretention(bearingratio)
• Paper/toner
• Phonehandsetfinish
• Toothwear
• SIMScraters
• Waferroughness
• Waferetchdepth
• Solarcells
• LEDs
• MEMS
• Datastorage
LaptopdiffuseroptimizationControllingtheuniformityofthepits
improvesthedisplayquality.Highspeed
measurement allows efficient process
control of the diffuser manufacture.
The CCI has proven highly valuable. The instrument
utilizes Coherence Correlation Interferometry, a Taylor
Hobson-patented technique, to provide both long
scan ranges and high-resolution surface
measurement with a single mode of operation. Professor Manasreh
University of Arkansas, USA
TheCCIMP-HSXLisoptimizedfor the measurement of large components without compromising the resolution
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Speed, range, resolution, accuracy, reliability – our formula for your success Whateverthecomponent,howeverquicklyyoumustanalyseit,confidenceinyour3DarealmeasurementresultisassuredwiththerevolutionaryCCIMP-HSnon-contactopticalprofiler. Ahighspeed1MPcameracombineswith1/10ångstromverticalresolutionandtheClaritas20lightconditioningtodeliverincrediblydetailedanalysisofallsurfacetypesfromveryroughtoextremelysmooth.
Versatile – ready for a production run or a research project Keepingpacewiththeexpertiseofresearchersandscientists,theCCIMP-HSisreadyforyourmostdemandingmeasurementrequirementsincludingdevelopingfields.Advancedstitchingincreasesthevalueoftheinstrumentbyextendingtherangeofcomponentsthatcanbemeasured.
Ease-of-use reduces the cost of operator training Designedforeaseofusebyscientists,students,developersorproductioninspectors, CCIMP-HShasinnovativefeaturessuchasAutoRange,AutoFringeFindandmulti-sitemeasurmentthatsimplifysettingupandstagingofcomponents.Savevaluabletime,reduceerrorsandquicklygettheresultsyouneed.
Comprehensive platform simplifies ISO-17025 integrationGreatlyexpandyouranalysiscapabilitieswithoutincreasingthecomplexityofyouranalysisprograms.Abroadrangeofcomponentsandsurfacescanbemeasuredwithout the complication of switching between measurement modes or the extra burdenofintermediatelenscalibration.Standardizedmethods,proceduresandreportingeasetheintegrationofCCIMP-HSintoyourqualitymanagementsystem.
CCI MP-HS high speed performance for research and manufacturing
Bearing surface flatnessFlatnessofbearingsurfaceshasadramaticimpact
onbothperformanceandlifetime.Acombination
of advanced stitching and high speed measurement
gives results in minutes rather than hours.
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21st century optical profiling
One measurement mode Streamlineyourinspectionprogrambyeliminatingmultipleinspectionroutinesandincompatiblemeasurementreports.OurpatentedCoherenceCorrelationalgorithm provides sub-ångstrom resolution regardless of scanning range so that allsurfacesatanystageinproductioncanbemeasuredonthesameinstrumentanddirectlycompared.
Improved sensitivityThenewClaritas20lightconditioningoffersunrivalleddataquality.Increasedsensitivityprovideslessmissingdataonhardtomeasuresurfacesandanincreaseinmaximumanglecapability,improvingdataqualityandopeningupnewexcitingapplication opportunities.
Coating measurement ThickfilmmeasurementcapabilityisanexcitingadditiontotheCCIMP-HSByaddingawhiteLEDtothesystemcoatingthicknessesdownto1.5micronscanbeanalysedeasilyextendingtherangeofsamplesthatcanbemeasured.TheuniquehighresolutionmeasurementoftheCCIgivesindustryleadingthicknessandstepheightinformationfromsingleandmultilayersamples.
Save valuable time, reduce errors
and quickly get the results you need.
Grinding wheel roughness Difficulttomeasureroughsurfacesneedthe
highresolutioncapabilityoftheCCIMP-HS.
High speed measurement and stitching will
improvetheanalysisbylookingatlargerareas.
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Next generation 3D camera technology
Higher resolutionCCIMP-HSimagesensorswithhighspeed1024x1024pixelarraysarevastlysuperiortooldVGAvideocameratechnologywhere640x480pixelarraysgrosslylimitlateralresolution.Nowyoucanmeasurelargeareaswithoutthecomplexityorpotentialdistortioncausedbyfieldofviewmultipliers.
Faster measurementsAhighspeedsensorandlargerfieldofview(FOV)meansfewerset-ups,fasterinspectionspeedandbetterutilizationofequipmentandoperators.Costeffectivenessismuchimprovednowthatyoucaninspectmorepartsmorethoroughlyandingreaterdetailwithoutadditionalexpense.
Good results quickly With>1milliondatapointsandtheClaritas20lightconditioning,themeasuredsurfaceisdefinedinsuperbdetail.YoucanidentifysurfaceflawsorpotentialareasofconcernanywhereinthewideFOVandusesoftwareto“zoomin”fordetailedanalysiswithouthavingtowastetimere-measuringthecomponent.
New camera technology High speed with high resolution provides an essential tool for monitoring and improvingyourmanufacturingprocess.Stunning3Dimageswithsub-microndetailcan also be used to gain a better understanding of the sample properties.
Lastcentury640x480
CCIMP-HS1024x1024
Understanding curved surfacesRoughness and form of shallow curved
surfacescanbemeasuredquicklyand
analysedwithoutcontactingthesurface.
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Powerful automation features
AutoStitch XYZstitchingincreasestheeaseofuseandflexibilityoftheinstruments.Aswellasthestandardstitchingoptionslargecircular,sphericalandannularsurfacesareeasilymeasuredwiththeminimumofeffort.TheXYstitchingcanbecombinedwithZstitchingandotherautomationoptionstomeasurelargecomplexsampleswithhighresolutionquicklygivingtheuserhighqualitydatawiththeminimumofcomplications.
Multi-site measurement Automaticmeasurementofmultiplepartsormultiplesitesonasinglepartwithoutoperatorinterventioncangreatlyincreaseefficiencywhetherinproductionorresearchenvironments.FeaturessuchasAutoRange,AutoFringeFind,AutoCentreandAutoStitchofferadvancedautomationoptionstogivequick,accurateandrepeatable,savingtheuservaluabletimeandeffort.
Z step and measure CombiningtheinnovativeCCIclosedloopscannerandauniquealgorithmthez-stepandmeasuresoftwareallowsyoutomaximisethemeasurementrangewithoutcompromisingresolution.Measurementrangesof40mmorgreaterarenowpossiblewiththisuniquefeatureincreasingtherangeofsamplesbenefitingfrom the high resolution of the CCI instruments.
Automatic range settingSignificant reductions in measurement time are achieved with our exclusive AutoRangefeaturewhichautomaticallysetstheoptimumscanrangebasedonthesamplesurface.Manualsettingofthescanrangeistypicallyaguessinggamethatoftenresultsinoverscanning,longermeasurementtimesandfrustrationforeventhemostskillfuloperators.
Automatic surface detection AutoFringeFindwillincreaseinspectionthroughputbyeliminatingmanualset-upandtheneedtore-takemeasurementscausedbyfalseidentificationofthesamplesurface.Unlikecommonautofocusroutineswhichrequireaflatandsmoothsurface,thisinnovativecouplingofsoftwareandopticalexpertisecandetectalltypesofsurfacesquicklyandautomatically.
Stitched measurement of an annular sealing surfaceAswellasflatnessthefinedetailisidealfor
lookingatroughnessandsurfacedefects.
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Unrivalled application possibilities CCI single measurement mode gives unbeatable range resolution and accuracy
Injector flatness
CCIisidealforlookingatdieselinjectorassemblies.Thelargefieldofviewandhighdatadensityallowthe flatness and dimensions of the component to be measured and therefore controlled. The high measurementspeedmakesitidealforproductionenvironments.
Curved surfaces
Curvedsurfacessuchascamsandcrankshaftpinscan be slow to measure because of the curvature of the surface. The high speed and high resolution of the CCI MP-HS improves measurement throughput whilekeepingtightprocesscontrol.
Diamond turned surfaces
Faultssuchastoolheighterrorscanbeidentifiedandrectified.Roughnessandwavinessanalysistoolsforcuttingperformanceevaluationandfeedback(chatter,spoke,color,etc)willoptimiseopticalperformance.AdvancedPSDandslope-errortoolsareidealfordiagnosticevaluationoffrequencyerrors.
Super smooth surfaces
CCI MP-HS is able to scan at high speed while still maintainingindustryleadingperformance.Thehighresolutionenablestightertolerances,improvingprocess control. Measurement of sub ångstrom roughnesswithveryhighthroughputisnowpossible.
Optimising PV cell efficiency
Uniform trench depth prevents conducting material flowing out of the trench leading to reduced efficiency.Thehighspeedofmeasurementallowsrapidmeasurementoftrenchdepthandwidth,helping to control the dimensions and therefore improve cell performance.
Rough surfaces
Becauseroughsurfacesscatterlighttheyareoftendifficulttomeasure.TheuniqueCCIalgorithm,highspeedandhighsensitivitycameragiveslessmissingdatathananyofourleadingcompetitorswhile measuring at high speed.
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CCI MP-HS offers a wide range of advanced analysis
Thick film measurement
Controlling surface roughness
Measurement of honed surface
Fluid retention analysis
Using a white light source it is possible to measure filmthicknessofmultilayerthickfilms.TheCCIalgorithmgivesunrivalledthicknessandinterfaceresolution.
CCIisidealforlookingattheroughnessofverysmoothsurfaces.PSDanalysiscanbeusedtoidentifyanyissuesinsilicon wafer polishing.
High lateral resolution over large areas is perfect for3Dtexturedirectionanalysis.Acombinationoffinedetailandadvancedanalysisofferscriticalassessment of advanced engineered surfaces.
Manyengineeringsurfaces are designed to encourage fluid retention. The bearing ratio of the surface is used to optimizethenumberandshapeofpits,optimizingperformance.
3D honed surface
Ball bearing surface
Texture direction Surface parameters
Bearing ratio analysis
Film thickness
Average profile PSD
Form removed surface
Form removed surface
Top surface
Bottom surface
Silicon surfaces
Air
Film
Substrate
Top surface
Bottom surface
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Powerful new software features
Key features
Control software Nowwith64bitprocessing,theCCIcontrolsoftwarefeaturesgreaterflexibility,fasteroperatingspeedandimprovedoverallperformance.Compatibilitywithmostmainstreamplatformsoffersthepossibilityofcollaborativeresearchprojectsanddevelopmentofadvancedapplications.
Multi-languagesupportisnowavailabletokeeppacewiththeglobaleconomyand international manufacturing partnerships.
Flexible, user-friendly, all-inclusive software ThelatestgenerationofTalyMapsoftwareassuresconformitywiththelatest3Dstandard,ISO25178,aswellasfullmetrologicaltraceability.Newanalyticalfunctionsinclude4Danalysisof3Dsurfacesastheyevolveovertime,pressureorotherphysicalproperties.Alongwithphoto-realisticfullcolourimages,TalyMapalsoincludesenhancedproductivitytoolssuchastemplatesforrepetitiveworkandautomaticreportgenerationbasedonbatchesofmeasurement data.
Researchfacilities,factoriesanduniversitiesworldwidehavemadeTalyMaptheirpreferredsurfaceanalysissoftware.Itisusedforproductdevelopment,processimprovement,predictivebehaviouranalysisandroutineinspectioninmanysectors.TalyMapiscontinuouslyevolvedbyamulti-disciplinaryteamofspecialistsinmetrology,softwareengineeringandautomationinordertomeetpresentandfuturesurfacemetrologyneeds.
Full metrological traceability Newanalysisworkflowenablessteptraceabilityinananalysisdocument.Newstepscanbeadded,fine-tunedordeletedatanytime.
Statistics for quality control Newstatisticsoptionmakesitpossibletotrackandgeneratestatisticsonparametersacrossmultiplemeasurementdatasets.
Multi-language support TalyMapcanbeconfiguredtoworkinoneofsixEuropeanlanguages,Japanese,Chinese,KoreanorBrazilianPortuguese.
Quick results Minidocfunctionsignificantlyspeedsupreportpreparationbycreatingshortcutstocommonsequences
Customization Addcompanylogos,measurementidentitycards,screennotesandillustrationsincludingbitmaps,textblocksandarrows.
Advanced modules TalyMapadvancedmodulesenhancefunctionalitybyprovidingadditionalanalysisorpresentationcapabilities.
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†Allparametersmarkedwithanasteriskaresuitableforuser-assignedsingleormultiplequalifiers,e.g.,materialratio(mr)maybeassessedatoneormore slice levels within a single measurement.
Flexible, user-friendly, all-inclusive software
ThelatestgenerationofTalyMapsoftwareassuresconformitywiththe3DstandardISO25178aswellasfullmetrologicaltraceability.Idealforresearchanddevelopmentproducts,thelatest2Dand3Dparameterswillbecritical for future developments.
Alongwithphoto-realisticfullcolourimages,TalyMapalsoincludesenhancedproductivitytoolssuchastemplatesforrepetitiveworkandautomaticreportgeneration based on batches of measurement data.
TaylorHobsonhasawell-deservedreputationforindustry-leadingdataprocessing. Analysisparametersandsoftwaremodulesavailableinclude:
2D parameters 3D parameters
Primary (unfiltered)Pa,Pc,Pdc,Pdq,PHSC,PHtp,Pku,Plo,Plq,Pmr,Pp,PPc,Pq,Prms,Psk,PSm,Pt,Ptp,Pv,Py,Pz,Pz(JIS),P3z,Pfd,Pda,Pla,PH,PD,PS,Pvo
AmplitudeSa,Sq,Sp,Sv,St,Ssk,Sku,Sz
Waviness (filtered)Wa,Wc,Wdc,Wdq,WHSC†,WHtp,Wku,Wlo,Wlq,Wmr†,Wp,WPc†,Wq,Wrms,Wsk,WSm,Wt,Wtm,Wtp,Wv,Wy,Wz,Wz(JIS),W3z,Wda,Wla,Wmax,WH,WD,WS,Wvo
Area & volumeStp,SHtp,Smmr,Smvr,Smr,Sdc
Roughness (filtered)Ra,Rc,Rdc,Rdq,RHSC,RHtp,Rku,Rlo,Rlq,Rmr†,Rp,RPc,Rq,Rrms,Rsk,RSm,Rt,Rtm,Rtp,Rv,Ry,Rz,Rz(JIS),R3z,Rfd,Rda,Rla,Rmax,RH,RD,RS,Rvo
Data analysisStepheight,LateralDistance,Pitch,AngleMeasurement,PeakCount,InteractiveAbbott-FirestoneCurve,VolumeofIslands,FractalAnalysis,MotifsAnalysis,FrequencyAnalysis,DataPatching
Rk (DIN 4776, ISO 13565-2)A1,A2,Mr1,Mr2,Rk,Rpk,Rvk,Rpk*,Rvk*
FunctionalSk,Spk,Svk,Sr1,Sr2,Sbi,Sci,Svi,Sm,Vv,Vm,Vmp,Vmc,Vvc,Vvv
R&W (ISO 12085)AR,AW,HTrc,Pt,R,Rke,Rpke,Rvke,Rx,Trc,W,Wte,Wx,Kr,Nr,SR,SAR,Kw,
FlatnessFLTt,FLTp,FLTs,FLTq,FLTv
Autocorrelation,Nw,SW,SAW
Hybrid & spatialSdq,Ssc,SdrSpc,Sds,Str,Sal,Std,Sfd
Straightness (ISO 12780)STRt,STRp,STRv,STRq
FiltersGaussian,RobustGaussian,Spline,Wavelet,RobustWaveletandMorphological
Copyright© 2013 • Taylor Hobson • CCI MP-HS_GB_V12_3 June
Taylor Hobson UK (Global Headquarters)
PO Box 36, 2 New Star RoadLeicester, LE4 9JQ, England
Tel: +44 116 276 3771 Fax: +44 116 246 0579 email: [email protected]
Taylor Hobson FranceRond Point de l’Epine Champs
Batiment D, 78990 Elancourt, FranceTel: +33 130 68 89 30 Fax: +33 130 68 89 39
Taylor Hobson GermanyPostfach 4827, Kreuzberger Ring 6
65205 Wiesbaden, GermanyTel: +49 611 973040 Fax: +49 611 97304600
Taylor Hobson India1st Floor, Prestige Featherlite Tech Park
148, EPIP II Phase, Whitefield, Bangalore – 560 006Tel: +91 1860 2662 468 Fax: +91 80 6782 3232
Taylor Hobson ItalyVia De Barzi
20087 Robecco sul Naviglio, Milan, ItalyTel: +39 02 946 93401 Fax: +39 02 946 93450
Taylor Hobson Japan3F Shiba NBF Tower, 1-1-30, Shiba Daimon Minato-ku
Tokyo 105-0012, JapanTel: +81 (0) 3 6809-2406 Fax: +81 (0) 3 6809-2410
Taylor Hobson Korea#310, Gyeonggi R&DB Center, 906-5, lui-dong
Yeongtong-gu, Suwon, Gyeonggi, 443-766, KoreaTel: +82 31 888 5255 Fax: +82 31 888 5256
Taylor Hobson China Beijing OfficeWestern Section, 2nd Floor, Jing Dong Fang Building (B10)
No.10, Jiu Xian Qiao Road, Chaoyang District, Beijing, 100015, ChinaTel: +86 10 8526 2111 Fax: +86 10 8526 2141
Taylor Hobson China Shanghai OfficePart A, 1st Floor, No. 460 North Fute Road
Waigaoqiao Free Trade Zone, Shanghai, 200131, ChinaTel: +86 21 5868 5111-110 Fax: +86 21 5866 0969-110
Taylor Hobson SingaporeAMETEK Singapore, 10 Ang Mo Kio Street 65
No. 05-12 Techpoint, Singapore 569059Tel: +65 6484 2388 Ext 120 Fax: +65 6484 2388 Ext 120
Taylor Hobson USA1725 Western Drive
West Chicago, Illinois 60185, USATel: +1 630 621 3099 Fax: +1 630 231 1739
www.taylor-hobson.com
© DiskArt™ 1988
TAYLOR HOBSONA8248 ISO9001
OPTIMA�UKAS
Serving a global marketTaylor Hobson is world renowned as a manufacturer of precision measuring instruments used for inspection in research and production facilities. Our equipment performs at nanometric levels of resolution and accuracy.
To complement our precision manufacturing capability we also offer a host of metrology support services to provide our customers with complete solutions to their measuring needs and total confidence in their results.
Contracted Services from Taylor Hobson
• Inspection services measurement of your production parts by skilled technicians using industry leading instruments in accord with ISO standards
• Metrology training practical, hands-on training courses for roundness and surface finish conducted by experienced metrologists • Operator training on-site instruction will lead to greater proficiency and higher productivity • UKAS Calibration and Testing certification for artifacts or instruments in our laboratory or at customer’s site
For the above services, contact our Center of Excellence:email: [email protected] or call: +44 116 276 3779
• Design engineering special purpose, dedicated metrology systems for demanding applications
• Precision manufacturing contract machining services for high precision applications and industries
• Preventative maintenance protect your metrology investment with a Talycare service cover plan
For the above services, contact our Sales Department:email: [email protected] or call: +44 116 246 2034
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